CN101379584B - 粒子光学组件 - Google Patents
粒子光学组件 Download PDFInfo
- Publication number
- CN101379584B CN101379584B CN2006800446092A CN200680044609A CN101379584B CN 101379584 B CN101379584 B CN 101379584B CN 2006800446092 A CN2006800446092 A CN 2006800446092A CN 200680044609 A CN200680044609 A CN 200680044609A CN 101379584 B CN101379584 B CN 101379584B
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- Prior art keywords
- pole shoe
- lens arrangement
- object lens
- exciting coil
- magnet exciting
- Prior art date
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- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
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- H01J37/14—Lenses magnetic
- H01J37/141—Electromagnetic lenses
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- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
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- H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
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- H01J2237/26—Electron or ion microscopes
- H01J2237/28—Scanning microscopes
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Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Electron Beam Exposure (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Optical Recording Or Reproduction (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Multi-Conductor Connections (AREA)
- Transition And Organic Metals Composition Catalysts For Addition Polymerization (AREA)
- Optical Head (AREA)
Abstract
Description
Claims (12)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US74058105P | 2005-11-28 | 2005-11-28 | |
US60/740,581 | 2005-11-28 | ||
PCT/EP2006/011413 WO2007060017A2 (en) | 2005-11-28 | 2006-11-28 | Particle-optical component |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2010105282862A Division CN102103966B (zh) | 2005-11-28 | 2006-11-28 | 粒子光学组件 |
CN2010105282491A Division CN102103967B (zh) | 2005-11-28 | 2006-11-28 | 粒子光学组件 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101379584A CN101379584A (zh) | 2009-03-04 |
CN101379584B true CN101379584B (zh) | 2010-12-22 |
Family
ID=37728176
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2010105282491A Active CN102103967B (zh) | 2005-11-28 | 2006-11-28 | 粒子光学组件 |
CN2006800446092A Expired - Fee Related CN101379584B (zh) | 2005-11-28 | 2006-11-28 | 粒子光学组件 |
CN2010105282862A Expired - Fee Related CN102103966B (zh) | 2005-11-28 | 2006-11-28 | 粒子光学组件 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2010105282491A Active CN102103967B (zh) | 2005-11-28 | 2006-11-28 | 粒子光学组件 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2010105282862A Expired - Fee Related CN102103966B (zh) | 2005-11-28 | 2006-11-28 | 粒子光学组件 |
Country Status (8)
Country | Link |
---|---|
US (4) | US20090159810A1 (zh) |
EP (7) | EP2270836B1 (zh) |
JP (1) | JP5663722B2 (zh) |
KR (2) | KR20140061480A (zh) |
CN (3) | CN102103967B (zh) |
AT (1) | ATE464647T1 (zh) |
DE (1) | DE602006013707D1 (zh) |
WO (1) | WO2007060017A2 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102148122A (zh) * | 2011-02-16 | 2011-08-10 | 北京航空航天大学 | 应用于透射电子显微镜的层叠式低像差会聚小透镜 |
Families Citing this family (67)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5227643B2 (ja) * | 2008-04-14 | 2013-07-03 | 株式会社日立ハイテクノロジーズ | 高分解能でかつ高コントラストな観察が可能な電子線応用装置 |
DE102008062888B4 (de) * | 2008-12-23 | 2010-12-16 | Carl Zeiss Nts Gmbh | Teilchenoptische Vorrichtung mit Magnetanordnung |
EP2556527B1 (en) | 2010-04-09 | 2017-03-22 | Carl Zeiss Microscopy GmbH | Charged particle detection system and multi-beamlet inspection system |
US9384938B2 (en) | 2010-09-28 | 2016-07-05 | Carl Zeiss Microscopy Gmbh | Particle-optical systems and arrangements and particle-optical components for such systems and arrangements |
US8519353B2 (en) * | 2010-12-29 | 2013-08-27 | Varian Semiconductor Equipment Associates, Inc. | Method and apparatus for controlling an asymmetric electrostatic lens about a central ray trajectory of an ion beam |
US8835866B2 (en) * | 2011-05-19 | 2014-09-16 | Fei Company | Method and structure for controlling magnetic field distributions in an ExB Wien filter |
GB2497758A (en) * | 2011-12-20 | 2013-06-26 | Univ Antwerpen | Generation of charged particle vortex waves |
EP2665082A1 (en) * | 2012-05-16 | 2013-11-20 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Element for fast magnetic beam deflection |
JP5667618B2 (ja) * | 2012-12-14 | 2015-02-12 | 株式会社アドバンテスト | 電磁レンズ及び電子ビーム露光装置 |
JP6161430B2 (ja) * | 2013-06-25 | 2017-07-12 | 株式会社日立ハイテクノロジーズ | 電子レンズ及び荷電粒子線装置 |
DE102013014976A1 (de) | 2013-09-09 | 2015-03-12 | Carl Zeiss Microscopy Gmbh | Teilchenoptisches System |
DE102013016113B4 (de) | 2013-09-26 | 2018-11-29 | Carl Zeiss Microscopy Gmbh | Verfahren zum Detektieren von Elektronen, Elektronendetektor und Inspektionssystem |
US9263233B2 (en) | 2013-09-29 | 2016-02-16 | Carl Zeiss Microscopy Gmbh | Charged particle multi-beam inspection system and method of operating the same |
EP3053183B1 (en) | 2013-09-30 | 2018-11-07 | Carl Zeiss Microscopy GmbH | Charged particle beam system and method of operating the same |
JP6258474B2 (ja) * | 2014-04-28 | 2018-01-10 | 株式会社日立ハイテクノロジーズ | 電子線装置 |
DE102014008105B4 (de) | 2014-05-30 | 2021-11-11 | Carl Zeiss Multisem Gmbh | Mehrstrahl-Teilchenmikroskop |
DE102014008083B9 (de) | 2014-05-30 | 2018-03-22 | Carl Zeiss Microscopy Gmbh | Teilchenstrahlsystem |
DE102014008383B9 (de) | 2014-06-06 | 2018-03-22 | Carl Zeiss Microscopy Gmbh | Teilchenstrahlsystem und Verfahren zum Betreiben einer Teilchenoptik |
TWI502616B (zh) * | 2014-08-08 | 2015-10-01 | Nat Univ Tsing Hua | 桌上型電子顯微鏡以及其廣域可調式磁透鏡 |
JP6204388B2 (ja) * | 2015-01-30 | 2017-09-27 | 松定プレシジョン株式会社 | 荷電粒子線装置及び走査電子顕微鏡 |
JP6177817B2 (ja) * | 2015-01-30 | 2017-08-09 | 松定プレシジョン株式会社 | 荷電粒子線装置及び走査電子顕微鏡 |
DE102015202172B4 (de) | 2015-02-06 | 2017-01-19 | Carl Zeiss Microscopy Gmbh | Teilchenstrahlsystem und Verfahren zur teilchenoptischen Untersuchung eines Objekts |
US9691588B2 (en) | 2015-03-10 | 2017-06-27 | Hermes Microvision, Inc. | Apparatus of plural charged-particle beams |
JP6718782B2 (ja) * | 2016-09-21 | 2020-07-08 | 日本電子株式会社 | 対物レンズおよび透過電子顕微鏡 |
JP6812561B2 (ja) * | 2017-09-04 | 2021-01-13 | 株式会社日立ハイテク | 荷電粒子線装置 |
DE102018202421B3 (de) | 2018-02-16 | 2019-07-11 | Carl Zeiss Microscopy Gmbh | Vielstrahl-Teilchenstrahlsystem |
DE102018202428B3 (de) | 2018-02-16 | 2019-05-09 | Carl Zeiss Microscopy Gmbh | Vielstrahl-Teilchenmikroskop |
CN112055886A (zh) | 2018-02-27 | 2020-12-08 | 卡尔蔡司MultiSEM有限责任公司 | 带电粒子多束***及方法 |
US10811215B2 (en) | 2018-05-21 | 2020-10-20 | Carl Zeiss Multisem Gmbh | Charged particle beam system |
