JP5057113B2 - 半導体装置および電子部品並びにそれらの製造方法 - Google Patents
半導体装置および電子部品並びにそれらの製造方法 Download PDFInfo
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- JP5057113B2 JP5057113B2 JP2009262166A JP2009262166A JP5057113B2 JP 5057113 B2 JP5057113 B2 JP 5057113B2 JP 2009262166 A JP2009262166 A JP 2009262166A JP 2009262166 A JP2009262166 A JP 2009262166A JP 5057113 B2 JP5057113 B2 JP 5057113B2
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- conductive layer
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Description
第1の面と、前記第1の面の反対側の第2の面とを有する半導体基板と、
前記半導体基板の前記第1の面の上に設けられた電極と、
前記半導体基板の前記第1の面の上に設けられ、前記電極の少なくとも一部とオーバーラップする開口部を有する絶縁膜と、
前記絶縁膜の上に設けられた樹脂突起と、
前記電極と電気的に接続され、一部が前記樹脂突起の上に設けられた配線層と、
を有し、
前記配線層は、前記電極および前記樹脂突起の上に形成された第1の導電層と、前記第1の導電層の上に形成された第2の導電層と、を有し、
前記第1の導電層は、前記半導体基板側の第1の面と、前記第2の導電層側の第2の面と、を有し、
前記第1の導電層の前記第2の面に、前記第1の導電層の第1の酸化膜または第1の窒化膜が形成され、前記第1の導電層の前記第1の面の前記樹脂突起と接触する領域に、下地層が形成される。
前記下地層は、前記第1の導電層の第2の酸化膜または第2の窒化膜により形成されてもよい。
前記下地層は、前記第1の導電層を形成する前に、前記第1の導電層と同じ材料からなる導電層を形成し、前記導電層を酸素雰囲気または窒素雰囲気において熱処理することにより形成されてもよい。
(4)本発明の様態の1つにおいて、
前記下地層は、酸素雰囲気または窒素雰囲気において前記第1の導電層を熱処理することにより形成されてもよい。
(5)本発明の様態の1つにおいて、
前記下地層は、前記第1の導電層の前記第1の面の全面に形成されてもよい。
前記第1の導電層は、チタン、ニッケル、クロム、タングステンのいずれか1つを含み、
前記第2の導電層は、金、白金、銅のいずれか1つを含んでいてもよい。
第1の面と、前記第1の面の反対側の第2の面とを有する半導体基板と、前記半導体基板の前記第1の面に設けられた電極と、前記半導体基板の前記第1の面に設けられ、前記電極の少なくとも一部とオーバーラップする開口部を有する絶縁膜と、を有する構造体を用意する工程と、
前記絶縁膜の上に樹脂突起を形成する工程と、
前記電極と電気的に接続され、一部が前記樹脂突起の上に設けられた配線層を形成する工程と、
を有し、
前記配線層を形成する工程は、
前記電極および前記樹脂突起の上に、前記半導体基板側の第1の面と、前記第1の面と反対側の第2の面と、を有する第1の導電層を形成する工程と、
前記第1の導電層の前記第2の面に、前記第1の導電層の第1の酸化膜または第1の窒化膜を形成する工程と、
前記第1の導電層の前記第1の酸化膜または前記第1の窒化膜の上に第2の導電層を形成する工程と、
前記第1の導電層の前記第1の面に、第2の酸化膜または第2の窒化膜を形成する工程と、
を有し、
前記第2の酸化膜または前記第2の窒化膜を形成する工程は、前記第1の導電層を形成する前に、前記第1の導電層と同じ材料からなる導電層を形成し、前記導電層を酸素雰囲気または窒素雰囲気において熱処理する工程を有する。
第1の面と、前記第1の面の反対側の第2の面とを有する半導体基板と、前記半導体基板の前記第1の面に設けられた電極と、前記半導体基板の前記第1の面に設けられ、前記電極の少なくとも一部とオーバーラップする開口部を有する絶縁膜と、を有する構造体を用意する工程と、
前記絶縁膜の上に樹脂突起を形成する工程と、
前記電極と電気的に接続され、一部が前記樹脂突起の上に設けられた配線層を形成する工程と、
を有し、
前記配線層を形成する工程は、
前記電極および前記樹脂突起の上に、前記半導体基板側の第1の面と、前記第1の面と反対側の第2の面と、を有する第1の導電層を形成する工程と、
前記第1の導電層の前記第2の面に、前記第1の導電層の第1の酸化膜または第1の窒化膜を形成する工程と、
前記第1の導電層の前記第1の酸化膜または前記第1の窒化膜の上に第2の導電層を形成する工程と、
前記第1の導電層の前記第1の面の前記樹脂突起と接触する領域に、前記第1の導電層の第3の酸化膜または第3の窒化膜を形成する工程と、
を、有し、
前記第3の酸化膜または前記第3の窒化膜は、酸素雰囲気または窒素雰囲気において前記第1の導電層を熱処理することにより形成される。
上記いずれかに記載の半導体装置の製造方法によって製造された半導体装置を準備する工程と、
前記半導体装置を配線基板に電気的に接続する工程と、を有する。
以下、図面を参照して、第1の実施の形態及び第2の実施の形態に係る半導体装置について説明する。
図2において、第1の実施の形態に係る半導体装置100の一例を示す。
また、図2(B)に示すように、第1の導電層21の第1の面21aの全面に下地層31を形成してもよい。言い換えれば、配線層20の最下層を下地層31としてもよい。
以下、図面を参照して、本実施の形態に係る半導体装置の製造方法について説明する。
以下、図面を参照して、第1の実施の形態に係る半導体装置の製造方法について説明する。図5は、第1の実施の形態に係る半導体装置の製造方法を模式的に説明する要部の断面図である。
以下、図面を参照して、第2の実施の形態に係る半導体装置の製造方法について説明する。図6は、第2の実施の形態に係る半導体装置の製造方法を模式的に説明する要部の断面図である。
以下、図面を参照して、本実施の形態に係る電子部品、およびその製造方法について説明する。
16a 開口部、18 樹脂突起、20 配線層、21 第1の導電層、
21a 第1の面、21b 第2の面、22 第2の導電層、30 中間層、
31 下地層、40 樹脂材料膜、41 樹脂層、50 第1の導電膜、
50a 第1の導電膜、51 中間膜、52 第2の導電膜、
53 第3の導電膜、54 第4の導電膜、55 下地膜、60 外部端子、
80 配線基板、100 半導体装置、110 第1の方向、120 第2の方向、
1000 電子部品。
Claims (10)
- 第1の面と、前記第1の面の反対側の第2の面とを有する半導体基板と、
前記半導体基板の前記第1の面の上に設けられた電極と、
前記半導体基板の前記第1の面の上に設けられ、前記電極の少なくとも一部とオーバーラップする開口部を有する絶縁膜と、
前記絶縁膜の上に設けられた樹脂突起と、
前記電極と電気的に接続され、一部が前記樹脂突起の上に設けられた配線層と、
を有し、
前記配線層は、前記電極および前記樹脂突起の上に形成された第1の導電層と、前記第1の導電層の上に形成された第2の導電層と、を有し、
前記第1の導電層は、前記半導体基板側の第1の面と、前記第2の導電層側の第2の面と、を有し、
前記第1の導電層の前記第2の面に、前記第1の導電層の第1の酸化膜または第1の窒化膜が形成され、前記第1の導電層の前記第1の面の前記樹脂突起と接触する領域に、下地層が形成された、半導体装置。 - 請求項1において、
前記下地層は、前記第1の導電層の第2の酸化膜または第2の窒化膜により形成される、半導体装置。 - 請求項1又は2において、
前記下地層は、前記第1の導電層を形成する前に、前記第1の導電層と同じ材料からなる導電層を形成し、前記導電層を酸素雰囲気または窒素雰囲気において熱処理することにより形成される、半導体装置。 - 請求項1において、
前記下地層は、酸素雰囲気または窒素雰囲気において前記第1の導電層を熱処理することにより形成される、半導体装置。 - 請求項1から3のいずれか1項において、
前記下地層は、前記第1の導電層の前記第1の面の全面に形成された、半導体装置。 - 請求項1から3のいずれか1項において、
前記第1の導電層は、チタン、ニッケル、クロム、タングステンのいずれか1つを含み、
前記第2の導電層は、金、白金、銅のいずれか1つを含む、半導体装置。 - 請求項1から6のいずれか1項に記載の半導体装置が電気的に接続された、電子部品。
- 第1の面と、前記第1の面の反対側の第2の面とを有する半導体基板と、前記半導体基板の前記第1の面に設けられた電極と、前記半導体基板の前記第1の面に設けられ、前記電極の少なくとも一部とオーバーラップする開口部を有する絶縁膜と、を有する構造体を用意する工程と、
前記絶縁膜の上に樹脂突起を形成する工程と、
前記電極と電気的に接続され、一部が前記樹脂突起の上に設けられた配線層を形成する工程と、
を有し、
前記配線層を形成する工程は、
前記電極および前記樹脂突起の上に、前記半導体基板側の第1の面と、前記第1の面と反対側の第2の面と、を有する第1の導電層を形成する工程と、
前記第1の導電層の前記第2の面に、前記第1の導電層の第1の酸化膜または第1の窒化膜を形成する工程と、
前記第1の導電層の前記第1の酸化膜または前記第1の窒化膜の上に第2の導電層を形成する工程と、
前記第1の導電層の前記第1の面に、第2の酸化膜または第2の窒化膜を形成する工程と、
を有し、
前記第2の酸化膜または前記第2の窒化膜を形成する工程は、前記第1の導電層を形成する前に、前記第1の導電層と同じ材料からなる導電層を形成し、前記導電層を酸素雰囲気または窒素雰囲気において熱処理する工程を有する、半導体装置の製造方法。 - 第1の面と、前記第1の面の反対側の第2の面とを有する半導体基板と、前記半導体基板の前記第1の面に設けられた電極と、前記半導体基板の前記第1の面に設けられ、前記電極の少なくとも一部とオーバーラップする開口部を有する絶縁膜と、を有する構造体を用意する工程と、
前記絶縁膜の上に樹脂突起を形成する工程と、
前記電極と電気的に接続され、一部が前記樹脂突起の上に設けられた配線層を形成する工程と、
を有し、
前記配線層を形成する工程は、
前記電極および前記樹脂突起の上に、前記半導体基板側の第1の面と、前記第1の面と反対側の第2の面と、を有する第1の導電層を形成する工程と、
前記第1の導電層の前記第2の面に、前記第1の導電層の第1の酸化膜または第1の窒化膜を形成する工程と、
前記第1の導電層の前記第1の酸化膜または前記第1の窒化膜の上に第2の導電層を形成する工程と、
前記第1の導電層の前記第1の面の前記樹脂突起と接触する領域に、前記第1の導電層の第3の酸化膜または第3の窒化膜を形成する工程と、
を、有し、
前記第3の酸化膜または前記第3の窒化膜は、酸素雰囲気または窒素雰囲気において前記第1の導電層を熱処理することにより形成される、半導体装置の製造方法。 - 請求項8又は9のいずれかに記載の半導体装置の製造方法によって製造された半導体装置を準備する工程と、
前記半導体装置を配線基板に電気的に接続する工程と、
を有する、電子部品の製造方法。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009262166A JP5057113B2 (ja) | 2009-11-17 | 2009-11-17 | 半導体装置および電子部品並びにそれらの製造方法 |
US12/873,570 US8212356B2 (en) | 2009-11-17 | 2010-09-01 | Semiconductor device having multi-layered wiring layer and fabrication process thereof |
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