CN104282248A - Array substrate, testing method thereof, displaying panel and displaying device - Google Patents
Array substrate, testing method thereof, displaying panel and displaying device Download PDFInfo
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- CN104282248A CN104282248A CN201410510232.1A CN201410510232A CN104282248A CN 104282248 A CN104282248 A CN 104282248A CN 201410510232 A CN201410510232 A CN 201410510232A CN 104282248 A CN104282248 A CN 104282248A
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Abstract
The invention provides an array substrate, a testing method thereof, a displaying panel and a displaying device and belongs to the field of liquid crystal displaying. At least one test pixel is arranged outside the displaying zone of the array substrate. The test pixel receives test signals through a first signal wire arranged on the array substrate and sends the received test signals to a test point placed at a peripheral circuit zone through a second signal wire arranged on the array substrate. According to the technical scheme, under the premise that the displaying panel is not damaged, the damping situations of data signals and scanning signals of the displaying panel are measured accurately.
Description
Technical field
The present invention relates to field of liquid crystal display, refer to a kind of array base palte and method of testing, display panel, display device especially.
Background technology
At present along with the development of lcd technology, high-frequency, large scale become the mainstream development direction of liquid crystal display.But, along with the continuous increase of liquid crystal panel size and the continuous lifting of resolution, the load of display panels constantly increases the weight of, the sweep signal and data-signal that cause display panels are decayed serious, thus have impact on the performance of liquid crystal display product, therefore, it is extremely important that testing and analysis is carried out in the sweep signal decay caused display panels load and data-signal decay.
Because sweep signal transmits on the grid line of array base palte, data-signal transmits on the data line of array base palte, therefore in the existing method that liquid crystal display product is tested, in order to the signal that on array base palte, data line or grid line transmit can be detected, usually liquid crystal display product is needed to carry out corner cut process, remove the color membrane substrates of liquid crystal display product afterwards, signal testing is carried out with the data line on probes touch array base palte or grid line after cleaning, test process is complicated, and destroys the time of day of liquid crystal display product.
Summary of the invention
The technical problem to be solved in the present invention is to provide a kind of array base palte and method of testing, display panel, display device, under can be implemented in the prerequisite not destroying display panel, measures the data-signal of display panel and the attenuation of sweep signal exactly.
For solving the problems of the technologies described above, embodiments of the invention provide technical scheme as follows:
On the one hand, a kind of array base palte is provided, the viewing area of described array base palte is outside equipped with at least one test pixel, described test pixel receives signal to be tested by the first signal wire that array base palte is arranged, and by the secondary signal line that array base palte is arranged, the signal to be tested received is sent to the test point being positioned at peripheral circuit region.
Further, described test pixel region is provided with via hole, and the grid line corresponding to described test pixel is connected with the data line corresponding to described test pixel by described via hole.
Further, grid line arrangement in a row on described array base palte, described test pixel comprises the sweep signal test pixel be positioned at after last row pixel of described array base palte viewing area, described sweep signal test pixel receives the sweep signal that corresponding grid line transmits, and by respective data lines, the sweep signal received is sent to the sweep signal attenuation test point being positioned at peripheral circuit region.
Further, data line arrayed in columns on described array base palte, described test pixel comprises the data-signal test pixel be positioned at after last column pixel of described array base palte viewing area, described data-signal test pixel receives the data-signal that respective data lines is transmitted, and by corresponding grid line, the data-signal received is sent to the data-signal attenuation test point being positioned at peripheral circuit region.
The embodiment of the present invention additionally provides a kind of method of testing of array base palte, and the viewing area of described array base palte is outside equipped with at least one test pixel, and described method of testing comprises:
By the first signal wire that array base palte is arranged, signal to be tested is sent to described test pixel, and by the secondary signal line that array base palte is arranged, described signal to be tested is sent to the test point being positioned at peripheral circuit region by described test pixel;
In described test point, described signal to be tested is measured.
Further, described test pixel region is provided with via hole, and the grid line corresponding to described test pixel is connected with the data line corresponding to described test pixel by described via hole.
Further, described signal to be tested is sweep signal, by the first signal wire that array base palte is arranged, signal to be tested is sent to described test pixel, and by the secondary signal line that array base palte is arranged, described signal to be tested is sent to the test point being positioned at peripheral circuit region by described test pixel and comprises:
By the grid line corresponding to described test pixel, described sweep signal is sent to described test pixel, and by the data line corresponding to described test pixel, described sweep signal is sent to the sweep signal attenuation test point being positioned at peripheral circuit region.
