CN102981686A - Method for detecting defects of capacitive touch screen device - Google Patents
Method for detecting defects of capacitive touch screen device Download PDFInfo
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- CN102981686A CN102981686A CN2012103126619A CN201210312661A CN102981686A CN 102981686 A CN102981686 A CN 102981686A CN 2012103126619 A CN2012103126619 A CN 2012103126619A CN 201210312661 A CN201210312661 A CN 201210312661A CN 102981686 A CN102981686 A CN 102981686A
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Abstract
The invention relates to a method for detecting defects of a capacitive touch screen device. The device comprises a capacitive screen and a capacitive screen control chip. The method includes setting a voltage value first, sequentially driving all drive lines, measuring a mutual capacitive value between each drive line and a sense line, obtaining a mutual capacitive value matrix as a standard, changing the drive voltage value applied to the driving lines, sequentially driving all the drive lines, measuring the mutual capacitive value between each drive line and the sense line again, and judging whether the defects exist according to a change rule of difference between measured values of two times.
Description
Technical field
The present invention relates to a kind of capacitive touch screen defect inspection method, especially projecting type capacitor formula touch-screen sweep trace capacitance determining method.
Background technology
Touch-screen is because the advantages such as it is sturdy and durable, reaction velocity fast, saving space have obtained increasing application in various electronic device field.The projection-type capacitive touch screen product is becoming the mainstream product in the market at present.Its scanning theory as shown in Figure 1, make the overlapping electrod-array of transverse and longitudinal at glass baseplate surface with ITO (indium tin oxide), horizontal and vertical ITO electrode crossing place forms several Inductance and Capacitance, also be the two poles of the earth that two arrays of electrodes consists of respectively electric capacity, when occuring to touch, touch place adjacent electrode coupling situation changes, thereby the mutual capacitance value changes, by the change of scan capture to capacitance, namely obtain touch location.The touch-screen that consists of take 4 lines, 4 alignments is as example, the electrode of line and alignment; Consist of respectively the two poles of the earth of Inductance and Capacitance, when the position of pixel 103 correspondences on the finger touch screen, near two electrode couplings the pixel 103 change, cause the variation of Inductance and Capacitance 105 values, 102 pairs of lines of driving circuit, also be that drive wire Drive Iine100 timesharing applies the driving signal successively, alignment also is that sense wire Sense Iine104 carries out sensing by column, sensing signal obtains the position coordinates of touch point by operational amplifier 106 and output by the variation that detects corresponding capacitance.
Need before the touch-screen formed product its electrical specification such as capacitance are tested, to guarantee product yield.May there be defective in capacitance plate device and capacitance plate control chip and cause the capacitance detecting value constant, and no matter no touch is namely arranged, and corresponding capacitance is fixed value or changes not obvious.But only can test its conducting and impedance after the present stage touch-screen ITO etching, and can't test sweep trace electric capacity.Therefore can only utilize mechanical arm simulation finger the mode of operation that actual persons is simulated in action such as to rule, get ready at product, reading out data and processing then, whether the judgement product is qualified.This method efficient is low and be subjected to external interference easily and produce error.
Also having a kind of measuring technology is mode by external capacitor, whether relatively output after the row operation of going forward side by side in parallel is processed respectively with coupling capacitance with sweep trace testing capacitance, an external tunable capacitor can be accepted by the scanning capacitance value of relatively judging of analysis result and preset threshold value.The method has increased extra cost and extendability shortcoming.
The application namely proposes a kind of capacitance touch screen defect inspection method efficient, that easily expand, and sweep trace electric capacity is detected.
Summary of the invention
Purpose of the present invention namely provides a kind of capacitance touch screen defect inspection method and adopts the capacitive touch screen architecture of the method in order to overcome the deficiencies in the prior art, can detect the capacitance profile of Projected capacitive touch screen, thereby further detect the touch-screen yield.
In the technical scheme of the present invention, a magnitude of voltage is set first drives successively all drive wire Drive Line, measure the mutual capacitance value between every drive wire Drive Line and the sense wire Sense Line, obtain the mutual capacitance value matrix as benchmark, change again the driving voltage value that is applied to drive wire Drive Line, drive successively all drive wires, again measure the mutual capacitance value between every drive wire Drive Line and the sense wire Sense Line, judge whether that according to the difference Changing Pattern between twice measured value defectiveness exists.I.e. variation with driving voltage causes the change that detects data, and judges defective according to this change.
Capacitance touch screen is because the opening circuit of various factors such as adjacent electrode, short circuit etc., can cause Inductance and Capacitance to have defective, thereby cause the capacitance detecting value can't correctly detect actual capacitance value, when changing such as capacitance, the Detection capacitance value is constant or almost constant, perhaps improper numerical value appears in detected value, as much larger than or much smaller than normal mutual capacitance value variation range, and twice measured value difference of qualified capacitance plate is controlled in the zone of reasonableness usually.Compare with the threshold value of presetting by the deviation with measurement result, can judge whether capacitance plate exists defective.
With respect to prior art, but the method setting program that the present invention proposes automatically control, have and measure accurately the advantages such as efficient height, favorable expandability.
Description of drawings
Fig. 1 is the signal of projected capacitive screen drive principle.
Fig. 2 is the difference tabulation of the capacitance plate of 6*6 twice mutual capacitance measured value when adopting different driving voltage.
Embodiment
The present invention is described in detail below in conjunction with specific embodiment.
Take the capacitance plate of 6*6 as example, C[x, y] for drive the capacitance measurement value matrix that obtains correspondence with initial driving voltage, C ' [x, y] is for driving the measurement capacitance that obtains correspondence, Δ C[x with new driving voltage after changing driving voltage, y]=C[x, y]-C ' [x, y], x is the electrode matrix row-coordinate, y is electrode matrix row coordinates, and Tx among Fig. 2, Rx are the pins after the circuit chip encapsulation, Tx is drive end, and Rx is sense terminals.For the mutual capacitance touchscreens of a N*M, N transmitting terminal Tx need to be arranged, link to each other with alignment (being sense wire) with the line (being drive wire) of electrode matrix respectively with M receiving end Rx.Twice measured value difference of qualified capacitance plate is controlled in the zone of reasonableness usually, and such as Thr1＜Δ Cxy＜Thr2, Thr1, Thr2 are threshold value, and its concrete numerical value is determined by practical experience and data processing method.In the test practice, can test short run touch-screen product first, measure difference DELTA Cxy and be considered as continuous random variable, its Normal Distribution is analyzed distribution curve, determines choosing of threshold value according to fiducial interval.If the capacitance measurement difference not in the threshold value scope, thinks then that corresponding capacitance can not accept, this deviation and other sweep trace deviations are compared, can provide the basis for subsequent technique improves.
In the method that the present invention proposes, the measurement that matrix is measured in mutual capacitance is not limited to 2 times, can measure n time in the practice, measures matrix to n time and carries out analysis-by-synthesis, thereby improve test accuracy.
This method can be applicable to existing capacitive touch screen architecture, it comprises capacitance touch screen, capacitance plate control circuit and corresponding connecting circuit, control circuit can comprise driving circuit and testing circuit, the driving voltage of the configurable different sizes of driving circuit, the capacitance plate control circuit can be independent chip, also can be integrated with the MCU of other electronic equipments, the quantity of capacitance plate control chip is not limited to 1, can expand according to demand, such as disposing a plurality of chips realization expansions for middle size or large-sized capacitance plate, to adapt to different demands.
Although take the capacitance plate of 6*6 as example, be not limited to the array of 6*6 in the present embodiment, the capacitance plate of shape such as N*M (M, N is natural number) form all can be with reference to the present embodiment examinations.The above only is preferred embodiment of the present invention, not in order to limiting the present invention, all any modifications of making within the spirit and principles in the present invention, is equal to and replaces and improvement etc., all should be included within protection scope of the present invention.
Claims (8)
1. the method for a capacitive touch screen architecture defects detection, described device comprises capacitance plate, the capacitance plate control chip, be provided with drive wire Drive Line and sense wire Sense Line that many intersections are placed on the described capacitance plate, it is characterized in that, a driving voltage value is set first drives successively all drive wires, obtain the mutual capacitance value two-dimensional matrix corresponding to mutual capacitance value between drive wire and the sense wire, change again driving voltage value, drive successively all drive wires, again measure the mutual capacitance value two-dimensional matrix that obtains corresponding to mutual capacitance value between every drive wire and the sense wire, judge according to the difference Changing Pattern of measuring between the matrix whether defectiveness exists corresponding capacitance.
2. the method for claim 1, it is characterized in that: described defective is the change that the Detection capacitance value can't correctly detect capacitance.
3. method as claimed in claim 1 or 2 is characterized in that: the difference of the mutual capacitance value two-dimensional matrix that twice measurement obtained compares with default threshold value, if difference not in the threshold value scope, illustrates that there is defective in corresponding electric capacity.
4. method as claimed in claim 1 or 2, it is characterized in that: the measurement of described mutual capacitance value two-dimensional matrix can be n time, n＞2.
5. method as claimed in claim 1 or 2, it is characterized in that: described capacitance plate control chip comprises driving circuit and the testing circuit of configurable driving voltage, and described driving circuit has adjustable driving voltage.
6. method as claimed in claim 5, it is characterized in that: the number of described capacitance plate control chip can be more than 1, to adapt to the demand of different size capacitance plate.
7. method as claimed in claim 5, it is characterized in that: described capacitance plate control chip can also integrate with MCU.
8. method as claimed in claim 1 or 2 is characterized in that: described change driving voltage comprises boosted voltage or reduces voltage.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201210312661.9A CN102981686B (en) | 2012-08-29 | 2012-08-29 | A kind of method of capacitive touch screen architecture defects detection |
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| CN201210312661.9A CN102981686B (en) | 2012-08-29 | 2012-08-29 | A kind of method of capacitive touch screen architecture defects detection |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104238849A (en) * | 2013-06-07 | 2014-12-24 | 日本电产理德株式会社 | Checking device, checking device correcting method and checking method thereof |
| CN105224149A (en) * | 2014-06-06 | 2016-01-06 | 敦泰科技有限公司 | A kind of method for detecting capacitive touch screen |
| CN106707575A (en) * | 2017-03-20 | 2017-05-24 | 厦门天马微电子有限公司 | Liquid crystal display panel testing circuit, liquid crystal display panel and testing method thereof |
| CN106971137A (en) * | 2016-06-15 | 2017-07-21 | 深圳信炜科技有限公司 | The detection means of fingerprint sensor, fingerprint sensor, electronic equipment |
| CN109684734A (en) * | 2018-12-26 | 2019-04-26 | 北京华大九天软件有限公司 | A kind of method of inspection model matrix |
| CN112241225A (en) * | 2014-12-01 | 2021-01-19 | 赛普拉斯半导体公司 | Systems, methods, and devices for touch event and hover event detection |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101958090A (en) * | 2009-07-21 | 2011-01-26 | 上海天马微电子有限公司 | Touch detection circuit and method |
| US20110050620A1 (en) * | 2009-09-01 | 2011-03-03 | Qrg Limited Level 1 | Methods and apparatuses to test the functionality of capacitive sensors |
-
2012
- 2012-08-29 CN CN201210312661.9A patent/CN102981686B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101958090A (en) * | 2009-07-21 | 2011-01-26 | 上海天马微电子有限公司 | Touch detection circuit and method |
| US20110050620A1 (en) * | 2009-09-01 | 2011-03-03 | Qrg Limited Level 1 | Methods and apparatuses to test the functionality of capacitive sensors |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104238849A (en) * | 2013-06-07 | 2014-12-24 | 日本电产理德株式会社 | Checking device, checking device correcting method and checking method thereof |
| CN104238849B (en) * | 2013-06-07 | 2018-07-03 | 日本电产理德株式会社 | Check device, the bearing calibration of check device and inspection method |
| CN105224149A (en) * | 2014-06-06 | 2016-01-06 | 敦泰科技有限公司 | A kind of method for detecting capacitive touch screen |
| CN105224149B (en) * | 2014-06-06 | 2018-02-16 | 敦泰科技有限公司 | A kind of method for detecting capacitive touch screen |
| CN112241225A (en) * | 2014-12-01 | 2021-01-19 | 赛普拉斯半导体公司 | Systems, methods, and devices for touch event and hover event detection |
| CN106971137A (en) * | 2016-06-15 | 2017-07-21 | 深圳信炜科技有限公司 | The detection means of fingerprint sensor, fingerprint sensor, electronic equipment |
| CN106971137B (en) * | 2016-06-15 | 2024-01-12 | 柳州梓博科技有限公司 | Detection device of fingerprint sensor, fingerprint sensor and electronic equipment |
| CN106707575A (en) * | 2017-03-20 | 2017-05-24 | 厦门天马微电子有限公司 | Liquid crystal display panel testing circuit, liquid crystal display panel and testing method thereof |
| CN106707575B (en) * | 2017-03-20 | 2020-03-10 | 厦门天马微电子有限公司 | Liquid crystal display panel and test method thereof |
| CN109684734A (en) * | 2018-12-26 | 2019-04-26 | 北京华大九天软件有限公司 | A kind of method of inspection model matrix |
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| CN102981686B (en) | 2015-11-25 |
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Address after: No. 2, Jingyuan North Street, Beijing Economic and Technological Development Zone, 100176 Patentee after: CHIPONE TECHNOLOGY (BEIJING) Co.,Ltd. Address before: 100088 13th Floor, Building No. 4, 31 North Third Ring Road, Haidian District, Beijing (Taist Building) Patentee before: CHIPONE TECHNOLOGY(BEIJING) Co.,Ltd. |
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