FR2549257B1 - Procede permettant de detecter une anomalie dans des unites d'entree et de sortie - Google Patents

Procede permettant de detecter une anomalie dans des unites d'entree et de sortie

Info

Publication number
FR2549257B1
FR2549257B1 FR8409753A FR8409753A FR2549257B1 FR 2549257 B1 FR2549257 B1 FR 2549257B1 FR 8409753 A FR8409753 A FR 8409753A FR 8409753 A FR8409753 A FR 8409753A FR 2549257 B1 FR2549257 B1 FR 2549257B1
Authority
FR
France
Prior art keywords
input
output units
detecting anomaly
anomaly
detecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR8409753A
Other languages
English (en)
Other versions
FR2549257A1 (fr
Inventor
Yutaka Otobe
Takeo Kiuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Honda Motor Co Ltd
Original Assignee
Honda Motor Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honda Motor Co Ltd filed Critical Honda Motor Co Ltd
Publication of FR2549257A1 publication Critical patent/FR2549257A1/fr
Application granted granted Critical
Publication of FR2549257B1 publication Critical patent/FR2549257B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D21/00—Measuring or testing not otherwise provided for
    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07C—TIME OR ATTENDANCE REGISTERS; REGISTERING OR INDICATING THE WORKING OF MACHINES; GENERATING RANDOM NUMBERS; VOTING OR LOTTERY APPARATUS; ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDED FOR ELSEWHERE
    • G07C5/00—Registering or indicating the working of vehicles
    • G07C5/08—Registering or indicating performance data other than driving, working, idle, or waiting time, with or without registering driving, working, idle or waiting time
    • G07C5/0808—Diagnosing performance data

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Combined Controls Of Internal Combustion Engines (AREA)
  • Electrical Control Of Air Or Fuel Supplied To Internal-Combustion Engine (AREA)
  • Debugging And Monitoring (AREA)
  • Testing And Monitoring For Control Systems (AREA)
FR8409753A 1983-06-21 1984-06-21 Procede permettant de detecter une anomalie dans des unites d'entree et de sortie Expired - Fee Related FR2549257B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58111665A JPS603732A (ja) 1983-06-21 1983-06-21 入出力装置の異常検出方法

Publications (2)

Publication Number Publication Date
FR2549257A1 FR2549257A1 (fr) 1985-01-18
FR2549257B1 true FR2549257B1 (fr) 1990-06-15

Family

ID=14567075

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8409753A Expired - Fee Related FR2549257B1 (fr) 1983-06-21 1984-06-21 Procede permettant de detecter une anomalie dans des unites d'entree et de sortie

Country Status (5)

