WO2012042869A1 - 拡張性フィルム、ダイシングフィルム、および半導体装置の製造方法 - Google Patents
拡張性フィルム、ダイシングフィルム、および半導体装置の製造方法 Download PDFInfo
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J7/00—Adhesives in the form of films or foils
- C09J7/20—Adhesives in the form of films or foils characterised by their carriers
- C09J7/29—Laminated material
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/06—Layered products comprising a layer of synthetic resin as the main or only constituent of a layer, which is next to another layer of the same or of a different material
- B32B27/08—Layered products comprising a layer of synthetic resin as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/30—Layered products comprising a layer of synthetic resin comprising vinyl (co)polymers; comprising acrylic (co)polymers
- B32B27/308—Layered products comprising a layer of synthetic resin comprising vinyl (co)polymers; comprising acrylic (co)polymers comprising acrylic (co)polymers
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/32—Layered products comprising a layer of synthetic resin comprising polyolefins
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J5/00—Manufacture of articles or shaped materials containing macromolecular substances
- C08J5/18—Manufacture of films or sheets
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J7/00—Adhesives in the form of films or foils
- C09J7/20—Adhesives in the form of films or foils characterised by their carriers
- C09J7/22—Plastics; Metallised plastics
- C09J7/24—Plastics; Metallised plastics based on macromolecular compounds obtained by reactions involving only carbon-to-carbon unsaturated bonds
- C09J7/241—Polyolefin, e.g.rubber
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L21/6836—Wafer tapes, e.g. grinding or dicing support tapes
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2270/00—Resin or rubber layer containing a blend of at least two different polymers
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2274/00—Thermoplastic elastomer material
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2405/00—Adhesive articles, e.g. adhesive tapes
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2457/00—Electrical equipment
- B32B2457/14—Semiconductor wafers
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J2323/00—Characterised by the use of homopolymers or copolymers of unsaturated aliphatic hydrocarbons having only one carbon-to-carbon double bond; Derivatives of such polymers
- C08J2323/02—Characterised by the use of homopolymers or copolymers of unsaturated aliphatic hydrocarbons having only one carbon-to-carbon double bond; Derivatives of such polymers not modified by chemical after treatment
- C08J2323/16—Ethene-propene or ethene-propene-diene copolymers
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J2323/00—Characterised by the use of homopolymers or copolymers of unsaturated aliphatic hydrocarbons having only one carbon-to-carbon double bond; Derivatives of such polymers
- C08J2323/02—Characterised by the use of homopolymers or copolymers of unsaturated aliphatic hydrocarbons having only one carbon-to-carbon double bond; Derivatives of such polymers not modified by chemical after treatment
- C08J2323/18—Homopolymers or copolymers of hydrocarbons having four or more carbon atoms
- C08J2323/20—Homopolymers or copolymers of hydrocarbons having four or more carbon atoms having four to nine carbon atoms
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2203/00—Applications of adhesives in processes or use of adhesives in the form of films or foils
- C09J2203/326—Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2301/00—Additional features of adhesives in the form of films or foils
- C09J2301/10—Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive tape or sheet
- C09J2301/16—Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive tape or sheet by the structure of the carrier layer
- C09J2301/162—Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive tape or sheet by the structure of the carrier layer the carrier being a laminate constituted by plastic layers only
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2423/00—Presence of polyolefin
- C09J2423/006—Presence of polyolefin in the substrate
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/10—Methods of surface bonding and/or assembly therefor
- Y10T156/1052—Methods of surface bonding and/or assembly therefor with cutting, punching, tearing or severing
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24942—Structurally defined web or sheet [e.g., overall dimension, etc.] including components having same physical characteristic in differing degree
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/28—Web or sheet containing structurally defined element or component and having an adhesive outermost layer
Definitions
- the present invention relates to an expandable film and a dicing film including the expandable film.
- the dicing film is useful as a pressure-sensitive adhesive sheet for fixing and supporting a semiconductor wafer which is cut and divided into element pieces (chips) and attached to the front or back surface of the wafer in a process of automatically collecting the elements by a pickup method.
- the present invention also relates to a method for manufacturing a semiconductor device using the dicing film, and a semiconductor device obtained by the manufacturing method.
- a silicon wafer on which a predetermined circuit pattern is formed is cut and separated (diced) into element pieces by a rotating round blade (blade).
- a method is generally used in which a silicon wafer is attached to an adhesive film, the silicon wafer is cut into small pieces, the adhesive film is stretched both vertically and horizontally, and the gap between the elements is increased (patent).
- a semiconductor substrate dicing method laser ablation dicing
- light absorption ablation of laser light which has less thermal damage than blade dicing and enables high-definition processing, has attracted attention.
- it has been proposed to support and fix a workpiece on a dicing sheet and dice the workpiece with a laser beam see Patent Document 2.
- the element size after division is about several hundred microns, so that the distance between the elements can be expanded by sufficiently expanding the dicing adhesive film. Is required.
- the LED substrate is more brittle than silicon, the conventional blade dicing is likely to cause problems such as chipping of elements when divided. Accordingly, there is a need for an expandable base material for dicing that is suitable for laser ablation dicing with little damage to the substrate and that provides low contamination and sufficient expandability.
- the dicing expandable base material is required to stretch uniformly without causing necking during stretching. This is because, when necking occurs, only the peripheral portion of the film is stretched, the central portion of the film is not sufficiently stretched, and the central element is not easily separated into individual pieces.
- an expandable base material for dicing soft vinyl chloride that hardly causes necking is generally used (see, for example, Patent Document 3).
- Patent Document 4 An expandable substrate made of a thermoplastic polyolefin that does not contain a plasticizer has been proposed as an expandable substrate in place of vinyl chloride.
- this expandable base material can reduce contamination on the wafer, it has low expandability compared to vinyl chloride and is more likely to be necked, so that a sufficient element spacing cannot be obtained.
- Patent Document 1 discloses a dicing film composed of a base material obtained by laminating a thermoplastic resin having rubber elasticity and an ethylene resin and an adhesive layer. In this dicing film, although contamination of the wafer can be reduced, there is a concern that it causes necking.
- Patent Document 5 discloses a dicing film using a terpolymer (ionomer resin) containing ethylene, acrylic acid, and alkyl acrylate as constituents as an expandable substrate.
- Patent Document 6 discloses a semi-compatible or incompatible polymer blend containing a highly crystalline olefin resin and a low crystalline olefin resin as a base material capable of suppressing filamentous waste that is likely to occur during dicing.
- a dicing film as a material is disclosed.
- the low crystalline olefin resin include low density polyethylene, random copolymerized polypropylene, and ethylene-vinyl acetate copolymer.
- Patent Documents 7 to 9 disclose a dicing film using propylene and ethylene and / or an ⁇ -olefin-based thermoplastic elastomer having 4 to 8 carbon atoms as an expandable substrate as a substrate capable of suppressing filamentous waste that is likely to occur during dicing.
- the ⁇ -olefin-based thermoplastic elastomer may contain low density polyethylene, polypropylene, polybutene, polyester and the like as an additive component.
- JP-A-2-215528 JP 2002-343747 A Japanese Patent Laid-Open No. 2002-235055 JP 59-74178 Japanese Patent No. 3845129 Japanese Patent No. 33409779 Japanese Patent No. 3443110 Japanese Patent No. 3984075 Japanese Patent No. 3984076
- the dicing film of Patent Document 5 has high expandability and can suppress necking, but there is a concern that foreign matters derived from the polymerization method remain on the dicing film. In dicing using a laser, foreign matter may cause laser scattering.
- the dicing film of Patent Document 6 has insufficient expandability, is easily broken when the film is stretched, and there is a concern that the wafer may be damaged during expansion.
- the preferable range of the thermoplastic elastomer content is 80% by weight or more, and the expandability is insufficient.
- the object of the present invention in consideration of the above problems is to obtain a low-contamination olefinic expandable substrate (expandable film) and a dicing film containing the same, and the conventional olefinic expandable substrate is insufficient.
- Another object of the present invention is to obtain an olefinic expandable substrate having high expandability and difficult to neck and a dicing film including the same.
- the inventors of the present invention have intensively studied for the purpose of obtaining an expandable substrate having high expandability, low necking property, and low contamination. As a result, the inventors have found that the above object can be achieved by satisfying the following, and have reached the present invention.
- a propylene-based elastomer composition (B) containing a propylene / butene / ⁇ -olefin copolymer (b1) and a polypropylene (b2) is included, and the tensile modulus of the composition (B) is 8 to 500 MPa.
- the content of (B) is 30 to 70 parts by weight with respect to 100 parts by weight of the total of (A) and (B).
- the first of the present invention relates to an expandable film.
- Tensile elasticity at 23 ° C. including 1-butene / ⁇ -olefin copolymer (A) and propylene / ⁇ -olefin copolymer (b1) having a tensile modulus at 23 ° C. of 100 to 500 MPa.
- a base material comprising a propylene-based elastomer composition (B) having a rate of 8 to 500 MPa, wherein the content of (B) is based on a total of 100 parts by weight of (A) and (B)
- the propylene-based elastomer composition (B) contains 1 to 70 parts by weight of polypropylene (b2) with respect to 100 parts by weight of the propylene-based elastomer composition (B) [1] or [2] Expandable film as described in 1.
- the second of the present invention relates to a dicing film including an expandable film and a method for manufacturing a semiconductor device.
- Dicing film having an adhesive strength of 0.1 to 10 N / 25 mm.
- the MFR at 230 ° C. of the base material layer and the MFR at 230 ° C. of the pressure-sensitive adhesive layer measured according to ASTM D1238 are both 1 to 20 g / 10 min or less.
- the dicing film as described in 2.
- An intermediate layer is provided between the base material layer and the pressure-sensitive adhesive layer, and the intermediate layer has a tensile elastic modulus E (25) at 25 ° C and a tensile elastic modulus E (60) at 60 ° C.
- the dicing film according to [5] which satisfies a relationship of E (60) / E (25) ⁇ 0.1 and has a tensile elastic modulus E (25) at 25 ° C. of 1 to 10 MPa.
- the dicing film is used by bonding to a surface having a step of a semiconductor wafer having a step on at least one surface, and the thickness of the intermediate layer is larger than the step of the semiconductor wafer. 7] to [10].
- a method for manufacturing a semiconductor manufacturing apparatus comprising: a step of dicing the semiconductor wafer to obtain a semiconductor chip; and a step of expanding the dicing film and picking up the semiconductor chip.
- an olefin-based expandable base material (expandable film) that is low in contamination and has a high expandability and is difficult to be necked, which is insufficient with a conventional olefin-based expandable base material, and A dicing film can be obtained.
- Expandable film The expandable film of the present invention comprises a 1-butene / ⁇ -olefin copolymer (A) and a propylene-based elastomer composition (B).
- the 1-butene / ⁇ -olefin copolymer (A) contained in the expandable film is a polymer containing 1-butene as a main constituent.
- the ⁇ -olefin in the 1-butene / ⁇ -olefin copolymer (A) may be an ⁇ -olefin having 2 to 10 carbon atoms other than 1-butene. Examples of the ⁇ -olefin having 2 to 10 carbon atoms include ethylene, propylene, 1-pentene, 1-hexene, 1-heptene, 1-octene, 1-nonene, 1-decene, preferably ethylene, Propylene.
- the ⁇ -olefin contained in the 1-butene / ⁇ -olefin copolymer (A) may be one kind or a combination of two or more kinds.
- the 1-butene content contained in the 1-butene / ⁇ -olefin copolymer (A) is preferably at least 80 mol%, more preferably at least 90 mol%. If it is less than 80 mol%, sufficient expandability cannot be obtained.
- the density of the 1-butene / ⁇ -olefin copolymer (A) is not particularly limited, but is preferably 890 to 950 kg / m 3 . If the density is too low, the tensile elastic modulus may decrease and sufficient expandability may not be obtained.
- the film made of 1-butene / ⁇ -olefin copolymer (A) preferably has a tensile modulus at 23 ° C. of 100 to 500 MPa, more preferably 150 to 450 MPa. If the tensile modulus is too high, it will be too hard to expand, and if the tensile modulus is too low, it will be too soft and handling will be reduced.
- the melt flow rate (MFR) of the 1-butene / ⁇ -olefin copolymer (A) measured at 230 ° C. under a load of 2.16 kg in accordance with ASTM D1238 is the same as that of the propylene-based elastomer composition (B).
- MFR melt flow rate
- it is not particularly defined as long as it is easily mixed uniformly in the extruder it is preferably 1 to 20 g / 10 min, more preferably 1 to 10 g / 10 min. This is because, if the MFR is in the above range, it is easy to extrude with the propylene-based elastomer composition (B) relatively uniformly.
- the 1-butene / ⁇ -olefin copolymer (A) is prepared by co-polymerizing 1-butene with an ⁇ -olefin other than 1-butene in the presence of a conventionally known production method such as a Ziegler-Natta catalyst or a metallocene catalyst. It can be obtained by polymerization.
- Propylene-based elastomer composition (B) The propylene-based elastomer composition (B) contained in the expandable film contains a propylene / ⁇ -olefin copolymer (b1) as a main component, and preferably further contains polypropylene (b2). Including.
- the propylene / ⁇ -olefin copolymer (b1) is a copolymer of propylene and an ⁇ -olefin other than propylene.
- the ⁇ -olefin in the propylene / ⁇ -olefin copolymer (b1) is preferably an ⁇ -olefin having 2 to 20 carbon atoms. Examples of the ⁇ -olefin having 2 to 20 carbon atoms include ethylene, 1-butene, 1-pentene, 1-hexene, 1-heptene, 1-octene, 1-nonene and 1-decene, preferably Ethylene, 1-butene.
- the ⁇ -olefin contained in the propylene / ⁇ -olefin copolymer (b1) may be one kind or a combination of two or more kinds.
- the propylene / ⁇ -olefin copolymer (b1) is more preferably a propylene / 1-butene / ethylene copolymer.
- the content of the structural unit derived from propylene of the propylene / ⁇ -olefin copolymer (b1) is preferably 50 mol% or more, more preferably 60 mol% or more from the viewpoint of obtaining good rubber elasticity. .
- the propylene / ⁇ -olefin copolymer (b1) has only to have rubber elasticity at the handling temperature of the expandable film, and preferably has a glass transition point of 25 ° C. or lower. When the glass transition point exceeds 25 ° C., there is a concern that physical properties such as extensibility of the film after molding are likely to change depending on storage conditions.
- Polypropylene (b2) is essentially a homopolymer of propylene, but may contain a small amount of ⁇ -olefin other than propylene, so-called homopolypropylene (hPP), random polypropylene (rPP) and block polypropylene (bPP). Either of them is acceptable.