Further, described signal to be tested is data-signal, by the first signal wire that array base palte is arranged, signal to be tested is sent to described test pixel, and by the secondary signal line that array base palte is arranged, described signal to be tested is sent to the test point being positioned at peripheral circuit region by described test pixel and comprises:
By the data line corresponding to described test pixel, described data-signal is sent to described test pixel, and by the grid line corresponding to described test pixel, described data-signal is sent to the data-signal attenuation test point being positioned at peripheral circuit region.
The embodiment of the present invention additionally provides a kind of display panel, comprises above-mentioned array base palte, also comprises the color membrane substrates be oppositely arranged with described array base palte.
The embodiment of the present invention additionally provides a kind of display device, comprises above-mentioned display panel, also comprises the peripheral circuit region be arranged on outside described display panel, and described peripheral circuit region is provided with the test point treated test signal and carry out measuring.
Further, described test pixel comprises the data-signal test pixel be positioned at after last column pixel of described array base palte viewing area, described test point comprises the data-signal test point be arranged on sweep signal flexible PCB, and described data-signal test point is connected with data-signal test pixel by grid line.
Further, described test pixel comprises the sweep signal test pixel be positioned at after last row pixel of described array base palte viewing area, described test point comprises the sweep signal test point be arranged on data-signal flexible PCB, and described sweep signal test point is connected with sweep signal test pixel by data line; Or
Described test point comprises the sweep signal test point be arranged on data-signal printed circuit board (PCB), and described sweep signal test point is connected with sweep signal test pixel by data line.
Further, described peripheral circuit region is provided with warning circuit, for monitoring the measurement result that described test point obtains, and in described measurement result lower than output alarm signal during preset value.
Embodiments of the invention have following beneficial effect:
In such scheme, the test pixel for test signal is outside equipped with in the viewing area of array base palte, this test pixel does not affect display, the signal to be tested that simultaneously can will array base palte transmit, such as data-signal or sweep signal are sent to the test point of peripheral circuit region, like this when not destroying display panel, the data-signal that just can real-time testing array base palte be transmitted by the test point that is arranged on peripheral circuit region or the attenuation of sweep signal.
Accompanying drawing explanation
Fig. 1 is the structural representation of embodiment of the present invention display panel;
Fig. 2 is the structural representation of " A " pixel in the embodiment of the present invention;
Fig. 3 is the structural representation of " B " pixel in the embodiment of the present invention;
Fig. 4 is the schematic diagram that the embodiment of the present invention is tested sweep signal;
Fig. 5 is the schematic diagram that the embodiment of the present invention is tested data-signal.
Reference numeral
1 sweep signal attenuation test point
2 data-signal attenuation test points
3 printed circuit board (PCB)s
4 data-signal flexible PCBs
5 sweep signal flexible PCBs
6 via holes
Embodiment
For embodiments of the invention will be solved technical matters, technical scheme and advantage clearly, be described in detail below in conjunction with the accompanying drawings and the specific embodiments.
The process that embodiments of the invention are decayed for the sweep signal caused display panels load in prior art and data-signal is decayed to be tested is complicated, and destroy the problem of the time of day of liquid crystal display product, a kind of array base palte and method of testing, display panel, display device are provided, under can be implemented in the prerequisite not destroying display panel, measure the data-signal of display panel and the attenuation of sweep signal exactly.
Embodiments provide a kind of array base palte, the viewing area of this array base palte is outside equipped with at least one test pixel, described test pixel receives signal to be tested by the first signal wire that array base palte is arranged, and by the secondary signal line that array base palte is arranged, the signal to be tested received is sent to the test point being positioned at peripheral circuit region.
Technical scheme of the present invention is outside equipped with the test pixel for test signal in the viewing area of array base palte, this test pixel does not affect display, the signal to be tested that simultaneously can will array base palte transmit, such as data-signal or sweep signal are sent to the test point of peripheral circuit region, like this when not destroying display panel, the data-signal that just can real-time testing array base palte be transmitted by the test point that is arranged on peripheral circuit region or the attenuation of sweep signal.
Particularly, described test pixel region is provided with via hole, and the grid line corresponding to described test pixel is connected with the data line corresponding to described test pixel by described via hole.
