JP4762344B2 - マススペクトロメータ内イオン量増強方法 - Google Patents
マススペクトロメータ内イオン量増強方法 Download PDFInfo
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- JP4762344B2 JP4762344B2 JP2009504823A JP2009504823A JP4762344B2 JP 4762344 B2 JP4762344 B2 JP 4762344B2 JP 2009504823 A JP2009504823 A JP 2009504823A JP 2009504823 A JP2009504823 A JP 2009504823A JP 4762344 B2 JP4762344 B2 JP 4762344B2
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0027—Methods for using particle spectrometers
- H01J49/0031—Step by step routines describing the use of the apparatus
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
- H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
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- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Description
・プリトラップ24における衝突気体厚P・D … 好ましくは0.05mm・torr<P・D<0.2mm・torrの範囲内;英国特許出願第0506287.2号(出願人は本願出願人)に記載の通りプリトラップ24内にイオンを複数回通してもよい;
・イオントラップ30における衝突気体厚P・D … 好ましくは0.02〜0.1mm・torrの範囲内;同じく複数回通過型も可;
・(CIDによる)フラグメント化セル50における衝突気体厚P・D … 好ましくはP・D>0.5mm・torr、より好ましくはP・D>1mm・torr;
・各種補助イオン捕獲装置60における衝突気体厚P・D … 好ましくは0.02〜0.2mm・torrの範囲内;対するに静電トラップ40は例えば10-8torr未満の高真空に保つのがよい。
・プリトラップ24内への貯め込み … 通常は1〜100ms;
・湾曲型イオントラップ30への移送 … 通常は3〜10ms;
・静電トラップ40内での分析 … 通常は1〜10ms(質量選別分解能を10000超にする場合);
・フラグメント化セル50におけるフラグメント化(湾曲型イオントラップ30へのイオン返戻後) … 通常は5〜20ms;
・フラグメント化セル50を介した補助イオン捕獲装置60へ移送(フラグメント化なしの場合) … 通常は5〜10ms;
・Orbitrap(商標)型マスアナライザ70における分析 … 通常は50〜2000ms。
Claims (2)
- (a)イオン源にて試料イオンを発生させるステップと、
(b)そのイオンを第1イオン捕獲装置内に貯めるステップと、
(c)貯まったイオンをイオン選別装置に入射するステップと、
(d)指定されたm/z比のイオンを選別してイオン選別装置から出射させるステップと、
(e)イオン選別装置から出射されるイオンをイオン選別装置を通って遡行しないよう第2イオン捕獲装置内に貯めるステップと、
(f)ステップ(a)〜(e)を繰り返し実行することによって第2イオン捕獲装置内に上記m/z比のイオンを蓄積させるステップと、
(g)蓄積させたイオンを第1イオン捕獲装置に送り返して爾後の分析に供するステップと、
を有するマススペクトロメータ検知限界改善方法。 - (a)イオン源にて試料イオンを発生させるステップと、
(b)そのイオンを第1イオン捕獲装置内に貯めるステップと、
(c)貯まったイオンをイオン選別装置に入射するステップと、
(d)イオン選別装置で分析対象イオンを選別して出射するステップと、
(e)イオン選別装置から出射されるイオンをフラグメント化装置内でフラグメント化するステップと、
(f)生じたフラグメントイオンをイオン選別装置を通って遡行しないよう第2イオン捕獲装置内に貯めるステップと、
(g)ステップ(a)〜(f)を繰り返し実行することによって第2イオン捕獲装置内にフラグメントイオンを蓄積させるステップと、
(h)フラグメントイオンをその蓄積後に第1イオン捕獲装置に送り返して爾後の分析に供するステップと、
を有するマススペクトロメータ検知限界改善方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0607542.8 | 2006-04-13 | ||
GBGB0607542.8A GB0607542D0 (en) | 2006-04-13 | 2006-04-13 | Mass spectrometer |
PCT/GB2007/001362 WO2007122379A2 (en) | 2006-04-13 | 2007-04-13 | Method of ion abundance augmentation in a mass spectrometer |
Publications (2)
Publication Number | Publication Date |
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JP2009533670A JP2009533670A (ja) | 2009-09-17 |
JP4762344B2 true JP4762344B2 (ja) | 2011-08-31 |
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Application Number | Title | Priority Date | Filing Date |
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JP2009504823A Expired - Fee Related JP4762344B2 (ja) | 2006-04-13 | 2007-04-13 | マススペクトロメータ内イオン量増強方法 |
JP2009504824A Expired - Fee Related JP4763077B2 (ja) | 2006-04-13 | 2007-04-13 | イオン捕獲装置付きマススペクトロメータ |
JP2009504822A Expired - Fee Related JP4763830B2 (ja) | 2006-04-13 | 2007-04-13 | フラグメント化セル及びイオン選別装置併設型マススペクトロメータ |
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Application Number | Title | Priority Date | Filing Date |
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JP2009504824A Expired - Fee Related JP4763077B2 (ja) | 2006-04-13 | 2007-04-13 | イオン捕獲装置付きマススペクトロメータ |
JP2009504822A Expired - Fee Related JP4763830B2 (ja) | 2006-04-13 | 2007-04-13 | フラグメント化セル及びイオン選別装置併設型マススペクトロメータ |
Country Status (7)
Country | Link |
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US (4) | US7829842B2 (ja) |
JP (3) | JP4762344B2 (ja) |
CN (4) | CN101421818B (ja) |
CA (3) | CA2644279C (ja) |
DE (3) | DE112007000930B4 (ja) |
GB (4) | GB0607542D0 (ja) |
WO (3) | WO2007122379A2 (ja) |
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