- the content of ⁇ -olefin other than propylene in polypropylene (b2) is preferably 20 mol% or less, more preferably 10 mol% or less.
- Such polypropylene (b2) can be expected to have an effect of suppressing blocking of the propylene / ⁇ -olefin copolymer (b1) and an effect of improving film moldability.
- the content of polypropylene (b2) is preferably 1 to 70 parts by weight, more preferably 5 to 70 parts by weight, based on the total of 100 parts by weight of the propylene-based elastomer composition (B). More preferred is 5 to 20 parts by weight. If the content of polypropylene (b2) is less than 1 part by weight, the propylene / ⁇ -olefin copolymer (b1) may be blocked, and the extrusion state may become unstable during film formation. When the content of polypropylene (b2) is more than 30 parts by weight, the expansion rate may be small.
- the film of the propylene-based elastomer composition (B) has a tensile modulus at 23 ° C. of preferably 8 to 500 MPa, more preferably 10 to 500 MPa, further preferably 10 to 100 MPa, and particularly preferably 10 to 50 MPa. 10 to 45 MPa is more preferable.
- the melt flow rate (MFR) of the propylene-based elastomer composition (B) measured at 230 ° C. and 2.16 kg load according to ASTM D1238 is that of the 1-butene / ⁇ -olefin copolymer (A).
- the 1-butene / ⁇ -olefin copolymer (A) is not particularly specified as long as it is easily mixed in the extruder, but preferably 1 to 20 g / 10 min, more preferably 1 to 10 g / 10 min. is there. If MFR is in the above range, it is easy to extrude to a relatively uniform film thickness.
- the content of the propylene-based elastomer composition (B) contained in the expandable film is preferably 30 to 70 parts by weight with respect to 100 parts by weight in total of (A) and (B), More preferred are parts by weight.
- the expandable film is obtained by dry blending or melt blending the aforementioned 1-butene / ⁇ -olefin copolymer (A) and the propylene elastomer composition (B), followed by extrusion molding.
- the expandable film thus obtained has a relatively high crystallinity and a high tensile elastic modulus and a 1-butene / ⁇ -olefin copolymer (A), and a relatively low crystallinity and a low tensile elastic modulus. It has a structure in which the propylene elastomer composition (B) is finely dispersed.
- FIG. 1A is an example of a TEM image of a cross section parallel to the MD direction of the expandable film
- FIG. 1B is an example of a TEM image of a cross section parallel to the TD direction of the expandable film.
- the film cross-sectional TEM images in the MD direction and the TD direction show bright portions (1-butene / ⁇ -olefin copolymer (A)) extending in a direction parallel to the film surface. Is seen.
- phase separation structure can be observed as a “light / dark structure” by a transmission electron microscope (TEM) image obtained by observing a cross section of the expandable film as a thin section.
- TEM transmission electron microscope
- “bright part” is considered to be a 1-butene / ⁇ -olefin copolymer (A); “dark part” is considered to be a propylene-based elastomer composition (B).
- Such a phase separation structure is not formed by the highly crystalline olefinic resin and the low crystalline olefinic resin exemplified in Patent Document 5 (Japanese Patent No. 3340979). Therefore, the 1-butene of the present invention is not formed.
- -It is considered to be manifested by a combination of the ⁇ -olefin copolymer (A) and the propylene-based elastomer composition (B).
- the mechanism is not necessarily clear, but is presumed as follows. That is, when stress is applied to the expandable film having the phase separation structure as described above, the 1-butene / ⁇ -olefin copolymer (A) is elastically deformed and is not necked. Through B), the stress applied to the 1-butene / ⁇ -olefin copolymer (A) is made uniform in the cross-sectional direction of the film. For this reason, it is considered that the higher-order structure of the 1-butene / ⁇ -olefin copolymer (A) is isotropically deformed as a whole of the expandable film, and the range in which elastic deformation can be performed without causing necking is widened.
- the TEM observation of the expandable film was performed by cutting a sample piece having a thickness of 100 ⁇ m in a direction parallel to the MD direction and a direction parallel to the TD direction; and the obtained cross sections were respectively transmitted electron microscopes (TEM, H-7650 manufactured by Hitachi, Ltd.) And observing at a magnification of 5000 to 20000 times.
- the thickness of the expandable film is not particularly limited.
- the thickness of the base material layer is preferably about 50 to 200 ⁇ m.
- the expandable film of the present invention can be obtained by a method (extrusion molding method) in which each component is blended and then extrusion molded.
- the expandable film contains polypropylene (b2), a mixture (propylene-based elastomer composition (B)) obtained by pre-blending propylene / ⁇ -olefin copolymer (b1) and polypropylene (b2), 1- It is preferable to blend the butene / ⁇ -olefin copolymer (A) and the like to produce an expandable film by an extrusion method.
- the polypropylene (b2) and the propylene / ⁇ -olefin copolymer (b1) are blended in advance, so that the 1-butene / ⁇ -olefin copolymer (A) and the propylene-based elastomer composition (B) are mixed. It is considered that the compatibility of the above mixture is adjusted and the above-described phase separation structure is easily formed.
- the expandable film of the present invention has good handleability and excellent expandability. For this reason, the expandable film of the present invention is used as a dicing film used in various applications requiring expandability, such as protective members such as optical elements and semiconductor devices, and preferably used as a dicing film for semiconductors. It is done.
- the dicing film of the present invention has a base material layer containing the aforementioned expandable film, and may further have an adhesive layer, an intermediate layer, a low friction layer, and the like as necessary.
- a polyimide film, an aluminum electrode, a scribe line for dicing, and the like are formed on the surface, and the surface shape has a concavo-convex shape rich in undulations. is there.
- bumps such as solder bumps used for bonding a mounting board of a high-frequency device, such as a gold bump having a large undulation compared with a standard LSI, are seen. Therefore, preventing the breakage of the semiconductor wafer having these irregularities during dicing is also a major issue.
- a dicing film is closely attached to the circuit forming surface side of the wafer, and a rotating blade is used. There is a method of cutting from the non-circuit forming surface.
- a dicing film that does not have unevenness followability is used, a gap may be formed between the adhesive surface and the circuit forming surface, and the circuit forming surface may be damaged by scraps generated during cutting. It is difficult to suppress.
- the dicing film of the present invention When the dicing film of the present invention is used for such an application, it preferably has an intermediate layer capable of absorbing irregularities on the surface of the semiconductor wafer. When the dicing film of the present invention has an intermediate layer described later, it can adhere to the irregularities on the surface of the semiconductor wafer, and can prevent contamination of the circuit forming surface due to dicing and damage to the semiconductor wafer.
- the dicing film of the present invention preferably has good adhesion to the ring frame. Therefore, the dicing film of the present invention preferably has a pressure-sensitive adhesive layer described later on the outermost surface on the side to be bonded to the ring frame.
- the pressure-sensitive adhesive layer may be composed of a known pressure-sensitive adhesive, and is not particularly limited.
- a known pressure-sensitive adhesive in addition to rubber-based, acrylic-based, and silicone-based pressure-sensitive adhesives, styrene-based elastomers and olefin-based elastomers.
- it may be composed of a thermoplastic elastomer.
- the pressure-sensitive adhesive layer may be composed of a radiation curable pressure-sensitive adhesive that reduces the pressure-sensitive adhesive force by radiation, a heat-curable pressure-sensitive adhesive that decreases the pressure-sensitive adhesive strength by heating, or the like.
- a preferable example of the radiation curable pressure sensitive adhesive includes an ultraviolet curable pressure sensitive adhesive.
