HK118497A - Built-in self test for analog to digital converters - Google Patents
Built-in self test for analog to digital convertersInfo
- Publication number
- HK118497A HK118497A HK118497A HK118497A HK118497A HK 118497 A HK118497 A HK 118497A HK 118497 A HK118497 A HK 118497A HK 118497 A HK118497 A HK 118497A HK 118497 A HK118497 A HK 118497A
- Authority
- HK
- Hong Kong
- Prior art keywords
- analog
- built
- digital converters
- self test
- self
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1071—Measuring or testing
- H03M1/108—Converters having special provisions for facilitating access for testing purposes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318502—Test of Combinational circuits
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Analogue/Digital Conversion (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US49407090A | 1990-03-15 | 1990-03-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
HK118497A true HK118497A (en) | 1997-09-05 |
Family
ID=23962905
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK118497A HK118497A (en) | 1990-03-15 | 1997-06-26 | Built-in self test for analog to digital converters |
Country Status (5)
Country | Link |
---|---|
US (1) | US5132685A (de) |
EP (1) | EP0447117B1 (de) |
JP (1) | JP2619988B2 (de) |
DE (1) | DE69124709T2 (de) |
HK (1) | HK118497A (de) |
Families Citing this family (58)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04212524A (ja) * | 1990-12-06 | 1992-08-04 | Matsushita Electric Ind Co Ltd | 半導体集積回路 |
US5231314A (en) * | 1992-03-02 | 1993-07-27 | National Semiconductor Corporation | Programmable timing circuit for integrated circuit device with test access port |
US5332996A (en) * | 1993-06-30 | 1994-07-26 | At&T Bell Laboratories | Method and apparatus for all code testing |
US5483237A (en) * | 1994-01-31 | 1996-01-09 | At&T Corp. | Method and apparatus for testing a CODEC |
KR960016155A (ko) * | 1994-10-22 | 1996-05-22 | 김광호 | 아날로그/디지탈 컨버터의 자기진단방법 및 장치 |
US5568143A (en) * | 1994-10-27 | 1996-10-22 | Lucid Technologies Inc | Analog to digital conversion system having automatically and dynamically variable resolution range |
TW280869B (en) * | 1995-07-17 | 1996-07-11 | Philips Electronics Nv | IDDQ-testing of bias generator circuit |
KR0157903B1 (ko) * | 1995-10-13 | 1999-03-20 | 문정환 | 아날로그/디지탈 변환기의 변환특성 테스트회로와 그 방법 |
US6225937B1 (en) | 1996-05-24 | 2001-05-01 | Lockheed-Martin Ir Imaging Systems, Inc. | Metastability resolved monolithic analog-to-digital converter |
US5659312A (en) * | 1996-06-14 | 1997-08-19 | Logicvision, Inc. | Method and apparatus for testing digital to analog and analog to digital converters |
TW364950B (en) * | 1996-06-17 | 1999-07-21 | Koninkl Philips Electronics Nv | Method of testing an analog-to-digital converter |
KR100489144B1 (ko) * | 1996-06-17 | 2005-09-30 | 코닌클리케 필립스 일렉트로닉스 엔.브이. | 아날로그-디지탈컨버터테스트방법및집적회로 |
TW356596B (en) * | 1996-10-16 | 1999-04-21 | Koninl Philips Electronics Nv | Testing control signals in A/D converters the invention relates to an integrated circuit containing an A/D converter and a test circuit |
US5923676A (en) * | 1996-12-20 | 1999-07-13 | Logic Vision, Inc. | Bist architecture for measurement of integrated circuit delays |
US6161202A (en) * | 1997-02-18 | 2000-12-12 | Ee-Signals Gmbh & Co. Kg | Method for the monitoring of integrated circuits |
JP4279356B2 (ja) * | 1997-05-15 | 2009-06-17 | エヌエックスピー ビー ヴィ | 掃引周波数装置試験 |
US5909186A (en) * | 1997-07-01 | 1999-06-01 | Vlsi Technology Gmbh | Methods and apparatus for testing analog-to-digital and digital-to-analog device using digital testers |
US5982681A (en) * | 1997-10-10 | 1999-11-09 | Lsi Logic Corporation | Reconfigurable built-in self test circuit |
US6633335B1 (en) * | 1998-02-28 | 2003-10-14 | Hyundai Electronics Industries Co., Ltd. | CMOS image sensor with testing circuit for verifying operation thereof |
JP2002531986A (ja) * | 1998-12-03 | 2002-09-24 | コンティネンタル・テーベス・アクチエンゲゼルシヤフト・ウント・コンパニー・オッフェネ・ハンデルスゲゼルシヤフト | 安全上重要な用途のためのa/dコンバータを備えた回路装置 |
US6229465B1 (en) | 1999-04-30 | 2001-05-08 | International Business Machines Corporation | Built in self test method and structure for analog to digital converter |
US6333706B1 (en) | 1999-08-02 | 2001-12-25 | International Business Machines Corporation | Built-in self-test for analog to digital converter |
US6885700B1 (en) | 1999-09-23 | 2005-04-26 | University Of Washington | Charge-based frequency measurement bist |
US6320528B1 (en) | 1999-10-15 | 2001-11-20 | Koninklijke Philips Electronics Nv | Built-in self test for integrated digital-to-analog converters |
US6232759B1 (en) * | 1999-10-21 | 2001-05-15 | Credence Systems Corporation | Linear ramping digital-to-analog converter for integrated circuit tester |
EP1102403A1 (de) * | 1999-11-19 | 2001-05-23 | ABB Power Automation AG | Funktionsüberwachung eines Wandlers |
US6931579B2 (en) | 2000-04-28 | 2005-08-16 | Mcgill University | Integrated excitation/extraction system for test and measurement |
US6323792B1 (en) * | 2000-08-28 | 2001-11-27 | National Instruments Corporation | Method for correcting analog-to-digital converter (ADC) errors, and apparatus embodying same |
JP2002181893A (ja) * | 2000-12-11 | 2002-06-26 | Mitsubishi Electric Corp | 半導体装置の検査方法および検査装置 |
US7065740B2 (en) * | 2001-08-24 | 2006-06-20 | Microsoft Corporation | System and method to automate the management of computer services and programmable devices |
JP2003338756A (ja) * | 2002-05-21 | 2003-11-28 | Mitsubishi Electric Corp | 試験方法および試験回路 |
US6703952B2 (en) * | 2002-06-10 | 2004-03-09 | Adc Dsl Systems, Inc. | Testing analog-to-digital and digital-to-analog converters |
TWI233495B (en) * | 2004-02-11 | 2005-06-01 | Ind Tech Res Inst | IC with built-in self-test function and design method thereof |
US6933868B1 (en) * | 2004-03-02 | 2005-08-23 | Texas Instruments Incorporated | Testing of mixed signal integrated circuits generating analog signals from digital data elements |
US7599299B2 (en) * | 2004-04-30 | 2009-10-06 | Xilinx, Inc. | Dynamic reconfiguration of a system monitor (DRPORT) |
US7102555B2 (en) * | 2004-04-30 | 2006-09-05 | Xilinx, Inc. | Boundary-scan circuit used for analog and digital testing of an integrated circuit |
TWI241071B (en) * | 2004-06-30 | 2005-10-01 | Univ Nat Cheng Kung | Test framework and test method of analog to digital converter |
US7081841B1 (en) * | 2005-04-28 | 2006-07-25 | Lsi Logic Corporation | Analog to digital converter built in self test |
TWI270254B (en) * | 2005-09-16 | 2007-01-01 | Univ Nat Chiao Tung | Reprogrammable switched-capacitor input circuit for receiving digital test stimulus signal in analog test |
KR100837270B1 (ko) * | 2006-06-07 | 2008-06-11 | 삼성전자주식회사 | 스마트 카드 및 그것의 데이터 보안 방법 |
US20080086781A1 (en) * | 2006-10-06 | 2008-04-10 | Stephane Rodgers | Method and system for glitch protection in a secure system |
US20090219032A1 (en) * | 2008-02-28 | 2009-09-03 | Qimonda Ag | System and method for determining circuit functionality under varying external operating conditions |
US7868796B2 (en) * | 2008-09-30 | 2011-01-11 | Freescale Semiconductor, Inc. | Self-calibrating data conversion circuitry and method therefor |
US7880650B2 (en) * | 2008-09-30 | 2011-02-01 | Freescale Semiconductor, Inc. | Method and apparatus for testing data converter |
US7876254B2 (en) * | 2008-09-30 | 2011-01-25 | Freescale Semiconductor, Inc. | Data conversion circuitry having successive approximation circuitry and method therefor |
US7733258B2 (en) * | 2008-09-30 | 2010-06-08 | Freescale Semiconductor, Inc. | Data conversion circuitry for converting analog signals to digital signals and vice-versa and method therefor |
US7868795B2 (en) * | 2008-09-30 | 2011-01-11 | Freescale Semiconductor, Inc. | Data conversion circuitry with an extra successive approximation step and method therefor |
US8106801B2 (en) | 2009-02-12 | 2012-01-31 | Qualcomm, Incorporated | Methods and apparatus for built in self test of analog-to-digital convertors |
WO2010128541A1 (ja) * | 2009-05-07 | 2010-11-11 | パナソニック株式会社 | 逐次比較型a/d変換装置 |
US8310385B2 (en) * | 2009-05-13 | 2012-11-13 | Qualcomm, Incorporated | Systems and methods for vector-based analog-to-digital converter sequential testing |
US8477052B2 (en) | 2011-04-05 | 2013-07-02 | Freescale Semiconductor, Inc. | Method and apparatus for self-test of successive approximation register (SAR) A/D converter |
FR2990313A1 (fr) * | 2012-05-07 | 2013-11-08 | St Microelectronics Grenoble 2 | Test de convertisseur analogique-numerique embarque |
US9935646B2 (en) | 2015-07-17 | 2018-04-03 | Schweitzer Engineering Laboratories, Inc. | Systems and methods for identifying a failure in an analog to digital converter |
US9698809B1 (en) * | 2016-07-19 | 2017-07-04 | Scweitzer Engineering Laboratories, Inc. | Systems and methods for analog to digital converter failure identification |
US9985646B1 (en) | 2017-10-18 | 2018-05-29 | Schweitzer Engineering Laboratories, Inc. | Analog-to-digital converter verification using quantization noise properties |
US10033400B1 (en) | 2017-10-18 | 2018-07-24 | Schweitzer Engineering Laboratories, Inc. | Analog-to-digital converter verification using quantization noise properties |
DE102017221657A1 (de) * | 2017-12-01 | 2019-06-06 | Continental Automotive Gmbh | Verfahren zum Durchführen eines Selbsttests einer elektrischen Wandlerschaltung sowie Wandlerschaltung und Fahrzeugleuchte |
US11335426B2 (en) * | 2020-10-16 | 2022-05-17 | Micron Technology, Inc. | Targeted test fail injection |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3603772A (en) * | 1969-09-09 | 1971-09-07 | Nasa | Analog-to-digital converter analyzing system |
US3816813A (en) * | 1972-01-24 | 1974-06-11 | Spacetac Inc | Automatic converter tester |
FR2394928A1 (fr) * | 1977-06-14 | 1979-01-12 | Mcb | Procede de controle de validite des informations fournies par les capteurs numeriques de deplacement et capteurs utilisant ce procede |
SE417149B (sv) * | 1979-03-30 | 1981-02-23 | Ericsson Telefon Ab L M | Overvakningssett och - anordning for signalamplitudomvandlare |
US4352160A (en) * | 1980-01-21 | 1982-09-28 | The United States Of America As Represented By The Secretary Of The Air Force | Statistical method of measuring the differential linearity of an analog/digital converter using a pseudo-random triangle wave stimulus |
US4354177A (en) * | 1980-11-07 | 1982-10-12 | Fairchild Camera & Instr. Corp. | Method and apparatus for calibrating an analog-to-digital converter for a digital-to-analog converter test system |
JPS57119259A (en) * | 1981-01-19 | 1982-07-24 | Hitachi Ltd | Testing method for a/d converter |
DE3218066A1 (de) * | 1981-07-08 | 1983-01-27 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zur pruefung von analog-digital-wandlern und/oder von digital-analog-wandlern oder von nachrichtentechnischen uebertragungsabschnitten, die solche wandler enthalten oder mit ihnen in reihe geschaltet sind, insbsondere zur pruefung von codecs fuer pcm-geraete, sowie vorrichtung zur durchfuehrung des verfahrens |
JPS60148227A (ja) * | 1984-01-12 | 1985-08-05 | Fujitsu Ltd | A/d変換器の試験方法 |
JPS61137429A (ja) * | 1984-12-07 | 1986-06-25 | Matsushita Electric Ind Co Ltd | Ad変換器試験回路 |
JPS6272226A (ja) * | 1985-09-26 | 1987-04-02 | Hitachi Ltd | A/d変換器試験方式 |
JPS62136129A (ja) * | 1985-12-10 | 1987-06-19 | Matsushita Electric Ind Co Ltd | A/dコンバ−タの試験方法 |
DD247334A1 (de) * | 1986-03-05 | 1987-07-01 | Mittweida Ing Hochschule | Schaltungsanordnung fuer die ermittlung von linearietaets- und monotoniefehlern bei ad-wandlern |
DD247384A1 (de) * | 1986-03-31 | 1987-07-08 | Leipzig Energiekombinat | Verfahren und vorrichtung zur abscheidung von staeuben |
US4872168A (en) * | 1986-10-02 | 1989-10-03 | American Telephone And Telegraph Company, At&T Bell Laboratories | Integrated circuit with memory self-test |
US4827259A (en) * | 1986-11-04 | 1989-05-02 | Electric Power Research Institute | Circuit for high-frequency sampling and compression of data for high-frequency electrical transient signals superimposed in a low frequency steady-state signal |
JPS6465926A (en) * | 1987-09-04 | 1989-03-13 | Nippon Electric Ic Microcomput | Measuring instrument for monotonically increasing characteristic of d/a converter |
US4947106A (en) * | 1988-03-31 | 1990-08-07 | Hewlett-Packard Company | Programmatically generated in-circuit test of analog to digital converters |
US4897650A (en) * | 1988-04-05 | 1990-01-30 | General Electric Company | Self-characterizing analog-to-digital converter |
US4908621A (en) * | 1988-07-06 | 1990-03-13 | Tektronix, Inc. | Autocalibrated multistage A/D converter |
JP2735076B2 (ja) * | 1988-11-28 | 1998-04-02 | 富士通株式会社 | アナログ/ディジタル変換器の試験方法 |
-
1991
- 1991-03-06 DE DE69124709T patent/DE69124709T2/de not_active Expired - Fee Related
- 1991-03-06 EP EP91301875A patent/EP0447117B1/de not_active Expired - Lifetime
- 1991-03-15 JP JP3050073A patent/JP2619988B2/ja not_active Expired - Lifetime
- 1991-08-09 US US07/744,662 patent/US5132685A/en not_active Expired - Lifetime
-
1997
- 1997-06-26 HK HK118497A patent/HK118497A/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
DE69124709T2 (de) | 1997-05-28 |
EP0447117B1 (de) | 1997-02-19 |
JPH05291952A (ja) | 1993-11-05 |
DE69124709D1 (de) | 1997-03-27 |
EP0447117A3 (en) | 1993-07-28 |
US5132685A (en) | 1992-07-21 |
JP2619988B2 (ja) | 1997-06-11 |
EP0447117A2 (de) | 1991-09-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PC | Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee) |