DE3583629D1 - Integrierte schaltung mit einer schmelzsicherungsschaltung. - Google Patents
Integrierte schaltung mit einer schmelzsicherungsschaltung.Info
- Publication number
- DE3583629D1 DE3583629D1 DE8585400383T DE3583629T DE3583629D1 DE 3583629 D1 DE3583629 D1 DE 3583629D1 DE 8585400383 T DE8585400383 T DE 8585400383T DE 3583629 T DE3583629 T DE 3583629T DE 3583629 D1 DE3583629 D1 DE 3583629D1
- Authority
- DE
- Germany
- Prior art keywords
- circuit
- melt
- fuse
- integrated circuit
- integrated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
- G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
- G11C17/16—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM using electrically-fusible links
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
- Control Of Voltage And Current In General (AREA)
- Analogue/Digital Conversion (AREA)
- Logic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59037927A JPS60182219A (ja) | 1984-02-29 | 1984-02-29 | 半導体装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3583629D1 true DE3583629D1 (de) | 1991-09-05 |
Family
ID=12511183
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8585400383T Expired - Fee Related DE3583629D1 (de) | 1984-02-29 | 1985-02-28 | Integrierte schaltung mit einer schmelzsicherungsschaltung. |
Country Status (5)
Country | Link |
---|---|
US (1) | US4730129A (de) |
EP (1) | EP0161947B1 (de) |
JP (1) | JPS60182219A (de) |
KR (1) | KR900003938B1 (de) |
DE (1) | DE3583629D1 (de) |
Families Citing this family (42)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2228091B (en) * | 1989-02-08 | 1992-09-23 | Westinghouse Brake & Signal | Current monitoring |
DE58908287D1 (de) * | 1989-06-30 | 1994-10-06 | Siemens Ag | Integrierte Schaltungsanordnung. |
FR2660795B1 (fr) * | 1990-04-10 | 1994-01-07 | Sgs Thomson Microelectronics Sa | Circuit de detection de fusible. |
US5151611A (en) * | 1990-12-10 | 1992-09-29 | Westinghouse Electric Corp. | Programmable device for integrated circuits |
JPH05315448A (ja) * | 1992-04-27 | 1993-11-26 | Nec Corp | 集積回路装置およびそのレイアウト方法 |
US5418487A (en) * | 1992-09-04 | 1995-05-23 | Benchmarg Microelectronics, Inc. | Fuse state sense circuit |
FR2697673B1 (fr) * | 1992-10-29 | 1994-12-16 | Gemplus Card Int | Circuit à fusible, pour circuit intégré. |
US5361185A (en) * | 1993-02-19 | 1994-11-01 | Advanced Micro Devices, Inc. | Distributed VCC/VSS ESD clamp structure |
US5345110A (en) * | 1993-04-13 | 1994-09-06 | Micron Semiconductor, Inc. | Low-power fuse detect and latch circuit |
JP2707954B2 (ja) * | 1993-09-01 | 1998-02-04 | 日本電気株式会社 | コード設定回路 |
US5635854A (en) * | 1994-05-24 | 1997-06-03 | Philips Electronics North America Corporation | Programmable logic integrated circuit including verify circuitry for classifying fuse link states as validly closed, validly open or invalid |
US6100747A (en) * | 1994-05-30 | 2000-08-08 | Stmicroelectronics, S.R.L. | Device for selecting design options in an integrated circuit |
US5514980A (en) * | 1995-05-31 | 1996-05-07 | Integrated Device Technology, Inc. | High resolution circuit and method for sensing antifuses |
US5789970A (en) * | 1995-09-29 | 1998-08-04 | Intel Corporation | Static, low current, low voltage sensing circuit for sensing the state of a fuse device |
US5731733A (en) * | 1995-09-29 | 1998-03-24 | Intel Corporation | Static, low current sensing circuit for sensing the state of a fuse device |
US5959445A (en) * | 1995-09-29 | 1999-09-28 | Intel Corporation | Static, high-sensitivity, fuse-based storage cell |
US5748025A (en) * | 1996-03-29 | 1998-05-05 | Intel Corporation | Method and apparatus for providing high voltage with a low voltage CMOS integrated circuit |
US6096610A (en) * | 1996-03-29 | 2000-08-01 | Intel Corporation | Transistor suitable for high voltage circuit |
US5896041A (en) * | 1996-05-28 | 1999-04-20 | Micron Technology, Inc. | Method and apparatus for programming anti-fuses using internally generated programming voltage |
US5841723A (en) * | 1996-05-28 | 1998-11-24 | Micron Technology, Inc. | Method and apparatus for programming anti-fuses using an isolated well programming circuit |
DE69712302T2 (de) | 1996-12-31 | 2002-10-24 | St Microelectronics Inc | Struktur und Bauelement zur Auswahl von Entwurfsmöglichkeiten in einem integrierten Schaltkreis |
KR100247937B1 (ko) * | 1997-11-12 | 2000-03-15 | 윤종용 | 퓨징 장치 |
KR100287541B1 (ko) | 1998-05-29 | 2001-04-16 | 윤종용 | 반도체 메모리 장치의 리던던시 디코더 인에이블회로 |
US6191641B1 (en) * | 1999-02-23 | 2001-02-20 | Clear Logic, Inc. | Zero power fuse circuit using subthreshold conduction |
JP2000340656A (ja) * | 1999-05-28 | 2000-12-08 | Fujitsu Ltd | トリミング回路 |
KR100317490B1 (ko) * | 1999-12-29 | 2001-12-24 | 박종섭 | 안티퓨즈 회로 |
JP2002203901A (ja) * | 2000-12-27 | 2002-07-19 | Toshiba Microelectronics Corp | フューズ回路 |
US6417720B1 (en) * | 2000-12-28 | 2002-07-09 | Intel Corporation | High voltage sense circuit for programming of programmable devices |
JP2002217416A (ja) * | 2001-01-16 | 2002-08-02 | Hitachi Ltd | 半導体装置 |
DE10156830B4 (de) | 2001-11-20 | 2005-05-12 | Infineon Technologies Ag | Integrierte Schaltung mit einem programmierbaren Element und Verfahren zu ihrem Betrieb |
KR100427721B1 (ko) * | 2002-07-18 | 2004-04-28 | 주식회사 하이닉스반도체 | 전기적 퓨즈 프로그래밍 제어회로 |
JP4137888B2 (ja) | 2003-05-13 | 2008-08-20 | 富士通株式会社 | 半導体集積回路装置 |
US7315193B2 (en) * | 2005-08-24 | 2008-01-01 | International Business Machines Corporation | Circuitry and method for programming an electrically programmable fuse |
DE102006017480B4 (de) * | 2006-04-13 | 2008-11-27 | Austriamicrosystems Ag | Schaltungsanordnung mit einer nicht-flüchtigen Speicherzelle und Verfahren |
US7888771B1 (en) | 2007-05-02 | 2011-02-15 | Xilinx, Inc. | E-fuse with scalable filament link |
JP5160164B2 (ja) * | 2007-08-06 | 2013-03-13 | ルネサスエレクトロニクス株式会社 | ヒューズ回路 |
US8564023B2 (en) * | 2008-03-06 | 2013-10-22 | Xilinx, Inc. | Integrated circuit with MOSFET fuse element |
US7923811B1 (en) | 2008-03-06 | 2011-04-12 | Xilinx, Inc. | Electronic fuse cell with enhanced thermal gradient |
CN104751895B (zh) * | 2013-12-31 | 2018-08-10 | 中芯国际集成电路制造(上海)有限公司 | 存储器、电熔丝存储阵列的检测电路及方法 |
CN107464585B (zh) * | 2016-06-06 | 2020-02-28 | 华邦电子股份有限公司 | 电子式熔丝装置以及电子式熔丝阵列 |
US10360988B2 (en) | 2016-11-02 | 2019-07-23 | Skyworks Solutions, Inc. | Apparatus and methods for protection against inadvertent programming of fuse cells |
US10255982B2 (en) * | 2016-11-02 | 2019-04-09 | Skyworks Solutions, Inc. | Accidental fuse programming protection circuits |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2614781B2 (de) * | 1976-04-06 | 1979-04-05 | Robert Bosch Gmbh, 7000 Stuttgart | Integrierte Schaltungsanordnung |
US4329685A (en) * | 1980-06-09 | 1982-05-11 | Burroughs Corporation | Controlled selective disconnect system for wafer scale integrated circuits |
US4446534A (en) * | 1980-12-08 | 1984-05-01 | National Semiconductor Corporation | Programmable fuse circuit |
US4532607A (en) * | 1981-07-22 | 1985-07-30 | Tokyo Shibaura Denki Kabushiki Kaisha | Programmable circuit including a latch to store a fuse's state |
JPS6043300A (ja) * | 1983-08-17 | 1985-03-07 | Toshiba Corp | 感知増幅回路 |
-
1984
- 1984-02-29 JP JP59037927A patent/JPS60182219A/ja active Granted
-
1985
- 1985-02-19 KR KR1019850001095A patent/KR900003938B1/ko not_active IP Right Cessation
- 1985-02-21 US US06/703,987 patent/US4730129A/en not_active Expired - Lifetime
- 1985-02-28 DE DE8585400383T patent/DE3583629D1/de not_active Expired - Fee Related
- 1985-02-28 EP EP85400383A patent/EP0161947B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US4730129A (en) | 1988-03-08 |
JPS60182219A (ja) | 1985-09-17 |
EP0161947A3 (en) | 1987-10-21 |
KR900003938B1 (ko) | 1990-06-04 |
JPH0428175B2 (de) | 1992-05-13 |
EP0161947A2 (de) | 1985-11-21 |
EP0161947B1 (de) | 1991-07-31 |
KR850006651A (ko) | 1985-10-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |