DE68929104D1 - Integrierte Halbleiterschaltung - Google Patents

Integrierte Halbleiterschaltung

Info

Publication number
DE68929104D1
DE68929104D1 DE68929104T DE68929104T DE68929104D1 DE 68929104 D1 DE68929104 D1 DE 68929104D1 DE 68929104 T DE68929104 T DE 68929104T DE 68929104 T DE68929104 T DE 68929104T DE 68929104 D1 DE68929104 D1 DE 68929104D1
Authority
DE
Germany
Prior art keywords
semiconductor circuit
integrated semiconductor
integrated
circuit
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE68929104T
Other languages
English (en)
Other versions
DE68929104T2 (de
Inventor
Fumio Sandoh
Kazuo Tomizuka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP63202199A external-priority patent/JPH0628286B2/ja
Priority claimed from JP63235829A external-priority patent/JP2752098B2/ja
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Publication of DE68929104D1 publication Critical patent/DE68929104D1/de
Application granted granted Critical
Publication of DE68929104T2 publication Critical patent/DE68929104T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • H01L21/82Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/52Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
    • H01L23/528Geometry or layout of the interconnection structure
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/52Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
    • H01L23/528Geometry or layout of the interconnection structure
    • H01L23/5286Arrangements of power or ground buses
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/58Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
    • H01L23/585Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries comprising conductive layers or plates or strips or rods or rings
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/58Structural electrical arrangements for semiconductor devices not otherwise provided for
    • H01L2223/64Impedance arrangements
    • H01L2223/66High-frequency adaptations
    • H01L2223/6605High-frequency electrical connections
    • H01L2223/6616Vertical connections, e.g. vias
    • H01L2223/6622Coaxial feed-throughs in active or passive substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/3011Impedance

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Geometry (AREA)
  • Manufacturing & Machinery (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
DE68929104T 1988-08-12 1989-08-07 Integrierte Halbleiterschaltung Expired - Lifetime DE68929104T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP63202199A JPH0628286B2 (ja) 1988-08-12 1988-08-12 リニア半導体集積回路
JP63235829A JP2752098B2 (ja) 1988-09-20 1988-09-20 半導体集積回路

Publications (2)

Publication Number Publication Date
DE68929104D1 true DE68929104D1 (de) 2000-01-05
DE68929104T2 DE68929104T2 (de) 2000-07-13

Family

ID=26513234

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68929104T Expired - Lifetime DE68929104T2 (de) 1988-08-12 1989-08-07 Integrierte Halbleiterschaltung

Country Status (4)

Country Link
US (1) US5160997A (de)
EP (1) EP0354512B1 (de)
KR (1) KR920005863B1 (de)
DE (1) DE68929104T2 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3027990B2 (ja) * 1991-03-18 2000-04-04 富士通株式会社 半導体装置の製造方法
JPH05136125A (ja) * 1991-11-14 1993-06-01 Hitachi Ltd クロツク配線及びクロツク配線を有する半導体集積回路装置
IT1272933B (it) * 1994-01-28 1997-07-01 Fujitsu Ltd Dispositivo a circuito integrato di semiconduttore
JPH09232435A (ja) * 1996-02-22 1997-09-05 Oki Electric Ind Co Ltd 半導体集積回路
US5748547A (en) * 1996-05-24 1998-05-05 Shau; Jeng-Jye High performance semiconductor memory devices having multiple dimension bit lines
US5811882A (en) * 1996-09-24 1998-09-22 Philips Electronics North America Corporation On-chip shielding coaxial conductors for mixed-signal IC
JP3501620B2 (ja) * 1997-05-26 2004-03-02 株式会社 沖マイクロデザイン 半導体集積回路
US6584596B2 (en) 2001-09-24 2003-06-24 International Business Machines Corporation Method of designing a voltage partitioned solder-bump package
US6657285B1 (en) * 2002-07-08 2003-12-02 Alcor Micro, Corp. Semiconductor anti-interference band for integrated circuit
JP4141881B2 (ja) * 2003-04-04 2008-08-27 シャープ株式会社 集積回路
JP6338045B2 (ja) 2013-10-30 2018-06-06 セイコーエプソン株式会社 物理量検出装置用回路、物理量検出装置、電子機器及び移動体

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3769108A (en) * 1971-12-03 1973-10-30 Bell Telephone Labor Inc Manufacture of beam-crossovers for integrated circuits
US3769180A (en) * 1971-12-29 1973-10-30 O Gedde Process for electrolytically coloring previously anodized aluminum using alternating current
JPS57195480A (en) * 1981-05-26 1982-12-01 Hikozou Katayama Transparent dice
JPS5844743A (ja) * 1981-09-10 1983-03-15 Fujitsu Ltd 半導体集積回路
JPS5844742A (ja) * 1981-09-10 1983-03-15 Fujitsu Ltd 半導体集積回路装置
JPS5984542A (ja) * 1982-11-08 1984-05-16 Nec Corp 高周波半導体集積回路
JPS601843A (ja) * 1983-06-17 1985-01-08 Sanyo Electric Co Ltd 半導体集積回路
JPS6035537A (ja) * 1983-08-08 1985-02-23 Nec Corp 半導体集積回路
JPS6074455A (ja) * 1983-09-29 1985-04-26 Fujitsu Ltd マスタスライス集積回路
JPS60154644A (ja) * 1984-01-25 1985-08-14 Hitachi Ltd 半導体装置
JPS60165752A (ja) * 1984-02-08 1985-08-28 Nec Corp 半導体集積回路
JPS61119060A (ja) * 1984-11-14 1986-06-06 Toshiba Corp 半導体集積回路の信号伝送路
JPS6212147A (ja) * 1985-07-10 1987-01-21 Hitachi Ltd マスタ−スライス方式の半導体装置
JPS6344742A (ja) * 1986-08-12 1988-02-25 Fujitsu Ltd 半導体装置
US5050238A (en) * 1988-07-12 1991-09-17 Sanyo Electric Co., Ltd. Shielded front end receiver circuit with IF amplifier on an IC

Also Published As

Publication number Publication date
EP0354512B1 (de) 1999-12-01
EP0354512A2 (de) 1990-02-14
EP0354512A3 (de) 1991-08-14
KR900004000A (ko) 1990-03-27
KR920005863B1 (ko) 1992-07-23
DE68929104T2 (de) 2000-07-13
US5160997A (en) 1992-11-03

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition