CN104282248B - Array substrate, testing method thereof, displaying panel and displaying device - Google Patents
Array substrate, testing method thereof, displaying panel and displaying device Download PDFInfo
- Publication number
- CN104282248B CN104282248B CN201410510232.1A CN201410510232A CN104282248B CN 104282248 B CN104282248 B CN 104282248B CN 201410510232 A CN201410510232 A CN 201410510232A CN 104282248 B CN104282248 B CN 104282248B
- Authority
- CN
- China
- Prior art keywords
- signal
- pixel
- test
- array base
- base palte
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
Abstract
The invention provides an array substrate, a testing method thereof, a displaying panel and a displaying device and belongs to the field of liquid crystal displaying. At least one test pixel is arranged outside the displaying zone of the array substrate. The test pixel receives test signals through a first signal wire arranged on the array substrate and sends the received test signals to a test point placed at a peripheral circuit zone through a second signal wire arranged on the array substrate. According to the technical scheme, under the premise that the displaying panel is not damaged, the damping situations of data signals and scanning signals of the displaying panel are measured accurately.
Description
Technical field
The present invention relates to field of liquid crystal display, particularly relate to a kind of array base palte and its method of testing, display floater, display
Device.
Background technology
Now with the continuous development of lcd technology, altofrequency, large scale become the mainstream development of liquid crystal display
Direction.However, with liquid crystal panel size be continuously increased and resolution continuous lifting, the load of display panels is not
Breaking and increase, the scanning signal of display panels and data signal decay being led to serious, thus have impact on liquid crystal display producing
The performance of product, therefore, to display panels load cause scanning signal decay and data signal decay carry out test and
Analysis is extremely important.
Because scanning signal is transmission on the grid line of array base palte, data signal is the data wire upload in array base palte
Pass, in the therefore existing method that liquid crystal display product is tested, in order to detect on array base palte data wire or
The signal of grid line transmission, it usually needs liquid crystal display product is carried out corner cut process, removes the color film of liquid crystal display product afterwards
Substrate, carries out signal testing with the data wire on probe contact array substrate or grid line after cleaning, test process is complicated,
And destroy the time of day of liquid crystal display product.
Content of the invention
The technical problem to be solved in the present invention is to provide a kind of array base palte and its method of testing, display floater, display dress
Put, it is possible to achieve on the premise of not destroying display floater, accurately measure the data signal of display floater and scanning signal
Attenuation.
For solving above-mentioned technical problem, embodiments of the invention provide technical scheme as follows:
On the one hand, provide a kind of array base palte, be provided with least one outside the viewing area of described array base palte and test picture
Element, the first holding wire that described test pixel passes through arrangement on array base palte receives trial signal to be measured, and by array base palte
The trial signal to be measured receiving is sent to the test point of peripherally located circuit region by the secondary signal line of arrangement.
Further, described test pixel region is provided with via, and the grid line corresponding to described test pixel passes through
Described via is connected with the data wire corresponding to described test pixel.
Further, grid line arrangement in a row on described array base palte, described test pixel is included positioned at described array base palte
Scanning signal test pixel after the last string pixel of viewing area, described scanning signal test pixel receives corresponding grid line and passes
The scanning signal passed, and by respective data lines, the scanning signal receiving is sent to the scanning letter of peripherally located circuit region
Number attenuation test point.
Further, data wire arrayed in columns on described array base palte, described test pixel is included positioned at described array base
Data signal test pixel after last column pixel of plate viewing area, described data signal test pixel receives corresponding data
The data signal of line transmission, and by corresponding grid line, the data signal receiving is sent to the data of peripherally located circuit region
Signal attenuation test point.
The embodiment of the present invention additionally provides a kind of method of testing of array base palte, the viewing area peripheral hardware of described array base palte
It is equipped with least one test pixel, described method of testing includes:
Trial signal to be measured is sent to by described test pixel by the first holding wire of arrangement on array base palte, and by described
Described trial signal to be measured is sent to peripherally located circuit region by the secondary signal line of arrangement on array base palte by test pixel
Test point；
In described test point, described trial signal to be measured is measured.
Further, described test pixel region is provided with via, and the grid line corresponding to described test pixel passes through
Described via is connected with the data wire corresponding to described test pixel.
Further, described trial signal to be measured is scanning signal, will be treated by the first holding wire of arrangement on array base palte
Test signal is sent to described test pixel, and passes through the secondary signal line of arrangement on array base palte by institute by described test pixel
State trial signal to be measured and be sent to the test point of peripherally located circuit region and include:
Described scanning signal is sent to by described test pixel by the grid line corresponding to described test pixel, and passes through institute
State the data wire corresponding to test pixel to survey the scanning signal decay that described scanning signal is sent to peripherally located circuit region
Pilot.
Further, described trial signal to be measured is data signal, will be treated by the first holding wire of arrangement on array base palte
Test signal is sent to described test pixel, and passes through the secondary signal line of arrangement on array base palte by institute by described test pixel
State trial signal to be measured and be sent to the test point of peripherally located circuit region and include:
Described data signal is sent to by described test pixel by the data wire corresponding to described test pixel, and passes through
The data signal decay that described data signal is sent to peripherally located circuit region is surveyed by the grid line corresponding to described test pixel
Pilot.
The embodiment of the present invention additionally provides a kind of display floater, including above-mentioned array base palte, also includes and described array
The color membrane substrates that substrate is oppositely arranged.
The embodiment of the present invention additionally provides a kind of display device, including above-mentioned display floater, also includes being arranged on described
Peripheral circuit region outside display floater, described peripheral circuit region is provided with treats the test point that test signal measures.
Further, described test pixel includes the number after last column pixel of described array base palte viewing area
It is believed that number test pixel, described test point includes the data signal test point being arranged on scanning signal flexible PCB, described
Data signal test point is connected with data signal test pixel by grid line.
Further, sweeping after described test pixel includes string pixel last positioned at described array base palte viewing area
Retouch signal testing pixel, described test point includes the scanning signal test point being arranged on data signal flexible PCB, described
Scanning signal test point is connected with scanning signal test pixel by data wire；Or
Described test point includes the scanning signal test point being arranged on data signal printed circuit board (PCB), described scanning signal
Test point is connected with scanning signal test pixel by data wire.
Further, described peripheral circuit region is provided with warning circuit, for monitoring the measurement that described test point obtains
As a result, and described measurement result be less than preset value when output alarm signal.
Embodiments of the invention have the advantages that
In such scheme, it is provided with the test pixel for test signal outside the viewing area of array base palte, this test
Pixel does not affect to show, can pass the trial signal to be measured transmitting on array base palte, such as data signal or scanning signal simultaneously
Deliver to the test point of peripheral circuit region, so in the case of not destroying display floater, by being arranged on peripheral circuit region
Test point just can with real-time testing array base palte transmission data signal or scanning signal attenuation.
Brief description
Fig. 1 is the structural representation of embodiment of the present invention display floater；
Fig. 2 is the structural representation of " a " pixel in the embodiment of the present invention；
Fig. 3 is the structural representation of " b " pixel in the embodiment of the present invention；
The schematic diagram that Fig. 4 is tested to scanning signal for the embodiment of the present invention；
The schematic diagram that Fig. 5 is tested to data signal for the embodiment of the present invention.
Reference
1 scanning signal attenuation test point
2 data signal attenuation test points
3 printed circuit board (PCB)s
4 data signal flexible PCBs
5 scanning signal flexible PCBs
6 vias
Specific embodiment
For making embodiments of the invention technical problem to be solved, technical scheme and advantage clearer, below in conjunction with
Drawings and the specific embodiments are described in detail.
Embodiments of the invention be directed to prior art in display panels load cause scanning signal decay and
The process that data signal decay is tested is complicated, and destroys the problem of the time of day of liquid crystal display product, provides one
Plant array base palte and its method of testing, display floater, display device, it is possible to achieve on the premise of not destroying display floater, accurate
Really measure the data signal of display floater and the attenuation of scanning signal.
Embodiments provide a kind of array base palte, outside the viewing area of this array base palte, be provided with least one survey
Examination pixel, the first holding wire that described test pixel passes through arrangement on array base palte receives trial signal to be measured, and passes through array base
On plate, the trial signal to be measured receiving is sent to the test point of peripherally located circuit region by the secondary signal line of arrangement.
Technical scheme is provided with the test pixel for test signal outside the viewing area of array base palte, should
Test pixel does not affect to show, simultaneously can be by the trial signal to be measured transmitting on array base palte, such as data signal or scanning letter
Number it is sent to the test point of peripheral circuit region, so in the case of not destroying display floater, by being arranged on peripheral circuit
The test point in region just can be with the attenuation of the data signal of transmission or scanning signal on real-time testing array base palte.
Specifically, described test pixel region is provided with via, and the grid line corresponding to described test pixel passes through institute
State via to be connected with the data wire corresponding to described test pixel.
Further, grid line arrangement in a row on described array base palte, described test pixel is included positioned at described array base palte
Scanning signal test pixel after the last string pixel of viewing area, described scanning signal test pixel receives corresponding grid line and passes
The scanning signal passed, and by respective data lines, the scanning signal receiving is sent to the scanning letter of peripherally located circuit region
Number attenuation test point.
Further, data wire arrayed in columns on described array base palte, data wire arrayed in columns on described array base palte, institute
State the data signal test pixel that test pixel includes after last column pixel of described array base palte viewing area, described
Data signal test pixel receives the data signal of respective data lines transmission, and by corresponding grid line by the data signal receiving
It is sent to the data signal attenuation test point of peripherally located circuit region.
The embodiment of the present invention additionally provides a kind of method of testing of array base palte, the viewing area peripheral hardware of described array base palte
It is equipped with least one test pixel, described method of testing includes:
Trial signal to be measured is sent to by described test pixel by the first holding wire of arrangement on array base palte, and by described
Described trial signal to be measured is sent to peripherally located circuit region by the secondary signal line of arrangement on array base palte by test pixel
Test point；
In described test point, described trial signal to be measured is measured.
Technical scheme can treat test signal by the test point of peripherally located circuit region, such as scans
Signal or data signal measure, thus can be in the case of not destroying display floater, on real-time testing array base palte
The data signal of transmission or the attenuation of scanning signal.
Further, described test pixel region is provided with via, and the grid line corresponding to described test pixel passes through
Described via is connected with the data wire corresponding to described test pixel.
Further, described trial signal to be measured is scanning signal, will be treated by the first holding wire of arrangement on array base palte
Test signal is sent to described test pixel, and passes through the secondary signal line of arrangement on array base palte by institute by described test pixel
State trial signal to be measured and be sent to the test point of peripherally located circuit region and include:
Described scanning signal is sent to by described test pixel by the grid line corresponding to described test pixel, and passes through institute
State the data wire corresponding to test pixel to survey the scanning signal decay that described scanning signal is sent to peripherally located circuit region
Pilot.
Further, described trial signal to be measured is data signal, will be treated by the first holding wire of arrangement on array base palte
Test signal is sent to described test pixel, and passes through the secondary signal line of arrangement on array base palte by institute by described test pixel
State trial signal to be measured and be sent to the test point of peripherally located circuit region and include:
Described data signal is sent to by described test pixel by the data wire corresponding to described test pixel, and passes through
The data signal decay that described data signal is sent to peripherally located circuit region is surveyed by the grid line corresponding to described test pixel
Pilot.
The embodiment of the present invention additionally provides a kind of display floater, including array base palte as above, also include with described
The color membrane substrates that array base palte is oppositely arranged.
The embodiment of the present invention additionally provides a kind of display device, including display floater as above, also includes being arranged on
Peripheral circuit region outside described display floater, described peripheral circuit region is provided with treats the test that test signal measures
Point.Described display device can be: liquid crystal panel, LCD TV, liquid crystal display, DPF, mobile phone, panel computer etc. are appointed
What has product or the part of display function.
Further, in described display device, described test pixel includes last positioned at described array base palte viewing area
Data signal test pixel after one-row pixels, described test point includes the data being arranged on scanning signal flexible PCB
Signal testing point, described data signal test point is connected with data signal test pixel by grid line.
Further, in described display device, described test pixel includes last positioned at described array base palte viewing area
Scanning signal test pixel after string pixel, described test point includes the scanning being arranged on data signal flexible PCB
Signal testing point, described scanning signal test point is connected with scanning signal test pixel by data wire；Or
Described test point includes the scanning signal test point being arranged on data signal printed circuit board (PCB), described scanning signal
Test point is connected with scanning signal test pixel by data wire.
Further, in described display device, described peripheral circuit region is additionally provided with warning circuit, described for monitoring
The measurement result that test point obtains, and the output alarm signal when described measurement result is less than preset value.So user according to
This alarm signal, can easily know the scanning signal of display device or the attenuation of data signal.
Below in conjunction with the accompanying drawings and specific embodiment is situated between in detail to the array base palte of the present invention and its method of testing
Continue:
Two kinds of pixels are provided with the array base palte of the present embodiment: for the display pixel being shown, i.e. " a " pixel；
It is used for trial signal to be measured is sent to the test pixel of the test point of peripheral circuit region, i.e. " b " pixel.It is different from " a " pixel,
" b " pixel is arranged on outside viewing area, has no effect on display, and as shown in Figures 2 and 3, " b " pixel different from " a " pixel
Region is provided with via 6, and the grid line corresponding to " b " pixel is connected with the data wire corresponding to test pixel by via 6.
The method of testing of the array base palte of the present embodiment is as follows:
(1) test of scanning signal:
On the array base palte of the present embodiment, grid line arrangement in a row, as shown in figure 4, scanning signal is on the left of array base palte
Gate-cof (scanning signal flexible PCB) exports, and is input in the grid line of arrangement in a row on array base palte, works as scanning signal
When transmitting, by grid line, the low order end reaching viewing area, scanning signal reaches test pixel " b " region, and passes through via
Reach the data wire corresponding to test pixel " b ", this data wire moves towards identical with the data wire in normal viewing area, so
Scanning signal reaches the connecting line (as Fig. 4 dotted portion) in fan section by the data wire of pixel corresponding to test pixel " b ", and
Access in the control signal adhesion zone of source-cof (data signal flexible PCB) 4 by the connecting line in fan section, afterwards
It is linked into the scanning signal attenuation test point 1 of setting on printed circuit board (PCB) 3, further, scanning signal attenuation test point 1 also may be used
To be set directly on data signal flexible PCB 4.When measuring to scanning signal, outside measuring apparatus are passed through to visit
Pin contact scanning signal attenuation test point 1 just can measure the attenuation of scanning signal in real time.
Because the scanning signal transmission situation of every row grid line is roughly the same, therefore, it can need not all arrange survey in every a line
Examination pixel, can only wherein a line setting test pixel, as long as ensure test pixel be located at last display pixel of this row
Afterwards, so can ensure that measurement result embodies the final attenuation of this line scan signals.
(2) test of data signal:
On the array base palte of the present embodiment, data wire arrayed in columns, as shown in figure 5, data signal is on the upside of array base palte
Data signal flexible PCB output, be input in the data wire of arrayed in columns on array base palte, when data signal pass through number
When transmitting, according to line, the bottom reaching viewing area, scanning signal reaches test pixel " b ", and reaches test pixel by via
Grid line corresponding to " b ", moving towards of the grid line in this grid line and normal viewing area is identical, such scanning signal by with test
The corresponding grid line of pixel " b " reaches the connecting line (as Fig. 5 dotted portion) in fan section, and is swept by the connecting line access in fan section
Retouch the data signal attenuation test point 2 of setting on signal flexible circuits plate 5.When measuring to data signal, the survey of outside
Amount equipment contacts data signal attenuation test point 2 by probe just can be with the attenuation of real-time measuring data signal.
Because the data signal transmission situation of every column data line is roughly the same, therefore, it can all to arrange in every string
Test pixel, can only wherein string setting test pixel, as long as ensure test pixel be located at this row last show picture
After element, so can ensure that measurement result embodies the final attenuation of this column data signal.
After measurement obtains scanning signal or the attenuation of data signal, can be using measurement result as feedback letter
Number, it is scanned amplification and the compensation of signal or data signal by ic (integrated circuit), thus improving display floater further
Picture quality.
Technical scheme is passed through to make test pixel, and by the grid line corresponding to test pixel and corresponding number
Realize electrical connection such that it is able to trial signal to be measured is led to flexible PCB or printed circuit board (PCB) according to line, do not destroy display
In the case of panel, just can be with the data of transmission on real-time testing array base palte by the test point being arranged on peripheral circuit region
Signal or the attenuation of scanning signal.
The above is the preferred embodiment of the present invention it is noted that for those skilled in the art
For, on the premise of without departing from principle of the present invention, some improvements and modifications can also be made, these improvements and modifications
Should be regarded as protection scope of the present invention.
Claims (11)
1. a kind of array base palte is it is characterised in that be provided with least one test pixel outside the viewing area of described array base palte,
The first holding wire that described test pixel passes through arrangement on array base palte receives trial signal to be measured, and by arranging on array base palte
Secondary signal line the trial signal to be measured receiving is sent to the test point of peripherally located circuit region；
Described test pixel region is provided with via, the grid line corresponding to described test pixel pass through described via with described
Data wire corresponding to test pixel connects.
2. array base palte according to claim 1 is it is characterised in that grid line arrangement in a row on described array base palte, described
Test pixel includes the scanning signal test pixel after string pixel last positioned at described array base palte viewing area, described sweeps
Retouch the scanning signal that signal testing pixel receives corresponding grid line transmission, and by respective data lines, the scanning signal receiving is passed
Deliver to the scanning signal attenuation test point of peripherally located circuit region.
3. array base palte according to claim 1 is it is characterised in that data wire arrayed in columns, institute on described array base palte
State the data signal test pixel that test pixel includes after last column pixel of described array base palte viewing area, described
Data signal test pixel receives the data signal of respective data lines transmission, and by corresponding grid line by the data signal receiving
It is sent to the data signal attenuation test point of peripherally located circuit region.
4. a kind of method of testing of array base palte is it is characterised in that be provided with least one outside the viewing area of described array base palte
Individual test pixel, described method of testing includes:
Trial signal to be measured is sent to by described test pixel by the first holding wire of arrangement on array base palte, and by described test
Described trial signal to be measured is sent to the survey of peripherally located circuit region by the secondary signal line of arrangement on array base palte by pixel
Pilot；
In described test point, described trial signal to be measured is measured；
Described test pixel region is provided with via, the grid line corresponding to described test pixel pass through described via with described
Data wire corresponding to test pixel connects.
5. array base palte according to claim 4 method of testing it is characterised in that
Described trial signal to be measured is scanning signal, is sent to trial signal to be measured by the first holding wire of arrangement on array base palte
Described test pixel, and by the secondary signal line that described test pixel passes through arrangement on array base palte, described trial signal to be measured is passed
The test point delivering to peripherally located circuit region includes:
Described scanning signal is sent to by described test pixel by the grid line corresponding to described test pixel, and by described survey
Described scanning signal is sent to the scanning signal attenuation test point of peripherally located circuit region by the data wire corresponding to examination pixel.
6. array base palte according to claim 4 method of testing it is characterised in that
Described trial signal to be measured is data signal, is sent to trial signal to be measured by the first holding wire of arrangement on array base palte
Described test pixel, and by the secondary signal line that described test pixel passes through arrangement on array base palte, described trial signal to be measured is passed
The test point delivering to peripherally located circuit region includes:
Described data signal is sent to by described test pixel by the data wire corresponding to described test pixel, and by described
Described data signal is sent to the data signal attenuation test point of peripherally located circuit region by the grid line corresponding to test pixel.
7. a kind of display floater, it is characterised in that including the array base palte as any one of claim 1-3, also includes
The color membrane substrates being oppositely arranged with described array base palte.
8. a kind of display device, it is characterised in that including display floater as claimed in claim 7, also includes being arranged on described
Peripheral circuit region outside display floater, described peripheral circuit region is provided with treats the test point that test signal measures.
9. display device according to claim 8 is it is characterised in that described test pixel is included positioned at described array base palte
Data signal test pixel after last column pixel of viewing area, described test point includes being arranged on scanning signal flexible electrical
Data signal test point on the plate of road, described data signal test point is connected with data signal test pixel by grid line.
10. display device according to claim 8 is it is characterised in that described test pixel is included positioned at described array base
Scanning signal test pixel after the last string pixel of plate viewing area, described test point includes being arranged on data signal flexibility
Scanning signal test point on circuit board, described scanning signal test point is connected with scanning signal test pixel by data wire；
Or
Described test point includes the scanning signal test point being arranged on data signal printed circuit board (PCB), described scanning signal test
Point is connected with scanning signal test pixel by data wire.
11. display devices according to claim 8 it is characterised in that described peripheral circuit region is provided with warning circuit,
For monitoring the measurement result that described test point obtains, and the output alarm signal when described measurement result is less than preset value.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410510232.1A CN104282248B (en) | 2014-09-28 | 2014-09-28 | Array substrate, testing method thereof, displaying panel and displaying device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410510232.1A CN104282248B (en) | 2014-09-28 | 2014-09-28 | Array substrate, testing method thereof, displaying panel and displaying device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104282248A CN104282248A (en) | 2015-01-14 |
| CN104282248B true CN104282248B (en) | 2017-01-25 |
Family
ID=52257084
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410510232.1A Active CN104282248B (en) | 2014-09-28 | 2014-09-28 | Array substrate, testing method thereof, displaying panel and displaying device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104282248B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107728364B (en) * | 2017-10-27 | 2020-06-12 | 合肥鑫晟光电科技有限公司 | Array substrate, manufacturing method thereof and display device |
| CN108877616B (en) * | 2018-08-16 | 2019-09-20 | 深圳市华星光电半导体显示技术有限公司 | A kind of test method and display panel of array substrate driving circuit |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101556382A (en) * | 2008-04-10 | 2009-10-14 | 北京京东方光电科技有限公司 | TFT-LCD array substrate and methods for manufacturing and testing same |
| CN103246092A (en) * | 2013-04-28 | 2013-08-14 | 京东方科技集团股份有限公司 | Array substrate and display |
| CN103761935A (en) * | 2014-01-21 | 2014-04-30 | 深圳市华星光电技术有限公司 | Display panel |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101448006B1 (en) * | 2008-02-14 | 2014-10-13 | 삼성디스플레이 주식회사 | Liquid crystal display |
-
2014
- 2014-09-28 CN CN201410510232.1A patent/CN104282248B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101556382A (en) * | 2008-04-10 | 2009-10-14 | 北京京东方光电科技有限公司 | TFT-LCD array substrate and methods for manufacturing and testing same |
| CN103246092A (en) * | 2013-04-28 | 2013-08-14 | 京东方科技集团股份有限公司 | Array substrate and display |
| CN103761935A (en) * | 2014-01-21 | 2014-04-30 | 深圳市华星光电技术有限公司 | Display panel |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104282248A (en) | 2015-01-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR100596965B1 (en) | Module for appling driving signal, liquid crystal display assembly having the same and method for testing time of driving signal the same | |
| EP2759914B1 (en) | Electrical testing method of in-cell touch screen | |
| CN100409090C (en) | Liquid crystal display and driving method thereof | |
| JPS62237363A (en) | Electromagnetic radiation inspection method and device | |
| US7388626B2 (en) | Liquid crystal display panel having a cell test structure comprising bounding pads connecting shorting bars to flexible printed circuit and driving IC | |
| CN100580465C (en) | Panel test circuit structure | |
| US8508111B1 (en) | Display panel and method for inspecting thereof | |
| CN105652539B (en) | Liquid crystal display device and its liquid crystal display panel | |
| CN105183225A (en) | Testing device and testing method adopting same | |
| CN104282248B (en) | Array substrate, testing method thereof, displaying panel and displaying device | |
| CN105589244A (en) | Liquid crystal display device, liquid crystal display panel and manufacturing method thereof | |
| CN103676243B (en) | Array substrate assembly, measurement method of array substrate assembly and display device | |
| CN203350556U (en) | Array substrate motherboard and array substrate lead inspection device | |
| US6734692B2 (en) | Inspection apparatus and sensor | |
| CN102981686A (en) | Method for detecting defects of capacitive touch screen device | |
| CN113257160A (en) | Detection device and detection method for display panel | |
| CN106292025B (en) | Touch control display apparatus | |
| US20130162277A1 (en) | Uniform field area testing apparatus and testing method using same | |
| CN104200767A (en) | Array substrate, display device and detection method of display device | |
| CN104101743B (en) | The method of probe, line detection apparatus and detection circuit | |
| CN108847170A (en) | Display products detection method and detection device | |
| EP3108237B1 (en) | Method for the testing of ultrasound probes | |
| CN102981059A (en) | Method for detecting defects of capacitive touch screen device | |
| US6921892B2 (en) | Electrostatic imager | |
| KR20130121400A (en) | Non contact resistance inspecting apparatus |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |