FR2784193B1 - Mecanisme integre permettant une detection de defaillances par test automatique en temps reel pour un convertisseur analogique/numerique - Google Patents

Mecanisme integre permettant une detection de defaillances par test automatique en temps reel pour un convertisseur analogique/numerique

Info

Publication number
FR2784193B1
FR2784193B1 FR9812452A FR9812452A FR2784193B1 FR 2784193 B1 FR2784193 B1 FR 2784193B1 FR 9812452 A FR9812452 A FR 9812452A FR 9812452 A FR9812452 A FR 9812452A FR 2784193 B1 FR2784193 B1 FR 2784193B1
Authority
FR
France
Prior art keywords
failures
analog
real
detection
digital converter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9812452A
Other languages
English (en)
Other versions
FR2784193A1 (fr
Inventor
Eric Jean Louis Balard
Jacques Pierre Sonzogni
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments France SAS
Original Assignee
Texas Instruments France SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments France SAS filed Critical Texas Instruments France SAS
Priority to FR9812452A priority Critical patent/FR2784193B1/fr
Priority to US09/412,919 priority patent/US6396426B1/en
Publication of FR2784193A1 publication Critical patent/FR2784193A1/fr
Application granted granted Critical
Publication of FR2784193B1 publication Critical patent/FR2784193B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H03M1/1076—Detection or location of converter hardware failure, e.g. power supply failure, open or short circuit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
FR9812452A 1998-10-05 1998-10-05 Mecanisme integre permettant une detection de defaillances par test automatique en temps reel pour un convertisseur analogique/numerique Expired - Fee Related FR2784193B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR9812452A FR2784193B1 (fr) 1998-10-05 1998-10-05 Mecanisme integre permettant une detection de defaillances par test automatique en temps reel pour un convertisseur analogique/numerique
US09/412,919 US6396426B1 (en) 1998-10-05 1999-10-05 Embedded mechanism offering real-time self failure detection for an analog to digital converter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9812452A FR2784193B1 (fr) 1998-10-05 1998-10-05 Mecanisme integre permettant une detection de defaillances par test automatique en temps reel pour un convertisseur analogique/numerique

Publications (2)

Publication Number Publication Date
FR2784193A1 FR2784193A1 (fr) 2000-04-07
FR2784193B1 true FR2784193B1 (fr) 2001-01-05

Family

ID=9531206

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9812452A Expired - Fee Related FR2784193B1 (fr) 1998-10-05 1998-10-05 Mecanisme integre permettant une detection de defaillances par test automatique en temps reel pour un convertisseur analogique/numerique

Country Status (2)

Country Link
US (1) US6396426B1 (fr)
FR (1) FR2784193B1 (fr)

