CN103681618A - 具有通孔的功能性玻璃处理晶片 - Google Patents
具有通孔的功能性玻璃处理晶片 Download PDFInfo
- Publication number
- CN103681618A CN103681618A CN201310428799.XA CN201310428799A CN103681618A CN 103681618 A CN103681618 A CN 103681618A CN 201310428799 A CN201310428799 A CN 201310428799A CN 103681618 A CN103681618 A CN 103681618A
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- Prior art keywords
- layer
- hole
- conductive
- wiring circuit
- composite wiring
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49827—Via connections through the substrates, e.g. pins going through the substrate, coaxial cables
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/14—Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
- H01L23/15—Ceramic or glass substrates
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L25/0655—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00 the devices being arranged next to each other
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0284—Details of three-dimensional rigid printed circuit boards
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/14—Structural association of two or more printed circuits
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/18—Printed circuits structurally associated with non-printed electric components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L24/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/156—Material
- H01L2924/15786—Material with a principal constituent of the material being a non metallic, non metalloid inorganic material
- H01L2924/15788—Glasses, e.g. amorphous oxides, nitrides or fluorides
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
Abstract
Description
Claims (15)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/623,873 | 2012-09-20 | ||
US13/623,873 US9059161B2 (en) | 2012-09-20 | 2012-09-20 | Composite wiring board with electrical through connections |
Publications (2)
Publication Number | Publication Date |
---|---|
CN103681618A true CN103681618A (zh) | 2014-03-26 |
CN103681618B CN103681618B (zh) | 2016-08-17 |
Family
ID=50274267
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201310428799.XA Expired - Fee Related CN103681618B (zh) | 2012-09-20 | 2013-09-18 | 具有通孔的功能性玻璃处理晶片 |
Country Status (2)
Country | Link |
---|---|
US (1) | US9059161B2 (zh) |
CN (1) | CN103681618B (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2022001062A1 (zh) * | 2020-07-01 | 2022-01-06 | 无锡中微亿芯有限公司 | 利用有源硅连接层实现内置模拟电路的多裸片fpga |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9312219B2 (en) * | 2012-12-28 | 2016-04-12 | Dyi-chung Hu | Interposer and packaging substrate having the interposer |
US20140339705A1 (en) * | 2013-05-17 | 2014-11-20 | Nvidia Corporation | Iintegrated circuit package using silicon-on-oxide interposer substrate with through-silicon vias |
US20140339706A1 (en) * | 2013-05-17 | 2014-11-20 | Nvidia Corporation | Integrated circuit package with an interposer formed from a reusable carrier substrate |
US20230005834A1 (en) * | 2014-08-18 | 2023-01-05 | Samtec, Inc. | Electrically conductive vias and methods for producing same |
US9514093B2 (en) | 2014-09-26 | 2016-12-06 | Intel Corporation | Method and apparatus for stacking core and uncore dies having landing slots |
WO2016161434A1 (en) | 2015-04-02 | 2016-10-06 | Nanopac Technologies, Inc. | Method for creating through-connected vias and conductors on a substrate |
US10593562B2 (en) | 2015-04-02 | 2020-03-17 | Samtec, Inc. | Method for creating through-connected vias and conductors on a substrate |
WO2017109537A1 (en) * | 2015-12-21 | 2017-06-29 | Intel IP Corporation | An electrical device and a method for forming an electrical device |
CN112154538A (zh) | 2018-03-30 | 2020-12-29 | 申泰公司 | 导电过孔及其制造方法 |
US10790232B2 (en) * | 2018-09-15 | 2020-09-29 | International Business Machines Corporation | Controlling warp in semiconductor laminated substrates with conductive material layout and orientation |
US11195789B2 (en) | 2018-11-30 | 2021-12-07 | International Business Machines Corporation | Integrated circuit module with a structurally balanced package using a bottom side interposer |
US11817359B2 (en) * | 2020-09-01 | 2023-11-14 | International Business Machines Corporation | Warp mitigation using pattern-matched metal layers in organic substrates |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1678175A (zh) * | 2004-03-31 | 2005-10-05 | 阿尔卑斯电气株式会社 | 电路部件模块及其制造方法 |
US20080265399A1 (en) * | 2007-04-27 | 2008-10-30 | Clinton Chao | Low-cost and ultra-fine integrated circuit packaging technique |
US20080284037A1 (en) * | 2007-05-15 | 2008-11-20 | Andry Paul S | Apparatus and Methods for Constructing Semiconductor Chip Packages with Silicon Space Transformer Carriers |
US20110304999A1 (en) * | 2010-06-10 | 2011-12-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Interposer-on-Glass Package Structures |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5656858A (en) * | 1994-10-19 | 1997-08-12 | Nippondenso Co., Ltd. | Semiconductor device with bump structure |
US5807783A (en) | 1996-10-07 | 1998-09-15 | Harris Corporation | Surface mount die by handle replacement |
US7312487B2 (en) | 2004-08-16 | 2007-12-25 | International Business Machines Corporation | Three dimensional integrated circuit |
US7258010B2 (en) | 2005-03-09 | 2007-08-21 | Honeywell International Inc. | MEMS device with thinned comb fingers |
US20100084752A1 (en) | 2008-10-08 | 2010-04-08 | Honeywell International Inc. | Systems and methods for implementing a wafer level hermetic interface chip |
US8115292B2 (en) * | 2008-10-23 | 2012-02-14 | United Test And Assembly Center Ltd. | Interposer for semiconductor package |
US8295056B2 (en) | 2009-07-22 | 2012-10-23 | International Business Machines Corporation | Silicon carrier structure and method of forming same |
US8048794B2 (en) | 2009-08-18 | 2011-11-01 | International Business Machines Corporation | 3D silicon-silicon die stack structure and method for fine pitch interconnection and vertical heat transport |
-
2012
- 2012-09-20 US US13/623,873 patent/US9059161B2/en not_active Expired - Fee Related
-
2013
- 2013-09-18 CN CN201310428799.XA patent/CN103681618B/zh not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1678175A (zh) * | 2004-03-31 | 2005-10-05 | 阿尔卑斯电气株式会社 | 电路部件模块及其制造方法 |
US20080265399A1 (en) * | 2007-04-27 | 2008-10-30 | Clinton Chao | Low-cost and ultra-fine integrated circuit packaging technique |
US20080284037A1 (en) * | 2007-05-15 | 2008-11-20 | Andry Paul S | Apparatus and Methods for Constructing Semiconductor Chip Packages with Silicon Space Transformer Carriers |
US20110304999A1 (en) * | 2010-06-10 | 2011-12-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Interposer-on-Glass Package Structures |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2022001062A1 (zh) * | 2020-07-01 | 2022-01-06 | 无锡中微亿芯有限公司 | 利用有源硅连接层实现内置模拟电路的多裸片fpga |
US12009307B2 (en) | 2020-07-01 | 2024-06-11 | Wuxi Esiontech Co., Ltd. | Multi-die FPGA implementing built-in analog circuit using active silicon connection layer |
Also Published As
Publication number | Publication date |
---|---|
CN103681618B (zh) | 2016-08-17 |
US20140078704A1 (en) | 2014-03-20 |
US9059161B2 (en) | 2015-06-16 |
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PB01 | Publication | ||
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right |
Effective date of registration: 20171030 Address after: Grand Cayman, Cayman Islands Patentee after: GLOBALFOUNDRIES INC. Address before: American New York Patentee before: Core USA second LLC Effective date of registration: 20171030 Address after: American New York Patentee after: Core USA second LLC Address before: American New York Patentee before: International Business Machines Corp. |
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CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160817 Termination date: 20190918 |
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CF01 | Termination of patent right due to non-payment of annual fee |