CN1527484B - 集成电路存储器装置及控制延迟锁定环电路的方法 - Google Patents

集成电路存储器装置及控制延迟锁定环电路的方法 Download PDF

Info

Publication number
CN1527484B
CN1527484B CN 200410033080 CN200410033080A CN1527484B CN 1527484 B CN1527484 B CN 1527484B CN 200410033080 CN200410033080 CN 200410033080 CN 200410033080 A CN200410033080 A CN 200410033080A CN 1527484 B CN1527484 B CN 1527484B
Authority
CN
China
Prior art keywords
signal
delay
locked loop
control
described device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CN 200410033080
Other languages
English (en)
Chinese (zh)
Other versions
CN1527484A (zh
Inventor
林钟亨
成熹庆
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR10-2003-0013429A external-priority patent/KR100493054B1/ko
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of CN1527484A publication Critical patent/CN1527484A/zh
Application granted granted Critical
Publication of CN1527484B publication Critical patent/CN1527484B/zh
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 
    • G11C7/222Clock generating, synchronizing or distributing circuits within memory device
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/406Management or control of the refreshing or charge-regeneration cycles
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/4074Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/4076Timing circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2211/00Indexing scheme relating to digital stores characterized by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C2211/401Indexing scheme relating to cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C2211/406Refreshing of dynamic cells
    • G11C2211/4067Refresh in standby or low power modes

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
CN 200410033080 2003-03-04 2004-03-04 集成电路存储器装置及控制延迟锁定环电路的方法 Expired - Lifetime CN1527484B (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
KR13429/2003 2003-03-04
KR13429/03 2003-03-04
KR10-2003-0013429A KR100493054B1 (ko) 2003-03-04 2003-03-04 지연동기 루프를 구비하는 반도체 장치 및 지연동기 루프제어방법
US10/646,718 US6937534B2 (en) 2003-03-04 2003-08-25 Integrated circuit memory device including delay locked loop circuit and delay locked loop control circuit and method of controlling delay locked loop circuit
US10/646,718 2003-08-25

Publications (2)

Publication Number Publication Date
CN1527484A CN1527484A (zh) 2004-09-08
CN1527484B true CN1527484B (zh) 2010-05-05

Family

ID=32911522

Family Applications (1)

Application Number Title Priority Date Filing Date
CN 200410033080 Expired - Lifetime CN1527484B (zh) 2003-03-04 2004-03-04 集成电路存储器装置及控制延迟锁定环电路的方法

Country Status (3)

Country Link
JP (1) JP4276112B2 (de)
CN (1) CN1527484B (de)
DE (1) DE102004011732B4 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011061457A (ja) 2009-09-09 2011-03-24 Elpida Memory Inc クロック生成回路及びこれを備える半導体装置並びにデータ処理システム
JP5695895B2 (ja) 2010-12-16 2015-04-08 ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. 半導体装置
JP2013030247A (ja) * 2011-07-28 2013-02-07 Elpida Memory Inc 情報処理システム

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6342801B1 (en) * 1999-06-29 2002-01-29 Hyundai Electronics Industries Co., Ltd. Duty cycle correction circuit of delay locked loop
US6501328B1 (en) * 2001-08-14 2002-12-31 Sun Microsystems, Inc. Method for reducing peak to peak jitter in a dual-loop delay locked loop

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100543934B1 (ko) * 2000-05-31 2006-01-23 주식회사 하이닉스반도체 반도체 메모리 장치에서 어드레스 및 데이터 억세스타임을 고속으로 하는 제어 및 어드레스 장치
EP1435145A4 (de) * 2001-10-09 2010-06-02 Interdigital Tech Corp Durch wegverlust unterstützte leistungsregelung in geschlossener schleife

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6342801B1 (en) * 1999-06-29 2002-01-29 Hyundai Electronics Industries Co., Ltd. Duty cycle correction circuit of delay locked loop
US6501328B1 (en) * 2001-08-14 2002-12-31 Sun Microsystems, Inc. Method for reducing peak to peak jitter in a dual-loop delay locked loop

Also Published As

Publication number Publication date
JP4276112B2 (ja) 2009-06-10
JP2004273106A (ja) 2004-09-30
DE102004011732A1 (de) 2004-09-23
CN1527484A (zh) 2004-09-08
DE102004011732B4 (de) 2010-04-01

Similar Documents

Publication Publication Date Title
KR100422572B1 (ko) 레지스터 제어 지연고정루프 및 그를 구비한 반도체 소자
US8149641B2 (en) Active cycle control circuit for semiconductor memory apparatus
US7606101B2 (en) Circuit and method for controlling a clock synchronizing circuit for low power refresh operation
US7340632B2 (en) Domain crossing device
US20060245277A1 (en) Semiconductor memory device
US20070069777A1 (en) DLL driver control circuit
US8116161B2 (en) System and method for refreshing a DRAM device
US20020039323A1 (en) Semiconductor device
KR100702766B1 (ko) 안정적인 dll용 내부 전압을 생성하는 내부 전압발생기와 이를 포함하는 내부 클록 발생기 및 그 내부 전압발생 방법
US9520169B2 (en) Semiconductor device
US20060120195A1 (en) Voltage generation control circuit in semiconductor memory device , circuit using the same and method threreof
US6771108B2 (en) Input circuit and semiconductor integrated circuit having the input circuit
US8923082B2 (en) Semiconductor device on which wafer-level burn-in test is performed and manufacturing method thereof
US6292420B1 (en) Method and device for automatically performing refresh operation in semiconductor memory device
US7283421B2 (en) Semiconductor memory device
KR100333708B1 (ko) 전력 소모를 감소시킨 지연고정루프
US6937534B2 (en) Integrated circuit memory device including delay locked loop circuit and delay locked loop control circuit and method of controlling delay locked loop circuit
US6954094B2 (en) Semiconductor memory device having partially controlled delay locked loop
US8750067B2 (en) Semiconductor device having reset function
CN1941172B (zh) 延迟锁定回路电路和延迟锁定回路驱动控制电路
CN1527484B (zh) 集成电路存储器装置及控制延迟锁定环电路的方法
US20080008283A1 (en) Circuit for controlling data output
KR100701705B1 (ko) 반도체 메모리 장치의 셀프 리프레쉬 제어 회로
KR100571741B1 (ko) 반도체 기억 장치

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CX01 Expiry of patent term

Granted publication date: 20100505

CX01 Expiry of patent term