BR0012290A - Pó de cério aperfeiçoado - Google Patents
Pó de cério aperfeiçoadoInfo
- Publication number
- BR0012290A BR0012290A BR0012290-4A BR0012290A BR0012290A BR 0012290 A BR0012290 A BR 0012290A BR 0012290 A BR0012290 A BR 0012290A BR 0012290 A BR0012290 A BR 0012290A
- Authority
- BR
- Brazil
- Prior art keywords
- slurry
- cmp
- cerium
- cerium powder
- improved
- Prior art date
Links
- 229910052684 Cerium Inorganic materials 0.000 title abstract 3
- GWXLDORMOJMVQZ-UHFFFAOYSA-N cerium Chemical compound [Ce] GWXLDORMOJMVQZ-UHFFFAOYSA-N 0.000 title abstract 3
- 239000000843 powder Substances 0.000 title abstract 2
- 239000002002 slurry Substances 0.000 abstract 5
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 abstract 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N Alumina Chemical compound [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 abstract 1
- 239000003945 anionic surfactant Substances 0.000 abstract 1
- 235000013339 cereals Nutrition 0.000 abstract 1
- 230000003287 optical effect Effects 0.000 abstract 1
- 238000005498 polishing Methods 0.000 abstract 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
- C09K3/1463—Aqueous liquid suspensions
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01F—COMPOUNDS OF THE METALS BERYLLIUM, MAGNESIUM, ALUMINIUM, CALCIUM, STRONTIUM, BARIUM, RADIUM, THORIUM, OR OF THE RARE-EARTH METALS
- C01F17/00—Compounds of rare earth metals
- C01F17/20—Compounds containing only rare earth metals as the metal element
- C01F17/206—Compounds containing only rare earth metals as the metal element oxide or hydroxide being the only anion
- C01F17/224—Oxides or hydroxides of lanthanides
- C01F17/235—Cerium oxides or hydroxides
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2004/00—Particle morphology
- C01P2004/01—Particle morphology depicted by an image
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2004/00—Particle morphology
- C01P2004/01—Particle morphology depicted by an image
- C01P2004/03—Particle morphology depicted by an image obtained by SEM
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2004/00—Particle morphology
- C01P2004/60—Particles characterised by their size
- C01P2004/62—Submicrometer sized, i.e. from 0.1-1 micrometer
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2006/00—Physical properties of inorganic compounds
- C01P2006/12—Surface area
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30625—With simultaneous mechanical treatment, e.g. mechanico-chemical polishing
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Geology (AREA)
- Inorganic Chemistry (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Compounds Of Alkaline-Earth Elements, Aluminum Or Rare-Earth Metals (AREA)
Abstract
"Pó DE CéRIO APERFEIçOADO". Pasta fluida de polimento, útil em aplicações ópticas ou de CMP compreende um cério com uma área de superfície de BET de pelo menos 10 m^ 2^/gm. A pasta fluida deve ser feita por meio de sujeição de uma pasta fluida de cério comercial compreendendo aglomerados para um tratamento mecano - química em um pH de 9 a 11, usando meios que são alfa alumina ou zircónia de baixa pureza. As pastas fluidas preferidas mantêm uma carga de superfície positiva em todos os valores de pH. As pastas fluidas de CMP, de preferência, compreendem, em adição, uma tensoativo aniónico para auxiliar na remoção de resíduos de superfície.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US33422299A | 1999-06-16 | 1999-06-16 | |
US09/553,968 US6238450B1 (en) | 1999-06-16 | 2000-04-21 | Ceria powder |
PCT/US2000/015479 WO2000076920A1 (en) | 1999-06-16 | 2000-06-06 | Improved ceria powder |
Publications (2)
Publication Number | Publication Date |
---|---|
BR0012290A true BR0012290A (pt) | 2002-04-16 |
BR0012290B1 BR0012290B1 (pt) | 2009-01-13 |
Family
ID=26989098
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BRPI0012290-4A BR0012290B1 (pt) | 1999-06-16 | 2000-06-06 | processo para a produÇço de pasta fluida de àxido de cÉrio e a referida pasta. |
Country Status (14)
Country | Link |
---|---|
US (1) | US6238450B1 (pt) |
EP (1) | EP1200352B1 (pt) |
JP (1) | JP3887230B2 (pt) |
KR (1) | KR100429940B1 (pt) |
CN (1) | CN1129554C (pt) |
AU (1) | AU752038B2 (pt) |
BR (1) | BR0012290B1 (pt) |
CA (1) | CA2374373C (pt) |
DE (1) | DE60001958T2 (pt) |
IL (1) | IL147040A (pt) |
MX (1) | MXPA01013093A (pt) |
MY (1) | MY125250A (pt) |
TW (1) | TW503216B (pt) |
WO (1) | WO2000076920A1 (pt) |
Families Citing this family (66)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6602111B1 (en) * | 1999-07-16 | 2003-08-05 | Seimi Chemical Co., Ltd. | Abrasive |
US6402851B1 (en) * | 2000-05-19 | 2002-06-11 | International Business Machines Corporation | Lanthanide oxide dissolution from glass surface |
US7887714B2 (en) | 2000-12-25 | 2011-02-15 | Nissan Chemical Industries, Ltd. | Cerium oxide sol and abrasive |
TWI272249B (en) * | 2001-02-27 | 2007-02-01 | Nissan Chemical Ind Ltd | Crystalline ceric oxide sol and process for producing the same |
US6839362B2 (en) * | 2001-05-22 | 2005-01-04 | Saint-Gobain Ceramics & Plastics, Inc. | Cobalt-doped saturable absorber Q-switches and laser systems |
TWI256971B (en) * | 2002-08-09 | 2006-06-21 | Hitachi Chemical Co Ltd | CMP abrasive and method for polishing substrate |
JP3860528B2 (ja) * | 2002-11-12 | 2006-12-20 | 株式会社東芝 | 半導体装置の製造方法 |
JP2004193495A (ja) * | 2002-12-13 | 2004-07-08 | Toshiba Corp | 化学的機械的研磨用スラリーおよびこれを用いた半導体装置の製造方法 |
US7326477B2 (en) * | 2003-09-23 | 2008-02-05 | Saint-Gobain Ceramics & Plastics, Inc. | Spinel boules, wafers, and methods for fabricating same |
US7045223B2 (en) * | 2003-09-23 | 2006-05-16 | Saint-Gobain Ceramics & Plastics, Inc. | Spinel articles and methods for forming same |
US20050061230A1 (en) * | 2003-09-23 | 2005-03-24 | Saint-Gobain Ceramics & Plastics, Inc. | Spinel articles and methods for forming same |
TWI273632B (en) | 2004-07-28 | 2007-02-11 | K C Tech Co Ltd | Polishing slurry, method of producing same, and method of polishing substrate |
KR100682233B1 (ko) * | 2004-07-29 | 2007-02-12 | 주식회사 엘지화학 | 산화세륨 분말 및 그 제조방법 |
KR100672940B1 (ko) | 2004-08-03 | 2007-01-24 | 삼성전자주식회사 | 금속막을 위한 화학적기계적 연마 슬러리 및 이를 이용한금속막의 화학적기계적 연마 방법 |
US7919815B1 (en) | 2005-02-24 | 2011-04-05 | Saint-Gobain Ceramics & Plastics, Inc. | Spinel wafers and methods of preparation |
KR100641348B1 (ko) | 2005-06-03 | 2006-11-03 | 주식회사 케이씨텍 | Cmp용 슬러리와 이의 제조 방법 및 기판의 연마 방법 |
US20080132150A1 (en) * | 2006-11-30 | 2008-06-05 | Gregory John Arserio | Polishing method for extreme ultraviolet optical elements and elements produced using the method |
JP5474566B2 (ja) * | 2007-01-23 | 2014-04-16 | サンーゴバン アブレイシブズ,インコーポレイティド | 凝集塊を含む研磨布紙製品 |
JP4301305B2 (ja) * | 2007-02-16 | 2009-07-22 | ソニー株式会社 | 基体研磨方法、半導体装置の製造方法 |
US8000487B2 (en) | 2008-03-06 | 2011-08-16 | Starkey Laboratories, Inc. | Frequency translation by high-frequency spectral envelope warping in hearing assistance devices |
KR100873945B1 (ko) * | 2008-07-16 | 2008-12-12 | (주) 뉴웰 | 미세 산화세륨 분말 그 제조 방법 및 이를 포함하는 씨엠피슬러리 |
BRPI0916391A2 (pt) * | 2008-07-22 | 2019-03-06 | Saint Gobain Abrasifs Sa | produtos abrasivos revestidos contendo agregados |
US8526650B2 (en) | 2009-05-06 | 2013-09-03 | Starkey Laboratories, Inc. | Frequency translation by high-frequency spectral envelope warping in hearing assistance devices |
WO2012092619A2 (en) | 2010-12-30 | 2012-07-05 | Saint-Gobain Abrasives, Inc. | Coated abrasive aggregates and products containg same |
CN103370174B (zh) | 2010-12-31 | 2017-03-29 | 圣戈本陶瓷及塑料股份有限公司 | 具有特定形状的研磨颗粒和此类颗粒的形成方法 |
CN102751187B (zh) * | 2011-04-20 | 2015-11-25 | 中芯国际集成电路制造(上海)有限公司 | 抛光方法以及栅极的形成方法 |
WO2013003830A2 (en) | 2011-06-30 | 2013-01-03 | Saint-Gobain Ceramics & Plastics, Inc. | Abrasive articles including abrasive particles of silicon nitride |
CN103764349B (zh) | 2011-06-30 | 2017-06-09 | 圣戈本陶瓷及塑料股份有限公司 | 液相烧结碳化硅研磨颗粒 |
BR112014007089A2 (pt) | 2011-09-26 | 2017-03-28 | Saint-Gobain Ceram & Plastics Inc | artigos abrasivos incluindo materiais de partículas abrasivas, abrasivos revestidos usando os materiais de partículas abrasivas e os métodos de formação |
US9168638B2 (en) | 2011-09-29 | 2015-10-27 | Saint-Gobain Abrasives, Inc. | Abrasive products and methods for finishing hard surfaces |
KR102187425B1 (ko) | 2011-12-30 | 2020-12-09 | 생-고뱅 세라믹스 앤드 플라스틱스, 인코포레이티드 | 형상화 연마입자 및 이의 형성방법 |
CN104114664B (zh) | 2011-12-30 | 2016-06-15 | 圣戈本陶瓷及塑料股份有限公司 | 形成成型研磨颗粒 |
PL2797716T3 (pl) | 2011-12-30 | 2021-07-05 | Saint-Gobain Ceramics & Plastics, Inc. | Kompozytowe ukształtowane cząstki ścierne i sposób ich formowania |
WO2013106575A1 (en) | 2012-01-10 | 2013-07-18 | Saint-Gobain Abrasives, Inc. | Abrasive products and methods for finishing coated surfaces |
EP3705177A1 (en) | 2012-01-10 | 2020-09-09 | Saint-Gobain Ceramics & Plastics Inc. | Abrasive particles having complex shapes and methods of forming same |
US8840696B2 (en) | 2012-01-10 | 2014-09-23 | Saint-Gobain Ceramics & Plastics, Inc. | Abrasive particles having particular shapes and methods of forming such particles |
CA2867350C (en) | 2012-03-16 | 2017-05-23 | Saint-Gobain Abrasives, Inc. | Abrasive products and methods for finishing surfaces |
US8968435B2 (en) | 2012-03-30 | 2015-03-03 | Saint-Gobain Abrasives, Inc. | Abrasive products and methods for fine polishing of ophthalmic lenses |
US9242346B2 (en) | 2012-03-30 | 2016-01-26 | Saint-Gobain Abrasives, Inc. | Abrasive products having fibrillated fibers |
KR102534897B1 (ko) | 2012-05-23 | 2023-05-30 | 생-고뱅 세라믹스 앤드 플라스틱스, 인코포레이티드 | 형상화 연마입자들 및 이의 형성방법 |
US10106714B2 (en) | 2012-06-29 | 2018-10-23 | Saint-Gobain Ceramics & Plastics, Inc. | Abrasive particles having particular shapes and methods of forming such particles |
KR20150030237A (ko) * | 2012-07-25 | 2015-03-19 | 코니카 미놀타 가부시키가이샤 | 연마재 재생 방법 |
US9440332B2 (en) | 2012-10-15 | 2016-09-13 | Saint-Gobain Abrasives, Inc. | Abrasive particles having particular shapes and methods of forming such particles |
KR101818946B1 (ko) | 2012-12-31 | 2018-01-17 | 생-고뱅 세라믹스 앤드 플라스틱스, 인코포레이티드 | 미립자 소재 및 이의 형성방법 |
CN107685296B (zh) | 2013-03-29 | 2020-03-06 | 圣戈班磨料磨具有限公司 | 具有特定形状的磨粒、形成这种粒子的方法及其用途 |
TW201502263A (zh) | 2013-06-28 | 2015-01-16 | Saint Gobain Ceramics | 包含成形研磨粒子之研磨物品 |
CA3114978A1 (en) | 2013-09-30 | 2015-04-02 | Saint-Gobain Ceramics & Plastics, Inc. | Shaped abrasive particles and methods of forming same |
US9281210B2 (en) * | 2013-10-10 | 2016-03-08 | Cabot Microelectronics Corporation | Wet-process ceria compositions for polishing substrates, and methods related thereto |
KR101870617B1 (ko) | 2013-12-31 | 2018-06-26 | 생-고뱅 어브레이시브즈, 인코포레이티드 | 형상화 연마 입자들을 포함하는 연마 물품 |
US9771507B2 (en) | 2014-01-31 | 2017-09-26 | Saint-Gobain Ceramics & Plastics, Inc. | Shaped abrasive particle including dopant material and method of forming same |
MX2016013464A (es) | 2014-04-14 | 2017-04-13 | Saint-Gobain Ceram & Plastics Inc | Articulo abrasivo que incluye particulas abrasivas conformadas. |
ES2972193T3 (es) | 2014-04-14 | 2024-06-11 | Saint Gobain Ceramics | Artículo abrasivo que incluye partículas abrasivas conformadas |
WO2015184355A1 (en) | 2014-05-30 | 2015-12-03 | Saint-Gobain Abrasives, Inc. | Method of using an abrasive article including shaped abrasive particles |
US9914864B2 (en) | 2014-12-23 | 2018-03-13 | Saint-Gobain Ceramics & Plastics, Inc. | Shaped abrasive particles and method of forming same |
US9707529B2 (en) | 2014-12-23 | 2017-07-18 | Saint-Gobain Ceramics & Plastics, Inc. | Composite shaped abrasive particles and method of forming same |
US9676981B2 (en) | 2014-12-24 | 2017-06-13 | Saint-Gobain Ceramics & Plastics, Inc. | Shaped abrasive particle fractions and method of forming same |
WO2016161157A1 (en) | 2015-03-31 | 2016-10-06 | Saint-Gobain Abrasives, Inc. | Fixed abrasive articles and methods of forming same |
TWI634200B (zh) | 2015-03-31 | 2018-09-01 | 聖高拜磨料有限公司 | 固定磨料物品及其形成方法 |
EP3307483B1 (en) | 2015-06-11 | 2020-06-17 | Saint-Gobain Ceramics&Plastics, Inc. | Abrasive article including shaped abrasive particles |
PL3455321T3 (pl) | 2016-05-10 | 2022-12-12 | Saint-Gobain Ceramics&Plastics, Inc. | Sposób formowania cząstek ściernych |
CN109462993A (zh) | 2016-05-10 | 2019-03-12 | 圣戈本陶瓷及塑料股份有限公司 | 磨料颗粒及其形成方法 |
EP4349896A3 (en) | 2016-09-29 | 2024-06-12 | Saint-Gobain Abrasives, Inc. | Fixed abrasive articles and methods of forming same |
US10563105B2 (en) | 2017-01-31 | 2020-02-18 | Saint-Gobain Ceramics & Plastics, Inc. | Abrasive article including shaped abrasive particles |
US10759024B2 (en) | 2017-01-31 | 2020-09-01 | Saint-Gobain Ceramics & Plastics, Inc. | Abrasive article including shaped abrasive particles |
WO2018236989A1 (en) | 2017-06-21 | 2018-12-27 | Saint-Gobain Ceramics & Plastics, Inc. | PARTICULATE MATERIALS AND METHODS OF FORMATION THEREOF |
KR20220116556A (ko) | 2019-12-27 | 2022-08-23 | 세인트-고바인 세라믹스 앤드 플라스틱스, 인크. | 연마 물품 및 이의 형성 방법 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1501570A (en) | 1975-11-11 | 1978-02-15 | Showa Denko Kk | Abrader for mirror polishing of glass and method for mirror polishing |
EP0078098B1 (en) * | 1981-08-07 | 1986-05-14 | United Kingdom Atomic Energy Authority | Cerium compounds |
FR2549846B1 (fr) | 1983-07-29 | 1986-12-26 | Rhone Poulenc Spec Chim | Nouvelle composition de polissage a base de cerium et son procede de fabrication |
FI95387C (fi) | 1992-12-29 | 1996-01-25 | Borealis As | Menetelmä -olefiinien polymeroimiseksi sekä esipolymeroitu katalyyttikompositio ja menetelmä tämän valmistamiseksi |
US5527423A (en) | 1994-10-06 | 1996-06-18 | Cabot Corporation | Chemical mechanical polishing slurry for metal layers |
US5693239A (en) | 1995-10-10 | 1997-12-02 | Rodel, Inc. | Polishing slurries comprising two abrasive components and methods for their use |
WO1997029510A1 (fr) * | 1996-02-07 | 1997-08-14 | Hitachi Chemical Company, Ltd. | Abrasif d'oxyde de cerium, microplaquette semi-conductrice, dispositif semi-conducteur, procede pour les produire et procede pour polir les substrats |
US5858813A (en) | 1996-05-10 | 1999-01-12 | Cabot Corporation | Chemical mechanical polishing slurry for metal layers and films |
KR19980019046A (ko) | 1996-08-29 | 1998-06-05 | 고사이 아키오 | 연마용 조성물 및 이의 용도(Abrasive composition and use of the same) |
JPH10102040A (ja) * | 1996-09-30 | 1998-04-21 | Hitachi Chem Co Ltd | 酸化セリウム研磨剤及び基板の研磨法 |
JPH10106986A (ja) * | 1996-09-30 | 1998-04-24 | Hitachi Chem Co Ltd | 酸化セリウム研磨剤及び基板の研磨法 |
US5759917A (en) | 1996-12-30 | 1998-06-02 | Cabot Corporation | Composition for oxide CMP |
JP3359535B2 (ja) * | 1997-04-25 | 2002-12-24 | 三井金属鉱業株式会社 | 半導体装置の製造方法 |
-
2000
- 2000-04-21 US US09/553,968 patent/US6238450B1/en not_active Expired - Fee Related
- 2000-05-16 TW TW089109353A patent/TW503216B/zh not_active IP Right Cessation
- 2000-06-06 IL IL14704000A patent/IL147040A/xx not_active IP Right Cessation
- 2000-06-06 MX MXPA01013093A patent/MXPA01013093A/es active IP Right Grant
- 2000-06-06 JP JP2001503391A patent/JP3887230B2/ja not_active Expired - Fee Related
- 2000-06-06 KR KR10-2001-7016080A patent/KR100429940B1/ko not_active IP Right Cessation
- 2000-06-06 CN CN00808911A patent/CN1129554C/zh not_active Expired - Fee Related
- 2000-06-06 EP EP00939578A patent/EP1200352B1/en not_active Expired - Lifetime
- 2000-06-06 CA CA002374373A patent/CA2374373C/en not_active Expired - Fee Related
- 2000-06-06 DE DE60001958T patent/DE60001958T2/de not_active Expired - Lifetime
- 2000-06-06 AU AU54647/00A patent/AU752038B2/en not_active Ceased
- 2000-06-06 WO PCT/US2000/015479 patent/WO2000076920A1/en active IP Right Grant
- 2000-06-06 BR BRPI0012290-4A patent/BR0012290B1/pt not_active IP Right Cessation
- 2000-06-14 MY MYPI20002675 patent/MY125250A/en unknown
Also Published As
Publication number | Publication date |
---|---|
DE60001958D1 (de) | 2003-05-08 |
CA2374373C (en) | 2005-04-05 |
KR100429940B1 (ko) | 2004-05-03 |
BR0012290B1 (pt) | 2009-01-13 |
MY125250A (en) | 2006-07-31 |
CN1355769A (zh) | 2002-06-26 |
JP3887230B2 (ja) | 2007-02-28 |
IL147040A (en) | 2005-07-25 |
AU5464700A (en) | 2001-01-02 |
IL147040A0 (en) | 2002-08-14 |
DE60001958T2 (de) | 2004-03-04 |
KR20020015698A (ko) | 2002-02-28 |
EP1200352A1 (en) | 2002-05-02 |
AU752038B2 (en) | 2002-09-05 |
CN1129554C (zh) | 2003-12-03 |
US6238450B1 (en) | 2001-05-29 |
TW503216B (en) | 2002-09-21 |
CA2374373A1 (en) | 2000-12-21 |
WO2000076920A1 (en) | 2000-12-21 |
EP1200352B1 (en) | 2003-04-02 |
JP2003502255A (ja) | 2003-01-21 |
MXPA01013093A (es) | 2002-06-04 |
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