CN101234704B - 电子组件移载装置及方法 - Google Patents

电子组件移载装置及方法 Download PDF

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Publication number
CN101234704B
CN101234704B CN2007100024881A CN200710002488A CN101234704B CN 101234704 B CN101234704 B CN 101234704B CN 2007100024881 A CN2007100024881 A CN 2007100024881A CN 200710002488 A CN200710002488 A CN 200710002488A CN 101234704 B CN101234704 B CN 101234704B
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China
Prior art keywords
building brick
electronic building
transfer
carrier
fetching device
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CN2007100024881A
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English (en)
Chinese (zh)
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CN101234704A (zh
Inventor
张简荣力
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hongjin Precision Co ltd
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HNI Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by HNI Technologies Inc filed Critical HNI Technologies Inc
Priority to CN2007100024881A priority Critical patent/CN101234704B/zh
Priority to KR1020070135709A priority patent/KR20080071068A/ko
Priority to JP2008001253A priority patent/JP4879914B2/ja
Publication of CN101234704A publication Critical patent/CN101234704A/zh
Application granted granted Critical
Publication of CN101234704B publication Critical patent/CN101234704B/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
CN2007100024881A 2007-01-29 2007-01-29 电子组件移载装置及方法 Active CN101234704B (zh)

Priority Applications (3)

Application Number Priority Date Filing Date Title
CN2007100024881A CN101234704B (zh) 2007-01-29 2007-01-29 电子组件移载装置及方法
KR1020070135709A KR20080071068A (ko) 2007-01-29 2007-12-21 전자 소자 운반 장치 및 방법
JP2008001253A JP4879914B2 (ja) 2007-01-29 2008-01-08 電子部品移送装置及び方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2007100024881A CN101234704B (zh) 2007-01-29 2007-01-29 电子组件移载装置及方法

Publications (2)

Publication Number Publication Date
CN101234704A CN101234704A (zh) 2008-08-06
CN101234704B true CN101234704B (zh) 2011-11-16

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ID=39728720

Family Applications (1)

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CN2007100024881A Active CN101234704B (zh) 2007-01-29 2007-01-29 电子组件移载装置及方法

Country Status (3)

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JP (1) JP4879914B2 (ja)
KR (1) KR20080071068A (ja)
CN (1) CN101234704B (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI508817B (ja) * 2013-03-15 2015-11-21
TWI581900B (zh) * 2015-06-05 2017-05-11 Hon Tech Inc Object transfer device and its application of electronic components operating equipment

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102233334B (zh) * 2010-04-21 2015-03-18 鸿劲科技股份有限公司 电子组件测试分类机的测试装置
CN102233335B (zh) * 2010-04-21 2013-06-05 鸿劲科技股份有限公司 应用于电子元件测试分类机的测试装置
JP2013053991A (ja) * 2011-09-06 2013-03-21 Seiko Epson Corp ハンドラー及び部品検査装置
CN103086153B (zh) * 2011-11-01 2015-03-04 鸿劲科技股份有限公司 电子元件变距移料装置
CN102784761A (zh) * 2012-06-25 2012-11-21 致茂电子(苏州)有限公司 半封装堆叠晶片测试分类机台
CN103575937B (zh) * 2012-07-31 2016-03-02 鸿劲科技股份有限公司 气压式测试装置及其应用的测试设备
TWI531798B (zh) * 2013-12-31 2016-05-01 Chroma Ate Inc Variable pitch chip pick and place device
TWI560536B (en) * 2014-06-27 2016-12-01 Mpi Corp Apparutus of fully-auto loader and control method thereof
CN104133173B (zh) * 2014-08-14 2017-02-01 潍坊路加精工有限公司 一种全自动测试装置
CN105984722B (zh) * 2015-02-16 2018-05-15 鸿劲科技股份有限公司 电子元件搬移装置及其应用的作业设备
TWI575644B (zh) * 2015-12-18 2017-03-21 Hon Tech Inc Electronic device moving mechanism and its application equipment
CN106428795A (zh) * 2016-10-20 2017-02-22 Tcl王牌电器(惠州)有限公司 包装装置
CN109709463A (zh) * 2017-10-25 2019-05-03 泰克元有限公司 机械手
CN108111961B (zh) * 2018-02-07 2023-11-07 江西天键电声有限公司 应用于耳机生产的自动磁规分脱设备
CN108459259A (zh) * 2018-02-08 2018-08-28 上海华岭集成电路技术股份有限公司 一种确保多工位坐标正确的方法
CN110095707A (zh) * 2019-04-09 2019-08-06 深圳市贝优通新能源技术开发有限公司 一种具有调整功能的便捷型芯片检测设备
CN114429930B (zh) * 2022-01-28 2023-04-14 上海世禹精密设备股份有限公司 一种芯片载具自动收集装置
CN114455317A (zh) * 2022-02-11 2022-05-10 江西安福华洋劳务合作有限公司 一种用于电子元件生产线的运送装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5865319A (en) * 1994-12-28 1999-02-02 Advantest Corp. Automatic test handler system for IC tester
CN1715940A (zh) * 2004-06-29 2006-01-04 鸿劲科技股份有限公司 可适用不同ic盛装对象的ic检测机

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3141677B2 (ja) * 1994-02-28 2001-03-05 安藤電気株式会社 複数の吸着ハンドによるｉｃ搬送機構
JP3080845B2 (ja) * 1994-08-16 2000-08-28 東京エレクトロン株式会社 検査装置及びその方法
JP4588923B2 (ja) * 2001-06-01 2010-12-01 ヤマハ発動機株式会社 部品試験装置
JP2003075505A (ja) * 2001-09-05 2003-03-12 Yamaha Motor Co Ltd 部品試験装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5865319A (en) * 1994-12-28 1999-02-02 Advantest Corp. Automatic test handler system for IC tester
CN1715940A (zh) * 2004-06-29 2006-01-04 鸿劲科技股份有限公司 可适用不同ic盛装对象的ic检测机

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
JP特开平11-326451A 1999.11.26
JP特开平5-312903A 1993.11.26
JP特开平8-43484A 1996.02.16

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI508817B (ja) * 2013-03-15 2015-11-21
TWI581900B (zh) * 2015-06-05 2017-05-11 Hon Tech Inc Object transfer device and its application of electronic components operating equipment

Also Published As

Publication number Publication date
JP2008185583A (ja) 2008-08-14
JP4879914B2 (ja) 2012-02-22
KR20080071068A (ko) 2008-08-01
CN101234704A (zh) 2008-08-06

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Effective date of registration: 20210927

Address after: Taichung City, Taiwan, China

Patentee after: HONGJIN PRECISION Co.,Ltd.

Address before: TaiWan, China

Patentee before: HON TECHNOLOGIES, Inc.

TR01 Transfer of patent right