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US7254518B2 (en) * 1996-03-28 2007-08-07 Rosemount Inc. Pressure transmitter with diagnostics
US8290721B2 (en) 1996-03-28 2012-10-16 Rosemount Inc. Flow measurement diagnostics
US7949495B2 (en) 1996-03-28 2011-05-24 Rosemount, Inc. Process variable transmitter with diagnostics
FR2829321B1 (fr) * 2001-09-05 2004-12-24 Crouzet Automatismes Entree analogique pour circuit electronique
DE10163651A1 (de) * 2001-12-21 2003-07-03 Philips Intellectual Property Schaltungsanordnung zum Testen eines Analog-Digital-Umsetzers
JP2003242049A (ja) * 2002-02-18 2003-08-29 Niles Parts Co Ltd マイクロコンピュータの異常検出方法
DE10215405A1 (de) * 2002-04-08 2003-10-16 Bosch Gmbh Robert Verfahren und Vorrichtung zur Funktionsprüfung eines Analog-Digital-Wandlers sowie Analog-Digital-Wandler
WO2003096540A1 (fr) * 2002-05-08 2003-11-20 Continental Teves Ag & Co. Ohg Circuit electronique de conversion analogique/numerique de signaux protegee contre les erreurs
EP1394558A1 (fr) * 2002-08-26 2004-03-03 Alcatel Dispositif de test de sécurité d'un convertisseur analogique-numérique
US7046180B2 (en) * 2004-04-21 2006-05-16 Rosemount Inc. Analog-to-digital converter with range error detection
DE102004048194A1 (de) * 2004-09-30 2006-04-06 Robert Bosch Gmbh Verfahren und Anordnung zum Analog/Digital-Wandeln
DE102005016800A1 (de) * 2005-04-12 2006-10-19 Robert Bosch Gmbh Wandleranordnung und Testverfahren für einen Wandler
US8112565B2 (en) 2005-06-08 2012-02-07 Fisher-Rosemount Systems, Inc. Multi-protocol field device interface with automatic bus detection
US20070068225A1 (en) 2005-09-29 2007-03-29 Brown Gregory C Leak detector for process valve
US7286068B2 (en) * 2005-12-30 2007-10-23 Honeywell International Inc. Method and system for detecting failures in an analog-to-digital converter
US7953501B2 (en) 2006-09-25 2011-05-31 Fisher-Rosemount Systems, Inc. Industrial process control loop monitor
US8788070B2 (en) 2006-09-26 2014-07-22 Rosemount Inc. Automatic field device service adviser
JP2010505121A (ja) 2006-09-29 2010-02-18 ローズマウント インコーポレイテッド 検証を備える磁気流量計
US8898036B2 (en) 2007-08-06 2014-11-25 Rosemount Inc. Process variable transmitter with acceleration sensor
JP2009278236A (ja) * 2008-05-13 2009-11-26 Panasonic Corp 固体撮像装置
JP5627246B2 (ja) * 2009-04-03 2014-11-19 三洋電機株式会社 電池システム、電動車両及び電池制御装置
JP2011077847A (ja) * 2009-09-30 2011-04-14 Renesas Electronics Corp Ａ／ｄコンバータ及びそのオープン検出方法
DE102010040721A1 (de) * 2010-09-14 2012-03-15 Sb Limotive Company Ltd. Batteriesystem mit Zellspannungserfassungseinheiten
US9207670B2 (en) 2011-03-21 2015-12-08 Rosemount Inc. Degrading sensor detection implemented within a transmitter
DE102012203670A1 (de) * 2012-03-08 2013-09-12 Robert Bosch Gmbh Analog-Digital-Wandleranordnung und zugehöriges Verfahren zur Überprüfung eines Multiplexers für einen Analog-Digital-Wandler
US9052240B2 (en) 2012-06-29 2015-06-09 Rosemount Inc. Industrial process temperature transmitter with sensor stress diagnostics
US9602122B2 (en) 2012-09-28 2017-03-21 Rosemount Inc. Process variable measurement noise diagnostic
EP3376671B1 (fr) * 2015-11-11 2023-02-15 Mitsubishi Electric Corporation Dispositif de conversion a/n
EP3465239B1 (fr) 2016-06-01 2020-05-20 Signify Holding B.V. Circuit intégré de détection d'erreur sur des broches d'entrée/sortie
WO2019130621A1 (fr) * 2017-12-28 2019-07-04 株式会社豊田自動織機 Circuit de surveillance et procédé de détermination d'exécution de conversion analogique numérique
CN111190047B (zh) * 2019-10-11 2022-03-25 浙江中控技术股份有限公司 一种电流采集诊断电路及其失效诊断方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3579103A (en) * 1969-10-06 1971-05-18 Nasa Analog-to-digital converter tester
JPS57119259A (en) * 1981-01-19 1982-07-24 Hitachi Ltd Testing method for a/d converter
JPS5975717A (ja) * 1982-10-25 1984-04-28 Hitachi Ltd Ａｄ変換器の診断装置
US4700174A (en) * 1986-05-12 1987-10-13 Westinghouse Electric Corp. Analog signal processor
US4947106A (en) * 1988-03-31 1990-08-07 Hewlett-Packard Company Programmatically generated in-circuit test of analog to digital converters
US4940947A (en) * 1989-02-28 1990-07-10 Oneac Corporation Line noise signal measurement system using analog signal compression with digital linearity correction
KR930004772Y1 (ko) * 1991-05-13 1993-07-23 금성일렉트론 주식회사 아날로그/디지탈 변환기의 테스트장치
US5235333A (en) * 1992-03-05 1993-08-10 Burr-Brown Corporation Hysteresis-insensitive single-comparator successive approximation analog-to-digital converter
JP3597303B2 (ja) * 1996-04-23 2004-12-08 株式会社ルネサステクノロジ Ａ／ｄコンバータのテスト方法及びテスト装置
US6188057B1 (en) * 1998-09-11 2001-02-13 Agilent Technologies, Inc. Method and apparatus for testing photo-receiver arrays and associated read channels

Also Published As

Publication number Publication date
FR2784193A1 (fr) 2000-04-07
US6396426B1 (en) 2002-05-28

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Effective date: 20150630