- the acrylic pressure-sensitive adhesive may be a homopolymer of an acrylate compound or a copolymer of an acrylate compound and a comonomer.
- the acrylate compound include ethyl acrylate, butyl acrylate and 2-ethylhexyl acrylate.
- Examples of comonomer constituting the acrylic copolymer include vinyl acetate, acrylonitrile, acrylamide, styrene, methyl methacrylate, methyl acrylate, methacrylic acid, acrylic acid, itaconic acid, hydroxyethyl methacrylate, hydroxypropyl methacrylate, dimethylamino Examples include ethyl methacrylate, acrylic amide, methylol acrylic amide, glycidyl methacrylate and maleic anhydride.
- rubber-based adhesives examples include natural rubber, synthetic isoprene rubber, styrene butadiene rubber, styrene / butadiene block copolymer, styrene / isoprene block copolymer, butyl rubber, polyisobutylene, polybutadiene, polyvinyl ether, silicone rubber, and Chloroprene rubber and the like are included.
- a tackifier resin may be further added to the rubber adhesive.
- tackifying resins include rosin resins and terpene resins, and are preferably terpene resins from the viewpoint of good compatibility with rubber adhesives.
- rosin resins include rosin, polymerized rosin, hydrogenated rosin, rosin ester, etc .
- terpene resins include terpene resins, terpene phenol resins, aromatic modified terpene resins and rosin phenol resins, etc. Is included.
- the content of the tackifying resin is preferably 5 to 100 parts by weight with respect to 100 parts by weight of the rubber adhesive.
- thermoplastic elastomers examples include polystyrene elastomers, polyolefin elastomers, polyurethane elastomers, and polyester elastomers. Of these, polystyrene elastomers and polyolefin elastomers are preferable in terms of easy adjustment of adhesiveness and flexibility.
- Polystyrene elastomers include styrene-isoprene-styrene block copolymer (SIS), styrene-ethylene-butylene-styrene block copolymer (SEBS), styrene-ethylene-propylene-styrene block copolymer (SEPS), etc. Styrene / diene block copolymers and hydrogenated products thereof (hydrogenated styrene / butadiene rubber (HSBR), etc.).
- SIS styrene-isoprene-styrene block copolymer
- SEBS styrene-ethylene-butylene-styrene block copolymer
- SEPS styrene-ethylene-propylene-styrene block copolymer
- HBR hydrogenated styrene / butadiene rubber
- the polyolefin-based elastomer includes a block copolymer of a polyolefin block exhibiting crystallinity and a monomer copolymer block exhibiting non-crystallinity. Specific examples include olefin (crystalline) / ethylene / butylene / olefin (crystalline) block copolymers, polypropylene / polyethylene oxide / polypropylene block copolymers, polypropylene / polyolefin / polypropylene block copolymers, and the like. .
- the polyolefin-based elastomer is preferably a polyethylene-based elastomer.
- the ultraviolet curable pressure-sensitive adhesive and the heat-curable pressure-sensitive adhesive are a pressure-sensitive adhesive such as the acrylic pressure-sensitive adhesive, a curable compound (a component having a carbon-carbon double bond), a photopolymerization initiator or a thermal polymerization initiator, ,including.
- the curable compound may be any monomer, oligomer or polymer having a carbon-carbon double bond in the molecule and curable by radical polymerization.
- curable compounds include trimethylolpropane tri (meth) acrylate, pentaerythritol tri (meth) acrylate, tetraethylene glycol di (meth) acrylate, 1,6-hexanediol di (meth) acrylate, neo Esters of (meth) acrylic acid and polyhydric alcohols such as pentyl glycol di (meth) acrylate and dipentaerythritol hexa (meth) acrylate; ester acrylate oligomers; 2-propenyl di-3-butenyl cyanurate, 2-hydroxyethyl Examples thereof include isocyanurates or isocyanurate compounds such as bis (2-acryloxyethyl) isocyanurate and tris (2-methacryloxyethyl) isocyanur
- the content of the curable compound is preferably 5 to 900 parts by weight and more preferably 20 to 200 parts by weight with respect to 100 parts by weight of the pressure-sensitive adhesive. If the content of the curable compound is too small, there are too few parts to be cured, and the adjustment of the adhesive strength becomes insufficient. If the content of the curable compound is too large, the sensitivity to heat and light is too high and the storage stability is high. Decreases.
- the photopolymerization initiator may be any compound that can be cleaved by irradiation with ultraviolet rays to generate radicals.
- benzoin alkyl ethers such as benzoin methyl ether, benzoin isopropyl ether, and benzoin isobutyl ether
- benzyl, benzoin benzophenone, ⁇ -Aromatic ketones such as hydroxycyclohexyl phenyl ketone
- aromatic ketals such as benzyldimethyl ketal
- thioxanthones such as chlorothioxanthone, dodecylthioxanthone, dimethylthioxanthone, and diethylthioxanthone.
- the thermal polymerization initiator is an organic peroxide derivative or an azo polymerization initiator, and is preferably an organic peroxide derivative from the point that nitrogen is not generated during heating.
- examples of the thermal polymerization initiator include ketone peroxide, peroxyketal, hydroperoxide, dialkyl peroxide, diacyl peroxide, peroxyester, peroxydicarbonate, and the like.
- a cross-linking agent may be added to the adhesive.
- cross-linking agents epoxy compounds such as sorbitol polyglycidyl ether, polyglycerol polyglycidyl ether, pentaerythritol polyglycidyl ether, diglycerol polyglycidyl ether; tetramethylolmethane-tri- ⁇ -aziridinylpropionate, trimethylol Propane-tri- ⁇ -aziridinylpropionate, N, N′-diphenylmethane-4,4′-bis (1-aziridinecarboxamide), N′-hexamethylene-1,6-bis (1-aziridinecarboxyl) Aziridine-based compounds such as amide); isocyanate-based compounds such as tetramethylene diisocyanate, hexamethylene diisocyanate, and polyisocyanate.
- the adhesive strength of the pressure-sensitive adhesive layer can be adjusted by, for example, the amount of crosslinking agent added. Specifically, it can be adjusted by the method described in JP-A No. 2004-155591.
- the thickness of the pressure-sensitive adhesive layer is not particularly limited as long as it does not impair the expandability of the base material layer, but is usually preferably 1 to 50 ⁇ m, more preferably 1 to 25 ⁇ m.
- An intermediate layer is a layer which has the uneven
- the intermediate layer may be, for example, a layer provided between the base material layer and the pressure-sensitive adhesive layer, or may be a layer having the function of the pressure-sensitive adhesive layer.
- the intermediate layer preferably has a tensile elastic modulus E (25) at 25 ° C. and a tensile elastic modulus E (60) at 60 ° C. satisfying E (60) / E (25) ⁇ 0.1, particularly E (60 ) / E (25) ⁇ 0.08 is more preferable, and E (60) / E (25) ⁇ 0.05 is more preferable.
- E (60) / E (25) ⁇ 0.05 is more preferable.
- the tensile elastic modulus E (25) at 25 ° C. of the intermediate layer is 1 MPa to 10 MPa, and more preferably 2 MPa to 9 MPa. If the tensile modulus E (25) is in the above range, the shape at room temperature after the sheet is attached can be maintained, and the adhesion during processing can be maintained.
