WO2020211087A1 - 阵列基板、其制备方法及显示装置 - Google Patents
阵列基板、其制备方法及显示装置 Download PDFInfo
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- WO2020211087A1 WO2020211087A1 PCT/CN2019/083518 CN2019083518W WO2020211087A1 WO 2020211087 A1 WO2020211087 A1 WO 2020211087A1 CN 2019083518 W CN2019083518 W CN 2019083518W WO 2020211087 A1 WO2020211087 A1 WO 2020211087A1
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/13—Active-matrix OLED [AMOLED] displays comprising photosensors that control luminance
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/121—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
- H10K59/1213—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements the pixel elements being TFTs
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/121—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
- H10K59/1216—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements the pixel elements being capacitors
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/30—Devices specially adapted for multicolour light emission
- H10K59/35—Devices specially adapted for multicolour light emission comprising red-green-blue [RGB] subpixels
- H10K59/353—Devices specially adapted for multicolour light emission comprising red-green-blue [RGB] subpixels characterised by the geometrical arrangement of the RGB subpixels
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/60—OLEDs integrated with inorganic light-sensitive elements, e.g. with inorganic solar cells or inorganic photodiodes
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/1201—Manufacture or treatment
Definitions
- the present disclosure relates to the field of display technology, and in particular to an array substrate, a preparation method thereof, and a display device.
- OLED displays are one of the hotspots in the field of display research today. Compared with Liquid Crystal Displays (LCD), OLED displays have low energy consumption, low production costs, self-luminous, and wide viewing angles. And the advantages of fast response. In display fields such as mobile phones, tablet computers, and digital cameras, OLED displays have been widely used.
- LCD Liquid Crystal Displays
- a plurality of pixel units are located on the base substrate, each of the pixel units includes a plurality of sub-pixels; each of the sub-pixels includes:
- the pixel circuit includes a driving transistor for driving the electroluminescent device to emit light; wherein, the driving transistor is a low-temperature polysilicon transistor;
- the light-emitting detection circuit includes a detection switch transistor and a PIN-type photodiode; wherein the detection switch transistor is a metal oxide transistor.
- the first electrode of the driving transistor is coupled to the first power terminal, and the second electrode of the driving transistor is coupled to the first terminal of the electroluminescent device;
- the pixel circuit further includes: a data switch transistor and a compensation switch transistor;
- the gate of the data switch transistor is coupled to the first scan signal terminal, the first electrode of the data switch transistor is coupled to the data signal terminal, and the second electrode of the data switch transistor is connected to the gate of the driving transistor.
- the gate of the compensation switch transistor is coupled to the second scan signal terminal, the first pole of the compensation switch transistor is coupled to the preset signal terminal, and the second pole of the compensation switch transistor is connected to the electroluminescent device ⁇ first end coupled.
- the data switch transistor is a low temperature polysilicon transistor or a metal oxide transistor.
- the compensation switching transistor is a low temperature polysilicon transistor or a metal oxide transistor.
- the driving transistor is an N-type transistor
- the pixel circuit further includes a storage capacitor
- the storage capacitor is coupled between the gate and the second electrode of the driving transistor.
- the data switch transistor and the compensation switch transistor are both N-type transistors.
- the driving transistor is a P-type transistor
- the pixel circuit further includes: a storage capacitor
- the storage capacitor is coupled between the gate and the first electrode of the driving transistor.
- the data switch transistor and the compensation switch transistor are both P-type transistors.
- the luminescence detection circuit further includes: a detection capacitance
- the gate of the detection switch transistor is coupled to the third scan signal terminal, the first pole of the detection switch transistor is coupled to the second electrode of the PIN photodiode, and the second pole of the detection switch transistor is coupled to Optical detection signal terminal coupling;
- the first electrode of the PIN-type photodiode is coupled to a reference voltage terminal
- the detection capacitor is coupled between the first electrode and the second electrode of the PIN photodiode.
- each transistor using the metal oxide transistor is located on the side of each transistor using the low-temperature polysilicon transistor and the PIN photodiode away from the base substrate.
- an embodiment of the present disclosure also provides a display device including the above-mentioned array substrate.
- embodiments of the present disclosure also provide a method for preparing the above-mentioned array substrate, including:
- An electroluminescent device is formed on a base substrate on which the pixel circuit and the light emission detection circuit are formed.
- the forming the pixel circuit and the luminescence detection circuit on the base substrate includes:
- Each transistor using a metal oxide transistor is formed on a base substrate on which each transistor using a low-temperature polysilicon transistor and the PIN photodiode are formed.
- the formation of the transistors using low-temperature polysilicon transistors and the PIN-type photodiode on the base substrate includes:
- a first amorphous silicon layer is formed on the first electrode; wherein the orthographic projection of the first amorphous silicon layer on the base substrate overlaps with the orthographic projection of the first electrode on the base substrate ;
- a second amorphous silicon layer is formed on the first amorphous silicon layer; wherein, the orthographic projection of the second amorphous silicon layer on the base substrate is the same as that of the first electrode on the base substrate. Orthographic projection overlap
- a first gate insulating layer and a first gate are sequentially formed on the polysilicon layer to expose the source and drain regions of the polysilicon layer; wherein, the first gate insulating layer and the first gate
- the orthographic projection of the base substrate covers the channel region of the polysilicon layer;
- a third amorphous silicon layer is formed on the second amorphous silicon layer; wherein the orthographic projection of the third amorphous silicon layer on the base substrate is the same as that of the first electrode on the base substrate. Orthographic projection overlap
- a first interlayer dielectric layer is formed on the base substrate on which the second electrode is formed.
- each transistor using a metal oxide transistor on a base substrate on which each transistor using a low-temperature polysilicon transistor and the PIN-type photodiode are formed includes:
- a metal oxide semiconductor layer, a second gate insulating layer, and a second gate are sequentially formed on the first interlayer dielectric layer, exposing the source region and the drain region of the metal oxide semiconductor layer; wherein The orthographic projection of the second gate insulating layer and the second gate on the base substrate covers the channel region of the metal oxide semiconductor layer;
- a plurality of first connecting parts, second connecting parts and third connecting parts are formed on the second interlayer dielectric layer, so that the second electrode is connected to the corresponding first through the first via hole.
- Part is electrically connected, so that the source region and the drain region of the polysilicon layer are electrically connected to the corresponding second connection part through the first via hole, and the source region and the drain region of the metal oxide semiconductor layer
- the pole regions are respectively electrically connected to the corresponding third connecting parts through the second via holes; wherein, one of the PIN-type photodiodes corresponds to one first connecting part, one low-temperature polysilicon transistor corresponds to two second connecting parts, and one metal The oxide transistor corresponds to two third connecting parts.
- FIG. 1 is a schematic diagram of the structure of an array substrate in an embodiment of the disclosure
- FIG. 2 is one of the structural schematic diagrams of the pixel circuit in the embodiment of the disclosure.
- FIG. 3 is a schematic diagram of the structure of the luminescence detection circuit in the embodiment of the disclosure.
- FIG. 4 is a schematic partial sectional view of the structure of the array substrate in the embodiment of the disclosure.
- FIG. 5 is one of the partial top structural schematic diagrams of the array substrate in the embodiment of the disclosure.
- FIG. 6a is one of the circuit timing diagrams provided by an embodiment of the disclosure.
- FIG. 6b is the second sequence diagram of the circuit provided by the embodiment of the disclosure.
- FIG. 7 is a second schematic diagram of a partial top view of the array substrate in an embodiment of the disclosure.
- FIG. 8 is the third of a circuit timing diagram provided by an embodiment of the disclosure.
- 11 is the third flow chart of the manufacturing method of the array substrate in the embodiment of the disclosure.
- FIGS. 12a to 12m are respectively schematic cross-sectional structural diagrams of an array substrate obtained corresponding to each manufacturing step in a manufacturing method of an array substrate provided by an embodiment of the disclosure.
- OLEDs are driven by current, and light emission is controlled by using pixel circuits.
- the driving transistor provides a driving current for the OLED to light up each sub-pixel.
- the magnitude of the current directly determines the brightness of the sub-pixel.
- the luminescence brightness of OLED will change.
- a luminescence detection circuit that detects the intensity of light emitted by the OLED is generally set in the sub-pixels to detect through luminescence The circuit compensates for the light emission of the OLED.
- the luminescence detection circuit can include a detection switch transistor and a PIN-type photodiode.
- the PIN-type photodiode When the luminescence detection circuit detects the intensity of the light emitted by the OLED, the PIN-type photodiode receives the light emitted by the OLED and converts the received light into an electrical signal, so as to compensate the OLED light emission through the converted electrical signal. If the leakage current of the detection switch transistor is large when it is turned off, this will adversely affect the accuracy of the detection result.
- H atoms are involved in the manufacturing process of the PIN photodiode, and the driving transistor in the pixel circuit generally uses a metal oxide transistor, so that the H atoms of the PIN photodiode pass through the insulating layer and enter the driving transistor. When in the channel region of the source layer, it will cause the threshold voltage of the driving transistor to drift, which will cause the current flowing through the OLED to change, resulting in uneven display brightness, thereby affecting the display effect of the entire image.
- the embodiments of the present disclosure provide an array substrate to improve the display effect.
- Some array substrates provided by embodiments of the present disclosure, as shown in FIGS. 1 to 3, may include:
- a plurality of pixel units 200 are located on the base substrate 100, and each pixel unit 200 includes a plurality of sub-pixels 210; each sub-pixel 210 may include:
- Electroluminescent device 211
- the pixel circuit 212 includes a driving transistor M1 that drives the electroluminescent device 211 to emit light; wherein, the driving transistor M1 is a low-temperature polysilicon transistor;
- the light emission detection circuit 213 includes a detection switch transistor M4 and a PIN photodiode DP; wherein the detection switch transistor M4 is a metal oxide transistor.
- each sub-pixel may include: an electroluminescent device, a pixel circuit, and a light-emitting detection circuit.
- LTPS TFT Low-temperature poly-Si Thin Film Transistor
- the performance is relatively stable. Therefore, by setting the driving transistor in the pixel circuit as a low-temperature polysilicon transistor, the influence of the H atom of the PIN-type photodiode can be avoided to improve the stability of the driving transistor, thereby improving the stability of the driving current generated by the driving transistor Performance, thereby improving the display effect.
- the off-state leakage current of the metal oxide transistor is small, by setting the detection switch transistor as a metal oxide transistor, the influence of the leakage current can be reduced, the accuracy of the detection result can be improved, and the display effect can be improved.
- the pixel unit may include 3 sub-pixels.
- the three sub-pixels may be red sub-pixels, green sub-pixels and blue sub-pixels.
- the pixel unit may also include 4 sub-pixels.
- the four sub-pixels may be red sub-pixels, green sub-pixels, blue sub-pixels, and white sub-pixels.
- the number of sub-pixels in the pixel unit and specific implementations can be designed and determined according to the actual application environment, which is not limited here.
- the first end of the electroluminescent device is its anode, and the second end is its cathode. And the second terminal of the electroluminescent device is coupled to the second power terminal VSS.
- a general electroluminescent device has a light-emitting threshold voltage, and emits light when the voltage difference between the two ends of the electroluminescent device is greater than or equal to the light-emitting threshold voltage.
- the electroluminescent device can be configured as an OLED.
- the electroluminescent device can also be configured as Quantum Dot Light Emitting Diodes (QLED).
- QLED Quantum Dot Light Emitting Diodes
- the first electrode of the driving transistor M1 is coupled to the first power supply terminal VDD, and the second electrode of the driving transistor M1 is connected to the first electrode of the electroluminescent device 211. End coupling
- the pixel circuit 212 may further include: a data switch transistor M2 and a compensation switch transistor M3;
- the gate of the data switch transistor M2 is coupled to the first scan signal terminal G1, the first pole of the data switch transistor M2 is coupled to the data signal terminal DA, and the second pole of the data switch transistor M2 is coupled to the gate G of the drive transistor M1 Connect
- the gate of the compensation switch transistor M3 is coupled to the second scanning signal terminal G2, the first pole of the compensation switch transistor M3 is coupled to the preset signal terminal VS, and the second pole of the compensation switch transistor M3 is coupled to the first electrode of the electroluminescent device 211. One end is coupled.
- the signal of the data signal terminal DA can be provided to the gate of the driving transistor M1 G.
- the compensation switch transistor M3 is in the conducting state under the control of the signal of the second scan signal terminal G2, it can conduct the preset signal terminal VS with the first terminal of the electroluminescent device 211.
- the driving transistor M1 may be an N-type transistor; wherein the first electrode of the driving transistor M1 has its drain D, and the second electrode of the driving transistor M1 has its source When the driving transistor M1 is in a saturated state, the current flows from the drain D of the driving transistor M1 to its source S, so that the electroluminescent device 211 is realized under the action of the driving current when the driving transistor M1 is in the saturated state. Glow.
- the pixel circuit 212 may further include: a storage capacitor CST; wherein the storage capacitor CST is coupled between the gate G and the second electrode of the driving transistor M1 . That is, the storage capacitor CST is coupled between the gate G and the source S of the driving transistor M1 to store the voltage input to the storage capacitor CST.
- the data switch transistor M2 may be configured as a metal oxide transistor. In this way, the influence of the leakage current on the voltage input to the gate G of the driving transistor M1 can be reduced, the stability of the voltage input to the gate G of the driving transistor M1 can be improved, and the stability of the light emission brightness can be further improved.
- the data switch transistor M2 in order to unify the manufacturing process of the pixel circuit, can also be configured as a low-temperature polysilicon transistor.
- the specific implementation of the data switch transistor M2 can be designed and determined according to the actual application environment, which is not limited here.
- the compensation switch transistor M3 can be configured as a metal oxide transistor. In this way, the influence of the leakage current on the driving current flowing into the electroluminescent device 211 can be reduced, and the stability of the luminous brightness can be further improved. Or, in order to unify the manufacturing process of the pixel circuit, the compensation switch transistor M3 can also be set as a low-temperature polysilicon transistor. Of course, in actual applications, the specific implementation of the compensation switch transistor M3 can be designed and determined according to the actual application environment, which is not limited here.
- the data switch transistor M2 and the compensation switch transistor M3 are both N-type transistors.
- both the data switch transistor M2 and the compensation switch transistor M3 are metal oxide transistors or low temperature polysilicon transistors, the process difficulty of manufacturing the pixel circuit can be reduced.
- both the switching transistor M2 and the compensation switching transistor M3 may be P-type transistors.
- both the data switch transistor M2 and the compensation switch transistor M3 may be metal oxide transistors or low temperature polysilicon transistors, the process difficulty of manufacturing the pixel circuit can be reduced.
- the light emission detection circuit 213 may further include: a detection capacitor CSF;
- the gate of the detection switch transistor M4 is coupled to the third scanning signal terminal G3, the first pole of the detection switch transistor M4 is coupled to the second electrode of the PIN-type photodiode DP, and the second pole of the detection switch transistor M4 is coupled to the optical detection signal Terminal VG coupling;
- the first electrode of the PIN photodiode DP is coupled to the reference voltage terminal VREF;
- the detection capacitor CSF is coupled between the first electrode and the second electrode of the PIN photodiode DP.
- the first electrode of the PIN photodiode DP may be the anode of the PIN photodiode DP
- the second electrode of the PIN photodiode DP may be the cathode of the PIN photodiode DP
- the detection switch transistor M4 when the detection switch transistor M4 is in the on state under the control of the signal of the third scan signal terminal G3, the second electrode of the PIN photodiode DP can be connected to the optical detection signal terminal VG is turned on.
- the detection capacitor CSF can store the input voltage.
- the transistors using metal oxide transistors can be located on the side of the transistors using low-temperature polysilicon transistors and the PIN photodiode away from the base substrate.
- the detecting switch transistor M4 is located on the side of the driving transistor M1 and the PIN photodiode DP away from the base substrate. The influence of the H atoms in the PIN photodiode on the metal oxide transistor can be further avoided.
- the driving transistor M1 will experience aging, which will cause the threshold voltage Vth and mobility of the driving transistor M1 to drift, which will cause a difference in display brightness.
- the pixel circuit shown in FIG. 2 may be used to compensate the threshold voltage Vth and mobility of the driving transistor M1 through external compensation. In this way, it is also necessary to provide a first detection line SL1 in the array substrate so that the first pole of the compensation switch transistor M3 is coupled to the first detection line SL1.
- a plurality of first detection lines SL1 may be provided in the array substrate, and the first pole of the compensation switch transistor M3 of the pixel circuit in a column of sub-pixels 210 is coupled to one first detection line SL1.
- a plurality of second detection lines SL2 may be provided in the array substrate.
- the second pole of the detection switch transistor M4 of the light-emitting detection circuit 213 in a column of sub-pixels 210 is coupled to a second detection line SL2.
- the photodiode DP detects the light emission of the electroluminescence device 211 to compensate the light emission brightness of the electroluminescence device 211.
- the electrical compensation stage T10 in FIG. 6a and the optical compensation stage T20 in FIG. 6b are mainly selected.
- the electrical compensation stage T10 may include: T11, T12 and T13 stages.
- the optical compensation stage T20 may include: T21, T22, T23, T24, and T25 stages.
- the data switch transistor M2 is turned on under the high level control of the signal g1 of the first scan signal terminal G1 to provide the data voltage Vs to the gate G of the driving transistor M1 and store it through the storage capacitor CST.
- the compensating switch transistor M3 is turned on under the high level control of the signal g2 of the second scan signal terminal G2 to provide the reference voltage signal on the first detection line SL1 to the first terminal of the electroluminescent device 211 for the The electroluminescent device 211 is reset.
- the voltage value of the reference voltage signal may be smaller than the voltage value of the signal of the second power terminal VSS, so that the electroluminescent device 211 is in a reverse bias state, and the characteristics of the electroluminescent device 211 are restored.
- the data switch transistor M2 is turned on under the high level control of the signal g1 of the first scan signal terminal G1 to provide the data voltage Vs to the gate G of the driving transistor M1 and store it through the storage capacitor CST.
- the compensation switch transistor M3 is turned off under the low level control of the signal g2 of the second scan signal terminal G2.
- the data switch transistor M2 is turned on under the high level control of the signal g1 of the first scan signal terminal G1 to provide the data voltage Vs to the gate G of the driving transistor M1 and store it through the storage capacitor CST.
- the compensation switch transistor M3 is turned on under the high-level control of the signal g2 of the second scan signal terminal G2, so as to provide the voltage V1 of the first terminal of the electroluminescent device 211 to the first detection line SL1.
- the first detection voltage V1 is acquired through a driver IC (Integrated Circuit, integrated circuit), so as to perform analysis and compensation calculations through the first detection voltage V1, thereby improving the screen display effect.
- the driving transistor M1 adopts a low-temperature polysilicon transistor, the influence of the H atom of the PIN-type photodiode can be avoided to improve the stability of the driving transistor M1, thereby improving the stability of the driving current I generated by the driving transistor M1, thereby improving the display effect.
- the detection switch transistor M4 is turned off under the low level control of the signal g3 of the third scan signal terminal G3.
- the detection switch transistor M4 is turned on under the high level control of the signal g3 of the third scan signal terminal G3, and the second electrode of the PIN photodiode DP is turned on with the second detection line SL2, so that the PIN A positive voltage is applied to the second electrode of the type photodiode DP.
- the reference voltage terminal VREF is loaded with a negative voltage (for example, -5V), so that the first electrode of the PIN-type photodiode DP is loaded with a negative voltage, so that the PIN-type photodiode DP works in a reverse bias state.
- the data switch transistor M2 is turned off under the low level control of the signal g1 at the first scan signal terminal G1, and the compensation switch transistor M3 is turned off under the low level control of the signal g2 at the second scan signal terminal G2.
- the data switch transistor M2 is turned on under the high level control of the signal g1 at the first scan signal terminal G1, and the compensation switch transistor M3 is turned on under the high level control of the signal g2 at the second scan signal terminal G2. through.
- the turned-on data switch transistor M2 provides the input data voltage Vdata to the gate G of the driving transistor M1, so that the voltage of the gate G of the driving transistor M1 is Vdata.
- the turned-on compensation switch transistor M3 provides the reference voltage signal (for example, 0V) transmitted on the first detection line SL1 to the electroluminescent device 211.
- the voltage value of the reference voltage signal may be smaller than the voltage value of the signal of the second power terminal VSS, so that the electroluminescent device 211 is in a reverse bias state, and the characteristics of the electroluminescent device 211 are restored.
- the detection switch transistor M4 is turned off under the low level control of the signal g3 of the third scan signal terminal G3.
- the data switch transistor M2 is turned off under the low level control of the signal g1 at the first scan signal terminal G1, and the compensation switch transistor M3 is turned off under the low level control of the signal g2 at the second scan signal terminal G2.
- the detection switch transistor M4 is turned off under the low level control of the signal g3 of the third scan signal terminal G3.
- the driving current I generated by the driving transistor M1 can drive the electroluminescent device 211 to emit light, so that the PIN-type photodiode DP can receive the light emitted by the electroluminescent device 211 and convert the received light into current, thereby making the PIN-type
- the voltage of the second electrode of the photodiode DP changes.
- the data switch transistor M2 is turned on under the high level control of the signal g1 at the first scan signal terminal G1, and the compensation switch transistor M3 is turned on under the high level control of the signal g2 at the second scan signal terminal G2 .
- the turned-on data switch transistor M2 provides a data voltage Vdata of 0V to the gate G of the driving transistor M1.
- the turned-on compensation switch transistor M3 provides the reference voltage signal (for example, 0V) transmitted on the first detection line SL1 to the electroluminescent device 211. In this way, the electroluminescent device 211 can stop emitting light, thereby ensuring that the voltage of the second electrode of the PIN-type photodiode DP is stable.
- the detection switch transistor M4 is turned on under the high-level control of the signal g3 of the third scan signal terminal G3 to conduct the PIN photodiode DP with the second detection line SL2, thereby turning the PIN photodiode DP on.
- the voltage of the second electrode is transmitted to the second detection line SL2, so that the second detection line SL2 is charged with the second detection voltage V2.
- the second detection voltage V2 is acquired by the driver IC, so as to perform analysis and compensation calculations through the second detection voltage V2, so as to improve the screen display effect.
- the detection switch transistor M4 is configured as a metal oxide transistor, the influence of leakage current can be reduced, the accuracy of the detection result can be improved, and the display effect can be improved.
- the electrical compensation stage T10 may be performed when the display device is turned on or off, and the optical compensation stage T20 may be performed when the display device is turned on.
- the electrical compensation stage T10 and the optical compensation stage T20 can be designed and determined according to the actual application environment, which is not limited here.
- FIG. 7 The schematic structural diagrams of other array substrates of the embodiments of the present disclosure are shown in FIG. 7, which are modified from the embodiment shown in FIG. 5. The following describes only the differences between this embodiment and the embodiment corresponding to FIG. 5, and the similarities are not repeated here.
- the driving transistor M1 may be a P-type transistor; wherein, the first electrode of the driving transistor M1 has its source S, and the second electrode of the driving transistor M1 has its drain.
- the driving transistor M1 When the driving transistor M1 is in a saturated state, the current flows from the source S of the driving transistor M1 to its drain D, so that the electroluminescent device 211 is realized under the action of the driving current when the driving transistor M1 is in the saturated state. Glow.
- the pixel circuit 212 may further include: a storage capacitor CST; wherein the storage capacitor CST is coupled between the gate G and the first electrode of the driving transistor M1 . That is, the storage capacitor CST is coupled between the gate G and the source S of the driving transistor M1 to store the voltage input to the storage capacitor CST.
- a reference signal line VREFL may also be provided in the array substrate, and the first pole of the compensation switch transistor M3 of the pixel circuit 212 in all sub-pixels 210 and the reference signal line VREFL is coupled.
- g1 represents the signal of the first scan signal terminal G1
- g2 represents the signal of the second scan signal terminal G2
- g3 represents the signal of the third scan signal terminal G2
- da represents the signal of the data signal terminal DA
- Vdata represents the data voltage of the data signal terminal DA
- vsl2 represents the voltage on the second detection line SL2.
- the display stage T30 in FIG. 8 and the optical compensation stage T20 in FIG. 6b are mainly selected.
- the display stage T30 may include: T31 and T32 stages.
- the optical compensation stage T20 may include: T21, T22, T23, T24, and T25 stages.
- the data switch transistor M2 is turned on under the high level control of the signal g1 of the first scan signal terminal G1 to provide the data voltage Vd to the gate G of the driving transistor M1 and store it through the storage capacitor CST.
- the compensation switch transistor M3 is turned on under the high level control of the signal g2 of the second scan signal terminal G2 to provide the reference voltage signal on the reference signal line VREFL to the first terminal of the electroluminescent device 211, so as The light emitting device 211 is reset.
- the voltage value of the reference voltage signal may be smaller than the voltage value of the signal of the second power terminal VSS, so that the electroluminescent device 211 is in a reverse bias state, and the characteristics of the electroluminescent device 211 are restored.
- the data switch transistor M2 is turned off under the low level control of the signal g1 at the first scan signal terminal G1, and the compensation switch transistor M3 is turned off under the low level control of the signal g2 at the second scan signal terminal G2.
- the electroluminescent device 211 is driven to emit light by the driving current I.
- the driving transistor M1 adopts a low-temperature polysilicon transistor, the influence of the H atom of the PIN-type photodiode can be avoided to improve the stability of the driving transistor M1, thereby improving the stability of the driving current generated by the driving transistor M1, thereby improving the display effect .
- embodiments of the present disclosure also provide a method for preparing the above-mentioned array substrate, as shown in FIG. 9, which may include the following steps:
- the preparation method provided by the embodiments of the present disclosure is to form electroluminescent devices, pixel circuits, and light-emitting detection circuits on a base substrate, due to the influence of low-temperature poly-Si Thin Film Transistor (LTPS TFT) on the H atom
- LTPS TFT Low-temperature poly-Si Thin Film Transistor
- the lower performance is relatively stable. Therefore, by setting the driving transistor in the pixel circuit as a low-temperature polysilicon transistor, the influence of the H atom of the PIN-type photodiode can be avoided, so as to improve the stability of the driving transistor, thereby increasing the driving current generated by the driving transistor. Stability, thereby improving the display effect.
- the off-state leakage current of the metal oxide transistor is small, by setting the detection switch transistor as a metal oxide transistor, the influence of the leakage current can be reduced, the accuracy of the detection result can be improved, and the display effect can be improved.
- the structure of the pixel circuit and the light emission detection circuit formed on the base substrate may be basically the same as the structure of the pixel circuit and the light emission detection circuit in the above-mentioned embodiment of the array substrate. Do not repeat it.
- step S20 forms a pixel circuit and a light emission detection circuit on a base substrate, as shown in FIG. 10, which may include the following steps:
- S21 forming each transistor and PIN photodiode using low-temperature polysilicon transistors on the base substrate, as shown in FIG. 11, may include the following steps:
- a first gate insulating layer and a first gate are sequentially formed on the polysilicon layer, and the source region and the drain region of the polysilicon layer are exposed; wherein the first gate insulating layer and the first gate are on the base substrate
- the orthographic projection covers the channel region of the polysilicon layer; the source and drain regions of the polysilicon layer are respectively located on both sides of the channel region of the polysilicon layer;
- each transistor using a metal oxide transistor on a base substrate on which each transistor using a low-temperature polysilicon transistor and a PIN photodiode are formed can include the following steps:
- a metal oxide semiconductor layer, a second gate insulating layer, and a second gate are sequentially formed on the first interlayer dielectric layer, exposing the source region and the drain region of the metal oxide semiconductor layer; wherein, the second gate The orthographic projection of the insulating layer and the second gate on the base substrate covers the channel region of the metal oxide semiconductor layer;
- S2204 forming a plurality of first connecting portions, second connecting portions, and third connecting portions arranged at intervals on the second interlayer dielectric layer, so that the second electrode is electrically connected to the corresponding first connecting portion through the first via hole;
- the source region and the drain region of the polysilicon layer are respectively electrically connected to the corresponding second connection portion through the first via hole, and the source region and the drain region of the metal oxide semiconductor layer are respectively connected to the corresponding through the second via hole.
- the third connecting portion is electrically connected; wherein, a PIN-type photodiode corresponds to a first connecting portion, a low-temperature polysilicon transistor corresponds to two second connecting portions, and a metal oxide transistor corresponds to two third connecting portions.
- the method before forming the first electrode on the base substrate, the method further includes: forming a buffer layer covering the base substrate on the base substrate.
- the preparation method of the array substrate is listed below through the embodiments, but the reader should know that the specific process is not limited to this.
- the base substrate may be, for example, a glass substrate or a flexible substrate.
- the first electrode 312 may be a reflective electrode.
- the material of the first electrode 312 may be a metal material, for example, Al, Cu, Ag, Au, etc.
- a polysilicon layer 411 of the LTPS transistor is formed on the buffer layer 311; wherein, as shown in FIG. 12c, the polysilicon layer 411 and the first electrode 312 are spaced apart, so that the polysilicon layer 411 and the first electrode 312 are insulated.
- an amorphous silicon semiconductor layer of the LTPS transistor is formed and patterned on the buffer layer 311, and then dehydrogenation treatment and laser crystallization are performed on the amorphous silicon semiconductor layer, so that the amorphous silicon semiconductor layer forms a polysilicon layer 411.
- the first gate insulating layer 412 and the first gate 413 of the LTPS transistor are sequentially deposited on the polysilicon layer 411, and the source and drain regions of the polysilicon layer 411 are exposed; wherein, as shown in FIG. 12f, The orthographic projection of the first gate insulating layer 412 and the first gate 413 on the base substrate 100 covers the channel region of the polysilicon layer 411; the source region and the drain region of the polysilicon layer 411 are respectively located in the channel region of the polysilicon layer 411 side.
- a second electrode 316 is deposited on the third amorphous silicon layer 315; wherein, as shown in FIG. 12h, the orthographic projection of the second electrode 316 on the base substrate 100 and the first electrode 312 on the base substrate 100 The orthographic projections overlap.
- the material of the second electrode 316 may be a transparent conductive material, such as indium tin oxide (ITO) material, indium zinc oxide (IZO) material, carbon nanotube, graphene, or the like. In this way, the second electrode 316 can form a transparent electrode, so that the light emitted by the electroluminescent device can be sensed.
- ITO indium tin oxide
- IZO indium zinc oxide
- the metal oxide semiconductor layer 511, the second gate insulating layer 512, and the second gate 513 of the metal oxide transistor are sequentially formed on the first interlayer dielectric layer 320 to expose the source of the metal oxide semiconductor layer 511 Region and drain region; where, as shown in FIG. 12j, the orthographic projection of the second gate insulating layer 512 and the second gate 513 on the base substrate 100 covers the channel region of the metal oxide semiconductor layer 511.
- the source region and the drain region of the metal oxide semiconductor layer 511 are doped with corresponding ions to achieve conductorization.
- the material of the metal oxide semiconductor layer 511 may be indium gallium zinc oxide (Indium Gallium Zinc Oxide, IGZO).
- first via holes 611 penetrating the first interlayer dielectric layer 320 and the second interlayer dielectric layer 330 by etching, and forming a plurality of second via holes 612 penetrating the second interlayer dielectric layer, As shown in Figure 12k.
- one PIN photodiode corresponds to one first via 611
- one LTPS transistor corresponds to two first vias 611
- one metal oxide transistor corresponds to two second vias 612.
- An interlayer insulating layer 340 and a planarization layer 350 covering the base substrate 100 are sequentially deposited and formed on the base substrate 100 on which the first connection portion 317, the second connection portion 318, and the third connection portion 319 are formed, such as Shown in Figure 12m.
- An anode 711, a pixel defining layer 360, a light-emitting function layer 712, and a cathode 713 are sequentially deposited and formed on the planarization layer 350, as shown in FIG. Among them, the anode 711, the light-emitting functional layer 712, and the cathode 713 form an electroluminescent device.
- the anode 711 is electrically connected to the second electrode of the driving transistor M1 through a third via 613 penetrating the interlayer insulating layer 340 and the planarization layer 350.
- the anode 711 may have a single layer or a multilayer stacked layer structure.
- the anode 711 may have a stack structure of, for example, ITO/Ag/ITO.
- the material of the cathode 713 may be a transparent conductive material, such as indium tin oxide (ITO) material, indium zinc oxide (IZO) material, carbon nanotube, graphene, or the like.
- the first electrode 312, the first amorphous silicon layer 313, the second amorphous silicon layer 314, the third amorphous silicon layer 315, and the second electrode 316 can form a PIN-type photodiode.
- DP The source region and drain region of the polysilicon layer 411, the first gate insulating layer 412, the first gate 413, and the ion-doped polysilicon layer 411 form the driving transistor M1 of the LTPS transistor.
- embodiments of the present disclosure also provide a display device, including the above-mentioned array substrate provided by the embodiments of the present disclosure.
- the principle of solving the problems of the display device is similar to that of the aforementioned array substrate. Therefore, the implementation of the display device can refer to the implementation of the aforementioned array substrate, and the repetitive points will not be repeated here.
- the display device may be any product or component with a display function, such as a mobile phone, a tablet computer, a television, a monitor, a notebook computer, a digital photo frame, and a navigator.
- a display function such as a mobile phone, a tablet computer, a television, a monitor, a notebook computer, a digital photo frame, and a navigator.
- the other indispensable components of the display device are understood by those of ordinary skill in the art, and will not be repeated here, nor should they be used as a limitation to the present disclosure.
- the array substrate, the manufacturing method thereof, and the display device provided by the embodiments of the present disclosure have relatively stable performance under the influence of the H atom (Low Temperature Poly-Si Thin Film Transistor, LTPS TFT).
- the driving transistor is set as a low-temperature polysilicon transistor, which can avoid the influence of the H atoms of the PIN-type photodiode to improve the stability of the driving transistor, thereby improving the stability of the driving current generated by the driving transistor, thereby improving the display effect.
- the off-state leakage current of the metal oxide transistor is small, by setting the detection switch transistor as a metal oxide transistor, the influence of leakage current can be reduced, the accuracy of the detection result can be improved, and the display effect can be improved.
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Abstract
Description
Claims (15)
- 一种阵列基板,其中,包括:衬底基板;多个像素单元,位于所述衬底基板上,各所述像素单元包括多个子像素;各所述子像素包括:电致发光器件,像素电路,包括驱动所述电致发光器件发光的驱动晶体管;其中,所述驱动晶体管为低温多晶硅晶体管;发光检测电路,包括检测开关晶体管和PIN型光电二极管;其中,所述检测开关晶体管为金属氧化物晶体管。
- 如权利要求1所述的阵列基板,其中,所述驱动晶体管的第一极与第一电源端耦接,所述驱动晶体管的第二极与所述电致发光器件的第一端耦接;所述像素电路还包括:数据开关晶体管与补偿开关晶体管;所述数据开关晶体管的栅极与第一扫描信号端耦接,所述数据开关晶体管的第一极与数据信号端耦接,所述数据开关晶体管的第二极与所述驱动晶体管的栅极耦接;所述补偿开关晶体管的栅极与第二扫描信号端耦接,所述补偿开关晶体管的第一极与预设信号端耦接,所述补偿开关晶体管的第二极与所述电致发光器件的第一端耦接。
- 如权利要求2所述的阵列基板,其中,所述数据开关晶体管为低温多晶硅晶体管或金属氧化物晶体管。
- 如权利要求2所述的阵列基板,其中,所述补偿开关晶体管为低温多晶硅晶体管或金属氧化物晶体管。
- 如权利要求2-4任一项所述的阵列基板,其中,所述驱动晶体管为N型晶体管,所述像素电路还包括:存储电容;所述存储电容耦接于所述驱动晶体管的栅极与第二极之间。
- 如权利要求5所述的阵列基板,其中,所述数据开关晶体管和所述补偿开关晶体管均为N型晶体管。
- 如权利要求2-4任一项所述的阵列基板,其中,所述驱动晶体管为P型晶体管,所述像素电路还包括:存储电容;所述存储电容耦接于所述驱动晶体管的栅极与第一极之间。
- 如权利要求7所述的阵列基板,其中,所述数据开关晶体管和所述补偿开关晶体管均为P型晶体管。
- 如权利要求1-8任一项所述的阵列基板,其中,所述发光检测电路还包括:检测电容;所述检测开关晶体管的栅极与第三扫描信号端耦接,所述检测开关晶体管的第一极与所述PIN型光电二极管的第二电极耦接,所述检测开关晶体管的第二极与光学检测信号端耦接;所述PIN型光电二极管的第一电极与参考电压端耦接;所述检测电容耦接于所述PIN型光电二极管的第一电极与第二电极之间。
- 如权利要求1-9任一项所述的阵列基板,其中,采用所述金属氧化物晶体管的各晶体管位于采用所述低温多晶硅晶体管的各晶体管和所述PIN型光电二极管背离所述衬底基板一侧。
- 一种显示装置,其中,包括如权利要求1-10任一项所述的阵列基板。
- 一种如权利要求1-10任一项所述的阵列基板的制备方法,其中,包括:提供一衬底基板;在所述衬底基板上形成所述像素电路和所述发光检测电路;在形成有所述像素电路和所述发光检测电路的衬底基板上形成电致发光器件。
- 如权利要求12所述的制备方法,其中,所述在所述衬底基板上形成所述像素电路和所述发光检测电路,包括:在所述衬底基板上形成采用低温多晶硅晶体管的各晶体管和所述PIN型 光电二极管;在形成有采用低温多晶硅晶体管的各晶体管和所述PIN型光电二极管的衬底基板上形成采用金属氧化物晶体管的各晶体管。
- 如权利要求13所述的制备方法,其中,所述在所述衬底基板上形成采用低温多晶硅晶体管的各晶体管和所述PIN型光电二极管,包括:在所述衬底基板上形成第一电极;在所述衬底基板上形成多晶硅层;其中,所述多晶硅层与所述第一电极间隔设置;在所述第一电极上形成第一非晶硅层;其中,所述第一非晶硅层在所述衬底基板的正投影与所述第一电极在所述衬底基板的正投影重叠;对所述多晶硅层和所述第一非晶硅层进行第一次离子掺杂;在所述第一非晶硅层上形成第二非晶硅层;其中,所述第二非晶硅层在所述衬底基板的正投影与所述第一电极在所述衬底基板的正投影重叠;在所述多晶硅层上依次形成第一栅绝缘层和第一栅极,暴露出所述多晶硅层的源极区和漏极区;其中,所述第一栅绝缘层和所述第一栅极在所述衬底基板的正投影覆盖所述多晶硅层的沟道区;在所述第二非晶硅层上形成第三非晶硅层;其中,所述第三非晶硅层在所述衬底基板的正投影与所述第一电极在所述衬底基板的正投影重叠;对所述多晶硅层的源极区和漏极区以及所述第三非晶硅层进行第二次离子掺杂;在所述第三非晶硅层上形成第二电极;其中,所述第二电极在所述衬底基板的正投影与所述第一电极在所述衬底基板的正投影重叠;在形成有所述第二电极的衬底基板上形成第一层间介质层。
- 如权利要求14所述的制备方法,其中,所述在形成有采用低温多晶硅晶体管的各晶体管和所述PIN型光电二极管的衬底基板上形成采用金属氧化物晶体管的各晶体管,包括:在所述第一层间介质层上依次形成金属氧化物半导体层、第二栅绝缘层 以及第二栅极,暴露出所述金属氧化物半导体层的源极区和漏极区;其中,所述第二栅绝缘层和所述第二栅极在所述衬底基板的正投影覆盖所述金属氧化物半导体层的沟道区;在形成有所述金属氧化物半导体层、所述第二栅绝缘层以及所述第二栅极的衬底基板上形成第二层间介质层;通过刻蚀形成贯穿所述第一层间介质层和所述第二层间介质层的第一过孔,以及形成贯穿所述第二层间介质层的第二过孔;在所述第二层间介质层上形成间隔设置的多个第一连接部、第二连接部以及第三连接部,使所述第二电极通过所述第一过孔与对应的第一连接部电连接,使所述多晶硅层的源极区和漏极区分别通过所述第一过孔与对应的第二连接部电连接,以及使所述金属氧化物半导体层的源极区和漏极区分别通过第二过孔与对应的第三连接部电连接;其中,一个所述PIN型光电二极管对应一个第一连接部,一个低温多晶硅晶体管对应两个第二连接部,一个所述金属氧化物晶体管对应两个第三连接部。
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CN106783921A (zh) * | 2016-12-22 | 2017-05-31 | 深圳市华星光电技术有限公司 | 有机发光显示面板及其制作方法 |
CN107464529A (zh) * | 2017-10-12 | 2017-12-12 | 京东方科技集团股份有限公司 | 显示基板及其制备方法、显示面板及其驱动方法 |
CN108428721A (zh) * | 2018-03-19 | 2018-08-21 | 京东方科技集团股份有限公司 | 一种显示装置及控制方法 |
CN108538255A (zh) * | 2018-04-11 | 2018-09-14 | 京东方科技集团股份有限公司 | 像素驱动电路、像素驱动方法、阵列基板和显示装置 |
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CN109964316B (zh) | 2023-05-09 |
CN109964316A (zh) | 2019-07-02 |
US20210233984A1 (en) | 2021-07-29 |
US11302760B2 (en) | 2022-04-12 |
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