CN103180691B - 形状测定装置、形状测定方法、构造物的制造方法 - Google Patents
形状测定装置、形状测定方法、构造物的制造方法 Download PDFInfo
- Publication number
- CN103180691B CN103180691B CN201180051998.2A CN201180051998A CN103180691B CN 103180691 B CN103180691 B CN 103180691B CN 201180051998 A CN201180051998 A CN 201180051998A CN 103180691 B CN103180691 B CN 103180691B
- Authority
- CN
- China
- Prior art keywords
- aforementioned
- region
- shape
- information
- detected material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/004—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
- G01B5/008—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/045—Correction of measurements
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49718—Repairing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49764—Method of mechanical manufacture with testing or indicating
- Y10T29/49771—Quantitative measuring or gauging
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010241340 | 2010-10-27 | ||
JP2010-241340 | 2010-10-27 | ||
PCT/JP2011/074854 WO2012057283A1 (fr) | 2010-10-27 | 2011-10-27 | Dispositif de mesure de forme, procédé de mesure de forme, procédé de fabrication de structure et programme |
Publications (2)
Publication Number | Publication Date |
---|---|
CN103180691A CN103180691A (zh) | 2013-06-26 |
CN103180691B true CN103180691B (zh) | 2016-08-10 |
Family
ID=45993986
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201180051998.2A Active CN103180691B (zh) | 2010-10-27 | 2011-10-27 | 形状测定装置、形状测定方法、构造物的制造方法 |
Country Status (7)
Country | Link |
---|---|
US (1) | US9239219B2 (fr) |
EP (1) | EP2634530B1 (fr) |
JP (1) | JP5648692B2 (fr) |
KR (1) | KR101629545B1 (fr) |
CN (1) | CN103180691B (fr) |
TW (1) | TWI510756B (fr) |
WO (1) | WO2012057283A1 (fr) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9772394B2 (en) | 2010-04-21 | 2017-09-26 | Faro Technologies, Inc. | Method and apparatus for following an operator and locking onto a retroreflector with a laser tracker |
US9482529B2 (en) | 2011-04-15 | 2016-11-01 | Faro Technologies, Inc. | Three-dimensional coordinate scanner and method of operation |
US9686532B2 (en) | 2011-04-15 | 2017-06-20 | Faro Technologies, Inc. | System and method of acquiring three-dimensional coordinates using multiple coordinate measurement devices |
GB2504890A (en) | 2011-04-15 | 2014-02-12 | Faro Tech Inc | Enhanced position detector in laser tracker |
JP2014006149A (ja) * | 2012-06-25 | 2014-01-16 | Nikon Corp | 形状測定装置、構造物製造システム、形状測定方法、構造物製造方法、および形状測定プログラム |
WO2014084131A1 (fr) * | 2012-11-29 | 2014-06-05 | 株式会社ニコン | Appareil de mesure de forme, système de fabrication de structure, appareil d'étage, procédé de mesure de forme, procédé de fabrication de structure, programme et support d'enregistrement |
WO2014122437A1 (fr) * | 2013-02-05 | 2014-08-14 | Renishaw Plc | Procédé et appareil pour mesurer une pièce |
US9041914B2 (en) | 2013-03-15 | 2015-05-26 | Faro Technologies, Inc. | Three-dimensional coordinate scanner and method of operation |
CN105452802B (zh) * | 2013-07-19 | 2019-02-01 | 株式会社尼康 | 形状测定装置、构造物制造***、形状测定方法、构造物制造方法、形状测定程序、以及记录介质 |
US20150041094A1 (en) * | 2013-08-06 | 2015-02-12 | Honda Motor Co., Ltd. | Core pin detection |
CN103471554B (zh) * | 2013-09-27 | 2016-01-13 | 唐山市建华自动控制设备厂 | 料面三维成像测控*** |
WO2016006085A1 (fr) * | 2014-07-10 | 2016-01-14 | 株式会社ニコン | Dispositif à rayons x et procédé de fabrication de structure |
JP6451839B2 (ja) * | 2015-05-13 | 2019-01-16 | 新日鐵住金株式会社 | 形状検査方法、形状検査装置及びプログラム |
JP6866865B2 (ja) * | 2018-03-15 | 2021-04-28 | オムロン株式会社 | 計測処理装置、計測処理方法及びプログラム |
CN110876020A (zh) * | 2018-08-30 | 2020-03-10 | 菱光科技股份有限公司 | 外部触发的线性相机检测***及其影像曝光处理方法 |
JP2022139778A (ja) * | 2021-03-12 | 2022-09-26 | オムロン株式会社 | 光学式センサ、光学式センサの制御方法及び光学式センサの制御プログラム |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1243476A (zh) * | 1997-09-12 | 2000-02-02 | 株式会社珀蒂奥 | 三维形状数据处理装置、被雕刻板和雕刻装置 |
CN101517612A (zh) * | 2007-01-24 | 2009-08-26 | 富士通株式会社 | 图像读取装置、图像读取程序、图像读取方法 |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2112140B (en) * | 1981-12-16 | 1985-08-07 | Mauser Werke Oberndorf | Coordinate measuring machine |
JPS63250506A (ja) * | 1987-04-07 | 1988-10-18 | Mitsubishi Electric Corp | 加工用センサの位置制御方法 |
US5125035A (en) * | 1989-12-18 | 1992-06-23 | Chromalloy Gas Turbine Corporation | Five axis generated hole inspection system |
JP3508368B2 (ja) * | 1996-01-23 | 2004-03-22 | 株式会社ニコン | 画像測定機 |
JP2971822B2 (ja) * | 1996-11-06 | 1999-11-08 | 株式会社ミツトヨ | 非接触画像計測システム |
JP3468504B2 (ja) * | 1999-06-09 | 2003-11-17 | 株式会社ミツトヨ | 測定手順ファイル生成方法、測定装置および記憶媒体 |
JP4649704B2 (ja) * | 2000-05-25 | 2011-03-16 | 株式会社ニコン | 形状測定機 |
JP3427046B2 (ja) * | 2000-08-29 | 2003-07-14 | 株式会社日立製作所 | 3次元寸法計測装置及びその計測方法 |
EP1570234A2 (fr) * | 2002-12-13 | 2005-09-07 | Werth Messtechnik GmbH | Procede pour mesurer un contour d'une piece par balayage |
JP3923945B2 (ja) * | 2004-01-13 | 2007-06-06 | 三鷹光器株式会社 | 非接触表面形状測定方法 |
EP1596160A1 (fr) * | 2004-05-10 | 2005-11-16 | Hexagon Metrology AB | Procédé d'inspection d'une pièce par une machine de mesure |
JP4782990B2 (ja) * | 2004-05-31 | 2011-09-28 | 株式会社ミツトヨ | 表面倣い測定装置、表面倣い測定方法、表面倣い測定プログラムおよび記録媒体 |
JP4513062B2 (ja) * | 2004-11-15 | 2010-07-28 | 株式会社ニコン | 画像測定機 |
US20100014099A1 (en) * | 2004-12-16 | 2010-01-21 | Werth Messtechnik Gmbh | Coordinate measuring device and method for measuring with a coordinate measuring device |
US7545512B2 (en) * | 2006-01-26 | 2009-06-09 | Koh Young Technology Inc. | Method for automated measurement of three-dimensional shape of circuit boards |
JP5189806B2 (ja) * | 2006-09-07 | 2013-04-24 | 株式会社ミツトヨ | 表面形状測定装置 |
WO2009024757A1 (fr) * | 2007-08-17 | 2009-02-26 | Renishaw Plc | Appareil et procédé de mesure d'analyse de phase |
WO2009096422A1 (fr) | 2008-01-28 | 2009-08-06 | Nikon Corporation | Dispositif de mesure d'une forme tridimensionnelle, procédé et programme |
KR101251372B1 (ko) * | 2008-10-13 | 2013-04-05 | 주식회사 고영테크놀러지 | 3차원형상 측정방법 |
US9586367B2 (en) * | 2008-11-04 | 2017-03-07 | Lockheed Martin Corporation | Composite laminate thickness compensation |
JP5287266B2 (ja) | 2009-01-09 | 2013-09-11 | 株式会社ニコン | 測定装置 |
JP5278808B2 (ja) * | 2009-03-16 | 2013-09-04 | 株式会社ニコン | 三次元形状測定装置 |
TWI440847B (zh) * | 2009-03-30 | 2014-06-11 | Koh Young Tech Inc | 檢測方法 |