Further, grid line arrangement in a row on described array base palte, described test pixel comprises the sweep signal test pixel be positioned at after last row pixel of described array base palte viewing area, described sweep signal test pixel receives the sweep signal that corresponding grid line transmits, and by respective data lines, the sweep signal received is sent to the sweep signal attenuation test point being positioned at peripheral circuit region.
Further, data line arrayed in columns on described array base palte, data line arrayed in columns on described array base palte, described test pixel comprises the data-signal test pixel be positioned at after last column pixel of described array base palte viewing area, described data-signal test pixel receives the data-signal that respective data lines is transmitted, and by corresponding grid line, the data-signal received is sent to the data-signal attenuation test point being positioned at peripheral circuit region.
The embodiment of the present invention additionally provides a kind of method of testing of array base palte, and the viewing area of described array base palte is outside equipped with at least one test pixel, and described method of testing comprises:
By the first signal wire that array base palte is arranged, signal to be tested is sent to described test pixel, and by the secondary signal line that array base palte is arranged, described signal to be tested is sent to the test point being positioned at peripheral circuit region by described test pixel;
In described test point, described signal to be tested is measured.
Technical scheme of the present invention can treat test signal by the test point being positioned at peripheral circuit region, such as sweep signal or data-signal are measured, so just can when not destroying display panel, the data-signal that real-time testing array base palte transmits or the attenuation of sweep signal.
Further, described test pixel region is provided with via hole, and the grid line corresponding to described test pixel is connected with the data line corresponding to described test pixel by described via hole.
Further, described signal to be tested is sweep signal, by the first signal wire that array base palte is arranged, signal to be tested is sent to described test pixel, and by the secondary signal line that array base palte is arranged, described signal to be tested is sent to the test point being positioned at peripheral circuit region by described test pixel and comprises:
By the grid line corresponding to described test pixel, described sweep signal is sent to described test pixel, and by the data line corresponding to described test pixel, described sweep signal is sent to the sweep signal attenuation test point being positioned at peripheral circuit region.
Further, described signal to be tested is data-signal, by the first signal wire that array base palte is arranged, signal to be tested is sent to described test pixel, and by the secondary signal line that array base palte is arranged, described signal to be tested is sent to the test point being positioned at peripheral circuit region by described test pixel and comprises:
By the data line corresponding to described test pixel, described data-signal is sent to described test pixel, and by the grid line corresponding to described test pixel, described data-signal is sent to the data-signal attenuation test point being positioned at peripheral circuit region.
The embodiment of the present invention additionally provides a kind of display panel, comprises array base palte as above, also comprises the color membrane substrates be oppositely arranged with described array base palte.
The embodiment of the present invention additionally provides a kind of display device, comprises display panel as above, also comprises the peripheral circuit region be arranged on outside described display panel, and described peripheral circuit region is provided with the test point treated test signal and carry out measuring.Described display device can be: any product or parts with Presentation Function such as liquid crystal panel, LCD TV, liquid crystal display, digital album (digital photo frame), mobile phone, panel computer.
Further, in described display device, described test pixel comprises the data-signal test pixel be positioned at after last column pixel of described array base palte viewing area, described test point comprises the data-signal test point be arranged on sweep signal flexible PCB, and described data-signal test point is connected with data-signal test pixel by grid line.
Further, in described display device, described test pixel comprises the sweep signal test pixel be positioned at after last row pixel of described array base palte viewing area, described test point comprises the sweep signal test point be arranged on data-signal flexible PCB, and described sweep signal test point is connected with sweep signal test pixel by data line; Or
Described test point comprises the sweep signal test point be arranged on data-signal printed circuit board (PCB), and described sweep signal test point is connected with sweep signal test pixel by data line.
Further, in described display device, described peripheral circuit region is also provided with warning circuit, for monitoring the measurement result that described test point obtains, and in described measurement result lower than output alarm signal during preset value.Such user, according to this alerting signal, can know the sweep signal of display device or the attenuation of data-signal easily.
Below in conjunction with accompanying drawing and specific embodiment, array base palte of the present invention and method of testing thereof are described in detail:
The array base palte of the present embodiment is provided with two kinds of pixels: be used for the display pixel carrying out showing, i.e. " A " pixel; Be used for the test pixel of test point signal to be tested being sent to peripheral circuit region, i.e. " B " pixel.Different from " A " pixel, " B " pixel is arranged on outside viewing area, does not affect display, and as shown in Figures 2 and 3, different from " A " pixel, " B " pixel region is provided with via hole 6, and the grid line corresponding to " B " pixel is connected with the data line corresponding to test pixel by via hole 6.The method of testing of the array base palte of the present embodiment is as follows:
(1) test of sweep signal:
On the array base palte of the present embodiment, grid line arrangement in a row, as shown in Figure 4, the Gate-COF of sweep signal on the left of array base palte (sweep signal flexible PCB) exports, be input in the grid line of arrangement in a row on array base palte, when sweep signal transmits by grid line the low order end arriving viewing area, sweep signal arrives test pixel " B " region, and arrive the data line corresponding to test pixel " B " by via hole, this data line moves towards identical with the data line in normal viewing area, such sweep signal arrives the connecting line (as Fig. 4 dotted portion) in fan section by the data line of the corresponding pixel of test pixel " B ", and access in the control signal adhesion zone of Source-COF (data-signal flexible PCB) 4 by the connecting line in fan section, be linked into the sweep signal attenuation test point 1 that printed circuit board (PCB) 3 is arranged afterwards, further, sweep signal attenuation test point 1 can also be set directly on data-signal flexible PCB 4.When measuring sweep signal, outside measuring equipment just can measure the attenuation of sweep signal in real time by probes touch sweep signal attenuation test point 1.
It is roughly the same that sweep signal due to every row grid line transmits situation, therefore, test pixel can be set in each provisional capital, can only wherein a line test pixel is set, as long as after ensureing that test pixel is positioned at last display pixel of this row, can ensure that measurement result embodies the final attenuation of this line scan signals like this.
(2) test of data-signal:
On the array base palte of the present embodiment, data line arrayed in columns, as shown in Figure 5, the data-signal flexible PCB of data-signal on the upside of array base palte exports, be input in the data line of arrayed in columns on array base palte, when data-signal by data line transmit arrive viewing area bottom time, sweep signal arrives test pixel " B ", and arrive the grid line corresponding to test pixel " B " by via hole, grid line in this grid line and normal viewing area move towards identical, such sweep signal arrives the connecting line (as Fig. 5 dotted portion) in fan section by the grid line corresponding with test pixel " B ", and the data-signal attenuation test point 2 by the connecting line access sweep signal flexible PCB 5 in fan section is arranged.When measuring data-signal, outside measuring equipment just can the attenuation of real-time measuring data signal by probes touch data-signal attenuation test point 2.
It is roughly the same that data-signal due to every column data line transmits situation, therefore, at each row, all test pixel can be set, can only wherein one row test pixel is set, as long as after ensureing that test pixel is positioned at last display pixel of these row, can ensure that measurement result embodies the final attenuation of this column data signal like this.
After measurement obtains the attenuation of sweep signal or data-signal, can using measurement result as feedback signal, carried out amplification and the compensation of sweep signal or data-signal by IC (integrated circuit), thus improve the picture quality of display panel further.
Technical scheme of the present invention is by making test pixel, and the grid line corresponding to test pixel and corresponding data line are realized being electrically connected, thus signal to be tested can be led to flexible PCB or printed circuit board (PCB), when not destroying display panel, the data-signal that just can real-time testing array base palte be transmitted by the test point that is arranged on peripheral circuit region or the attenuation of sweep signal.
The above is the preferred embodiment of the present invention; it should be pointed out that for those skilled in the art, under the prerequisite not departing from principle of the present invention; can also make some improvements and modifications, these improvements and modifications also should be considered as protection scope of the present invention.
Claims (13)
1. an array base palte, it is characterized in that, the viewing area of described array base palte is outside equipped with at least one test pixel, described test pixel receives signal to be tested by the first signal wire that array base palte is arranged, and by the secondary signal line that array base palte is arranged, the signal to be tested received is sent to the test point being positioned at peripheral circuit region.
2. array base palte according to claim 1, is characterized in that, described test pixel region is provided with via hole, and the grid line corresponding to described test pixel is connected with the data line corresponding to described test pixel by described via hole.
3. array base palte according to claim 2, it is characterized in that, grid line arrangement in a row on described array base palte, described test pixel comprises the sweep signal test pixel be positioned at after last row pixel of described array base palte viewing area, described sweep signal test pixel receives the sweep signal that corresponding grid line transmits, and by respective data lines, the sweep signal received is sent to the sweep signal attenuation test point being positioned at peripheral circuit region.
4. array base palte according to claim 2, it is characterized in that, data line arrayed in columns on described array base palte, described test pixel comprises the data-signal test pixel be positioned at after last column pixel of described array base palte viewing area, described data-signal test pixel receives the data-signal that respective data lines is transmitted, and by corresponding grid line, the data-signal received is sent to the data-signal attenuation test point being positioned at peripheral circuit region.
5. a method of testing for array base palte, is characterized in that, the viewing area of described array base palte is outside equipped with at least one test pixel, and described method of testing comprises:
By the first signal wire that array base palte is arranged, signal to be tested is sent to described test pixel, and by the secondary signal line that array base palte is arranged, described signal to be tested is sent to the test point being positioned at peripheral circuit region by described test pixel;
In described test point, described signal to be tested is measured.
6. the method for testing of array base palte according to claim 5, is characterized in that,
Described test pixel region is provided with via hole, and the grid line corresponding to described test pixel is connected with the data line corresponding to described test pixel by described via hole.
7. the method for testing of array base palte according to claim 6, is characterized in that,
Described signal to be tested is sweep signal, by the first signal wire that array base palte is arranged, signal to be tested is sent to described test pixel, and by the secondary signal line that array base palte is arranged, described signal to be tested is sent to the test point being positioned at peripheral circuit region by described test pixel and comprises:
By the grid line corresponding to described test pixel, described sweep signal is sent to described test pixel, and by the data line corresponding to described test pixel, described sweep signal is sent to the sweep signal attenuation test point being positioned at peripheral circuit region.
8. the method for testing of array base palte according to claim 6, is characterized in that,
Described signal to be tested is data-signal, by the first signal wire that array base palte is arranged, signal to be tested is sent to described test pixel, and by the secondary signal line that array base palte is arranged, described signal to be tested is sent to the test point being positioned at peripheral circuit region by described test pixel and comprises:
By the data line corresponding to described test pixel, described data-signal is sent to described test pixel, and by the grid line corresponding to described test pixel, described data-signal is sent to the data-signal attenuation test point being positioned at peripheral circuit region.
9. a display panel, is characterized in that, comprises the array base palte according to any one of claim 1-4, also comprises the color membrane substrates be oppositely arranged with described array base palte.
10. a display device, is characterized in that, comprises display panel as claimed in claim 9, also comprises the peripheral circuit region be arranged on outside described display panel, and described peripheral circuit region is provided with the test point treated test signal and carry out measuring.
11. display device according to claim 10, it is characterized in that, described test pixel comprises the data-signal test pixel be positioned at after last column pixel of described array base palte viewing area, described test point comprises the data-signal test point be arranged on sweep signal flexible PCB, and described data-signal test point is connected with data-signal test pixel by grid line.
12. display device according to claim 10, it is characterized in that, described test pixel comprises the sweep signal test pixel be positioned at after last row pixel of described array base palte viewing area, described test point comprises the sweep signal test point be arranged on data-signal flexible PCB, and described sweep signal test point is connected with sweep signal test pixel by data line; Or
Described test point comprises the sweep signal test point be arranged on data-signal printed circuit board (PCB), and described sweep signal test point is connected with sweep signal test pixel by data line.
13. display device according to claim 10, is characterized in that, described peripheral circuit region is provided with warning circuit, for monitoring the measurement result that described test point obtains, and in described measurement result lower than output alarm signal during preset value.
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| CN201410510232.1A CN104282248B (en) | 2014-09-28 | 2014-09-28 | Array substrate, testing method thereof, displaying panel and displaying device |
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| CN107728364A (en) * | 2017-10-27 | 2018-02-23 | 合肥鑫晟光电科技有限公司 | Array base palte and its manufacture method, display device |
| CN108877616A (en) * | 2018-08-16 | 2018-11-23 | 深圳市华星光电半导体显示技术有限公司 | A kind of test method and display panel of array substrate driving circuit |
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| CN107728364A (en) * | 2017-10-27 | 2018-02-23 | 合肥鑫晟光电科技有限公司 | Array base palte and its manufacture method, display device |
| CN107728364B (en) * | 2017-10-27 | 2020-06-12 | 合肥鑫晟光电科技有限公司 | Array substrate, manufacturing method thereof and display device |
| CN108877616A (en) * | 2018-08-16 | 2018-11-23 | 深圳市华星光电半导体显示技术有限公司 | A kind of test method and display panel of array substrate driving circuit |
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| CN104282248B (en) | 2017-01-25 |
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