CN104101743B - The method of probe, line detection apparatus and detection circuit - Google Patents
The method of probe, line detection apparatus and detection circuit Download PDFInfo
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- CN104101743B CN104101743B CN201410338684.6A CN201410338684A CN104101743B CN 104101743 B CN104101743 B CN 104101743B CN 201410338684 A CN201410338684 A CN 201410338684A CN 104101743 B CN104101743 B CN 104101743B
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- probe
- switch
- circuit
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- display floater
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- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The present invention provides a kind of method of probe, line detection apparatus and detection circuit, the probe, including probe, wherein, the probe also includes first switch, and the probe is grounded by the first switch.The present invention is compared to existing technology in the bad particular location of searching LCDs point, line, simplify step, and need not carry out recalling by software, the process such as labelling, bad circuit can be quickly found, the detection efficiency of the bad circuit of display floater is improved.By probe is connected with signal source or power supply, the present invention can be additionally used in the verification and testing of local circuit performance.
Description
Technical field
The present invention relates to display field, more particularly to a kind of method of probe, line detection apparatus and detection circuit.
Background technology
Liquid crystal display has small volume, low in energy consumption, the low advantage of radiation, is widely used to computer monitor, notes
The equipment such as this computer, mobile phone and LCD TV.
Liquid crystal display is mainly made up of color membrane substrates, array base palte and liquid crystal between the two, wherein, array base palte is needed
Complicated technological process manufacture is passed through, signal line thereon easily forms open circuit and short circuit phenomenon (can so cause to include
The bad phenomenon such as the bad and line of point is bad), detect the open circuit and short circuit of circuit on substrate and carry out maintenance and can improve product
Yield.At present, in the detection process of bad circuit, it is necessary first to obtain the position of bad circuit, conventional method is to pass through
Software shows " ten " spirte on tested display floater, then moves " ten " word figure and the bad viewing area on display floater
Domain overlaps, so as to obtain the position (sequence number of data wire or grid line) of bad circuit, then according to the bad circuit position for obtaining
Put and corresponding circuit is found out on tested display floater by microscope, and the COF being connected with the circuit is traced back to along the circuit
On (Chip on film, cover thin film chip), make marks, the letter on the circuit is detected finally according to the labelling and by probe
Number.
However, above-mentioned bad wireline inspection procedure is loaded down with trivial details, and operates more difficulty, it is unfavorable for improving wireline inspection
Efficiency.
The content of the invention
(1) technical problem to be solved
The technical problem to be solved in the present invention is to provide a kind of method of probe, line detection apparatus and detection circuit, energy
The detection efficiency of bad circuit in display floater is improved enough.
(2) technical scheme
To solve above-mentioned technical problem, technical scheme provides a kind of probe, including probe, wherein, it is described
Probe also includes first switch, and the probe is grounded by the first switch.
To solve above-mentioned technical problem, present invention also offers a kind of line detection apparatus, including oscillograph and as weighed
Profit requires the probe described in 1.
Further, also including second switch and signal input module, the signal input module is opened by described second
Pass is connected with the probe.
Further, also including the 3rd switch and control source module, the control source module is opened by the described 3rd
Pass is connected with the probe.
To solve above-mentioned technical problem, present invention also offers a kind of method that above-mentioned line detection apparatus detect circuit,
Characterized in that, including：
The output probe being placed in the tested display floater in the case where tested display floater is powered is drawn
On line；
First switch closure is controlled so that the panel zone corresponding to the output lead that contacted with the probe is carried out
It is particularly shown；
The movement probe is so that the region being particularly shown is mutually overlap with the bad viewing area in the display floater
Close；
Disconnect the first switch to detect the corresponding bad circuit in the bad viewing area.
Further, carrying out detection to the corresponding bad circuit in the bad viewing area includes：To the bad circuit
Impedance measure.
Further, the output lead is the output lead of COF in the tested display floater.
(3) beneficial effect
The present invention when the particular location of bad circuit is found, simplifies step, and need not lead to compared to existing technology
Cross software carry out recalling, the process such as labelling, bad circuit can be quickly found, the detection effect of the bad circuit of display floater is improved
Rate.
Description of the drawings
Fig. 1 is a kind of schematic diagram of probe that embodiment of the present invention is provided；
Fig. 2 is that embodiment of the present invention provides a kind of schematic diagram of line detection apparatus；
Fig. 3 is the schematic diagram of another kind of line detection apparatus that embodiment of the present invention is provided.
Specific embodiment
With reference to the accompanying drawings and examples, the specific embodiment of the present invention is described in further detail.Hereinafter implement
Example is for illustrating the present invention, but is not limited to the scope of the present invention.
Fig. 1 is a kind of schematic diagram of probe that embodiment of the present invention is provided, and the probe includes probe 1 and first switch 2,
Wherein, probe 1 is grounded by the first switch 2.
The probe that embodiment of the present invention is provided is used for oscillograph, can pass through the probe and detect the bad of tested display floater
Circuit, specifically, first, connects the power supply of tested display floater, probe is placed on the output lead in tested display floater
On, for example, the approximate location that can first pass through the tested display floater defective region of perusal (bad viewing area can be in display
Panel is observed by the naked eye in the case of switching on power), further determine what bad circuit was connected according to the approximate location
COF, is then placed on the probe on arbitrary output lead of the COF, first switch is closed and causes probe ground connection, with probe
The voltage of the circuit for contacting is zero, and then it is abnormal so as to enter that the panel zone corresponding to the circuit being connected with probe is shown
Row is particularly shown (for example, for TN panels can then show a bright line), mobile spy between multiple output leads of COF
Pin, so that the region being particularly shown is coincided with the bad viewing area on display floater, then can determine whether that current probe is touched
Output lead be the corresponding circuit in bad viewing area, then by first switch disconnect so that letter of the oscillograph to bad circuit
Number waveform is caught, compared to existing technology in wireline inspection method, present embodiment finding the concrete position of bad circuit
When putting, simplify step, and need not carry out recalling by software, the process such as labelling, by the movement probe, directly look for
To the particular location of bad circuit, which is simple to operate, when wireline inspection is carried out, it is possible to increase the inspection of the bad circuit of display floater
Survey efficiency.
Referring to Fig. 2, Fig. 2 be embodiment of the present invention provide a kind of line detection apparatus structure chart, the wireline inspection
Device includes oscillograph 3 and probe, and the probe includes probe 1 and first switch 2, wherein, probe 1 is by the first switch
2 ground connection.
Preferably, the present invention is can be also used in the performance test of common line plate.The feature of certain circuit is tested such as
Impedance, or with the present invention one pop one's head in point to certain input signal, and with another probe test another point
Response signal.At this moment we just can easily see the comparison waveform of pumping signal and response signal.Specifically, referring to figure
3, Fig. 3 is the structure chart of another kind of line detection apparatus that embodiment of the present invention is provided, and the line detection apparatus include oscillography
Device 3 and probe, the probe include probe 1 and first switch 2, wherein, probe 1 is grounded by the first switch 2, the circuit
Detection means also includes second switch 4, the switch 6, control source module 7 of signal input module the 5, the 3rd；
The signal input module 5 is connected with the probe 1 by the second switch 4, for being input into the probe
Pumping signal, on oscillograph, another probe is used to receive response signal.Thus, just easily can see pumping signal and/or
The comparison waveform of response signal.The control source module 7 is connected with the probe 1 by the 3rd switch 6, for the spy
Pin is input into default voltage.
Wherein, for above-mentioned line detection apparatus, first switch therein, second switch and the 3rd switch can be adopted
Switch switch to realize, specifically, switch switching and be connected with probe, signal input module and control source module respectively,
During user's use, can by switch on-off control probe ground connection pattern and signal input module connect pattern and
Control source module connect pattern, Disconnected mode (disconnecting with ground, signal input module and control source module) it
Between switch.
In addition to aforesaid way, can so that an interface is arranged on probe, for example can be socket, using in user
Cheng Zhong, made by the way of plug one of the socket and ground wire, signal input module and control source module be connected or with
Above-mentioned three is not attached to, and connects pattern and control source module in ground connection pattern and signal input module so as to control probe
Switch between connection pattern, Disconnected mode.
Additionally, embodiment of the present invention additionally provides the method that above-mentioned line detection apparatus detect circuit, including：
S1：The output probe being placed in the case where tested display floater is powered in the tested display floater
On lead；For example, the output lead can be the output lead of COF in tested display floater, specifically, first, connect tested
The power supply of display floater, and (bad viewing area can be to observe by the naked eye the approximate location of tested display floater defective region
Display floater is observed by the naked eye in the case of switching on power), the COF that bad circuit is connected is determined according to the approximate location,
Then the probe is placed on arbitrary output lead of the COF；
S2：First switch closure is controlled so that the panel zone corresponding to the output lead that contacted with the probe is entered
Row is particularly shown；By first switch close cause probe ground connection, the voltage of the circuit contacted with probe is zero, so cause with
The panel zone corresponding to circuit that probe is connected shows abnormal so as to be particularly shown, for example, for TN panels can then show
Show a bright line；
S3：The mobile probe is so that bad viewing area phase in the region being particularly shown and the display floater
Overlap；Mobile probe between multiple output leads of COF, so that bad aobvious on the region being particularly shown and display floater
Show that region coincides, then can determine whether that the output lead that current probe is touched is the corresponding circuit in bad viewing area；
S4：Disconnect the first switch to detect the corresponding bad circuit in the bad viewing area；When specific
After bad viewing area on the region of display and display floater coincides, then the output lead that current probe is touched is can determine whether
For the corresponding circuit in bad viewing area, first switch is disconnected so that oscillograph is caught to the signal waveform of bad circuit
Catch.Further, it is also possible to use probe of the present invention, the test of various wiring board Local Properties is carried out.
Embodiment of the present invention provide detection circuit method compared to existing technology in wireline inspection method, find not
During the particular location of good circuit, simplify step, and need not carry out recalling by software, the process such as labelling, by movement
Probe, directly finds the particular location of bad circuit, and which is simple to operate, when wireline inspection is carried out, it is possible to increase display floater
The detection efficiency of bad circuit.
Embodiment of above is merely to illustrate the present invention, and not limitation of the present invention, about the common of technical field
Technical staff, without departing from the spirit and scope of the present invention, can also make a variety of changes and modification, therefore all
The technical scheme of equivalent falls within scope of the invention, and the scope of patent protection of the present invention should be defined by the claims.
Claims (5)
1. a kind of method that line detection apparatus detect circuit, it is characterised in that the line detection apparatus include oscillograph with
And pop one's head in, the probe includes probe, and the probe also includes first switch, and the probe is grounded by the first switch,
By the first switch is disconnected so that the oscillograph is caught to the signal waveform of bad circuit；Methods described bag
Include：
The probe is placed on the output lead in the tested display floater in the case where tested display floater is powered；
Control first switch closure so that the panel zone corresponding to the output lead that contacts with the probe carry out it is specific
Show；
The movement probe is so that the region being particularly shown is coincided with the bad viewing area in the display floater；
Disconnect the first switch to detect the corresponding bad circuit in the bad viewing area.
2. method according to claim 1, it is characterised in that the corresponding bad circuit in the bad viewing area is carried out
Detection includes：Impedance to the bad circuit is measured.
3. method according to claim 1 and 2, it is characterised in that during the output lead is the tested display floater
The output lead of COF.
4. method according to claim 1, it is characterised in that the line detection apparatus also include second switch and signal
Input module, the signal input module are connected with the probe by the second switch.
5. method according to claim 1, it is characterised in that the line detection apparatus are also including the 3rd switch and voltage
Input module, the control source module are connected with the probe by the described 3rd switch.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410338684.6A CN104101743B (en) | 2014-07-16 | 2014-07-16 | The method of probe, line detection apparatus and detection circuit |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410338684.6A CN104101743B (en) | 2014-07-16 | 2014-07-16 | The method of probe, line detection apparatus and detection circuit |
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| Publication Number | Publication Date |
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| CN104101743A CN104101743A (en) | 2014-10-15 |
| CN104101743B true CN104101743B (en) | 2017-03-29 |
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Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104635113B (en) * | 2015-02-09 | 2017-07-11 | 合肥鑫晟光电科技有限公司 | A kind of method and system for determining panel Location |
| CN110426582B (en) * | 2019-08-07 | 2021-10-15 | 中国商用飞机有限责任公司北京民用飞机技术研究中心 | Line detection system |
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| US8529307B1 (en) * | 2012-08-01 | 2013-09-10 | Shenzhen China Star Optoelectronics Technology Co., Ltd. | Detection circuit and manufacturing method for LCD panel |
| CN203350556U (en) * | 2013-08-09 | 2013-12-18 | 合肥京东方光电科技有限公司 | Array substrate motherboard and array substrate lead inspection device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| KR100796171B1 (en) * | 2006-07-20 | 2008-01-21 | 마이크로 인스펙션 주식회사 | Contact type single side probe and inspection apparatus and method for open/short test of conductive lines used thereof |
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|---|---|---|---|---|
| JPH0365927A (en) * | 1989-08-05 | 1991-03-20 | Matsushita Electric Ind Co Ltd | Inspecting device of liquid crystal display panel and inspecting method thereof |
| CN101369404A (en) * | 2008-06-13 | 2009-02-18 | 黄山市英赛特实业有限公司 | Detection apparatus and detection method of LCD screen |
| CN102681222A (en) * | 2011-03-24 | 2012-09-19 | 北京京东方光电科技有限公司 | Method for testing line defect, and liquid crystal display |
| CN202583329U (en) * | 2012-05-24 | 2012-12-05 | 北京京东方光电科技有限公司 | Auxiliary device of capacitance measuring instrument |
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| US8529307B1 (en) * | 2012-08-01 | 2013-09-10 | Shenzhen China Star Optoelectronics Technology Co., Ltd. | Detection circuit and manufacturing method for LCD panel |
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| CN104101743A (en) | 2014-10-15 |
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