CN107192913B - 基板检查装置及基板检查方法 - Google Patents

基板检查装置及基板检查方法 Download PDF

Info

Publication number
CN107192913B
CN107192913B CN201710144128.9A CN201710144128A CN107192913B CN 107192913 B CN107192913 B CN 107192913B CN 201710144128 A CN201710144128 A CN 201710144128A CN 107192913 B CN107192913 B CN 107192913B
Authority
CN
China
Prior art keywords
measured value
case
current
measurement
value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201710144128.9A
Other languages
English (en)
Chinese (zh)
Other versions
CN107192913A (zh
Inventor
笹岑敬一郎
斋藤智一
土田宪吾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanjou Precision Science & Technology Co Ltd
Original Assignee
Sanjou Precision Science & Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanjou Precision Science & Technology Co Ltd filed Critical Sanjou Precision Science & Technology Co Ltd
Publication of CN107192913A publication Critical patent/CN107192913A/zh
Application granted granted Critical
Publication of CN107192913B publication Critical patent/CN107192913B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/16—Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
    • G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
CN201710144128.9A 2016-03-14 2017-03-10 基板检查装置及基板检查方法 Active CN107192913B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016-050233 2016-03-14
JP2016050233A JP6633949B2 (ja) 2016-03-14 2016-03-14 基板検査装置及び基板検査方法

Publications (2)

Publication Number Publication Date
CN107192913A CN107192913A (zh) 2017-09-22
CN107192913B true CN107192913B (zh) 2019-11-12

Family

ID=59871588

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201710144128.9A Active CN107192913B (zh) 2016-03-14 2017-03-10 基板检查装置及基板检查方法

Country Status (4)

Country Link
JP (1) JP6633949B2 (ja)
KR (1) KR101961536B1 (ja)
CN (1) CN107192913B (ja)
TW (1) TWI621863B (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6965110B2 (ja) * 2017-11-09 2021-11-10 日置電機株式会社 検査装置および検査方法
JP7517680B2 (ja) * 2020-04-15 2024-07-17 ヤマハファインテック株式会社 検査装置、及び検査方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2723382B2 (ja) * 1983-06-13 1998-03-09 ヒューレット・パッカード・カンパニー 回路試験装置
EP0919820A2 (en) * 1997-10-30 1999-06-02 Nidec-Read Corporation Circuit board testing apparatus and method
JP2004101275A (ja) * 2002-09-06 2004-04-02 Nidec-Read Corp 基板検査装置及び基板検査方法
CN103257285A (zh) * 2012-02-21 2013-08-21 日本电产理德株式会社 基板内置电子部件的端子判别方法和端子判别装置
JP2013257259A (ja) * 2012-06-14 2013-12-26 Hioki Ee Corp 抵抗測定装置および回路基板検査装置
CN104950182A (zh) * 2014-03-26 2015-09-30 日本电产理德股份有限公司 电阻测定装置、基板检查装置、检查方法以及维护方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002086520A1 (fr) * 2001-04-19 2002-10-31 Oht Inc. Appareil d'inspection et procede d'inspection
JP2003098213A (ja) * 2001-09-20 2003-04-03 Oht Inc 検査装置並びに検査方法
JP4919787B2 (ja) * 2006-12-15 2012-04-18 日置電機株式会社 測定装置
JP5555633B2 (ja) * 2007-10-10 2014-07-23 カスケード・マイクロテク・ゲゼルシャフト・ミト・ベシュレンクテル・ハフツング 所定の温度条件下で試験基板を検査する方法及び温度条件を設定可能な検査装置
CN101799516A (zh) * 2010-02-24 2010-08-11 海洋王照明科技股份有限公司 一种电路板检测装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2723382B2 (ja) * 1983-06-13 1998-03-09 ヒューレット・パッカード・カンパニー 回路試験装置
EP0919820A2 (en) * 1997-10-30 1999-06-02 Nidec-Read Corporation Circuit board testing apparatus and method
JP2004101275A (ja) * 2002-09-06 2004-04-02 Nidec-Read Corp 基板検査装置及び基板検査方法
CN103257285A (zh) * 2012-02-21 2013-08-21 日本电产理德株式会社 基板内置电子部件的端子判别方法和端子判别装置
JP2013257259A (ja) * 2012-06-14 2013-12-26 Hioki Ee Corp 抵抗測定装置および回路基板検査装置
CN104950182A (zh) * 2014-03-26 2015-09-30 日本电产理德股份有限公司 电阻测定装置、基板检查装置、检查方法以及维护方法

Also Published As

Publication number Publication date
KR101961536B1 (ko) 2019-03-22
JP6633949B2 (ja) 2020-01-22
TW201732309A (zh) 2017-09-16
KR20170106917A (ko) 2017-09-22
JP2017166875A (ja) 2017-09-21
TWI621863B (zh) 2018-04-21
CN107192913A (zh) 2017-09-22

Similar Documents

Publication Publication Date Title
KR100796171B1 (ko) 접촉식 싱글사이드 프로브와 이를 이용한 도선의 단선 및단락 검사장치 및 그 방법
TW201142681A (en) Capacitance type touch panel inspection system and inspection method
US9606162B2 (en) Insulation inspection method and insulation inspection apparatus
KR102216324B1 (ko) 접촉자의 유지 보수 방법 및 검사 장치
KR101206893B1 (ko) 전력 회로 차단기 장치의 제 1 전력 회로 차단기의 제 1 출력 핀과 외부 노드 사이 및 상기 전력 회로 차단기 장치의 제 2 전력 회로 차단기의 제 2 출력 핀과 노드 사이의 전기 콘택들을 검사하기 위한 방법 및 회로
CN107192913B (zh) 基板检查装置及基板检查方法
US20150067378A1 (en) Measuring apparatus, measuring method, and measuring system
TW200825430A (en) Board testing apparatus and board testing method
TWI512308B (zh) 檢測裝置及檢測方法
US20140152335A1 (en) Continuous broken sense lead detection system
JP4987862B2 (ja) フィンガーテスターを用いて、コンポーネント化されていない大型印刷回路基板を検査する方法
JP6421463B2 (ja) 基板検査装置、及び基板検査方法
JP2002014134A (ja) 回路基板検査装置
US5432460A (en) Apparatus and method for opens and shorts testing of a circuit board
JP6219073B2 (ja) 絶縁検査装置
KR20140146535A (ko) 기판검사장치
KR101430040B1 (ko) 절연검사장치 및 절연검사방법
EP3037828A1 (en) Fault detection for a flexible probe tip
JP5944121B2 (ja) 回路基板検査装置および回路基板検査方法
JP5485012B2 (ja) 回路基板検査装置および回路基板検査方法
CN108169664A (zh) 电路板故障检测方法和装置、计算机设备和存储介质
JP2000232141A (ja) 半導体パッケージ用基板の導通検査方法
KR20140092242A (ko) 검사 지그의 검사 방법
KR101474620B1 (ko) 기판 검사 장치 및 기판 검사 방법
JP2006071567A (ja) プローブの接触状態判別方法、回路基板検査方法および回路基板検査装置

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant