HK23192A - Integrated semiconductor memory - Google Patents

Integrated semiconductor memory

Info

Publication number
HK23192A
HK23192A HK231/92A HK23192A HK23192A HK 23192 A HK23192 A HK 23192A HK 231/92 A HK231/92 A HK 231/92A HK 23192 A HK23192 A HK 23192A HK 23192 A HK23192 A HK 23192A
Authority
HK
Hong Kong
Prior art keywords
data
memory
separators
response
output terminals
Prior art date
Application number
HK231/92A
Other languages
English (en)
Inventor
Kurt Dr Prof Hoffmann
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Publication of HK23192A publication Critical patent/HK23192A/xx

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/26—Accessing multiple arrays
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Non-Volatile Memory (AREA)
  • Semiconductor Memories (AREA)
HK231/92A 1984-12-28 1992-03-26 Integrated semiconductor memory HK23192A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE3447762 1984-12-28

Publications (1)

Publication Number Publication Date
HK23192A true HK23192A (en) 1992-04-03

Family

ID=6254082

Family Applications (1)

Application Number Title Priority Date Filing Date
HK231/92A HK23192A (en) 1984-12-28 1992-03-26 Integrated semiconductor memory

Country Status (6)

Country Link
US (1) US4742490A (fr)
EP (1) EP0186040B1 (fr)
JP (1) JP2598383B2 (fr)
AT (1) ATE51316T1 (fr)
DE (1) DE3576755D1 (fr)
HK (1) HK23192A (fr)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0186051B1 (fr) * 1984-12-28 1991-07-17 Siemens Aktiengesellschaft Mémoire intégrée à semi-conducteur
JPS62170094A (ja) * 1986-01-21 1987-07-27 Mitsubishi Electric Corp 半導体記憶回路
FR2607956A1 (fr) * 1986-12-05 1988-06-10 Eurotechnique Sa Procede de test des memoires integrees et memoires pour la mise en oeuvre du procede
JPS63244400A (ja) * 1987-03-16 1988-10-11 シーメンス・アクチエンゲゼルシヤフト メモリセルの検査回路装置および方法
JP2659095B2 (ja) * 1987-06-30 1997-09-30 富士通株式会社 ゲートアレイ及びメモリを有する半導体集積回路装置
DE58903906D1 (de) * 1988-02-10 1993-05-06 Siemens Ag Redundanzdekoder eines integrierten halbleiterspeichers.
DE58909354D1 (de) * 1989-05-31 1995-08-24 Siemens Ag Verfahren und Vorrichtung zum internen Paralleltest von Halbleiterspeichern.
KR100274478B1 (ko) * 1990-05-10 2001-01-15 칼 하인쯔 호르닝어 병렬 테스트 장치를 갖는 집적 반도체 메모리 및 그 리던던시 방법
JP3084759B2 (ja) * 1991-01-29 2000-09-04 日本電気株式会社 ダイナミックランダムアクセスメモリ装置
DE19607724A1 (de) * 1996-02-29 1997-09-04 Siemens Ag Schaltungsanordnung für einen programmierbaren nichtflüchtigen Speicher
DE10226585C1 (de) * 2002-06-14 2003-12-11 Infineon Technologies Ag RAM-Speicherschaltung
DE10232178B3 (de) 2002-07-16 2004-02-26 Infineon Technologies Ag Anordnung und Verfahren zum Überprüfen eines Adress-Generators

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51147924A (en) * 1975-06-13 1976-12-18 Fujitsu Ltd Memory unit
JPS573298A (en) * 1980-06-06 1982-01-08 Nec Corp Memory integrated circuit
US4495603A (en) * 1980-07-31 1985-01-22 Varshney Ramesh C Test system for segmented memory
DE3030852A1 (de) * 1980-08-14 1982-03-11 Siemens AG, 1000 Berlin und 8000 München Schaltungsanordnung fuer die pruefung von speicherzellen programmierbarer mos-integrierter halbleiterspeicher
JPS57179997A (en) * 1981-04-25 1982-11-05 Toshiba Corp Semiconductor memory
US4541090A (en) * 1981-06-09 1985-09-10 Matsushita Electric Industrial Co., Ltd. Semiconductor memory device
JPS57203298A (en) * 1981-06-09 1982-12-13 Matsushita Electric Ind Co Ltd Semiconductor storage device
JPS57208697A (en) * 1981-06-16 1982-12-21 Matsushita Electric Ind Co Ltd Semiconductor storage device
JPS59119597A (ja) * 1982-12-27 1984-07-10 Fujitsu Ltd 半導体記憶装置
DE3318564A1 (de) * 1983-05-20 1984-11-22 Siemens AG, 1000 Berlin und 8000 München Integrierte digitale mos-halbleiterschaltung
JPS60115099A (ja) * 1983-11-25 1985-06-21 Fujitsu Ltd 半導体記憶装置

Also Published As

Publication number Publication date
JP2598383B2 (ja) 1997-04-09
JPS61158099A (ja) 1986-07-17
EP0186040A1 (fr) 1986-07-02
US4742490A (en) 1988-05-03
ATE51316T1 (de) 1990-04-15
DE3576755D1 (de) 1990-04-26
EP0186040B1 (fr) 1990-03-21

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)