DE102017127098B8 - Gerät und Verfahren zum Annehmen eines Anormalitätsauftretens für Teleskopabdeckung - Google Patents

Gerät und Verfahren zum Annehmen eines Anormalitätsauftretens für Teleskopabdeckung Download PDF

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Publication number
DE102017127098B8
DE102017127098B8 DE102017127098.1A DE102017127098A DE102017127098B8 DE 102017127098 B8 DE102017127098 B8 DE 102017127098B8 DE 102017127098 A DE102017127098 A DE 102017127098A DE 102017127098 B8 DE102017127098 B8 DE 102017127098B8
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Prior art keywords
telescope
coverage
assuming
abnormality occurrence
abnormality
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DE102017127098.1A
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DE102017127098B4 (de
DE102017127098A1 (de
Inventor
Noboru Kurokami
Naoki Sato
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Fanuc Corp
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Fanuc Corp
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Priority claimed from JP2017174459A external-priority patent/JP6499737B2/ja
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Publication of DE102017127098B8 publication Critical patent/DE102017127098B8/de
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/14—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object using acoustic emission techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/10—Geometric CAD
    • G06F30/17—Mechanical parametric or variational design
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q11/00—Accessories fitted to machine tools for keeping tools or parts of the machine in good working condition or for cooling work; Safety devices specially combined with or arranged in, or specially adapted for use in connection with, machine tools
    • B23Q11/08—Protective coverings for parts of machine tools; Splash guards
    • B23Q11/0816—Foldable coverings, e.g. bellows
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/20—Investigating the presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4409—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
    • G01N29/4418—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with a model, e.g. best-fit, regression analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4472—Mathematical theories or simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4481—Neural networks
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/20—Design optimisation, verification or simulation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods
    • G06N3/084—Backpropagation, e.g. using gradient descent
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2119/00—Details relating to the type or aim of the analysis or the optimisation
    • G06F2119/04—Ageing analysis or optimisation against ageing

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Signal Processing (AREA)
  • Theoretical Computer Science (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • Acoustics & Sound (AREA)
  • Pure & Applied Mathematics (AREA)
  • Artificial Intelligence (AREA)
  • Mathematical Analysis (AREA)
  • Mathematical Optimization (AREA)
  • Mathematical Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Algebra (AREA)
  • Computer Hardware Design (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Data Mining & Analysis (AREA)
  • Computational Mathematics (AREA)
  • Biomedical Technology (AREA)
  • Biophysics (AREA)
  • Computational Linguistics (AREA)
  • Mechanical Engineering (AREA)
  • Molecular Biology (AREA)
  • Computing Systems (AREA)
  • Software Systems (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Numerical Control (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
DE102017127098.1A 2016-11-24 2017-11-17 Gerät und Verfahren zum Annehmen eines Anormalitätsauftretens für Teleskopabdeckung Active DE102017127098B8 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2016227720 2016-11-24
JP2016-227720 2016-11-24
JP2017-174459 2017-09-12
JP2017174459A JP6499737B2 (ja) 2016-11-24 2017-09-12 テレスコピックカバーの異常発生推定装置及び異常発生推定方法

Publications (3)

Publication Number Publication Date
DE102017127098A1 DE102017127098A1 (de) 2018-05-24
DE102017127098B4 DE102017127098B4 (de) 2023-03-16
DE102017127098B8 true DE102017127098B8 (de) 2023-05-04

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DE102017127098.1A Active DE102017127098B8 (de) 2016-11-24 2017-11-17 Gerät und Verfahren zum Annehmen eines Anormalitätsauftretens für Teleskopabdeckung

Country Status (3)

Country Link
US (1) US10761063B2 (de)
CN (1) CN108108516B (de)
DE (1) DE102017127098B8 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10732606B2 (en) * 2016-05-13 2020-08-04 Ricoh Company, Ltd. Information processing apparatus, information processing method, and information processing system
JP6445088B2 (ja) * 2017-05-24 2018-12-26 ファナック株式会社 テレスコピックカバー
JP6698724B2 (ja) 2018-03-06 2020-05-27 ファナック株式会社 衝突位置推定装置及び機械学習装置
JP2020057165A (ja) * 2018-10-01 2020-04-09 株式会社椿本チエイン 異常判定装置、信号特徴量予測器、異常判定方法、学習モデルの生成方法及び学習モデル
JP7148421B2 (ja) * 2019-01-22 2022-10-05 ファナック株式会社 工作機械の予防保全システム
CN110405537B (zh) * 2019-07-17 2022-02-08 湘潭大学 一种基于深度学习的导轨精度预测模型的建立方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010006220A1 (de) 2009-07-21 2011-02-10 Nabell Corporation, Iga-shi Teleskopische Abdeckung

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000052183A (ja) 1998-08-11 2000-02-22 Okuma Corp カバー装置の損傷防止装置
JP3905405B2 (ja) 2002-03-22 2007-04-18 株式会社ジェイテクト 切粉堆積検知方法および装置
US20030205892A1 (en) 2002-05-01 2003-11-06 Andrews Craig D. Protective assembly for a trailer
CN100584415C (zh) 2004-09-15 2010-01-27 雅马哈发动机株式会社 车辆控制装置和车辆
JP4501918B2 (ja) 2006-09-29 2010-07-14 パナソニック電工株式会社 工具の取付異常検出装置
JP4321581B2 (ja) * 2006-11-30 2009-08-26 パナソニック電工株式会社 工作機械総合監視装置
JP5301310B2 (ja) * 2009-02-17 2013-09-25 株式会社日立製作所 異常検知方法及び異常検知システム
AT511177B1 (de) 2011-03-10 2015-12-15 Fronius Int Gmbh Verfahren und vorrichtung zur überwachung eines lichtbogenprozesses
US8781982B1 (en) * 2011-09-23 2014-07-15 Lockheed Martin Corporation System and method for estimating remaining useful life
JP6299527B2 (ja) 2014-08-29 2018-03-28 ブラザー工業株式会社 数値制御装置と制御方法
JP2016068183A (ja) 2014-09-29 2016-05-09 株式会社ナベル 工作機械用遮蔽装置
JP6778547B2 (ja) 2016-08-15 2020-11-04 オークマ株式会社 テレスコカバー装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010006220A1 (de) 2009-07-21 2011-02-10 Nabell Corporation, Iga-shi Teleskopische Abdeckung

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Übersetzung Beschreibung JP 2008- 87 094 A

Also Published As

Publication number Publication date
US20180143162A1 (en) 2018-05-24
DE102017127098B4 (de) 2023-03-16
CN108108516B (zh) 2020-06-26
US10761063B2 (en) 2020-09-01
CN108108516A (zh) 2018-06-01
DE102017127098A1 (de) 2018-05-24

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