WO2013155757A1 - 液晶显示面板配线区线路结构及液晶显示面板测试方法 - Google Patents
液晶显示面板配线区线路结构及液晶显示面板测试方法 Download PDFInfo
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- WO2013155757A1 WO2013155757A1 PCT/CN2012/076143 CN2012076143W WO2013155757A1 WO 2013155757 A1 WO2013155757 A1 WO 2013155757A1 CN 2012076143 W CN2012076143 W CN 2012076143W WO 2013155757 A1 WO2013155757 A1 WO 2013155757A1
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136254—Checking; Testing
Definitions
- the present invention relates to the field of liquid crystal display technology, and in particular, to a wiring structure of a liquid crystal display panel wiring area and a liquid crystal display panel testing method.
- the liquid crystal display device of the prior art mainly includes a liquid crystal display panel and a backlight module.
- the liquid crystal display panel includes a display area 1 and a wiring area 2 adjacent thereto, wherein the display area 1 includes a plurality of data lines. (data Line) and a gate line; the wiring area 2 includes a wiring 3 correspondingly connected to a plurality of data lines and scanning lines, and a test line 4 connected to the wiring 3.
- the screen detecting machine when testing the screen of the liquid crystal display panel, the screen detecting machine inputs the test signal into the display area 1 of the liquid crystal display panel through the test line 4 and the wiring 3 through the signal test point 5, and the screen inspection machine tests the finished product. After that, the laser cutting machine is used to cut off the connecting portion 6 of the test line 4 and the wiring 3, and then supplied to the subsequent module process.
- COF Chip On
- a film, a flip chip is attached to a pad 7 on the wiring 3 to provide a signal.
- COF Chip On
- clarifying the cause of the box process it is necessary
- the COF is removed, and the screen detection is performed again in the screen detecting machine in the box forming process.
- the connecting portion 6 for the test test wire 4 and the wiring 3 has been cut by the laser cutting machine in the box forming process, It is impossible to detect again through the screen inspection machine in the box-forming process, which plagues the clarification of responsibility.
- a primary object of the present invention is to provide a liquid crystal display panel wiring area line structure and a liquid crystal display panel testing method capable of testing a liquid crystal display panel when a test line and a wiring connection portion are cut.
- the present invention provides a wiring structure of a liquid crystal display panel wiring area, including a plurality of data lines and scan line wiring, a signal test point for receiving a test signal to test the liquid crystal display panel, and a connection.
- a first test line between the wiring and the signal test point, the wiring is connected to one end of the corresponding data line and the scan line
- the liquid crystal display panel wiring area line structure further includes a corresponding connection a second test line between the other end of the data line and the scan line and the signal test point, and a connection with the second test line for controlling the test signal to enter by the signal test point
- a switch control circuit that displays the path of the display area of the panel.
- the switch control circuit includes: an electronic switch connected between the second test line and a corresponding data line or scan line, and a switch control signal input point for controlling whether the electronic switch is turned on or off,
- the switch control signal input point is connected to the electronic switch through a switch control bus; when the first test line is not disconnected from the wiring, the switch control signal input point receives a low level signal to make the electronic switch Turning off, the test signal is sequentially input to the display area via the signal test point, the first test line, the wiring, and one end of the data line or the scan line; when the first test line is After the wiring is cut off, the switch control signal input point receives a high level signal to turn on the electronic switch, and the test signal is input by the signal test point, and sequentially passes through the second test line and the electronic switch. And transmitting the other end of the data line or the scan line to the display area.
- the electronic switch is a thin film transistor, a gate of the thin film transistor is connected to the switch control bus, a drain is connected to a corresponding data line or a scan line, and a source is connected to the second test line.
- each of the electronic switches connected to the second test line and the thin film transistor in the display area are formed in a synchronous process.
- a flip chip is attached to the pad of the wiring.
- the signal test point comprises a first signal test point and a second signal test point, wherein:
- One end of the first signal test point is connected to the wiring of the data line via a first test line of the data line, and the other end is connected to the other end of the data line via a second test line of the data line.
- One end of the second signal test point is connected to the wiring of the scan line via a first test line of the scan line, and the other end is connected to the other end of the scan line via a second test line of the scan line.
- the invention also provides a method for testing a liquid crystal display panel by using the above-mentioned liquid crystal display panel wiring area line structure, comprising:
- the switch control circuit receives a corresponding high level signal or a low level signal according to a connection state between the wiring and the first test line;
- the display panel is tested by the switch control circuit to control a path of the test signal received by the signal test point into the display area of the display panel.
- the step of causing the switch control circuit to receive a corresponding high level signal or a low level signal according to the connection state between the wiring and the first test line comprises:
- the switch control signal input point of the control circuit receives a low level signal
- the switch control signal input point of the control circuit receives a high level signal.
- the step of controlling the path of the test signal received by the control signal test point into the display area of the display panel by the switch control circuit comprises:
- the switch control signal input point of the control circuit receives the low level signal, turning off the electronic switch on the second test line, the test signal sequentially passing the signal test point, the first test line, and the matching And a line and one end of the data line or the scan line are input to the display area;
- the switch control signal input point of the control circuit When the switch control signal input point of the control circuit receives a high level signal, the electronic switch is turned on, and the test signal is input by the signal test point, and sequentially passes through the second test line, the electronic The switch and the other end of the corresponding data line or scan line are transmitted to the display area.
- the electronic switch is a thin film transistor, a gate of the thin film transistor is connected to the switch control bus, a drain is connected to a corresponding data line or a scan line, and a source is connected to the second test line.
- a wiring structure of a liquid crystal display panel wiring area and a liquid crystal display panel testing method wherein another test line is connected to the other end of one end of the wiring which can be connected to the data line and the scanning line, and
- the switch control circuit controls the path of the test signal received by the signal test point into the display area of the liquid crystal display panel, so that after the test line connected to the wiring is cut off in the previous process, the data line and the other end of the scan line can still be
- the test signal from the signal test point is input to the display area, and the display panel is driven to display for the purpose of testing the display panel, thereby avoiding the prior art that the test line and the wiring connection portion are cut off and cannot be passed through the box again.
- the screen inspection machine in the process detects the trouble caused by the clarification of responsibility.
- FIG. 1 is a schematic view showing a circuit structure of a wiring area of a conventional liquid crystal display panel
- FIG. 2 is a schematic structural view of a preferred embodiment of a wiring structure of a wiring area of a liquid crystal display panel of the present invention
- FIG. 3 is a schematic flow chart of a preferred embodiment of a method for testing a liquid crystal display panel of the present invention.
- the solution of the embodiment of the present invention is mainly: forming another test line connected to the other end of the one end of the data line and the scan line opposite to the wiring line, and controlling the test received by the signal control point through the switch control circuit
- the signal enters the display area of the liquid crystal display panel, so that after the test line connected to the wiring is cut off in the previous process, the test signal from the signal test point can still be input to the display area from the other end of the data line and the scan line. Test the display panel.
- a preferred embodiment of the present invention provides a wiring structure of a liquid crystal display panel wiring area.
- the liquid crystal display panel of the circuit structure includes a display area 10 and a wiring area adjacent to the display area 10, and displays A plurality of data lines 101 and scan lines 102 are disposed in the area 10, the wiring area includes a data line wiring area 20 corresponding to the data line 101, and a scan line wiring area 21 corresponding to the scan line 102; wherein, the data line distribution area 20 is provided with a wiring 201 connected to one end of the data line 101, and the scanning line wiring area 21 is provided with a wiring 211 connected to one end of the scanning line 102, and a pad 70 for each wiring 201, 211 is attached with a signal for providing COF.
- the wiring area line structure in this embodiment includes the wiring 201 corresponding to the data line 101, the signal test point 50, the first test line 30, and the second test line 40; the wiring 211 corresponding to the scan line 102, and the signal a test point 51, a first test line 31, a second test line 41; and a switch control circuit, wherein:
- the signal test points 50, 51 are used to receive test signals to test the liquid crystal display panel.
- One end of the data line 101 is connected to the first test line 30 through its corresponding wiring 201, and the other end of the data line 101 (the other end opposite to one end of the connection wiring 201) is connected to the second test line 40; one end of the scan line 102
- the first test line 31 is connected by its corresponding wiring 211, while the other end of the scan line 102 (the other end opposite to one end of the connection wiring 211) is connected to the second test line 41.
- one end of the first signal test point 50 is connected to the wiring 201 of the data line 101 via the first test line 30 of the data line 101, and the other end is connected to the other end of the data line 101 via the second test line 40 of the data line 101.
- One end of the second signal test point 51 is connected to the wiring 211 of the scan line 102 via the first test line 31 of the scan line 102, and the other end is connected to the other end of the scan line 102 via the second test line 41 of the scan line 102.
- the switch control circuit is respectively connected to the second test line 40 of the data line 101 and the second test line 41 of the scan line 102 for controlling the path of the test signal from the corresponding signal test points 50, 51 into the display area 10 of the display panel.
- the switch control circuit includes: an electronic switch 62 connected between the second test line 40 or 41 and the corresponding data line 101 or scan line 102, and controls the electronic switch 62 to be turned on or off.
- the switch control signal is input to the point 60, and the switch control signal input point 60 is connected to the electronic switch 62 via the switch control bus 61. .
- the switch control signal input point 60 receives a low level signal to turn off the corresponding electronic switch 62, and the test signal is sequentially tested by the corresponding signal.
- a point 50 or 51, a first test line 30 or 31, a wiring 201 or 211, and one end of the data line 101 or the scan line 102 are input to the display area 10 of the liquid crystal display panel, and the display panel is driven for display.
- the switch control signal input point 60 receives a high level signal to turn on the corresponding electronic switch 62, the test signal being signaled by the test point 50. Or 51 input, sequentially transmitted to the display area 10 of the liquid crystal display panel via the corresponding second test line 40 or 41, the electronic switch 62, and the other end of the data line 101 or the scan line 102, and drive the display panel for display.
- the electronic switch 62 is a thin film transistor.
- the gate of the thin film transistor is connected to the switch control bus 61, the drain is connected to the corresponding data line 101 or the scan line 102, and the source is connected to the corresponding data line 101 or scan line 102.
- a commonly used method for detecting a liquid crystal display panel is to use a plurality of test lines, that is, the first test line 30 or 31 in this embodiment, for each signal line (data line 101 or scan line 102).
- the short circuits are connected together, and then the test signal is input to the thin film transistor array of the liquid crystal display panel through the test line.
- the connection between the test line and each signal line is cut off by the laser to perform the next assembly of the drive circuit module.
- test points 50, 51 can still retest the line through the alternate conductive path and peripheral electronic switch 62 and switch control signal input point 60.
- the peripheral electronic switch 62 and the switch in the display area 10 can be in the TFT (Thin Film Transistor, thin film field effect transistor) is formed synchronously in the process, that is, in the synchronous process.
- the switch control signal input point 60 inputs a DC low level signal to turn off the electronic switch 62, and the test signal is input by the signal test point 50 or 51 through the first test line 30 or 31. Go to the display area 10, drive the liquid crystal display panel for display, and achieve the purpose of testing the display panel.
- the connection portion of the first test line 30 or 31 and the corresponding wiring 201 or 211 is cut.
- the DC input voltage is input through the switch control signal input point 60.
- the level signal turns on the electronic switch 62, and the test signal is input through the signal test point 50 or 51, passes through the corresponding data line 101 or the other end of the scan line 102, and is transmitted to the display area 10 of the liquid crystal display panel to drive the display panel for display. The same can be achieved for testing the display panel.
- a DC low level signal is input through the switch control signal input point 60, so that the electronic switch 62 is turned off, and the second test connected to the other end of the data line 101 or the scan line 102 is performed. Lines 40 or 41 are not used.
- the other function of the first test lines 30, 31 can also avoid damage to the TFT device by electrostatic discharge.
- the second test line 40 or 41 is connected to the other end of the process to form one end of the wiring 201 or 211 opposite to the data line 101 or the scan line 102, and the signal test point 50 or 51 is controlled by the switch control circuit.
- the received test signal enters the path of the display area 10 of the liquid crystal display panel, so that the corresponding first test line 30 or 31 connected to the wiring 201 or 211 is still cut off from the data line 101 or the scan line 102.
- the test signal from the signal test point 50 or 51 is input to the display area 10, and the display panel is driven for display to achieve the purpose of testing the display panel, thereby avoiding the connection between the test line and the wiring in the prior art.
- a preferred embodiment of the present invention further provides a method for testing a liquid crystal display panel by using a wiring structure of a liquid crystal display panel wiring area as described above, including:
- Step S101 according to the connection state between the wiring and the first test line, the switch control circuit receives the corresponding high level signal or low level signal;
- the switch control signal input point of the control circuit when the wiring is not disconnected from the first test line, the switch control signal input point of the control circuit receives a low level signal; when the wiring is disconnected from the first test line, the switch control signal input of the control circuit The point receives a high level signal.
- Step S102 the switch control circuit is used to control the test signal received by the signal test point to enter the display area of the display panel, and the display panel is tested.
- the switch control signal input point of the control circuit When the switch control signal input point of the control circuit receives the low level signal, the electronic switch on the second test line is turned off, and the test signal is sequentially passed through the signal test point, the first test line, the wiring, and the data line or the scan line. One end is input to the display area; when the switch control signal input point of the control circuit receives the high level signal, the electronic switch is turned on, the test signal is input by the signal test point, and sequentially passes through the second test line, the electronic switch, and the corresponding The other end of the data line or scan line is transmitted to the display area.
- the electronic switch is a thin film transistor having a gate connected to the switch control bus, a drain connected to a corresponding data line or a scan line, and a source connected to the data line or the second test line of the scan line.
- a commonly used method for detecting a liquid crystal display panel is to short-circuit each signal line (data line or scan line) by using a plurality of test lines, that is, the first test line in this embodiment. Connected together, the test signal is input to the thin film transistor array of the liquid crystal display panel through the test line. When the test is completed, the connection between the test line and each signal line is cut off by the laser to perform the next assembly of the drive circuit module.
- the connection portion of the first test line and the wiring is also cut off.
- the test point can still retest the line through the alternate conductive path and the peripheral electronic switch and switch control signal input points.
- the peripheral electronic switch and the switch in the display area can be formed synchronously in the TFT process, that is, in the synchronous process.
- the switch control signal input point When performing the screen test in the box forming process, the switch control signal input point inputs a DC low level signal to turn off the electronic switch, and the test signal is input from the signal test point through the first test line to input the signal to the display area to drive the liquid crystal display panel. Display to achieve the purpose of testing the display panel.
- the connection portion of the first test line and the wiring is cut off.
- the DC power is input through the switch control signal input point.
- the electronic switch is turned on, the test signal is input through the signal test point, input through the other end of the data line and the scan line, transmitted to the display area of the liquid crystal display panel, and the display panel is driven to display, and the purpose of testing the display panel can also be achieved.
- the DC low-level signal is input through the switch control signal input point, so that the switch is turned off, and the line of the second test line connected to the other end of the data line or the scan line is not use.
- the wiring structure of the wiring area of the liquid crystal display panel and the test method of the liquid crystal display panel are connected to another test line by forming another end of one end of the wiring which can be connected with the data line and the scanning line, and are controlled by a switch.
- the test signal received by the circuit control signal test point enters the path of the display area of the liquid crystal display panel, so that after the test line connected to the wiring is cut off in the previous process, the signal test can still be taken from the other end of the data line and the scan line.
- the test signal of the point is input to the display area, and the display panel is driven to display, so as to achieve the purpose of testing the display panel, thereby avoiding the prior art, because the test line and the wiring connection part are cut off and cannot pass through the box forming process again.
- the detection of the screen inspection machine is troublesome for the clarification of the responsibility, which greatly helps the analysis and testing of the product.
- the signal test point of the newly added test line is shared with the signal test point of the original test line, there is no need to change the test.
- the structure of the machine is not only easy to implement, but also reduces costs.
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Abstract
本发明公开一种液晶显示面板配线区线路结构及显示面板测试方法，其线路结构包括与对应的数据线（101）和扫描线（102）的一端连接的配线（201）、信号测试点（50，51）、连接在配线（201）与信号测试点（50，51）之间的第一测试线（30，31）、对应连接在数据线（101）和扫描线（102）的另一端与信号测试点（50，51）之间的第二测试线（40，41），以及与第二测试线（40，41）连接、用于控制测试信号由信号测试点（50，51）进入显示面板的显示区的路径的开关控制电路。本发明在先前制程中切断测试线与配线（201）连接部分后，仍可从数据线（101）和扫描线（102）的另一端将来自信号测试点（50，51）的测试信号输入到显示区，驱动显示面板进行显示，达到对显示面板进行测试的目的，避免了现有技术中由于测试线与配线（201）连接部分切断而无法再次通过成盒工艺中的画面检测机进行检测对责任的厘清造成的困扰。
Description
技术领域
本发明涉及液晶显示技术领域，尤其涉及一种液晶显示面板配线区线路结构及液晶显示面板测试方法。
背景技术
现有的液晶平板显示装置主要包括液晶显示面板和背光模组，如图1所示，液晶显示面板包括显示区1和与其相邻的配线区2，其中，显示区1包括多条数据线（data
line）和扫描线（gate line）；配线区2包括与多条数据线和扫描线对应连接的配线3以及与配线3连接的测试线4。
在成盒工艺中，在测试液晶显示面板画面时，画面检测机通过信号测试点5经测试线4、配线3将测试信号输入到液晶显示面板的显示区1内，画面检测机测试完毕产品后，需经过镭射切断机，将测试线4与配线3的连接部分6切断，然后提供给后续模组工艺使用。
在模组工艺中，需将COF（Chip On
Film，覆晶薄膜）贴附在配线3上的焊垫（Pad）7上，以提供信号。在模组工艺中，仍需要进行液晶显示面板画面测试，当测试出有不良产品时，需要在模组工艺或者成盒工艺中厘清造成不良产品的原因，当厘清成盒工艺的原因时，需要将COF去掉，在成盒工艺中的画面检测机中再次做画面检测，但是，由于供测试用的测试线4与配线3的连接部分6已在成盒工艺中被镭射切断机切断，因此，无法再次通过成盒工艺中的画面检测机进行检测，从而对责任的厘清造成困扰。
此外，在RA（Reliability
Assurance，可考性保证）测试时，也存在无法在成盒工艺中进行画面检查的状况。
发明内容
本发明的主要目的在于提供一种在测试线与配线连接部分被切断时仍能对液晶显示面板进行测试的液晶显示面板配线区线路结构及液晶显示面板测试方法。
为了达到上述目的，本发明提出一种液晶显示面板配线区线路结构，包括若干数据线和扫描线的配线、用于接收测试信号对所述液晶显示面板进行测试的信号测试点，以及连接在所述配线与所述信号测试点之间的第一测试线，所述配线与对应的所述数据线和扫描线的一端连接，该液晶显示面板配线区线路结构还包括对应连接在所述数据线和扫描线的另一端与所述信号测试点之间的第二测试线，以及与所述第二测试线连接、用于控制所述测试信号由所述信号测试点进入所述显示面板的显示区的路径的开关控制电路。
优选地，所述开关控制电路包括：连接在所述第二测试线与对应的数据线或扫描线之间的电子开关，以及控制所述电子开关导通或关闭的开关控制信号输入点，所述开关控制信号输入点通过开关控制总线连接所述电子开关；当所述第一测试线与所述配线未断开时，所述开关控制信号输入点接收低电平信号使所述电子开关关闭，所述测试信号依次经所述信号测试点、第一测试线、所述配线以及所述数据线或扫描线的一端输入至所述显示区；当所述第一测试线与所述配线被切断后，所述开关控制信号输入点接收高电平信号使所述电子开关打开，所述测试信号由所述信号测试点输入，依次经所述第二测试线、所述电子开关以及所述数据线或扫描线的另一端传输至所述显示区。
优选地，所述电子开关为薄膜晶体管，所述薄膜晶体管的栅极连接所述开关控制总线，漏极连接对应的数据线或扫描线，源极连接所述第二测试线。
优选地，每一所述第二测试线连接的电子开关与所述显示区中的薄膜晶体管在同期制程中形成。
优选地，所述配线的焊垫上贴附有覆晶薄膜。
优选地，所述信号测试点包括第一信号测试点和第二信号测试点，其中：
所述第一信号测试点的一端经所述数据线的第一测试线与所述数据线的配线连接，另一端经所述数据线的第二测试线与所述数据线的另一端连接；
所述第二信号测试点的一端经所述扫描线的第一测试线与所述扫描线的配线连接，另一端经所述扫描线的第二测试线与所述扫描线的另一端连接。
本发明还提出一种利用上述所述的液晶显示面板配线区线路结构测试液晶显示面板的方法，包括：
根据配线与第一测试线之间的连接状态，使开关控制电路接收相应的高电平信号或低电平信号；
通过所述开关控制电路，控制信号测试点所接收的测试信号进入所述显示面板的显示区的路径，对所述显示面板进行测试。
优选地，所述根据配线与第一测试线之间的连接状态，使开关控制电路接收相应的高电平信号或低电平信号的步骤包括：
当所述配线与所述第一测试线未断开时，所述控制电路的开关控制信号输入点接收低电平信号；
当所述配线与所述第一测试线断开时，所述控制电路的开关控制信号输入点接收高电平信号。
优选地，所述通过开关控制电路，控制信号测试点所接收的测试信号进入所述显示面板的显示区的路径的步骤包括：
当所述控制电路的开关控制信号输入点接收到低电平信号时，使第二测试线上的电子开关关闭，所述测试信号依次经所述信号测试点、第一测试线、所述配线以及所述数据线或扫描线的一端输入至所述显示区；
当所述控制电路的开关控制信号输入点接收到高电平信号时，使所述电子开关打开，所述测试信号由所述信号测试点输入，依次经所述第二测试线、所述电子开关以及对应的数据线或扫描线的另一端传输至所述显示区。
优选地，所述电子开关为薄膜晶体管，所述薄膜晶体管的栅极连接所述开关控制总线，漏极连接对应的数据线或扫描线，源极连接所述第二测试线。
本发明提出的一种液晶显示面板配线区线路结构及液晶显示面板测试方法，通过在制程上形成能与数据线和扫描线的相对连接配线的一端的另一端连接另一测试线，并通过开关控制电路控制信号测试点所接收的测试信号进入液晶显示面板的显示区的路径，使得在先前制程中切断与配线相连的测试线后，仍可从数据线和扫描线的另一端将来自信号测试点的测试信号输入到显示区，驱动显示面板进行显示，达到对显示面板进行测试的目的，从而避免了现有技术中，由于测试线与配线连接部分切断而无法再次通过成盒工艺中的画面检测机进行检测对责任的厘清造成的困扰。
附图说明
图1是现有的液晶显示面板配线区线路结构的示意图；
图2是本发明液晶显示面板配线区线路结构较佳实施例的结构示意图；
图3是本发明测试液晶显示面板的方法较佳实施例的流程示意图。
本发明目的的实现、功能特点及优点将结合实施例，参照附图做进一步说明。
具体实施方式
以下将结合附图及实施例，对实现发明目的的技术方案作详细说明。应当理解，此处所描述的具体实施例仅仅用以解释本发明，并不用于限定本发明。
本发明实施例的解决方案主要是：在制程上形成能与数据线和扫描线相对连接配线的一端的另一端连接的另一测试线，并通过开关控制电路控制信号测试点所接收的测试信号进入液晶显示面板的显示区的路径，使得在先前制程中切断与配线相连的测试线后，仍可从数据线和扫描线的另一端将来自信号测试点的测试信号输入到显示区，对显示面板进行测试。
如图2所示，本发明较佳实施例提出一种液晶显示面板配线区线路结构，该线路结构所在的液晶显示面板包括显示区10及与该显示区10相邻的配线区，显示区10中设有若干数据线101和扫描线102，配线区包括对应数据线101的数据线配线区20，以及对应扫描线102的扫描线配线区21；其中，数据线配线区20设有与数据线101一端连接的配线201，扫描线配线区21设有与扫描线102一端连接的配线211，各配线201、211的焊垫70上贴附有用于提供信号的COF。
具体地，本实施例中的配线区线路结构包括对应数据线101的配线201、信号测试点50、第一测试线30、第二测试线40；对应扫描线102的配线211、信号测试点51、第一测试线31、第二测试线41；以及开关控制电路，其中：
信号测试点50、51用于接收测试信号对液晶显示面板进行测试。
数据线101的一端通过其对应的配线201连接第一测试线30，数据线101的另一端（与连接配线201的一端相对的另一端）连接第二测试线40；扫描线102的一端通过其对应的配线211连接第一测试线31，同时，扫描线102的另一端（与连接配线211的一端相对的另一端）连接第二测试线41。
具体地，第一信号测试点50的一端经数据线101的第一测试线30与数据线101的配线201连接，另一端经数据线101的第二测试线40与数据线101的另一端连接；第二信号测试点51的一端经扫描线102的第一测试线31与扫描线102的配线211连接，另一端经扫描线102的第二测试线41与扫描线102的另一端连接。
开关控制电路分别与数据线101的第二测试线40、扫描线102的第二测试线41连接，用于控制测试信号由相应的信号测试点50、51进入显示面板的显示区10的路径。
在本实施例中，开关控制电路包括：连接在所述第二测试线40或41与对应的数据线101或扫描线102之间的电子开关62，以及控制所述电子开关62导通或关闭的开关控制信号输入点60，所述开关控制信号输入点60通过开关控制总线61连接电子开关62
。
当第一测试线30或31与相应的配线201或211未断开时，开关控制信号输入点60接收低电平信号使对应的所述电子开关62关闭，测试信号依次经相应的信号测试点50或51、第一测试线30或31、配线201或211以及所述数据线101或扫描线102的一端输入至液晶显示面板的显示区10，驱动显示面板进行显示。
当第一测试线30或31与相应的配线201或211被切断时，开关控制信号输入点60接收高电平信号使对应的所述电子开关62打开，所述测试信号由信号测试点50或51输入，依次经相应的第二测试线40或41、电子开关62以及数据线101或扫描线102的另一端传输至液晶显示面板的显示区10，驱动显示面板进行显示。
其中，上述电子开关62为薄膜晶体管，该薄膜晶体管的栅极连接所述开关控制总线61，漏极连接对应的数据线101或扫描线102，源极连接对应的数据线101或扫描线102的第二测试线40或41。
如前所述，在现有技术中，常用的液晶显示面板的检测方法是用若干测试线即本实施例所称第一测试线30或31将各信号线（数据线101或扫描线102）短路连接在一起，再通过测试线向液晶显示面板的薄膜晶体管阵列输入测试信号，当测试完成后，用激光将测试线与各信号线的连接切断，以便进行下一步的驱动电路模块组装。
在本实施例中，在成盒工艺中，画面检测机测试完毕后，同样会将第一测试线30、31与配线的连接部分切断。在后续模组工艺中进行液晶显示面板画面测试时，若测试出有不良产品，需要在成盒工艺中的画面检测机中再次做画面检测，以厘清造成不良产品的原因，本实施例的信号测试点50、51仍能通过备用导电路径以及***的电子开关62与开关控制信号输入点60来重新测试线路。其中，***的电子开关62与显示区10内的开关可在TFT（Thin
Film Transistor，薄膜场效应晶体管）制程中同步形成，即在同期制程中形成。
当进行成盒工艺中的画面测试时，开关控制信号输入点60输入直流低电平信号使电子开关62关闭，测试信号由信号测试点50或51输入通过第一测试线30或31将信号输入到显示区10，驱动液晶显示面板进行显示，达到测试显示面板的目的。
在成盒工艺的画面检测机测试完毕后，将第一测试线30或31与相应的配线201或211的连接部分切断。在后续模组工艺中进行液晶显示面板画面测试时，若测试出有不良产品，需要在成盒工艺中的画面检测机中再次做画面检测，此时，通过开关控制信号输入点60输入直流高电平信号，将电子开关62打开，测试信号通过信号测试点50或51输入，经过对应的数据线101或扫描线102的另一端，传输到液晶显示面板的显示区10，驱动显示面板进行显示，同样可以达到测试显示面板的目的。
当模组工艺制造出的产品不需要进行测试时，通过开关控制信号输入点60输入直流低电平信号，使电子开关62关闭，与数据线101或扫描线102的另一端连接的第二测试线40或41的线路则不使用。
其中，第一测试线30、31的另一作用还可以避免静电放电对TFT器件的破坏。
本实施例通过在制程上形成能与数据线101或扫描线102相对连接配线201或211的一端的另一端连接第二测试线40或41，并通过开关控制电路控制信号测试点50或51所接收的测试信号进入液晶显示面板的显示区10的路径，使得之前与配线201或211相连的对应的第一测试线30或31被切断后，仍可从数据线101或扫描线102的另一端将来自信号测试点50或51的测试信号输入到显示区10，驱动显示面板进行显示，达到对显示面板进行测试的目的，从而避免了现有技术中，由于测试线与配线连接部分切断而无法再次通过成盒工艺中的画面检测机进行检测对责任的厘清造成的困扰，对产品的分析与测试带来很大帮助；而且，由于新增的测试线路的信号测试点50、51与原测试线路的信号测试点50、51共用，无需更改测试机台的结构，不仅容易实现，而且减少了成本。
如图3所示，本发明较佳实施例还提出一种利用如上所述的液晶显示面板配线区线路结构测试液晶显示面板的方法，包括：
步骤S101，根据配线与第一测试线之间的连接状态，使开关控制电路接收相应的高电平信号或低电平信号；
其中，当配线与第一测试线未断开时，控制电路的开关控制信号输入点接收低电平信号；当配线与所述第一测试线断开时，控制电路的开关控制信号输入点接收高电平信号。
步骤S102，通过开关控制电路，控制信号测试点所接收的测试信号进入显示面板的显示区的路径，对显示面板进行测试。
当控制电路的开关控制信号输入点接收到低电平信号时，使第二测试线上的电子开关关闭，测试信号依次经信号测试点、第一测试线、配线以及数据线或扫描线的一端输入至显示区；当控制电路的开关控制信号输入点接收到高电平信号时，使电子开关打开，测试信号由所述信号测试点输入，依次经第二测试线、电子开关以及对应的数据线或扫描线的另一端传输至显示区。
上述电子开关为薄膜晶体管，该薄膜晶体管的栅极连接所述开关控制总线，漏极连接对应的数据线或扫描线，源极连接数据线或扫描线的第二测试线。
具体地，如前所述，在现有技术中，常用的液晶显示面板的检测方法是用若干测试线即本实施例所称第一测试线分别将各信号线（数据线或扫描线）短路连接在一起，再通过测试线向液晶显示面板的薄膜晶体管阵列输入测试信号，当测试完成后，用激光将测试线与各信号线的连接切断，以便进行下一步的驱动电路模块组装。
在本实施例中，在成盒工艺中，画面检测机测试完毕后，同样会将第一测试线与配线的连接部分切断。在后续模组工艺中进行液晶显示面板画面测试时，若测试出有不良产品，需要在成盒工艺中的画面检测机中再次做画面检测，以厘清造成不良产品的原因，本实施例的信号测试点仍能通过备用导电路径以及***的电子开关与开关控制信号输入点来重新测试线路。其中，***的电子开关与显示区内的开关可在TFT制程中同步形成，即在同期制程中形成。
当进行成盒工艺中的画面测试时，开关控制信号输入点输入直流低电平信号使电子开关关闭，测试信号由信号测试点输入通过第一测试线将信号输入到显示区，驱动液晶显示面板进行显示，达到测试显示面板的目的。
在成盒工艺的画面检测机测试完毕后，将第一测试线与配线的连接部分切断。在后续模组工艺中进行液晶显示面板画面测试时，若测试出有不良产品，需要在成盒工艺中的画面检测机中再次做画面检测，此时，通过开关控制信号输入点输入直流高电平信号，将电子开关打开，测试信号通过信号测试点输入，经过数据线和扫描线的另一端输入，传输到液晶显示面板的显示区，驱动显示面板进行显示，同样可以达到测试显示面板的目的。
当模组工艺制造出的产品不需要进行测试时，通过开关控制信号输入点输入直流低电平信号，使开关关闭，与数据线或扫描线的另一端连接的第二测试线的线路则不使用。
本发明实施例液晶显示面板配线区线路结构及液晶显示面板测试方法，通过在制程上形成能与数据线和扫描线相对连接配线的一端的另一端连接另一测试线，并通过开关控制电路控制信号测试点所接收的测试信号进入液晶显示面板的显示区的路径，使得在先前制程中切断与配线相连的测试线后，仍可从数据线和扫描线的另一端将来自信号测试点的测试信号输入到显示区，驱动显示面板进行显示，达到对显示面板进行测试的目的，从而避免了现有技术中，由于测试线与配线连接部分切断而无法再次通过成盒工艺中的画面检测机进行检测对责任的厘清造成的困扰，对产品的分析与测试带来很大帮助；而且，由于新增的测试线路的信号测试点与原测试线路的信号测试点共用，无需更改测试机台的结构，不仅容易实现，而且减少了成本。
以上所述仅为本发明的优选实施例，并非因此限制本发明的专利范围，凡是利用本发明说明书及附图内容所作的等效结构或流程变换，或直接或间接运用在其他相关的技术领域，均同理包括在本发明的专利保护范围内。
Claims (16)
- 一种液晶显示面板配线区线路结构，包括若干数据线和扫描线的配线、用于接收测试信号对所述液晶显示面板进行测试的信号测试点，以及连接在所述配线与所述信号测试点之间的第一测试线，所述配线与对应的所述数据线和扫描线的一端连接，其特征在于，还包括对应连接在所述数据线和扫描线的另一端与所述信号测试点之间的第二测试线，以及与所述第二测试线连接、用于控制所述测试信号由所述信号测试点进入所述显示面板的显示区的路径的开关控制电路；所述信号测试点包括第一信号测试点和第二信号测试点，其中：所述第一信号测试点的一端经所述数据线的第一测试线与所述数据线的配线连接，另一端经所述数据线的第二测试线与所述数据线的另一端连接；所述第二信号测试点的一端经所述扫描线的第一测试线与所述扫描线的配线连接，另一端经所述扫描线的第二测试线与所述扫描线的另一端连接。
- 根据权利要求1所述液晶显示面板配线区线路结构，其特征在于，所述开关控制电路包括：连接在所述第二测试线与对应的数据线或扫描线之间的电子开关，以及控制所述电子开关导通或关闭的开关控制信号输入点，所述开关控制信号输入点通过开关控制总线连接所述电子开关；当所述第一测试线与所述配线未断开时，所述开关控制信号输入点接收低电平信号使所述电子开关关闭，所述测试信号依次经所述信号测试点、第一测试线、所述配线以及所述数据线或扫描线的一端输入至所述显示区；当所述第一测试线与所述配线被切断后，所述开关控制信号输入点接收高电平信号使所述电子开关打开，所述测试信号由所述信号测试点输入，依次经所述第二测试线、所述电子开关以及所述数据线或扫描线的另一端传输至所述显示区。
- 根据权利要求2所述的液晶显示面板配线区线路结构，其特征在于，所述电子开关为薄膜晶体管，所述薄膜晶体管的栅极连接所述开关控制总线，漏极连接对应的数据线或扫描线，源极连接所述第二测试线。
- 根据权利要求2所述的液晶显示面板配线区线路结构，其特征在于，每一所述第二测试线连接的电子开关与所述显示区中的薄膜晶体管在同期制程中形成。
- 根据权利要求1所述的液晶显示面板配线区线路结构，其特征在于，所述配线的焊垫上贴附有覆晶薄膜。
- 一种液晶显示面板配线区线路结构，包括若干数据线和扫描线的配线、用于接收测试信号对所述液晶显示面板进行测试的信号测试点，以及连接在所述配线与所述信号测试点之间的第一测试线，所述配线与对应的所述数据线和扫描线的一端连接，其特征在于，还包括对应连接在所述数据线和扫描线的另一端与所述信号测试点之间的第二测试线，以及与所述第二测试线连接、用于控制所述测试信号由所述信号测试点进入所述显示面板的显示区的路径的开关控制电路。
- 根据权利要求6所述的液晶显示面板配线区线路结构，其特征在于，所述开关控制电路包括：连接在所述第二测试线与对应的数据线或扫描线之间的电子开关，以及控制所述电子开关导通或关闭的开关控制信号输入点，所述开关控制信号输入点通过开关控制总线连接所述电子开关；当所述第一测试线与所述配线未断开时，所述开关控制信号输入点接收低电平信号使所述电子开关关闭，所述测试信号依次经所述信号测试点、第一测试线、所述配线以及所述数据线或扫描线的一端输入至所述显示区；当所述第一测试线与所述配线被切断后，所述开关控制信号输入点接收高电平信号使所述电子开关打开，所述测试信号由所述信号测试点输入，依次经所述第二测试线、所述电子开关以及所述数据线或扫描线的另一端传输至所述显示区。
- 根据权利要求7所述的液晶显示面板配线区线路结构，其特征在于，所述电子开关为薄膜晶体管，所述薄膜晶体管的栅极连接所述开关控制总线，漏极连接对应的数据线或扫描线，源极连接所述第二测试线。
- 根据权利要求7所述的液晶显示面板配线区线路结构，其特征在于，每一所述第二测试线连接的电子开关与所述显示区中的薄膜晶体管在同期制程中形成。
- 根据权利要求6所述的液晶显示面板配线区线路结构，其特征在于，所述配线的焊垫上贴附有覆晶薄膜。
- 一种利用权利要求6所述的液晶显示面板配线区线路结构测试液晶显示面板的方法，其特征在于，包括：根据配线与第一测试线之间的连接状态，使开关控制电路接收相应的高电平信号或低电平信号；通过所述开关控制电路，控制信号测试点所接收的测试信号进入所述显示面板的显示区的路径，对所述显示面板进行测试。
- 根据权利要求11所述的方法，其特征在于，所述根据配线与第一测试线之间的连接状态，使开关控制电路接收相应的高电平信号或低电平信号的步骤包括：当所述配线与所述第一测试线未断开时，所述控制电路的开关控制信号输入点接收低电平信号；当所述配线与所述第一测试线断开时，所述控制电路的开关控制信号输入点接收高电平信号。
- 根据权利要求12所述的方法，其特征在于，所述通过开关控制电路，控制信号测试点所接收的测试信号进入所述显示面板的显示区的路径的步骤包括：当所述控制电路的开关控制信号输入点接收到低电平信号时，使第二测试线上的电子开关关闭，所述测试信号依次经所述信号测试点、第一测试线、所述配线以及所述数据线或扫描线的一端输入至所述显示区；当所述控制电路的开关控制信号输入点接收到高电平信号时，使所述电子开关打开，所述测试信号由所述信号测试点输入，依次经所述第二测试线、所述电子开关以及对应的数据线或扫描线的另一端传输至所述显示区。
- 根据权利要求13所述的方法，其特征在于，所述电子开关为薄膜晶体管，所述薄膜晶体管的栅极连接所述开关控制总线，漏极连接对应的数据线或扫描线，源极连接所述第二测试线。
- 根据权利要求14所述的方法，其特征在于，每一所述第二测试线连接的电子开关与所述显示区中的薄膜晶体管在同期制程中形成。
- 根据权利要求11所述的方法，其特征在于，所述配线的焊垫上贴附有覆晶薄膜。
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| CN112331117A (zh) * | 2020-11-05 | 2021-02-05 | 北海惠科光电技术有限公司 | 液晶面板和液晶面板数据线电压检测方法 |
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