DE60111348D1 - Verfahren zum Auslesen eines nichtflüchtigen Halbleiterspeichers und nichtflüchtiger Halbleiterspeicher - Google Patents
Verfahren zum Auslesen eines nichtflüchtigen Halbleiterspeichers und nichtflüchtiger HalbleiterspeicherInfo
- Publication number
- DE60111348D1 DE60111348D1 DE60111348T DE60111348T DE60111348D1 DE 60111348 D1 DE60111348 D1 DE 60111348D1 DE 60111348 T DE60111348 T DE 60111348T DE 60111348 T DE60111348 T DE 60111348T DE 60111348 D1 DE60111348 D1 DE 60111348D1
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor memory
- nonvolatile semiconductor
- reading out
- nonvolatile
- memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/26—Sensing or reading circuits; Data output circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/26—Sensing or reading circuits; Data output circuits
- G11C16/28—Sensing or reading circuits; Data output circuits using differential sensing or reference cells, e.g. dummy cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
- G11C11/5642—Sensing or reading circuits; Data output circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5671—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge trapping in an insulator
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5692—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency read-only digital stores using storage elements with more than two stable states
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0466—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells with charge storage in an insulating layer, e.g. metal-nitride-oxide-silicon [MNOS], silicon-oxide-nitride-oxide-silicon [SONOS]
- G11C16/0475—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells with charge storage in an insulating layer, e.g. metal-nitride-oxide-silicon [MNOS], silicon-oxide-nitride-oxide-silicon [SONOS] comprising two or more independent storage sites which store independent data
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/08—Address circuits; Decoders; Word-line control circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2211/00—Indexing scheme relating to digital stores characterized by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C2211/56—Indexing scheme relating to G11C11/56 and sub-groups for features not covered by these groups
- G11C2211/563—Multilevel memory reading aspects
- G11C2211/5634—Reference cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/14—Word line organisation; Word line lay-out
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Read Only Memory (AREA)
- Non-Volatile Memory (AREA)
- Semiconductor Memories (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001050124 | 2001-02-26 | ||
JP2001050124A JP4467815B2 (ja) | 2001-02-26 | 2001-02-26 | 不揮発性半導体メモリの読み出し動作方法および不揮発性半導体メモリ |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60111348D1 true DE60111348D1 (de) | 2005-07-14 |
DE60111348T2 DE60111348T2 (de) | 2005-11-10 |
Family
ID=18911137
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60111348T Expired - Lifetime DE60111348T2 (de) | 2001-02-26 | 2001-12-31 | Verfahren zum Auslesen eines nichtflüchtigen Halbleiterspeichers und nichtflüchtiger Halbleiterspeicher |
Country Status (6)
Country | Link |
---|---|
US (1) | US6650568B2 (de) |
EP (1) | EP1235229B1 (de) |
JP (1) | JP4467815B2 (de) |
KR (1) | KR100688998B1 (de) |
DE (1) | DE60111348T2 (de) |
TW (1) | TW519753B (de) |
Families Citing this family (34)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4156248B2 (ja) * | 2002-02-18 | 2008-09-24 | 株式会社ルネサステクノロジ | 不揮発性半導体記憶装置 |
US6917544B2 (en) | 2002-07-10 | 2005-07-12 | Saifun Semiconductors Ltd. | Multiple use memory chip |
US6992932B2 (en) | 2002-10-29 | 2006-01-31 | Saifun Semiconductors Ltd | Method circuit and system for read error detection in a non-volatile memory array |
US6963505B2 (en) | 2002-10-29 | 2005-11-08 | Aifun Semiconductors Ltd. | Method circuit and system for determining a reference voltage |
US7136304B2 (en) | 2002-10-29 | 2006-11-14 | Saifun Semiconductor Ltd | Method, system and circuit for programming a non-volatile memory array |
US7178004B2 (en) | 2003-01-31 | 2007-02-13 | Yan Polansky | Memory array programming circuit and a method for using the circuit |
US7142464B2 (en) | 2003-04-29 | 2006-11-28 | Saifun Semiconductors Ltd. | Apparatus and methods for multi-level sensing in a memory array |
WO2005094178A2 (en) | 2004-04-01 | 2005-10-13 | Saifun Semiconductors Ltd. | Method, circuit and systems for erasing one or more non-volatile memory cells |
US7755938B2 (en) * | 2004-04-19 | 2010-07-13 | Saifun Semiconductors Ltd. | Method for reading a memory array with neighbor effect cancellation |
US7638850B2 (en) | 2004-10-14 | 2009-12-29 | Saifun Semiconductors Ltd. | Non-volatile memory structure and method of fabrication |
JP4410188B2 (ja) | 2004-11-12 | 2010-02-03 | 株式会社東芝 | 半導体記憶装置のデータ書き込み方法 |
US7257025B2 (en) * | 2004-12-09 | 2007-08-14 | Saifun Semiconductors Ltd | Method for reading non-volatile memory cells |
US8053812B2 (en) | 2005-03-17 | 2011-11-08 | Spansion Israel Ltd | Contact in planar NROM technology |
US7209406B2 (en) * | 2005-05-19 | 2007-04-24 | Macronix International Co., Ltd. | Memory device with rapid word line switch |
US8400841B2 (en) | 2005-06-15 | 2013-03-19 | Spansion Israel Ltd. | Device to program adjacent storage cells of different NROM cells |
US7804126B2 (en) | 2005-07-18 | 2010-09-28 | Saifun Semiconductors Ltd. | Dense non-volatile memory array and method of fabrication |
US7668017B2 (en) | 2005-08-17 | 2010-02-23 | Saifun Semiconductors Ltd. | Method of erasing non-volatile memory cells |
JP2007087441A (ja) * | 2005-09-20 | 2007-04-05 | Matsushita Electric Ind Co Ltd | 不揮発性半導体記憶装置 |
US7345917B2 (en) * | 2005-12-05 | 2008-03-18 | Macronix International Co., Ltd. | Non-volatile memory package and method of reading stored data from a non-volatile memory array |
US7808818B2 (en) | 2006-01-12 | 2010-10-05 | Saifun Semiconductors Ltd. | Secondary injection for NROM |
US7692961B2 (en) | 2006-02-21 | 2010-04-06 | Saifun Semiconductors Ltd. | Method, circuit and device for disturb-control of programming nonvolatile memory cells by hot-hole injection (HHI) and by channel hot-electron (CHE) injection |
US8253452B2 (en) | 2006-02-21 | 2012-08-28 | Spansion Israel Ltd | Circuit and method for powering up an integrated circuit and an integrated circuit utilizing same |
US7760554B2 (en) | 2006-02-21 | 2010-07-20 | Saifun Semiconductors Ltd. | NROM non-volatile memory and mode of operation |
US7701779B2 (en) | 2006-04-27 | 2010-04-20 | Sajfun Semiconductors Ltd. | Method for programming a reference cell |
US7471568B2 (en) * | 2006-06-21 | 2008-12-30 | Macronix International Co., Ltd. | Multi-level cell memory structures with enlarged second bit operation window |
US20070297244A1 (en) * | 2006-06-21 | 2007-12-27 | Macronix International Co., Ltd. | Top Dielectric Structures in Memory Devices and Methods for Expanding a Second Bit Operation Window |
KR101371522B1 (ko) * | 2007-02-27 | 2014-03-12 | 삼성전자주식회사 | 비휘발성 메모리 장치 및 그것의 구동 방법 |
US7675783B2 (en) * | 2007-02-27 | 2010-03-09 | Samsung Electronics Co., Ltd. | Nonvolatile memory device and driving method thereof |
