JP2011071174A5 - 半導体装置 - Google Patents

半導体装置 Download PDF

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Publication number
JP2011071174A5
JP2011071174A5 JP2009218824A JP2009218824A JP2011071174A5 JP 2011071174 A5 JP2011071174 A5 JP 2011071174A5 JP 2009218824 A JP2009218824 A JP 2009218824A JP 2009218824 A JP2009218824 A JP 2009218824A JP 2011071174 A5 JP2011071174 A5 JP 2011071174A5
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Japan
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semiconductor device
storage unit
value
characteristic
set value
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JP2009218824A
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JP2011071174A (ja
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Priority to JP2009218824A priority Critical patent/JP2011071174A/ja
Priority claimed from JP2009218824A external-priority patent/JP2011071174A/ja
Priority to US12/886,115 priority patent/US8717058B2/en
Priority to CN2010102956581A priority patent/CN102035529A/zh
Publication of JP2011071174A publication Critical patent/JP2011071174A/ja
Publication of JP2011071174A5 publication Critical patent/JP2011071174A5/ja
Pending legal-status Critical Current

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Claims (1)

  1. 半導体装置の初期特性値に基づき定められた設定値を記憶する設定値記憶部と、
    所定のタイミングにおける前記半導体装置の特性値と前記設定値記憶部に記憶された設定値とに基づき、前記半導体装置の特性劣化を検出する検出回路と、
    を備える半導体装置。
JP2009218824A 2009-09-24 2009-09-24 半導体装置、及び半導体装置の特性劣化検出方法 Pending JP2011071174A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2009218824A JP2011071174A (ja) 2009-09-24 2009-09-24 半導体装置、及び半導体装置の特性劣化検出方法
US12/886,115 US8717058B2 (en) 2009-09-24 2010-09-20 Semiconductor apparatus and method of detecting characteristic degradation of semiconductor apparatus
CN2010102956581A CN102035529A (zh) 2009-09-24 2010-09-21 半导体装置和检测半导体装置的特性退化的方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009218824A JP2011071174A (ja) 2009-09-24 2009-09-24 半導体装置、及び半導体装置の特性劣化検出方法

Publications (2)

Publication Number Publication Date
JP2011071174A JP2011071174A (ja) 2011-04-07
JP2011071174A5 true JP2011071174A5 (ja) 2012-04-05

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JP2009218824A Pending JP2011071174A (ja) 2009-09-24 2009-09-24 半導体装置、及び半導体装置の特性劣化検出方法

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US (1) US8717058B2 (ja)
JP (1) JP2011071174A (ja)
CN (1) CN102035529A (ja)

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