Country Link
US (1) US4618954A (fr)
JP (1) JPS603732A (fr)
DE (1) DE3422868A1 (fr)
FR (1) FR2549257B1 (fr)
GB (1) GB2142152B (fr)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62649A (ja) * 1985-06-25 1987-01-06 Honda Motor Co Ltd 内燃エンジン用制御装置の出力タイミング異常検出方法
US4752886A (en) * 1985-07-22 1988-06-21 General Electric Company Method for on-line testing of load control circuitry and the associated load
JPS6277002A (ja) * 1985-09-30 1987-04-09 Mitsubishi Electric Corp 列車用計測センサ検査装置
US4837683A (en) * 1985-10-21 1989-06-06 The United States Of America As Represented By The Secretary Of The Air Force Hidden fault bit apparatus for a self-organizing digital processor system
US4833613A (en) * 1986-04-18 1989-05-23 Eaton Corporation Method for controlling AMT system including throttle position sensor signal fault detection and tolerance
JPS62256007A (ja) * 1986-04-30 1987-11-07 Mitsubishi Electric Corp 故障診断装置
JPS6388422A (ja) * 1986-10-02 1988-04-19 Mazda Motor Corp 車両の故障検出装置
DE3732718A1 (de) * 1987-09-29 1989-04-06 Vdo Schindling Verfahren zur ueberwachung von abschalteinrichtungen
US4876684A (en) * 1988-02-11 1989-10-24 John Fluke Mfg. Co., Inc. Method of and apparatus for diagnosing failures in read only memory systems and the like
JP2608593B2 (ja) * 1988-08-26 1997-05-07 ファナック株式会社 故障診断方法
JPH0267658A (ja) * 1988-09-01 1990-03-07 Fujitsu Ten Ltd 不揮発性メモリの故障診断方法
EP0369489A3 (fr) * 1988-11-18 1991-11-27 Omron Corporation Système de commande de capteurs
JP2810397B2 (ja) * 1989-02-16 1998-10-15 キヤノン株式会社 誤り訂正装置
US5063516A (en) * 1989-08-21 1991-11-05 Ford Motor Company Smart power driver system for a motor vehicle
US5068852A (en) * 1989-11-23 1991-11-26 John Fluke Mfg. Co., Inc. Hardware enhancements for improved performance of memory emulation method
GB2242716B (en) * 1990-03-28 1994-04-06 Nissan Motor Control apparatus with fail-safe faculty
JP3505760B2 (ja) * 1993-02-18 2004-03-15 株式会社デンソー 車両の自己診断装置
DE4429157A1 (de) * 1994-08-17 1996-02-22 Kromschroeder Ag G Verfahren zur Funktionsüberwachung eines Steuer- und Regelsystems
US5568388A (en) * 1995-02-27 1996-10-22 Kelsey-Hayes Company Method and system for automatically calibrating control logic of a vehicle control system
JP3889523B2 (ja) * 1999-05-11 2007-03-07 株式会社日立製作所 エンジンのフェイルセーフ装置
JP4008197B2 (ja) * 2000-01-14 2007-11-14 株式会社デンソー ダイアグノーシス機能を有する車両用制御装置及び記録媒体
US8997255B2 (en) 2006-07-31 2015-03-31 Inside Secure Verifying data integrity in a data storage device
US8352752B2 (en) * 2006-09-01 2013-01-08 Inside Secure Detecting radiation-based attacks
JP4442617B2 (ja) * 2007-02-16 2010-03-31 株式会社デンソー 電子制御装置
JP2008301393A (ja) * 2007-06-04 2008-12-11 Funai Electric Co Ltd 画像処理装置
JP5840173B2 (ja) * 2013-06-21 2016-01-06 京セラドキュメントソリューションズ株式会社 情報処理装置、入出力制御部の再起動方法
US10254737B2 (en) * 2013-12-12 2019-04-09 Panasonic Intellectual Property Management Co., Ltd. Motor driving apparatus
GB2529478B (en) * 2014-08-22 2020-11-04 Knorr Bremse Rail Systems Uk Ltd Self testing process for a railway brake system
CN106932009A (zh) * 2017-04-28 2017-07-07 国网江苏省电力公司电力科学研究院 一种工件自动检测流水线
CN108053515A (zh) * 2017-11-30 2018-05-18 北京新能源汽车股份有限公司 一种电动汽车的数据获取方法及装置

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3787670A (en) * 1971-12-20 1974-01-22 Honeywell Inf Systems Automatic diagnostic system
JPS5229898B2 (fr) * 1972-02-18 1977-08-04
JPS4917941A (fr) * 1972-06-07 1974-02-16
DE2357104C2 (de) * 1973-11-15 1979-11-15 Siemens Ag, 1000 Berlin Und 8000 Muenchen Schaltungsanordnung zur Überwachung der Sollstellung eines Stellgliedes
JPS5112733A (fr) * 1974-07-23 1976-01-31 Hitachi Ltd
JPS5834853B2 (ja) * 1976-02-25 1983-07-29 株式会社東芝 誤り検定回路
JPS54141926A (en) * 1978-04-26 1979-11-05 Toyota Motor Corp Method and device for compensating abnormal operation of temperature sensor
US4360915A (en) * 1979-02-07 1982-11-23 The Warner & Swasey Company Error detection means
US4360917A (en) * 1979-02-07 1982-11-23 The Warner & Swasey Company Parity fault locating means
US4371930A (en) * 1980-06-03 1983-02-01 Burroughs Corporation Apparatus for detecting, correcting and logging single bit memory read errors
US4429391A (en) * 1981-05-04 1984-01-31 Bell Telephone Laboratories, Incorporated Fault and error detection arrangement
US4541090A (en) * 1981-06-09 1985-09-10 Matsushita Electric Industrial Co., Ltd. Semiconductor memory device
JPS588334A (ja) * 1981-07-08 1983-01-18 Hitachi Ltd 入出力チヤネル装置
US4477901A (en) * 1981-11-23 1984-10-16 Xerox Corporation Directive diagnostics
DE3146566C2 (de) * 1981-11-24 1988-10-20 Bosch-Siemens Hausgeräte GmbH, 7000 Stuttgart Verfahren zum Überwachen der Funktionstüchtigkeit von an ein elektronisches Steuergerät angeschlossenen Arbeitsorganen und Meßwertgebern in einem Haushaltgerät
US4499581A (en) * 1982-09-21 1985-02-12 Xerox Corporation Self testing system for reproduction machine

Also Published As

Publication number Publication date
JPS603732A (ja) 1985-01-10
DE3422868A1 (de) 1985-01-10
GB8415671D0 (en) 1984-07-25
GB2142152A (en) 1985-01-09
DE3422868C2 (fr) 1990-08-02
GB2142152B (en) 1987-08-12
US4618954A (en) 1986-10-21
FR2549257A1 (fr) 1985-01-18

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Legal Events

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