DE102018007455B4 (de) | 2018-09-21 | 2020-07-09 | Carl Zeiss Multisem Gmbh | Verfahren zum Detektorabgleich bei der Abbildung von Objekten mittels eines Mehrstrahl-Teilchenmikroskops, System sowie Computerprogrammprodukt |
DE102018007652B4 (de) | 2018-09-27 | 2021-03-25 | Carl Zeiss Multisem Gmbh | Teilchenstrahl-System sowie Verfahren zur Stromregulierung von Einzel-Teilchenstrahlen |
DE102018124044B3 (de) | 2018-09-28 | 2020-02-06 | Carl Zeiss Microscopy Gmbh | Verfahren zum Betreiben eines Vielstrahl-Teilchenstrahlmikroskops und Vielstrahl-Teilchenstrahlsystem |
DE102018124219A1 (de) | 2018-10-01 | 2020-04-02 | Carl Zeiss Microscopy Gmbh | Vielstrahl-Teilchenstrahlsystem und Verfahren zum Betreiben eines solchen |
US11264198B2 (en) * | 2018-10-15 | 2022-03-01 | Applied Materials Israel Ltd. | Objective lens arrangement |
DE102018133703B4 (de) | 2018-12-29 | 2020-08-06 | Carl Zeiss Multisem Gmbh | Vorrichtung zur Erzeugung einer Vielzahl von Teilchenstrahlen und Vielstrahl-Teilchenstrahlsysteme |
CN111477530B (zh) | 2019-01-24 | 2023-05-05 | 卡尔蔡司MultiSEM有限责任公司 | 利用多束粒子显微镜对3d样本成像的方法 |
TWI743626B (zh) | 2019-01-24 | 2021-10-21 | 德商卡爾蔡司多重掃描電子顯微鏡有限公司 | 包含多束粒子顯微鏡的系統、對3d樣本逐層成像之方法及電腦程式產品 |
US10741355B1 (en) | 2019-02-04 | 2020-08-11 | Carl Zeiss Multisem Gmbh | Multi-beam charged particle system |
DE102019004124B4 (de) | 2019-06-13 | 2024-03-21 | Carl Zeiss Multisem Gmbh | Teilchenstrahl-System zur azimutalen Ablenkung von Einzel-Teilchenstrahlen sowie seine Verwendung und Verfahren zur Azimut-Korrektur bei einem Teilchenstrahl-System |
DE102019005362A1 (de) | 2019-07-31 | 2021-02-04 | Carl Zeiss Multisem Gmbh | Verfahren zum Betreiben eines Vielzahl-Teilchenstrahlsystems unter Veränderung der numerischen Apertur, zugehöriges Computerprogrammprodukt und Vielzahl-Teilchenstrahlsystem |
DE102019005364B3 (de) | 2019-07-31 | 2020-10-08 | Carl Zeiss Multisem Gmbh | System-Kombination eines Teilchenstrahlsystem und eines lichtoptischen Systems mit kollinearer Strahlführung sowie Verwendung der System-Kombination |
DE102019008249B3 (de) | 2019-11-27 | 2020-11-19 | Carl Zeiss Multisem Gmbh | Teilchenstrahl-System mit einer Multistrahl-Ablenkeinrichtung und einem Strahlfänger, Verfahren zum Betreiben des Teilchenstrahl-Systems und zugehöriges Computerprogrammprodukt |
DE102020107738B3 (de) | 2020-03-20 | 2021-01-14 | Carl Zeiss Multisem Gmbh | Teilchenstrahl-System mit einer Multipol-Linsen-Sequenz zur unabhängigen Fokussierung einer Vielzahl von Einzel-Teilchenstrahlen, seine Verwendung und zugehöriges Verfahren |
DE102020115183A1 (de) | 2020-06-08 | 2021-12-09 | Carl Zeiss Multisem Gmbh | Teilchenstrahlsystem mit Multiquellensystem |
DE102020121132B3 (de) | 2020-08-11 | 2021-09-23 | Carl Zeiss Multisem Gmbh | Verfahren zum Betreiben eines Vielzahl-Teilchenstrahlsystems mit einem Spiegel-Betriebsmodus und zugehöriges Computerprogrammprodukt |
DE102020123567A1 (de) | 2020-09-09 | 2022-03-10 | Carl Zeiss Multisem Gmbh | Vielzahl-Teilchenstrahl-System mit Kontrast-Korrektur-Linsen-System |
DE102020125534B3 (de) | 2020-09-30 | 2021-12-02 | Carl Zeiss Multisem Gmbh | Vielzahl-Teilchenstrahlmikroskop und zugehöriges Verfahren mit schnellem Autofokus um einen einstellbaren Arbeitsabstand |
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