JP4273917B2 - 質量分析装置 - Google Patents
質量分析装置 Download PDFInfo
- Publication number
- JP4273917B2 JP4273917B2 JP2003349174A JP2003349174A JP4273917B2 JP 4273917 B2 JP4273917 B2 JP 4273917B2 JP 2003349174 A JP2003349174 A JP 2003349174A JP 2003349174 A JP2003349174 A JP 2003349174A JP 4273917 B2 JP4273917 B2 JP 4273917B2
- Authority
- JP
- Japan
- Prior art keywords
- ions
- flight
- time
- ion
- trajectory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0027—Methods for using particle spectrometers
- H01J49/0036—Step by step routines describing the handling of the data generated during a measurement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
- H01J49/408—Time-of-flight spectrometers with multiple changes of direction, e.g. by using electric or magnetic sectors, closed-loop time-of-flight
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- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Description
イオン源1は制御部5による制御の下に、分析対象であるイオンに運動エネルギーを付与する。これによって、イオンはイオン源1から引き出されて飛行を開始する(イオン出射)。データ処理部6は制御部5からイオン出射情報を受けると、時間の計測を開始する。イオン源1から出たイオンは飛行空間2に入り、ゲート電極21に到達する。イオン源1からゲート電極21までの飛行経路(入射軌道)の距離がLinである。ゲート電極21によりイオンは周回軌道Aに乗せられ(周回軌道突入)、案内電極22によって周回軌道A上を飛行する。この周回数は制御部5により制御される。イオンが周回軌道A上を飛行している期間中、上記時間計測は継続される。
2…飛行空間
21…ゲート電極
22…案内電極
3…イオン検出器
5…制御部
6…データ処理部
61…データメモリ
A…周回軌道
Claims (1)
- a)イオン源から出発した各種イオンを、飛行空間内に設定された所定の軌道に沿って複数回繰り返し飛行を行なった後、所定時間に達したならばイオンが該軌道を離れて検出手段へ向うよう制御する飛行制御手段と、
b)前記軌道を所定回数繰り返し飛行した後のイオンを検出する検出手段と、
c)前記軌道に沿って飛行しているイオンが、その繰り返し軌道を離れる時点又は離れると推測される時点である前記所定時間において、前記検出手段で検出されるイオン強度データの採取を開始するデータ処理手段と、を備えることを特徴とする質量分析装置。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003349174A JP4273917B2 (ja) | 2003-10-08 | 2003-10-08 | 質量分析装置 |
US10/957,642 US7038198B2 (en) | 2003-10-08 | 2004-10-05 | Mass spectrometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003349174A JP4273917B2 (ja) | 2003-10-08 | 2003-10-08 | 質量分析装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2005116340A JP2005116340A (ja) | 2005-04-28 |
JP2005116340A5 JP2005116340A5 (ja) | 2006-01-26 |
JP4273917B2 true JP4273917B2 (ja) | 2009-06-03 |
Family
ID=34419693
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003349174A Expired - Fee Related JP4273917B2 (ja) | 2003-10-08 | 2003-10-08 | 質量分析装置 |
Country Status (2)
Country | Link |
---|---|
US (1) | US7038198B2 (ja) |
JP (1) | JP4273917B2 (ja) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4182844B2 (ja) * | 2003-09-03 | 2008-11-19 | 株式会社島津製作所 | 質量分析装置 |
DE112007000931B4 (de) | 2006-04-13 | 2014-05-22 | Thermo Fisher Scientific (Bremen) Gmbh | Ionenenergiestreuungsreduzierung für ein Massenspektrometer |
GB0607542D0 (en) * | 2006-04-13 | 2006-05-24 | Thermo Finnigan Llc | Mass spectrometer |
GB0622689D0 (en) * | 2006-11-14 | 2006-12-27 | Thermo Electron Bremen Gmbh | Method of operating a multi-reflection ion trap |
US8093555B2 (en) * | 2007-11-21 | 2012-01-10 | Shimadzu Corporation | Mass spectrometer |
JP5476540B2 (ja) * | 2010-10-29 | 2014-04-23 | 株式会社アヤボ | Tof質量分析によるhipimsスパッタ源のプラズマ解析方法及びその装置 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6713758B2 (en) * | 1998-08-05 | 2004-03-30 | National Research Council Of Canada | Spherical side-to-side FAIMS |
US7034286B2 (en) * | 2002-02-08 | 2006-04-25 | Ionalytics Corporation | FAIMS apparatus having plural ion inlets and method therefore |
US6900431B2 (en) * | 2003-03-21 | 2005-05-31 | Predicant Biosciences, Inc. | Multiplexed orthogonal time-of-flight mass spectrometer |
-
2003
- 2003-10-08 JP JP2003349174A patent/JP4273917B2/ja not_active Expired - Fee Related
-
2004
- 2004-10-05 US US10/957,642 patent/US7038198B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US7038198B2 (en) | 2006-05-02 |
US20050077461A1 (en) | 2005-04-14 |
JP2005116340A (ja) | 2005-04-28 |
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