US8582824B2 (en) * | 2009-06-25 | 2013-11-12 | Twin Coast Metrology | Cell feature extraction and labeling thereof |
US20120194651A1 (en) | 2011-01-31 | 2012-08-02 | Nikon Corporation | Shape measuring apparatus |
-
2011
- 2011-10-27 TW TW100139262A patent/TWI510756B/zh active
- 2011-10-27 EP EP11836416.5A patent/EP2634530B1/fr active Active
- 2011-10-27 JP JP2012540941A patent/JP5648692B2/ja active Active
- 2011-10-27 KR KR1020137013485A patent/KR101629545B1/ko active IP Right Grant
- 2011-10-27 CN CN201180051998.2A patent/CN103180691B/zh active Active
- 2011-10-27 WO PCT/JP2011/074854 patent/WO2012057283A1/fr active Application Filing
-
2013
- 2013-04-26 US US13/871,203 patent/US9239219B2/en active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1243476A (zh) * | 1997-09-12 | 2000-02-02 | 株式会社珀蒂奥 | 三维形状数据处理装置、被雕刻板和雕刻装置 |
CN101517612A (zh) * | 2007-01-24 | 2009-08-26 | 富士通株式会社 | 图像读取装置、图像读取程序、图像读取方法 |
Also Published As
Publication number | Publication date |
---|---|
EP2634530A1 (fr) | 2013-09-04 |
US9239219B2 (en) | 2016-01-19 |
JP5648692B2 (ja) | 2015-01-07 |
US20130298415A1 (en) | 2013-11-14 |
WO2012057283A1 (fr) | 2012-05-03 |
EP2634530A4 (fr) | 2017-01-04 |
KR20130108398A (ko) | 2013-10-02 |
KR101629545B1 (ko) | 2016-06-10 |
EP2634530B1 (fr) | 2022-05-04 |
TWI510756B (zh) | 2015-12-01 |
CN103180691A (zh) | 2013-06-26 |
TW201233976A (en) | 2012-08-16 |
JPWO2012057283A1 (ja) | 2014-05-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN103180691B (zh) | 形状测定装置、形状测定方法、构造物的制造方法 | |
CN112683215B (zh) | 提供关于坐标测量机传感器链的信息的方法、坐标测量机 | |
CN103959010B (zh) | 形状测定装置、构造物制造***、形状测定方法、构造物制造方法、形状测定程序以及非暂时性电脑可读媒体 | |
JP4275632B2 (ja) | パラレルメカニズム機構のキャリブレーション方法、キャリブレーションの検証方法、キャリブレーションの検証プログラム、データ採取方法及び空間位置補正における補正データ採取方法 | |
US20170241759A1 (en) | Identification of geometric deviations of a motion guide in a coordinate-measuring machine or in a machine tool | |
KR101297001B1 (ko) | 삼각 측정 센서 및 평가 유닛을 이용하여 부품을 측정하기위한 장치 | |
TWI623724B (zh) | Shape measuring device, structure manufacturing system, stage system, shape measuring method, structure manufacturing method, shape measuring program, and computer readable recording medium | |
US6701267B2 (en) | Method for calibrating probe and computer-readable medium | |
CN101451825A (zh) | 图像测量装置的校正方法 | |
US20120072156A1 (en) | Method of correcting measurement data of a coordinate measuring machine and a coordinate measuring machine | |
JP6205727B2 (ja) | 形状測定方法、構造物製造方法、形状測定プログラム、光学式形状測定装置、及び構造物製造システム | |
CN105229428A (zh) | 测量模具内部容积的设备和方法 | |
JPH11351841A (ja) | 非接触三次元測定方法 | |
US5864778A (en) | Device and process for measuring and calculating geometrical parameters of an object | |
US7277818B2 (en) | Method and program for leveling aspherical workpieces | |
KR102460118B1 (ko) | 어태치먼트 중심위치의 보정방법 | |
JP6425009B2 (ja) | 三次元測定機、及びこれを用いた形状測定方法 | |
JP5218957B2 (ja) | 形状測定装置、形状測定方法、及び形状測定プログラム | |
JP5287266B2 (ja) | 測定装置 | |
JP5433848B2 (ja) | 画像測定装置 | |
CN103927755A (zh) | 多景深图像处理方法 | |
JP7021980B2 (ja) | 計測用x線ct装置 | |
KR20220134023A (ko) | 계측 장치, 계측 시스템, 계측 방법 및 프로그램 | |
CN117538027A (zh) | 一种探头的定位方法和装置 | |
JP2007078486A (ja) | 物体形状検査装置及び物体形状検査方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant |