DE69031671D1 - Integrierte Halbleiterschaltung - Google Patents

Integrierte Halbleiterschaltung

Info

Publication number: DE69031671D1
Authority: DE; Germany
Prior art keywords: semiconductor circuit; integrated semiconductor; integrated; circuit; semiconductor
Prior art date: 1989-07-11
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Fee Related

Application number

DE69031671T

Other languages

English (en)

Other versions

DE69031671T2 (de

Inventor

Tetsu Tashiro

Minoru Takeuchi

Yoshiyuki Ishimaru

Shinichi Hirose

Kazuo Hayashi

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Mitsubishi Electric Corp

Original Assignee

Mitsubishi Electric Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1989-07-11

Filing date

1990-07-11

Publication date

1997-12-11

1990-07-11 Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp

1997-12-11 Publication of DE69031671D1 publication Critical patent/DE69031671D1/de

1998-06-04 Application granted granted Critical

1998-06-04 Publication of DE69031671T2 publication Critical patent/DE69031671T2/de

2010-07-12 Anticipated expiration legal-status Critical

Status Expired - Fee Related legal-status Critical Current

Links

Classifications

- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate

Landscapes

Engineering & Computer Science (AREA)
General Engineering & Computer Science (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Computer Hardware Design (AREA)
Power Engineering (AREA)
Theoretical Computer Science (AREA)
Condensed Matter Physics & Semiconductors (AREA)
Microelectronics & Electronic Packaging (AREA)
Quality & Reliability (AREA)
Microcomputers (AREA)
Test And Diagnosis Of Digital Computers (AREA)
Semiconductor Integrated Circuits (AREA)
Dram (AREA)

DE69031671T 1989-07-11 1990-07-11 Integrierte Halbleiterschaltung Expired - Fee Related DE69031671T2 (de)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP1178417A JP2650124B2 (ja)	1989-07-11	1989-07-11	半導体集積回路

Publications (2)

Publication Number	Publication Date
DE69031671D1 true DE69031671D1 (de)	1997-12-11
DE69031671T2 DE69031671T2 (de)	1998-06-04

Family

ID=16048134

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
DE69031671T Expired - Fee Related DE69031671T2 (de)	1989-07-11	1990-07-11	Integrierte Halbleiterschaltung

Country Status (5)

Country	Link
US (1)	US5113093A (de)
EP (1)	EP0408353B1 (de)
JP (1)	JP2650124B2 (de)
KR (1)	KR940005203B1 (de)
DE (1)	DE69031671T2 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US5412260A (en) *	1991-05-03	1995-05-02	Lattice Semiconductor Corporation	Multiplexed control pins for in-system programming and boundary scan state machines in a high density programmable logic device
US5396639A (en) *	1991-09-16	1995-03-07	Rohm Co., Ltd.	One chip microcomputer having programmable I/O terminals programmed according to data stored in nonvolatile memory
DE69228980T2 (de) *	1991-12-06	1999-12-02	Nat Semiconductor Corp	Integriertes Datenverarbeitungssystem mit CPU-Kern und unabhängigem parallelen, digitalen Signalprozessormodul
JPH07110803A (ja) *	1993-10-13	1995-04-25	Nec Corp	シングルチップマイクロコンピュータ
US5608341A (en) *	1995-05-09	1997-03-04	Level One Communications, Inc.	Electrical circuit for setting internal chip functions without dedicated configuration pins
US5926504A (en) *	1995-06-05	1999-07-20	Level One Communications, Inc.	Electrical circuit for selectively connecting a repeater to a DTE port
SE505556C2 (sv) *	1995-12-21	1997-09-15	Ericsson Telefon Ab L M	Förfarande för inställning av en integrerad krets i ett förutbestämt av minst två skilda driftlägen samt integrerad krets
JP3484296B2 (ja) *	1996-06-28	2004-01-06	ブラザー工業株式会社	半導体集積回路
JP2885213B2 (ja) *	1997-01-23	1999-04-19	日本電気株式会社	半導体集積回路
US6603331B1 (en) *	2001-12-18	2003-08-05	Xilinx, Inc.	Low-voltage non-degenerative transmitter circuit
US7557604B2 (en) *	2005-05-03	2009-07-07	Oki Semiconductor Co., Ltd.	Input circuit for mode setting
JP2007171060A (ja) *	2005-12-23	2007-07-05	Toshiba Corp	動作モード設定回路、動作モード設定回路を有するｌｓｉ、及び動作モード設定方法
KR100656455B1 (ko) *	2005-12-27	2006-12-11	주식회사 하이닉스반도체	반도체 메모리의 액티브 싸이클 제어장치 및 방법

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4350906A (en) *	1978-06-23	1982-09-21	Rca Corporation	Circuit with dual-purpose terminal
JPS57174756A (en) *	1981-04-21	1982-10-27	Toshiba Corp	Controlling system for mode setting
JPS58115547A (ja) *	1981-12-29	1983-07-09	Fujitsu Ltd	マイクロプロセツサの動作モ−ド設定方式
JPS6031641A (ja) *	1983-08-02	1985-02-18	Nippon Denso Co Ltd	ワンチツプマイクロコンピユ−タ
JPS61292755A (ja) *	1985-06-20	1986-12-23	Fujitsu Ltd	半導体集積回路
JPH0760859B2 (ja) *	1985-11-19	1995-06-28	沖電気工業株式会社	半導体装置及びその製造方法
JPS62118557A (ja) *	1985-11-19	1987-05-29	Ricoh Co Ltd	半導体集積回路装置のモ−ド切換え回路
JPH0682405B2 (ja) *	1986-01-14	1994-10-19	カシオ計算機株式会社	テストプログラム起動方式
JPS63298173A (ja) *	1987-05-29	1988-12-05	Matsushita Electric Ind Co Ltd	集積回路
US4816665A (en) *	1987-08-06	1989-03-28	Maxtor Corporation	Sensor array for focus detection
JPH081760B2 (ja) *	1987-11-17	1996-01-10	三菱電機株式会社	半導体記憶装置
JPH0697560B2 (ja) *	1987-11-19	1994-11-30	三菱電機株式会社	半導体記憶装置
EP0317939B1 (de) *	1987-11-25	1994-03-09	Nec Corporation	Eingangsschaltung, die in eine Halbleiteranlage eingegliedert ist
KR910003593B1 (ko) *	1987-12-30	1991-06-07	삼성전자 주식회사	고집적도 메모리용 모드 선택회로
US4987325A (en) *	1988-07-13	1991-01-22	Samsung Electronics Co., Ltd.	Mode selecting circuit for semiconductor memory device
JP2569777B2 (ja) *	1988-12-16	1997-01-08	日本電気株式会社	入力信号切り換え回路
US4940909A (en) *	1989-05-12	1990-07-10	Plus Logic, Inc.	Configuration control circuit for programmable logic devices

1989
- 1989-07-11 JP JP1178417A patent/JP2650124B2/ja not_active Expired - Fee Related
1990
- 1990-06-21 KR KR1019900009110A patent/KR940005203B1/ko not_active IP Right Cessation
- 1990-07-10 US US07/550,604 patent/US5113093A/en not_active Expired - Lifetime
- 1990-07-11 DE DE69031671T patent/DE69031671T2/de not_active Expired - Fee Related
- 1990-07-11 EP EP90307612A patent/EP0408353B1/de not_active Expired - Lifetime

Also Published As

Publication number	Publication date
JP2650124B2 (ja)	1997-09-03
EP0408353A3 (en)	1992-01-02
KR910003798A (ko)	1991-02-28
EP0408353A2 (de)	1991-01-16
US5113093A (en)	1992-05-12
JPH0342732A (ja)	1991-02-22
DE69031671T2 (de)	1998-06-04
EP0408353B1 (de)	1997-11-05
KR940005203B1 (ko)	1994-06-13

Legal Events

Date	Code	Title	Description
1998-12-03	8364	No opposition during term of opposition
2009-06-04	8339	Ceased/non-payment of the annual fee

Publication	Publication Date	Title
DE69026164T2 (de)	1996-10-31	Halbleitende integrierte Schaltung
KR900012345A (ko)	1990-08-03	집적 회로 칩
KR890015413A (ko)	1989-10-30	반도체 집적회로
DE69124735T2 (de)	1997-07-03	Integrierte Halbleiterschaltung
DE3855797D1 (de)	1997-03-27	Integrierte Halbleiterschaltung
DE69130819T2 (de)	1999-06-17	Integrierte Halbleiterschaltung
DE69023565D1 (de)	1995-12-21	Integrierte Halbleiterschaltung.
DE69013267D1 (de)	1994-11-17	Integrierte Halbleiterschaltungsanordnung.
DE69012194D1 (de)	1994-10-13	Integrierter Halbleiterschaltkreis.
DE69126848T2 (de)	1997-11-20	Integrierte Halbleiterschaltung
KR900012359A (ko)	1990-08-03	집적회로 칩
DE69011038D1 (de)	1994-09-01	Integrierte Halbleiterschaltung.
DE69031671T2 (de)	1998-06-04	Integrierte Halbleiterschaltung
DE68929104T2 (de)	2000-07-13	Integrierte Halbleiterschaltung
DE69026226T2 (de)	1996-10-10	Integrierte Halbleiterschaltung
KR900011093A (ko)	1990-07-11	집적 회로형 반도체 소자
DE69129445D1 (de)	1998-06-25	Integrierte halbleiterschaltungsanordnung
DE69031944T2 (de)	1998-05-28	Integrierte halbleiterschaltung
DE69131898D1 (de)	2000-02-17	Integrierte Halbleiterschaltung
DE68929148T2 (de)	2000-09-21	Integrierte Halbleiterschaltung
DE69012848D1 (de)	1994-11-03	Integrierte Halbleiterschaltungsanordnungen.
DE69027828D1 (de)	1996-08-22	Integrierte Halbleiter-Schaltungs-Vorrichtungen
DE69124273D1 (de)	1997-03-06	Integrierte Halbleiterschaltung
KR900010775A (ko)	1990-07-09	반도체 집적회로
DE68928096D1 (de)	1997-07-10	Integrierter Halbleiterschaltkreis