CN107192913B - 基板检查装置及基板检查方法 - Google Patents
基板检查装置及基板检查方法 Download PDFInfo
- Publication number
- CN107192913B CN107192913B CN201710144128.9A CN201710144128A CN107192913B CN 107192913 B CN107192913 B CN 107192913B CN 201710144128 A CN201710144128 A CN 201710144128A CN 107192913 B CN107192913 B CN 107192913B
- Authority
- CN
- China
- Prior art keywords
- measured value
- case
- current
- measurement
- value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/16—Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016-050233 | 2016-03-14 | ||
JP2016050233A JP6633949B2 (ja) | 2016-03-14 | 2016-03-14 | 基板検査装置及び基板検査方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN107192913A CN107192913A (zh) | 2017-09-22 |
CN107192913B true CN107192913B (zh) | 2019-11-12 |
Family
ID=59871588
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201710144128.9A Active CN107192913B (zh) | 2016-03-14 | 2017-03-10 | 基板检查装置及基板检查方法 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP6633949B2 (ja) |
KR (1) | KR101961536B1 (ja) |
CN (1) | CN107192913B (ja) |
TW (1) | TWI621863B (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6965110B2 (ja) * | 2017-11-09 | 2021-11-10 | 日置電機株式会社 | 検査装置および検査方法 |
JP7517680B2 (ja) * | 2020-04-15 | 2024-07-17 | ヤマハファインテック株式会社 | 検査装置、及び検査方法 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2723382B2 (ja) * | 1983-06-13 | 1998-03-09 | ヒューレット・パッカード・カンパニー | 回路試験装置 |
EP0919820A2 (en) * | 1997-10-30 | 1999-06-02 | Nidec-Read Corporation | Circuit board testing apparatus and method |
JP2004101275A (ja) * | 2002-09-06 | 2004-04-02 | Nidec-Read Corp | 基板検査装置及び基板検査方法 |
CN103257285A (zh) * | 2012-02-21 | 2013-08-21 | 日本电产理德株式会社 | 基板内置电子部件的端子判别方法和端子判别装置 |
JP2013257259A (ja) * | 2012-06-14 | 2013-12-26 | Hioki Ee Corp | 抵抗測定装置および回路基板検査装置 |
CN104950182A (zh) * | 2014-03-26 | 2015-09-30 | 日本电产理德股份有限公司 | 电阻测定装置、基板检查装置、检查方法以及维护方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002086520A1 (fr) * | 2001-04-19 | 2002-10-31 | Oht Inc. | Appareil d'inspection et procede d'inspection |
JP2003098213A (ja) * | 2001-09-20 | 2003-04-03 | Oht Inc | 検査装置並びに検査方法 |
JP4919787B2 (ja) * | 2006-12-15 | 2012-04-18 | 日置電機株式会社 | 測定装置 |
JP5555633B2 (ja) * | 2007-10-10 | 2014-07-23 | カスケード・マイクロテク・ゲゼルシャフト・ミト・ベシュレンクテル・ハフツング | 所定の温度条件下で試験基板を検査する方法及び温度条件を設定可能な検査装置 |
CN101799516A (zh) * | 2010-02-24 | 2010-08-11 | 海洋王照明科技股份有限公司 | 一种电路板检测装置 |
-
2016
- 2016-03-14 JP JP2016050233A patent/JP6633949B2/ja active Active
-
2017
- 2017-02-21 TW TW106105795A patent/TWI621863B/zh active
- 2017-03-07 KR KR1020170028662A patent/KR101961536B1/ko active IP Right Grant
- 2017-03-10 CN CN201710144128.9A patent/CN107192913B/zh active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2723382B2 (ja) * | 1983-06-13 | 1998-03-09 | ヒューレット・パッカード・カンパニー | 回路試験装置 |
EP0919820A2 (en) * | 1997-10-30 | 1999-06-02 | Nidec-Read Corporation | Circuit board testing apparatus and method |
JP2004101275A (ja) * | 2002-09-06 | 2004-04-02 | Nidec-Read Corp | 基板検査装置及び基板検査方法 |
CN103257285A (zh) * | 2012-02-21 | 2013-08-21 | 日本电产理德株式会社 | 基板内置电子部件的端子判别方法和端子判别装置 |
JP2013257259A (ja) * | 2012-06-14 | 2013-12-26 | Hioki Ee Corp | 抵抗測定装置および回路基板検査装置 |
CN104950182A (zh) * | 2014-03-26 | 2015-09-30 | 日本电产理德股份有限公司 | 电阻测定装置、基板检查装置、检查方法以及维护方法 |
Also Published As
Publication number | Publication date |
---|---|
KR101961536B1 (ko) | 2019-03-22 |
JP6633949B2 (ja) | 2020-01-22 |
TW201732309A (zh) | 2017-09-16 |
KR20170106917A (ko) | 2017-09-22 |
JP2017166875A (ja) | 2017-09-21 |
TWI621863B (zh) | 2018-04-21 |
CN107192913A (zh) | 2017-09-22 |
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