US7843730B2 (en) | 2008-01-16 | 2010-11-30 | Freescale Semiconductor, Inc. | Non-volatile memory with reduced charge fluence |
KR101378602B1 (ko) * | 2008-05-13 | 2014-03-25 | 삼성전자주식회사 | 메모리 장치 및 메모리 프로그래밍 방법 |
KR101518199B1 (ko) | 2008-05-23 | 2015-05-06 | 삼성전자주식회사 | 오류 정정 장치, 그 방법 및 상기 장치를 포함하는 메모리장치 |
JP5368266B2 (ja) * | 2009-11-11 | 2013-12-18 | ローム株式会社 | 半導体不揮発記憶回路 |
JP2012069192A (ja) * | 2010-09-22 | 2012-04-05 | Toshiba Corp | メモリシステム |
CN103366790A (zh) * | 2012-03-30 | 2013-10-23 | 硅存储技术公司 | 用于读出放大器的可调整参考发生器 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0136119B1 (de) * | 1983-09-16 | 1988-06-29 | Fujitsu Limited | Festwertspeicherschaltung mit Multi-Bitzellen |
JPS6342099A (ja) * | 1986-08-06 | 1988-02-23 | Fujitsu Ltd | 3値レベルrom |
JP2904498B2 (ja) * | 1989-03-06 | 1999-06-14 | 株式会社東芝 | 不揮発性半導体メモリ装置およびその製造方法 |
JPH06137726A (ja) * | 1991-05-31 | 1994-05-20 | Suzuki Motor Corp | 自動車用空調装置の高低圧スイッチと溶栓の取付配置 |
JP3112182B2 (ja) * | 1991-08-20 | 2000-11-27 | 日本テキサス・インスツルメンツ株式会社 | 多値リードオンリーメモリ装置 |
JP3179943B2 (ja) * | 1993-07-12 | 2001-06-25 | 株式会社東芝 | 半導体記憶装置 |
US5526306A (en) * | 1994-02-10 | 1996-06-11 | Mega Chips Corporation | Semiconductor memory device and method of fabricating the same |
US5796149A (en) * | 1994-09-09 | 1998-08-18 | Nippon Steel Corporation | Semiconductor memory using different concentration impurity diffused layers |
JP2980012B2 (ja) * | 1995-10-16 | 1999-11-22 | 日本電気株式会社 | 不揮発性半導体記憶装置 |
US5736771A (en) * | 1996-02-07 | 1998-04-07 | United Microelectronics Corporation | Mask ROM cell structure with multi-level data selection by code |
JPH1011979A (ja) * | 1996-06-19 | 1998-01-16 | Sony Corp | 半導体不揮発性記憶装置 |
US5768192A (en) * | 1996-07-23 | 1998-06-16 | Saifun Semiconductors, Ltd. | Non-volatile semiconductor memory cell utilizing asymmetrical charge trapping |
US6137726A (en) * | 1997-11-25 | 2000-10-24 | Samsung Electronics Co., Ltd. | Multi-level memory devices having memory cell referenced word line voltage generations |
US6980938B2 (en) * | 2002-01-10 | 2005-12-27 | Cutler Technology Corporation | Method for removal of PID dynamics from MPC models |
WO2005030963A1 (en) * | 2003-09-26 | 2005-04-07 | Applied Research Systems Ars Holding N.V. | Leader sequences for use in production of proteins |
JP5796149B1 (ja) * | 2014-03-25 | 2015-10-21 | 三島光産株式会社 | 連続鋳造用鋳型 |
-
2001
- 2001-02-26 JP JP2001050124A patent/JP4467815B2/ja not_active Expired - Fee Related
- 2001-12-26 TW TW090132385A patent/TW519753B/zh not_active IP Right Cessation
- 2001-12-31 EP EP01310956A patent/EP1235229B1/de not_active Expired - Lifetime
- 2001-12-31 DE DE60111348T patent/DE60111348T2/de not_active Expired - Lifetime
-
2002
- 2002-01-08 US US10/038,828 patent/US6650568B2/en not_active Expired - Lifetime
- 2002-01-15 KR KR1020020002198A patent/KR100688998B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
EP1235229A2 (de) | 2002-08-28 |
EP1235229A3 (de) | 2002-10-02 |
KR20030009056A (ko) | 2003-01-29 |
US20020118570A1 (en) | 2002-08-29 |
TW519753B (en) | 2003-02-01 |
DE60111348T2 (de) | 2005-11-10 |
EP1235229B1 (de) | 2005-06-08 |
US6650568B2 (en) | 2003-11-18 |
JP2002251893A (ja) | 2002-09-06 |
JP4467815B2 (ja) | 2010-05-26 |
KR100688998B1 (ko) | 2007-03-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: FUJITSU MICROELECTRONICS LTD., TOKYO, JP |
|
8327 | Change in the person/name/address of the patent owner |
Owner name: FUJITSU SEMICONDUCTOR LTD., YOKOHAMA, KANAGAWA, JP |
|
8328 | Change in the person/name/address of the agent |
Representative=s name: SEEGER SEEGER LINDNER PARTNERSCHAFT PATENTANWAELTE |