CN105651325B - 在变送器中实现的劣化传感器检测 - Google Patents
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Abstract
一种过程变量变送器包括存储器,所述存储器存储已滤波传感器值和已滤波变化率值,基于先前接收的传感器值计算所述已滤波传感器值,基于先前的变化率值计算所述已滤波变化率值。过程变量变送器还包括控制器,所述控制器接收传感器值,并且将传感器值与已滤波传感器值进行比较来获得变化率值。控制器还将变化率值与已滤波变化率值进行比较来获得偏差值,并且基于偏差值产生诸如传感器故障警告输出的输出指示例如。这些在过程变量变送器中进行。
Description
本申请是申请号为201110303797.9(“在变送器中实现的劣化传感器检测”)的中国专利申请的分案申请。
相关申请的交叉引用
本申请基于2011年3月21提交的US临时专利申请序列号61/454815并要求其权益,在此将其一并作为参考。
背景技术
本公开涉及一种用于过程控制和监控***中的过程变量变送器。更具体地,本公开涉及使用嵌入在变送器中的组件来检测传感器劣化或故障。
过程变量变送器用于测量过程控制监控***中的过程参数。基于微处理器的变送器通常包括传感器、用于将来自传感器的输出转换为数字形式的模数转换器、用于补偿数字化输出的微处理器以及用于发送补偿输出的输出电路。目前,通常在过程控制回路上(例如,4-20毫安控制回路)或无线地完成这种发送。
这种过程变量变送器通常通过过程控制回路与主机***相连。一些当前的主机***在故障变为危急之前,使用被称作估计的标准误差(Se)统计量的统计量来分析测量数据,以预测传感器或其它过程组件是否出现故障。例如,一些这种主机***使用Se统计量来确定传感器之一(例如热电偶)是否劣化但还未出现故障。其它主机***在严重损坏发生之前使用Se统计量来识别特定过程故障(例如,核反应堆失控)。为了提供足够精确的这种类型的信息,必须以至少每秒一次或更频繁地更新传统的Se等式。
更具体地,Se统计量被用于确定线性区域上传感器信号的标准偏差值。这有助于识别数据线性化的程度或跟踪线性化的程度。以下示出用于这种统计量的等式的一个示例:
其中,
n=样本的数目(一般地,12至20)
i=样本编号(1至n)
个平均输入
Ti=采样的输入
t=更新时间
Se=估计的标准误差
针对多种过程变送器上使用的嵌入式微控制器***,这些等式是强调资源(resource intensive)。对于要被分析的每个传感器,该嵌入式微控制器***需要相对大量的随机访问存储器。等式的求解(resolution)也是非常强调时间的,这会减少可用于传感器处理正常测量信号输入的时间量。
发明内容
一种过程变量变送器包括存储器,所述存储器存储已滤波传感器值和已滤波变化率值,基于先前接收的传感器值计算所述已滤波传感器值,基于先前变化率值计算所述已滤波变化率值。过程变量变送器还包括控制器,所述控制器接收传感器值,并将传感器值与已滤波传感器值进行比较来获得变化率值。控制器还将变化率值与已滤波变化率值进行比较来获得偏差值,并且基于偏差值产生指示,可以是传感器故障警告输出。这些在过程变量变送器中进行。
附图说明
图1是在过程中与主机***和传感器耦合的过程变量变送器的简化框图。
图2是示出了图1所示***的操作的一个实施例的流程图。
图3是示出了针对多个传感器图1所示***的操作的一个实施例的流程图。
图4是示出了多个过程变量变送器和多个传感器的一个实施例的框图。
图5是示出了图4所示***的操作的一个实施例的流程图。
具体实施方式
图1是根据一个实施例的变送器10的简化框图。在图1示出的实施例中,变送器10包括模数(A/D)转换器12、处理器14、存储器16和输入/输出(I/O)组件18。示意性地,过程变量变送器10还包括调节组件19。示出了变送器10与多个不同过程变量(PV)传感器22和24耦合。还示出了变送器10通过控制回路26与主机***20耦合。当然,变送器10还可以与无线通信链路相连,而不用与过程控制回路26相连或除此之外还与过程控制回路26相连。在一个实施例中,过程控制回路26向变送器10提供电能。
示意性地,传感器22和24是从被感测的过程28接收输入的过程变量传感器。示意性地,例如,传感器22可以是感测温度的热电偶,传感器24也可以是热电偶或不同传感器,例如,流量传感器。其它的PV传感器可以包括多种传感器,例如压力传感器、pH传感器等等。示意性地,传感器22和24向调节组件19提供对所感测过程变量加以指示的输出。
示意性地,调节组件19通过例如放大从传感器22和24接收的信号以及对其进行线性化来调节从传感器22和24接收的信号,并向A/D转换器12提供所述信号。因此提供给A/D转换器12的模拟信号指示了所感测的参数。A/D转换器12将模拟信号转换为数字信号,并将其提供给处理器14。
在一个实施例中,处理器14是计算机微处理器或微控制器,具有相关联的存储器16和时钟电路(未示出),并向I/O组件18提供关于所感测参数的信息。I/O组件18进而通过控制回路26向主机***20提供该信息。I/O组件18可以经由控制回路26,通过控制流经回路26的电流(I)以数字形式或模拟形式提供信息。在任何情况下,变送器10经由过程控制回路26提供关于所感测参数的信息。
在图1示出的实施例中,处理器14还包括传感器偏差检测器30。检测器30对与传感器22和24提供的传感器信号相关的统计量进行检测,并且识别传感器22和24是否劣化、故障或即将出现故障。图2是示出了过程变量变送器10的操作的流程图,特别是识别出现故障或即将出现故障的传感器中的传感器偏差检测器30。
如上所述,一些传统主机***计算估计的标准误差(Se)统计量来分析测量数据以尝试识别故障传感器。但是,相信这些并非在嵌入变送器10的组件中完成。相反,传感器偏差检测器30可以处理从A/D转换器12接收的传感器信号来识别劣化、故障或即将出现故障的传感器。通过以上操作,传感器14首先从A/D转换器12接收传感器输入值。这由图2中的块40指示。然后,传感器偏差检测器30没有计算Se值,而是使用延迟算子(operator)(或滤波器)访问存储器16,并将来自传感器的输入数据与已滤波传感器信号进行比较来获得传感器信号变化率的估计。这可以如下来完成:
其中,x是传感器信号变化率的估计;
y是来自传感器的(被A/D转换器12数字化)输入信号;以及
是针对该给定传感器并被存储在存储器16中的若干在前传感器输入样本的平均值。
图2中的块42示出了:将传感器输入值(y)与已滤波传感器值进行比较来获得变化率的估计(x)。
然后,传感器偏差检测器30访问存储器16,并且对以上在Eq.5中获得的变化率的估计(x)执行相似的滤波操作以获得如下的偏差值:
其中是i个在前变化率的平均值计算,所述在前变化率计算针对该给定传感器,并被存储在存储器16中。图2中的块44示出了将针对当前信号的变化率的估计与已滤波变化率值相比较以获得等式6中示出的偏差。
然后,传感器偏差检测器30将新偏差值(dev)与阈值进行比较以确定与当前传感器输入对应的偏差是否完全超出指示传感器劣化、故障或即将故障的阈值。可以凭经验来确定用于阈值的具体值,或者基于正处理的特定类型的传感器来确定用于阈值的具体值。例如,如果传感器是第一类型的过程中感测温度的热电偶,那么阈值可以设置为一个电平,然而如果传感器是在不同类型过程中的热电偶,或者如果传感器是不同类型的传感器(例如,pH传感器或流量传感器),那么阈值可以根据需要设置为不同。图2中块46示出了将偏差值与阈值进行比较。
在块46,如果偏差值大于或超过阈值,那么传感器偏差检测器30产生对这种情况的指示给用户。在一个实施例中,这种指示采用传感器故障警告36的形式,传感器故障警告36被提供给I/O组件18以发送给主机20。这由图2中的块48示出。
然而,如果在块46确定偏差值没有超过阈值,那么传感器偏差检测器30更新变送器10中已滤波传感器值和已滤波估计变化率,并且将这些更新的值存储于存储器16中。这由图2中的块50示出。
然后,处理器14确定是否存在更多需要检查的传感器。这由图2中的块52示出。如果没有,那么过程完成,并且检测器30等待,直到再次执行它的检测为止。然而,如果在块52确定存在更多需要检查的传感器,如图2中的块54所示,选择下一个传感器,并且过程返回到块40。
因此,从上述描述可见:通过执行等式5和6,传感器偏差检测器30可以检测传感器是否故障,并由嵌入过程变量变送器10的组件进行。这是因为:没有使用需要利用每个新数据点的多个过程的Se等式,Se等式还包括平均、计算趋势线、以及对来自多个在前校正样本的趋势的理论值进行估计并使用例如多次平方和平方根的复杂数学,传感器偏差检测器30通过将新传感器输入值与先前的滚动平均值进行比较来简单地进行操作,并且对偏差值执行相同的操作。这种方式在处理器费用和时间方面花费更少,而且还提供了与主机***所使用的相似的特性来检测传感器故障。因此,可以在过程变量变送器自身中检测到传感器劣化和故障,而不需要在主机***20中计算。
尽管图2示出了图1所示用于单独处理传感器的***的操作,***还可以用于处理来自多个不同传感器22和24的输入,多个不同传感器22和24感测过程28中的变量并向相同过程变量变送器10提供传感器信号,或者向多个不同过程变量变送器提供信号。当从多个不同传感器接收信号时,传感器偏差检测器30可以通过比较来自传感器的值和该值之间的期望关系来检测或感测异常。例如,传感器22和24在过程28中的不同点处测量温度,在这两个传感器值之间可能存在期望关系(例如,一个值比另一个值冷或热特定的百分比)。类似地,可以期望根据给定的预定关系来改变来自这些传感器的值彼此之间的关系。例如,如果期望传感器信号线性相关,并且如果传感器之一示出了在温度上的快速增长,而另一个却没有,那么就不观察这些传感器之间的期望关系,而是可以确定传感器之一出现故障或即将出现故障。图3是示出了操作图1中示出***以执行其它类型的检测的流程图。
如图2中所述,变送器10首先接收和处理多个传感器输入。当然,可选地,传感器输入可以来自多个不同变送器,或可以来自多个不同过程,或者它们两个。在图3中的块60示出了如以上参考图2讨论的接收和处理传感器输入。
然后,传感器偏差检测器30对通过如上参考图2描述的过程获得的值进行比较,以通过比较在块60处理的多个不同传感器输入的值来确定是否存在任何相关联的传感器异常情况。这由图3中的块62指示。如果如块62确定的存在传感器异常情况,那么如块64所示,传感器偏差检测器30输出对这种情况的指示(例如传感器故障警告36)。如果不存在,则处理完成。
应该注意,在图3示出的实施例中,传感器输入之间的期望关系可以被存储于存储器16中,并且被传感器偏差检测器30访问以确定是否存在任何相关联的传感器异常情况。可以将关系作为等式、可以用作查找表的值的表、或其它方式存储在存储器16中。仅作为示例,变送器10可以用于一个或多个过程中,其中,期望传感器与传感器的线性关系或过程与过程的线性相关。在执行图3示出的检测中,传感器偏差检测器30可以简单地通过确定在输入值之间是否观测到期望线性关系来确定是否存在相关过程或传感器异常情况。当然,也可以使用其他关系。
图4是简化框图,示出了过程变量变送器10以及传感器22和24和主机***20。图4示出了在过程(或管道)28中感测过程变量的传感器22和24。图4示出了和其它传感器72一起的附加过程变量变送器70也被布置来感测来自过程(或管道)28的过程变量。变送器10和70彼此耦合以用于通信。
应该理解:只要传感器22、24和72之间的距离是已知的,使用传感器偏差检测器30计算多个变送器或传感器输入的偏差就允许检测器30计算过程变量速度和加速度。示意性地,距离可以通过用户可配置条目输入到传感器偏差检测器30中,或采用其它方式。
更具体地,如图4所示,当传感器在不同点与相同过程28相连且传感器之间的距离已知时,传感器偏差检测器30可以检测每个传感器通道上表示过程变量增加或减少的特性。当获知该过程变量沿着两个或三个(或更多个)通道增加或减少时,传感器偏差检测器30可以计算过程变量的速度和加速度。例如,如果传感器22、24和72全是温度传感器,那么通过如以上参考图2和/或3描述处理来自这些传感器的信号输入,传感器偏差检测器30可以识别每个传感器通道上表示温度增加或减少的特性,并且可以进而计算过程28中温度变化的速度和加速度。类似地,传感器偏差检测器30可以识别来自一个传感器通道的输入中的波峰或波谷,并且接下来通过观察波峰或波谷的通道-通道差来识别过程28中的温度耗散或热损失。传感器偏差检测器30还可以将指定传感器通道的状态识别为偏离正常关系,进而指示通道上信号的精确度是不确定的。
图5是示出了图4所示***的操作的流程图以执行这种类型的计算。过程变量变送器10首先(经由过程变量变送器70)从位于相同过程28的传感器22、24和72接收传感器输入。这由图5中的块80示出。然后,如以上参考图2描述的一样,过程变量变送器10中的传感器偏差检测器30处理传感器输入。这由图5的块82示出。
然后,传感器偏差检测器30查找与传感器输入相对应的异常特性。例如,这可以偏离期望关系、与异常速度和加速度对应的特性、与过程中异常过程变量差(例如,温度耗散或热损失)对应的特性、等等。这由图5中的块84示出。
然后,传感器偏差检测器30在存储器16中记录所识别的结果,并且产生任意可应用的警告36。这由图5中的块86示出。
尽管以上描述给出了可以感测的过程变量的多个示例,当然应该理解:可以实质上相同的方式来感测和处理多个其它类型的过程变量。该其它类型的过程变量的示例包括压力、电平、流量或流速,等等。
尽管已经参考说明性实施例描述了本公开,但本领域普通技术人员应当理解,在不脱离本公开的精神和范围的情况下,可以进行形式和细节上的多种改变。
Claims (12)
1.一种过程变量变送器,包括:
传感器,被配置为感测过程变量,并且提供对所感测的过程变量加以指示的多个传感器值;
存储器,适于存储多个传感器值和基于所存储的传感器值计算出的已滤波传感器值;
控制器,被配置为从传感器接收多个传感器值,访问存储器以获得所存储的传感器值,以及计算变化率值和已滤波变化率值;
其中,控制器能够基于变化率值和已滤波变化率值来获得偏差值,由此基于偏差值来产生输出指示,
其中,控制器被配置为通过产生所计算的变化率值的滚动平均值,计算已滤波变化率值。
2.如权利要求1所述的过程变量变送器,还包括:
输出组件,通过通信链路向主机***提供输出指示,作为传感器故障或劣化警告输出。
3.如权利要求2所述的过程变量变送器,其中,输出组件适于在过程控制回路上提供传感器故障警告输出。
4.如权利要求1所述的过程变量变送器,其中,控制器被配置为通过产生所存储的传感器值的滚动平均值,计算已滤波传感器值。
5.如权利要求4所述的过程变量变送器,其中,控制器被配置为基于多个传感器值和已滤波传感器值产生更新的已滤波传感器值,并在存储器中存储更新的已滤波传感器值,作为已滤波传感器值。
6.如权利要求5所述的过程变量变送器,其中,控制器被配置为基于变化率值和已滤波变化率值产生更新的已滤波变化率值,并在存储器中存储更新的已滤波变化率值,作为已滤波变化率值。
7.如权利要求1所述的过程变量变送器,其中,控制器被配置为根据以下等式将多个传感器值中的传感器值与已滤波传感器值进行比较:
其中,
x是变化率值的估计;
y是接收的传感器值;
是i个所存储的传感器值的平均值;
并且,控制器能够根据以下等式获得偏差值:
其中,是i个所存储的变化率值的平均值。
8.一种使用过程变量变送器中的处理器和存储器来识别传感器信号的特性的方法,所述方法包括:
在处理器处,从感测过程变量的传感器接收传感器值;
利用处理器,将传感器值与存储在存储器中的多个存储传感器值之一进行比较,以产生变化率值;
利用处理器,将变化率值与存储在存储器中的存储变化率值进行比较,其中,存储变化率值指示多个存储变化率值;
利用处理器,基于对变化率值与存储变化率值的比较来识别传感器特性;
利用处理器,识别指示传感器是否正确操作的传感器特性;以及
当传感器没有正确操作时,利用处理器来产生输出指示,
其中,存储变化率值是通过产生所产生的变化率值的滚动平均值来计算的。
9.如权利要求8所述的方法,其中,存储变化率值包括递增的变化率值和递减的变化率值中的至少一项,且比较变化率值和存储变化率值的步骤包括以下步骤:
将变化率值与递增的变化率值和递减的变化率值都进行比较。
10.如权利要求8所述的方法,其中,比较变化率值和存储变化率值提供了偏差值,以及识别传感器特性包括:将偏差值与存储的阈值进行比较。
11.如权利要求8所述的方法,还包括:在过程控制回路上向主机***发送作为传感器警告输出的输出指示。
12.如权利要求8所述的方法,还包括:在无线通信链路上向主机***发送作为传感器警告输出的输出指示。
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-
2011
- 2011-09-19 US US13/236,002 patent/US9207670B2/en active Active
- 2011-09-28 CN CN201110303797.9A patent/CN102692248B/zh active Active
- 2011-09-28 CN CN201610082460.2A patent/CN105651325B/zh active Active
- 2011-09-28 CN CN2011203782248U patent/CN202393413U/zh not_active Expired - Fee Related
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2012
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CN102692248B (zh) | 2016-02-24 |
RU2576588C2 (ru) | 2016-03-10 |
CA2838132A1 (en) | 2012-09-27 |
JP5993439B2 (ja) | 2016-09-14 |
EP2689307A2 (en) | 2014-01-29 |
RU2013146711A (ru) | 2015-04-27 |
CA2838132C (en) | 2016-08-23 |
CN105651325A (zh) | 2016-06-08 |
CN102692248A (zh) | 2012-09-26 |
US20120245895A1 (en) | 2012-09-27 |
JP2014512599A (ja) | 2014-05-22 |
EP2689307B1 (en) | 2019-05-08 |
WO2012128913A2 (en) | 2012-09-27 |
CN202393413U (zh) | 2012-08-22 |
WO2012128913A3 (en) | 2012-11-29 |
US9207670B2 (en) | 2015-12-08 |
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