FR2616246B1 - Appareil automatique de controle de memoires pour traiter une information de defauts d'une memoire sous controle - Google Patents
Appareil automatique de controle de memoires pour traiter une information de defauts d'une memoire sous controleInfo
- Publication number
- FR2616246B1 FR2616246B1 FR8807491A FR8807491A FR2616246B1 FR 2616246 B1 FR2616246 B1 FR 2616246B1 FR 8807491 A FR8807491 A FR 8807491A FR 8807491 A FR8807491 A FR 8807491A FR 2616246 B1 FR2616246 B1 FR 2616246B1
- Authority
- FR
- France
- Prior art keywords
- memory
- under control
- defect information
- checking apparatus
- processing defect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31935—Storing data, e.g. failure memory
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0751—Error or fault detection not based on redundancy
- G06F11/0754—Error or fault detection not based on redundancy by exceeding limits
- G06F11/076—Error or fault detection not based on redundancy by exceeding limits by exceeding a count or rate limit, e.g. word- or bit count limit
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
- G06F11/277—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
- G06F11/32—Monitoring with visual or acoustical indication of the functioning of the machine
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/059,550 US4876685A (en) | 1987-06-08 | 1987-06-08 | Failure information processing in automatic memory tester |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2616246A1 FR2616246A1 (fr) | 1988-12-09 |
FR2616246B1 true FR2616246B1 (fr) | 1994-07-08 |
Family
ID=22023700
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR8807491A Expired - Fee Related FR2616246B1 (fr) | 1987-06-08 | 1988-06-06 | Appareil automatique de controle de memoires pour traiter une information de defauts d'une memoire sous controle |
Country Status (6)
Country | Link |
---|---|
US (1) | US4876685A (fr) |
JP (1) | JP2539889B2 (fr) |
CA (1) | CA1281775C (fr) |
DE (1) | DE3819425A1 (fr) |
FR (1) | FR2616246B1 (fr) |
GB (1) | GB2206715B (fr) |
Families Citing this family (59)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5138619A (en) * | 1990-02-15 | 1992-08-11 | National Semiconductor Corporation | Built-in self test for integrated circuit memory |
US5280486A (en) * | 1990-03-16 | 1994-01-18 | Teradyne, Inc. | High speed fail processor |
US5200960A (en) * | 1990-09-21 | 1993-04-06 | Xerox Corporation | Streaming tape diagnostic |
JPH04177700A (ja) * | 1990-11-13 | 1992-06-24 | Toshiba Corp | メモリ不良解析装置 |
US5321701A (en) * | 1990-12-06 | 1994-06-14 | Teradyne, Inc. | Method and apparatus for a minimal memory in-circuit digital tester |
JP2964644B2 (ja) * | 1990-12-10 | 1999-10-18 | 安藤電気株式会社 | 高速パターン発生器 |
AU660011B2 (en) * | 1991-04-26 | 1995-06-08 | Nec Corporation | Method and system for fault coverage testing memory |
US5588115A (en) * | 1993-01-29 | 1996-12-24 | Teradyne, Inc. | Redundancy analyzer for automatic memory tester |
JP2616413B2 (ja) * | 1993-11-22 | 1997-06-04 | 日本電気株式会社 | リペアデータの編集装置およびリペアデータの編集方法 |
US5475815A (en) * | 1994-04-11 | 1995-12-12 | Unisys Corporation | Built-in-self-test scheme for testing multiple memory elements |
US5612965A (en) * | 1994-04-26 | 1997-03-18 | Unisys Corporation | Multiple memory bit/chip failure detection |
US5701313A (en) * | 1995-02-24 | 1997-12-23 | Unisys Corporation | Method and apparatus for removing soft errors from a memory |
US5666371A (en) * | 1995-02-24 | 1997-09-09 | Unisys Corporation | Method and apparatus for detecting errors in a system that employs multi-bit wide memory elements |
US5511164A (en) * | 1995-03-01 | 1996-04-23 | Unisys Corporation | Method and apparatus for determining the source and nature of an error within a computer system |
US5784382A (en) * | 1995-03-01 | 1998-07-21 | Unisys Corporation | Method and apparatus for dynamically testing a memory within a computer system |
KR100243314B1 (ko) | 1995-04-07 | 2000-02-01 | 윤종용 | 임시 디펙트 리스트를 이용한 에러 로그 방법 |
US5795797A (en) * | 1995-08-18 | 1998-08-18 | Teradyne, Inc. | Method of making memory chips using memory tester providing fast repair |
US5720031A (en) * | 1995-12-04 | 1998-02-17 | Micron Technology, Inc. | Method and apparatus for testing memory devices and displaying results of such tests |
US6032275A (en) * | 1996-01-12 | 2000-02-29 | Advantest Corp. | Test pattern generator |
WO1997025719A1 (fr) * | 1996-01-12 | 1997-07-17 | Advantest Corporation | Generateur de motif de controle |
JP3545535B2 (ja) * | 1996-05-29 | 2004-07-21 | 株式会社アドバンテスト | 半導体メモリ試験方法および装置 |
US5754556A (en) * | 1996-07-18 | 1998-05-19 | Teradyne, Inc. | Semiconductor memory tester with hardware accelerators |
JPH1092194A (ja) * | 1996-09-17 | 1998-04-10 | Oki Electric Ind Co Ltd | メモリテスト回路 |
US6009536A (en) * | 1996-09-20 | 1999-12-28 | Micron Electronics, Inc. | Method for using fuse identification codes for masking bad bits on memory modules |
JP3267981B2 (ja) * | 1996-10-15 | 2002-03-25 | 株式会社アドバンテスト | メモリ試験装置及びこの試験装置をram試験モードとrom試験モードとに切り替える方法 |
US6360340B1 (en) * | 1996-11-19 | 2002-03-19 | Teradyne, Inc. | Memory tester with data compression |
US5923675A (en) * | 1997-02-20 | 1999-07-13 | Teradyne, Inc. | Semiconductor tester for testing devices with embedded memory |
US5991899A (en) * | 1997-03-21 | 1999-11-23 | Samsung Electronics Co., Ltd. | Method and apparatus for a real-time diagnostic tool using a non-intrusive trace technique |
JP3558252B2 (ja) * | 1997-11-10 | 2004-08-25 | 株式会社アドバンテスト | 半導体メモリ試験装置 |
US6314527B1 (en) | 1998-03-05 | 2001-11-06 | Micron Technology, Inc. | Recovery of useful areas of partially defective synchronous memory components |
US6332183B1 (en) | 1998-03-05 | 2001-12-18 | Micron Technology, Inc. | Method for recovery of useful areas of partially defective synchronous memory components |
US6381708B1 (en) | 1998-04-28 | 2002-04-30 | Micron Technology, Inc. | Method for decoding addresses for a defective memory array |
US6381707B1 (en) | 1998-04-28 | 2002-04-30 | Micron Technology, Inc. | System for decoding addresses for a defective memory array |
JP3880210B2 (ja) * | 1998-08-04 | 2007-02-14 | エルピーダメモリ株式会社 | 半導体装置 |
US6496876B1 (en) | 1998-12-21 | 2002-12-17 | Micron Technology, Inc. | System and method for storing a tag to identify a functional storage location in a memory device |
JP2000215688A (ja) * | 1999-01-25 | 2000-08-04 | Mitsubishi Electric Corp | 半導体試験装置及び半導体試験方法 |
US6442724B1 (en) | 1999-04-02 | 2002-08-27 | Teradyne, Inc. | Failure capture apparatus and method for automatic test equipment |
KR100400957B1 (ko) * | 1999-07-29 | 2003-10-10 | 마쯔시다덴기산교 가부시키가이샤 | 집적회로 내부신호 감시장치 |
US6536005B1 (en) | 1999-10-26 | 2003-03-18 | Teradyne, Inc. | High-speed failure capture apparatus and method for automatic test equipment |
US6181614B1 (en) | 1999-11-12 | 2001-01-30 | International Business Machines Corporation | Dynamic repair of redundant memory array |
US6578157B1 (en) | 2000-03-06 | 2003-06-10 | Micron Technology, Inc. | Method and apparatus for recovery of useful areas of partially defective direct rambus rimm components |
US7269765B1 (en) | 2000-04-13 | 2007-09-11 | Micron Technology, Inc. | Method and apparatus for storing failing part locations in a module |
JP2001312897A (ja) * | 2000-04-27 | 2001-11-09 | Nec Corp | メモリ試験装置及び試験方法 |
US6560729B1 (en) | 2000-07-03 | 2003-05-06 | Advanced Micro Devices, Inc. | Automated determination and display of the physical location of a failed cell in an array of memory cells |
US6643807B1 (en) | 2000-08-01 | 2003-11-04 | International Business Machines Corporation | Array-built-in-self-test (ABIST) for efficient, fast, bitmapping of large embedded arrays in manufacturing test |
JP2002131401A (ja) * | 2000-10-27 | 2002-05-09 | Ando Electric Co Ltd | データログ取得回路、及びデータログ取得方法 |
US6842866B2 (en) * | 2002-10-25 | 2005-01-11 | Xin Song | Method and system for analyzing bitmap test data |
JP4119789B2 (ja) * | 2003-05-23 | 2008-07-16 | 横河電機株式会社 | メモリ試験装置及びメモリ試験方法 |
US7009391B2 (en) * | 2003-10-15 | 2006-03-07 | Seagate Technology Llc | High throughput missing pattern detector for servo printed recording media |
US7444564B2 (en) * | 2003-11-19 | 2008-10-28 | International Business Machines Corporation | Automatic bit fail mapping for embedded memories with clock multipliers |
JP4491587B2 (ja) * | 2004-11-26 | 2010-06-30 | テクトロニクス・インターナショナル・セールス・ゲーエムベーハー | データ発生装置 |
JP2006331571A (ja) * | 2005-05-27 | 2006-12-07 | Matsushita Electric Ind Co Ltd | 半導体装置 |
JP2007172778A (ja) * | 2005-12-26 | 2007-07-05 | Nec Electronics Corp | メモリテスト回路及びメモリテスト方法 |
KR100736673B1 (ko) * | 2006-08-01 | 2007-07-06 | 주식회사 유니테스트 | 반도체 소자 테스트 장치 |
US7508724B2 (en) | 2006-11-30 | 2009-03-24 | Mosaid Technologies Incorporated | Circuit and method for testing multi-device systems |
WO2009062280A1 (fr) | 2007-11-15 | 2009-05-22 | Mosaid Technologies Incorporated | Procédés et systèmes pour le repérage d'une défaillance et la récupération de données dans une configuration de dispositifs semi-conducteurs raccordés en série |
DE102009010886B4 (de) | 2009-02-27 | 2013-06-20 | Advanced Micro Devices, Inc. | Erkennung der Verzögerungszeit in einem eingebauten Speicherselbsttest unter Anwendung eines Ping-Signals |
KR102615807B1 (ko) * | 2016-08-23 | 2023-12-20 | 에스케이하이닉스 주식회사 | 래치회로를 테스트할 수 있는 테스트방법을 제공하는 반도체장치 |
US10643734B2 (en) * | 2018-06-27 | 2020-05-05 | Micron Technology, Inc. | System and method for counting fail bit and reading out the same |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55103660A (en) * | 1979-01-31 | 1980-08-08 | Nec Corp | Data processing unit |
US4369511A (en) * | 1979-11-21 | 1983-01-18 | Nippon Telegraph & Telephone Public Corp. | Semiconductor memory test equipment |
US4736373A (en) * | 1981-08-03 | 1988-04-05 | Pacific Western Systems, Inc. | Memory tester having concurrent failure data readout and memory repair analysis |
US4451918A (en) * | 1981-10-09 | 1984-05-29 | Teradyne, Inc. | Test signal reloader |
US4450560A (en) * | 1981-10-09 | 1984-05-22 | Teradyne, Inc. | Tester for LSI devices and memory devices |
JPS6111999A (ja) * | 1984-06-27 | 1986-01-20 | Toshiba Corp | メモリ不良解析方法および解析装置 |
JPS626498A (ja) * | 1985-06-29 | 1987-01-13 | Toshiba Corp | メモリ評価装置 |
-
1987
- 1987-06-08 US US07/059,550 patent/US4876685A/en not_active Expired - Lifetime
-
1988
- 1988-06-06 FR FR8807491A patent/FR2616246B1/fr not_active Expired - Fee Related
- 1988-06-07 JP JP63140355A patent/JP2539889B2/ja not_active Expired - Lifetime
- 1988-06-07 CA CA000568771A patent/CA1281775C/fr not_active Expired
- 1988-06-07 DE DE3819425A patent/DE3819425A1/de active Granted
- 1988-06-08 GB GB8813528A patent/GB2206715B/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
GB2206715B (en) | 1991-10-02 |
GB8813528D0 (en) | 1988-07-13 |
DE3819425A1 (de) | 1988-12-22 |
GB2206715A (en) | 1989-01-11 |
JP2539889B2 (ja) | 1996-10-02 |
JPS6449200A (en) | 1989-02-23 |
US4876685A (en) | 1989-10-24 |
DE3819425C2 (fr) | 1990-06-13 |
CA1281775C (fr) | 1991-03-19 |
FR2616246A1 (fr) | 1988-12-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20070228 |