- the tensile elastic modulus E (60) at 60 ° C. of the intermediate layer is preferably 0.005 MPa to 1.0 MPa, and more preferably 0.01 MPa to 0.5 MPa. If the tensile modulus E (60) is in the above range, when the sheet is attached under heating, fluidity is exhibited, and therefore good followability to unevenness can be obtained.
- the tensile modulus of the resin can be measured as follows. 1) As a measurement sample, for example, a sample film having an initial length of 140 mm, a width of 10 mm, and a thickness of 75 to 100 ⁇ m is prepared. 2) Then, a tensile test is performed at a measurement temperature of 25 ° C., a distance between chucks of 100 mm, and a tensile speed of 50 mm / min, and the amount of change (mm) in elongation of the sample is measured. 3) A tangent is drawn to the initial rising portion of the obtained SS curve (stress-strain curve), and the value obtained by dividing the slope of the tangent by the cross-sectional area of the sample film is taken as the tensile modulus.
- the density of the intermediate layer is preferably 800 ⁇ 890kg / m 3, more preferably 830 ⁇ 890kg / m 3, more preferably 850 ⁇ 890kg / m 3.
- the density of the intermediate layer is less than 800 kg / m 3 , the elastic modulus becomes too low, and thus the shape fixing force is reduced.
- the density exceeds 890 kg / m 3 , the elastic modulus becomes too high, and thus follows unevenness. Sex is reduced.
- the resin constituting the intermediate layer is not particularly limited as long as it satisfies the tensile elastic modulus, but is preferably an olefin copolymer.
- the olefin copolymer is preferably an ⁇ -olefin copolymer having a main structural unit of an ⁇ -olefin having 2 to 12 carbon atoms.
- Examples of ⁇ -olefins having 2 to 12 carbon atoms include ethylene, propylene, 1-butene, 1-pentene, 3-methyl-1-butene, 1-hexene, 4-methyl-1-pentene, 3-methyl -1-pentene, 1-heptene, 1-octene, 1-decene, 1-dodecene and the like are included.
- ethylene / propylene copolymers ethylene / 1-butene copolymers, and ethylene / propylene / ⁇ -olefins having 4 to 12 carbon atoms are terpolymers because of their excellent conformability when bonding.
- An ethylene / ⁇ -olefin copolymer such as a polymer; and a propylene / 1-butene copolymer / an ⁇ -olefin terpolymer having 5 to 12 carbon atoms are preferable, and an ethylene / propylene copolymer is preferable. More preferred. This is because propylene has high heat-meltability among olefin copolymers.
- Commercially available ⁇ -olefin copolymers include TAFMER (registered trademark) manufactured by Mitsui Chemicals.
- the tensile elastic modulus of the intermediate layer is adjusted by the type of monomer constituting the olefin copolymer, the copolymerization ratio, the presence or absence of modification, and the like.
- the copolymerization ratio of propylene may be increased or modified with carboxylic acid or the like.
- the intermediate layer may contain other resins or other additives within a range that does not impair easy pastability and easy peelability to the semiconductor wafer.
- additives include ultraviolet absorbers, antioxidants, heat stabilizers, lubricants, softeners, tackifiers and the like.
- the thickness of the intermediate layer is preferably larger than the step provided on one surface of the wafer to which the dicing film is bonded, and this step (for example, unevenness (including solder bumps) on the circuit forming surface of the semiconductor wafer) is embedded.
- the thickness is not particularly limited as long as the thickness can be reduced.
- the thickness of the intermediate layer can be 100 to 300 ⁇ m. That is, the thickness of the intermediate layer is preferably 1 to 3 times, more preferably 1 to 2 times the level difference on the wafer surface.
- the dicing film of this invention may further have a low friction layer in the surface on the opposite side to an adhesive layer as needed. That is, when the dicing film is used as a dicing film for a semiconductor as will be described later, as a method of expanding the dicing film, the peripheral portion of the dicing film is fixed with a ring frame, and the dicing film is expanded from below the center of the dicing film. There is a method of pushing up the stage of the machine (see FIG. 6 described later). At this time, if the friction of the surface of the dicing film on the side in contact with the stage is large, the film is difficult to slide on the stage, and the film portion in contact with the stage cannot be expanded.
- Such a low friction layer is made of a resin such as polyethylene or ethylene ionomer resin. Further, a lubricant may be applied or contained on the surface of the low friction layer in order to further improve the slipperiness as necessary. Examples of such lubricants include lubricants such as erucic acid amide, oleic acid amide, and silicone oil, and master batches thereof (lubricant master batch).
- the layer configuration of the dicing film of the present invention is not particularly limited, and may be a film composed of at least two layers of a base material layer and an adhesive layer, or a base material layer and an intermediate layer.
- stacked in this order may be sufficient.
- middle layer may be sufficient.
- the pressure-sensitive adhesive layer is on one surface side of the base material layer, and the low friction layer is on the other surface side of the base material layer. Preferably they are arranged. As long as the effect of the present invention is not impaired, between the base material layer and the adhesive layer, between the base material layer and the intermediate layer, between the intermediate layer and the adhesive layer, between the base material layer and the low friction layer. Layers other than the above may be stacked between the layers. Further, the base material layer, the intermediate layer, and the pressure-sensitive adhesive layer may each be a multilayer. Moreover, when it has two or more base material layers, arbitrary layers may be arrange
- FIG. 2 is a cross-sectional view schematically showing an embodiment of the dicing film of the present invention.
- the base material layer 12 having expandability, the pressure-sensitive adhesive layer 14 disposed on one surface thereof and bonded to the wafer, and the base material layer 12 are opposite to the pressure-sensitive adhesive layer 14.
- a low friction layer 16 disposed on the side surface Since the dicing film 10 having such a configuration has the base material layer 12, it has high expandability.
- FIG. 3 is a cross-sectional view schematically showing another embodiment of the dicing film of the present invention.
- a base material layer 12 having expandability As shown in FIG. 3, a base material layer 12 having expandability, an intermediate layer 13 that is disposed on one surface of the base material layer 12 to absorb unevenness of the wafer, an adhesive layer 14 that is bonded to the wafer, and a base material It has the low friction layer 16 arrange
- the intermediate layer 13 is provided, even when the semiconductor wafer is bonded to a semiconductor wafer having large irregularities, the intermediate layer 13 adheres to the irregularities, preventing contamination of the wafer surface and preventing damage to the semiconductor chip during dicing. It becomes possible.
- the total thickness is preferably 50 to 200 ⁇ m, and more preferably 70 to 150 ⁇ m.
- the total thickness is preferably 60 to 700 ⁇ m, more preferably 80 to 500 ⁇ m. .
- the tensile modulus at 23 ° C. of the dicing film of the present invention is preferably 70 MPa or more. This is because when the pressure is 70 MPa or less, the dicing film becomes wrinkles when the dicing film is attached to the wafer, and the handling property is prevented from being lowered.
- a separator may be further provided on the surface of the pressure-sensitive adhesive layer of the dicing film of the present invention as necessary in order to protect the surface of the pressure-sensitive adhesive layer.
- the material of the separator may be paper, a synthetic resin film such as polyethylene, polypropylene, and polyethylene terephthalate.
- the thickness of the separator is usually about 10 to 200 ⁇ m, preferably about 25 to 100 ⁇ m.
- the dicing film of the present invention does not contain polyvinyl chloride (PVC) or the like, chlorine ions are not generated and the environmental load can be reduced. Moreover, since the dicing film of the present invention does not contain a plasticizer, contamination of the wafer can be reduced. Furthermore, the dicing film of the present invention has sufficient expandability and hardly causes necking.
- PVC polyvinyl chloride
- the dicing film of this invention can be manufactured by arbitrary methods.
- the dicing film of the present invention is a laminated film including an adhesive layer and a low friction layer in addition to the base material layer, 1) a method of co-extrusion and lamination of the molten resin constituting each layer (co-extrusion) Method); 2) Method of laminating the molten resin constituting the other layer on the base material layer (extrusion laminating method); 3) Method of laminating the film constituting each layer via thermocompression bonding or an adhesive ( Laminating method); and 4) A method of applying and laminating the resin composition constituting the pressure-sensitive adhesive layer on the base material layer or the resin laminate in which the base material layer and the intermediate layer are laminated (coating method), etc. , May be manufactured.
- the method of blending two or more different resins before extrusion molding or coextrusion is not particularly limited, but is a method of dry mixing with various mixers such as a Henschel mixer and a tumbler mixer (dry blending method); A melt kneading method using a twin screw extruder or the like (melt blend method) may be used, and a melt kneading method using a twin screw extruder is preferred.
- the melt kneading temperature may be any temperature suitable for melting and kneading the resin constituting each layer, and the melting temperature of the resin constituting the base material layer can be set to 180 to 260 ° C., for example.
- the extrusion method is not particularly limited, and may be an inflation extrusion method, a T-die extrusion method, or the like.
- the MFR at 230 ° C. of the base material layer and the MFR at 230 ° C. of the pressure-sensitive adhesive layer measured in accordance with ASTM D1238 are both 1 to 20 g / 10 min or less. It is preferable. By having such an MFR, each layer can be molded with a stable film thickness.
- the resin composition constituting the base layer and the resin composition constituting the intermediate layer are coextruded, or the resin composition constituting the intermediate layer is extrusion laminated on the base layer.
- the MFR at 230 ° C. of the base material layer and the MFR at 230 ° C. of the intermediate layer measured in accordance with ASTM D1238 are both 1 to 20 g / 10 min or less. Preferably there is. By having such an MFR, each layer can be molded with a stable film thickness.
- the resin composition constituting the base layer, the resin composition constituting the intermediate layer, and the resin composition constituting the pressure-sensitive adhesive layer are coextruded, or the intermediate layer is formed on the base layer.
- a dicing film is obtained by extrusion laminating the resin composition constituting the adhesive and the resin composition constituting the pressure-sensitive adhesive, it is measured according to ASTM D1238 of the base material layer, the intermediate layer, and the pressure-sensitive adhesive layer.
- the MFR of the base material layer at 230 ° C. is preferably 1 to 20 g / 10 min or less. By having such an MFR, each layer can be molded with a stable film thickness.
- the pressure-sensitive adhesive forming the pressure-sensitive adhesive layer is a radiation-curable pressure-sensitive adhesive
- a method of drying after coating directly on the base material layer or on the resin laminate of the base material layer and the intermediate layer (The above-mentioned coating method) is preferable.
- the resin laminate of the base material layer and the intermediate layer is formed by coextruding the resin composition constituting the base material layer and the resin composition constituting the intermediate layer, or constituting the intermediate layer on the base material layer.
- the resin composition to be obtained can be obtained by extrusion lamination.
- the manufacturing method of the semiconductor device using the dicing film of the present invention includes 1) a step of attaching the dicing film of the present invention to the back surface of the semiconductor wafer via an adhesive layer, and 2) dicing the semiconductor wafer. 3) expanding the dicing film, and picking up the diced semiconductor wafer (semiconductor chip); 4) mounting the semiconductor chip by bonding it to a die pad (not shown) of the semiconductor device. It is manufactured through a process.
- the dicing film described above can be used as the dicing film of the present invention.
- FIG. 4A to 4E are views showing an example of a method for manufacturing a semiconductor device using a dicing film 30 having an adhesive layer 34 on one surface of a base material layer 32 and a low friction layer 36 on the other surface. is there.
- a wafer 22 is prepared.
- the wafer 22 is attached to the dicing film 30 of the present invention (step 1).
- the dicing film 30 has a diameter larger than that of the wafer 22, and has a size that allows the periphery of the dicing film 30 to be fixed by the ring frame 26. Then, the peripheral edge portion of the dicing film 30 is fixed by the ring frame 26.
- the wafer 22 is diced (cut) to obtain a semiconductor chip 22A (step 2).
- the cutting depth may be set to such an extent that it reaches the interface between the base material layer 32 and the pressure-sensitive adhesive layer 34 of the dicing film 30.
- the cutting means is not particularly limited, and may be a dicing saw or a laser.
- the dicing film 30 is expanded (step 3).
- the means for expanding (expanding) the dicing film 30 is a method of expanding the dicing film 30 in contact with the stage by raising the stage of the expansion machine below the dicing film 30, or pulling (expanding) the film in a direction parallel to the film surface. ) Method etc. are included.
- the interval between the semiconductor chips 22A obtained by dicing can be increased. Further, by expanding (expanding) the dicing film 30, shear stress is generated between the pressure-sensitive adhesive layer 34 of the dicing film 30 and the wafer 22, and the adhesive force between the wafer 22 and the pressure-sensitive adhesive layer 34 is reduced.
- the semiconductor chip 22A can be easily picked up. As described above, when the semiconductor chip 22 ⁇ / b> A is picked up, the semiconductor chip 22 ⁇ / b> A can be peeled from the adhesive layer 34 of the dicing film 30.
- 5A to 5E show a semiconductor device using a dicing film 50 having an intermediate layer 53 and an adhesive layer 54 in this order on one surface of a base material layer 52 and a low friction layer 56 on the other surface. It is a figure which shows an example of a manufacturing method.
- a wafer 42 having irregularities such as circuits on the surface and the dicing film 50 are prepared.
- a circuit protective layer for protecting the circuit may be provided in the wafer 42 on which the circuit is formed.
- the circuit protective layer may be an insulating resin, but may be, for example, polyimide, polybenzoxazole, or the like.
- the uneven surface of the wafer 42 is adhered to the dicing film 50 of the present invention under heating (step 1).
- the sticking can be performed at a temperature of 40 ° C. to 80 ° C. and a pressure of 0.3 to 0.5 MPa.
- the temperature at the time of sticking is less than 40 ° C., the elasticity of the intermediate layer 53 is unlikely to be low, and the followability of the intermediate layer 53 with respect to the unevenness is reduced.
- the temperature at the time of sticking exceeds 80 degreeC, it is not preferable as process temperature.
- the dicing film 50 can be attached by a known tape applicator.
- the dicing film 50 may be cooled. By cooling the dicing film 50 from the temperature at the time of sticking, the elastic modulus of the intermediate layer 53 is increased, and the intermediate layer 53 and the unevenness of the wafer 42 can be kept in good contact.
- the dicing film 50 has a diameter larger than that of the wafer 42 and has a size such that the peripheral edge thereof can be fixed by the ring frame 46. Then, the peripheral edge portion of the dicing film 50 is fixed by the ring frame 46.
- the wafer 42 is diced (cut) to obtain a semiconductor chip 42A (step 2).
- the cutting depth may be set to such an extent that it reaches the interface between the base material layer 52 and the intermediate layer 53 of the dicing film 50.
- the cutting means is not particularly limited, and may be a dicing saw or a laser.
- the dicing film 50 is expanded (step 3).
- the means for expanding (expanding) the dicing film 50 is a method of expanding the dicing film 50 in contact with the stage by raising the stage of the expansion machine below the dicing film 50, or pulling (expanding) the dicing film 50 in a direction parallel to the film surface. ) Method etc. are included.
- the interval between the semiconductor chips 42A obtained by dicing can be increased. Further, by expanding (expanding) the dicing film 50, shear stress is generated between the pressure-sensitive adhesive layer 54 of the dicing film 50 and the wafer 42, and the adhesive force between the wafer 42 and the pressure-sensitive adhesive layer 54 is reduced.
- the semiconductor chip 42A can be easily picked up. As described above, when the semiconductor chip 42 ⁇ / b> A is picked up, the semiconductor chip 42 ⁇ / b> A can be peeled from the adhesive layer 54 of the dicing film 50.
- 1-butene / ⁇ -olefin copolymer (A) As the 1-butene / ⁇ -olefin copolymer (A) contained in the base material layer, the 1-butene / ⁇ -olefin copolymer (A1) shown in Table 1 (trade name: TAFMER BL4000, Mitsui Chemicals, Inc.) 1-butene / ⁇ -olefin copolymer (A2) (trade name: Toughmer BL3450, manufactured by Mitsui Chemicals) and 1-butene / ⁇ -olefin copolymer (A3) (trade name: Toughmer BL2481, Mitsui) Chemical Co., Ltd.) was used.
- Table 1 trade name: TAFMER BL4000, Mitsui Chemicals, Inc.
- 1-butene / ⁇ -olefin copolymer (A2) (trade name: Toughmer BL3450, manufactured by Mitsui Chemicals)
- the density was measured using a density gradient tube method disclosed in JP-A-2001-33372. Specifically, the obtained 1-butene / ⁇ -olefin copolymer sample was melted by a melt indexer to obtain a strand. The strand was annealed, cut to an appropriate size, and put into a density gradient tube.
- the density gradient tube a glass cylindrical tube filled with a liquid having a continuous density gradient was used.
- the density of the sample of 1-butene / ⁇ -olefin copolymer was read from the equilibrium position where the solid sample was stationary in the liquid.
- an ethanol-water mixed liquid defined in Table 2 of JISK7112 was used as the liquid filled in the glass cylindrical tube.
- a film made of 1-butene / ⁇ -olefin copolymer (A) was produced.
- the tensile elastic modulus of this film was measured by a method based on ASTM D638. That is, i) A film having a thickness of 100 ⁇ m was cut to prepare a strip-shaped sample piece having a width (TD direction) of 10 mm and a length (MD direction) of 100 mm. ii) Next, in accordance with JIS K7161, the tensile modulus of the sample piece was measured with a tensile tester under conditions of a distance between chucks of 50 mm and a tensile speed of 300 mm / min. The tensile modulus was measured under conditions of a temperature of 23 ° C. and a relative humidity of 55%.
- a product name Evolue SP2040 manufactured by Prime Polymer Co., Ltd., linear low density polyethylene bigat softening point 101 ° C.
- the brand name NOTIO PN3560 Mitsubishi Chemicals Co., Ltd. make, MFR4g / 10min (ASTM D1238 conformity, measurement temperature 230 degreeC) was prepared.
- raw materials for the base material layer, the low friction layer, and the pressure-sensitive adhesive layer were charged into each extruder equipped with a full-flight type screw and melt-kneaded.
- the extrusion temperature of the base material layer, the low friction layer and the pressure-sensitive adhesive layer is 230 ° C.
- three layers of molten resin are laminated in a multilayer die and co-extruded to form a low friction layer as shown in FIG.
- a laminated film having a three-layer structure in which the base material layer and the pressure-sensitive adhesive layer were sequentially laminated was obtained.
- a separator (trade name SP-PET, manufactured by Tosero Co., Ltd.) was further laminated on the pressure-sensitive adhesive layer of the obtained laminated film, and then slit and wound up to a predetermined width.
- Example 2 Except that the mixing ratio of the 1-butene / ⁇ -olefin copolymer (A1) and the propylene-based elastomer composition (B1) in the base material layer was changed as shown in Table 4, it was the same as Example 1. Thus, a laminated film was obtained.
- Example 4 A laminated film was obtained in the same manner as in Example 1 except that the propylene-based elastomer composition (B1) in the base material layer was changed to the propylene-based elastomer composition (B2).
- Example 1 Example 1 was repeated except that the mixing ratio of the 1-butene / ⁇ -olefin copolymer (A1) and the propylene-based elastomer composition (B2) in the base material layer was changed as shown in Table 4. To obtain a laminated film.
- Example 7 The mixing ratio of the 1-butene / ⁇ -olefin copolymer (A1) and the propylene / ⁇ -olefin copolymer (b1-4) shown in Table 2 in the base material layer was changed as shown in Table 5. Except for the above, a laminated film was obtained in the same manner as in Example 1.
- Example 8 A laminated film was obtained in the same manner as in Example 1 except that Trade Name Evolue SP2040 (Linear Low Density Polyethylene manufactured by Prime Polymer Co., Ltd.) was used instead of NOTIO PN3560 which is a raw material for the pressure-sensitive adhesive layer.
- Trade Name Evolue SP2040 Linear Low Density Polyethylene manufactured by Prime Polymer Co., Ltd.
- Example 9 A laminated film was obtained in the same manner as in Example 4 except that trade name Evolue SP2040 (a linear low-density polyethylene manufactured by Prime Polymer Co., Ltd.) was used instead of NOTIO PN3560 which is a raw material for the pressure-sensitive adhesive layer.
- trade name Evolue SP2040 a linear low-density polyethylene manufactured by Prime Polymer Co., Ltd.
- Example 10 In the same manner as in Example 1 except that the same raw material as that of the base material layer was used instead of Evolue SP2040 (a linear low density polyethylene manufactured by Prime Polymer Co., Ltd.) which is a raw material of the low friction layer. A laminated film having a two-layer structure of a material layer and an adhesive layer was obtained.
- Evolue SP2040 a linear low density polyethylene manufactured by Prime Polymer Co., Ltd.
- Example 11 Instead of NOTIO PN3560, which is the raw material for the adhesive layer, NOTIO PN2060 (registered trademark, MFR 7 g / 10 min (according to ASTM D1238, 230 ° C.) manufactured by Mitsui Chemicals, Inc.) was used in the same manner as in Example 10. Thus, a laminated film having a two-layer structure was obtained.
- Example 12 Instead of NOTIO PN3560, which is the raw material for the adhesive layer, Dynalon DR1322P (registered trademark) (HSBR hydrogenated styrene-butadiene rubber manufactured by JSR Co., Ltd.) was used in the same manner as in Example 10 to obtain a two-layer structure. A laminated film was obtained.
- Dynalon DR1322P registered trademark
- UV-curable pressure-sensitive adhesive coating solution constituting UV-curable pressure-sensitive adhesive layer 48 parts by weight of ethyl acrylate, 27 parts by weight of 2-ethylhexyl acrylate, 20 parts by weight of methyl acrylate, 5 parts by weight of glycidyl methacrylate, and
- a polymerization initiator 0.5 part by weight of benzoyl peroxide was mixed. This was dropped into a nitrogen-substituted flask containing 65 parts by weight of toluene and 50 parts by weight of ethyl acetate over 5 hours at 80 ° C. with stirring, and further stirred for 5 hours to be reacted.
- the UV curable pressure-sensitive adhesive layer formed on the PET film and the surface of the base film on the side subjected to the corona treatment are bonded and pressed by a dry laminator, and the UV curable pressure-sensitive adhesive layer was transferred to the surface of the base film on which the corona treatment was applied to obtain a laminated film.
- Example 14 Evolue SP2040 (Linear Low Density Polyethylene, Prime Polymer Co., Ltd.), which is a raw material for the low friction layer, is traded under the trade name Nukurel AN4213C (Mitsui / Dupont Polychemical Co., Ltd., ethylene / methacrylic acid copolymer MFR 10 g / 10 min). A laminated film was obtained in the same manner as in Example 1 except that it was changed to (JIS K7210 1999 compliant 190 ° C.).
- Evolue SP2040 Linear Low Density Polyethylene manufactured by Prime Polymer Co., Ltd.
- Nukurel N1108C Mitsubishi Chemical Co., Ltd., ethylene / methacrylic acid copolymer MFR 8 g / 10 min.
- a laminated film was obtained in the same manner as in Example 1 except that it was changed to (JIS K7210 1999 compliant 190 ° C.).
- Evolue SP2040 (a linear low-density polyethylene manufactured by Prime Polymer Co., Ltd.), which is a raw material for the low friction layer
- NOTIO PN3560 which is a raw material for the pressure-sensitive adhesive layer
- Nukurel AN4213C Mitsubishi Chemical Co., Ltd.
- Ethylene / methacrylic acid copolymer MFR 10 g / 10 min JIS K7210 1999 compliant 190 ° C.
- Example 17 A laminated film was obtained in the same manner as in Example 10 except that the propylene elastomer composition (B1) in the base material layer was changed to the propylene elastomer composition (B3).
- Example 18 A laminated film was obtained in the same manner as in Example 10 except that the propylene elastomer composition (B1) in the base material layer was changed to the propylene elastomer composition (B4).
- Example 1 A laminated film was obtained in the same manner as in Example 1 except that only the 1-butene / ⁇ -olefin copolymer (A1) was used as a raw material for the base material layer.
- Example 2 A laminated film was obtained in the same manner as in Example 1 except that only 1-butene / ⁇ -olefin copolymer (A2) was used as a raw material for the base material layer.
- A2 1-butene / ⁇ -olefin copolymer
- Example 3 A laminated film was obtained in the same manner as in Example 1 except that only 1-butene / ⁇ -olefin copolymer (A3) was used as a raw material for the base material layer.
- Example 4 Lamination was performed in the same manner as in Example 1 except that the mixing ratio of the 1-butene / ⁇ -olefin copolymer (A1) and the propylene-based elastomer composition (B1) in the base material layer was changed to 80/20. A film was obtained.
- Example 5 A laminated film in the same manner as in Example 1, except that the mixing ratio of the 1-butene / ⁇ -olefin copolymer (A1) and the propylene-based elastomer composition (B2) in the base material layer was changed to 80/20. Got.
- Example 6 A laminated film in the same manner as in Example 1 except that the mixing ratio of the 1-butene / ⁇ -olefin copolymer (A1) and the propylene-based elastomer composition (B2) in the base material layer was changed to 20/80. Got.
- Example 7 A laminated film was obtained in the same manner as in Example 2, except that the propylene elastomer composition (B1) in the base material layer was changed to Toughmer P0275 (ethylene / ⁇ -olefin copolymer manufactured by Mitsui Chemicals, Inc.). .
- Example 8 A laminated film was obtained in the same manner as in Example 2 except that the propylene-based elastomer composition (B1) in the base material layer was changed to the trade name Dynalon DR8601P (SEBS manufactured by JSR Corporation).
- Example 9 A laminated film was obtained in the same manner as in Example 2, except that the propylene-based elastomer composition (B1) in the base material layer was changed to the trade name Dynalon DR1322P (HSBR hydrogenated styrene / butadiene rubber manufactured by JSR Corporation). .
- Dynalon DR1322P HSBR hydrogenated styrene / butadiene rubber manufactured by JSR Corporation.
- the films obtained in Examples and Comparative Examples were evaluated for 1) expandability, 2) ease of necking, and 3) handling properties as follows. Moreover, the adhesive force of 4) adhesive layer of each film was evaluated as follows. Furthermore, 5) TEM observation was performed about the film of some Examples.
- a 2 cm square lattice was filled in with an oil pen on the surface of the low friction layer for enhancing the slipperiness of the film.
- the length in the MD direction and the length in the TD direction of the lattice were 12 cm, respectively.
- the ring frame 44 was fixed to the expander so that the surface of the base layer of the film 40 was in contact with the stage 43 of the expander.
- Hugle Electronics HS-1800 was used as the expansion machine.
- the stage 43 of the expander was raised 65 mm to measure the length in the TD direction and the length in the MD direction of the lattice when the film 40 was expanded.
- the obtained measured value was applied to the following formula to obtain the expansion rate and the anisotropy of the expansion rate.
- Expansion rate (MD direction, TD direction) (%) 100 ⁇ length of lattice after expansion / length of lattice before expansion
- Expansion rate anisotropy (expansion rate in MD direction ⁇ expansion rate in TD direction) Therefore, the expansion rate indicates the expansion rate of the expandable adhesive film on the stage.
- the extensibility corresponds to the extensibility required in a dicing process of a semiconductor or the like that picks up a semiconductor chip corresponding to the lattice.
- the handling property of the film was evaluated by the tensile elastic modulus of the film. That is, the obtained film was cut to obtain a strip-shaped sample piece having a width (TD direction) of 10 mm and a length (MD direction) of 100 mm.
- the tensile modulus of the sample piece was measured using a tensile tester at a distance between chucks of 50 mm and a tensile speed of 300 mm / min.
- the tensile elastic modulus was measured in the same manner for the five sample pieces, and the average value thereof was taken as the tensile elastic modulus.
- the tensile modulus was measured under conditions of a temperature of 23 ° C. and a humidity of 55%.
- Tensile modulus of the whole film is less than 70 MPa or 170 MPa or more: ⁇
- the tensile elastic modulus of the whole film is 70 MPa or more and less than 170 MPa: ⁇
- Adhesive strength The adhesive strength of the obtained film (film with co-extrusion pressure-sensitive adhesive layer, film with UV-curable pressure-sensitive adhesive layer) is 23 ° C. relative to the pressure-sensitive adhesive sheet test method described in JIS Z0237. The measurement was performed in a 50% humidity environment. The obtained film was attached to a SUS-BA plate while applying pressure with a rubber roll of about 2 kg, and placed in a constant environment at a temperature of 23 ° C. and a relative humidity of 50% for 30 minutes. Next, the adhesive force when the film was peeled from the SUS-BA plate in the 180 ° direction at a peeling speed of 300 mm / min was measured. This adhesive strength was measured twice. The average value of the adhesive strength when measured using a test piece having a width of 25 mm was defined as “adhesive strength” (N / 25 mm).
- the tensile modulus and MFR were measured in the same manner as described above for the low friction layer, the base material layer, and the pressure-sensitive adhesive layer used in each example and comparative example.
- surface shows the tensile elasticity modulus of a base material layer.
- the results of Examples 1 to 6 are shown in Table 4; the results of Examples 7 to 12 are shown in Table 5; the results of Examples 13 to 18 are shown in Table 6.
- the results of Comparative Examples 1 to 6 are shown in Table 7; the results of Comparative Examples 7 to 9 are shown in Table 8; and the results of Comparative Examples 10 to 12 are shown in Table 9.
- the films of Examples 1 to 18 having a base layer obtained by mixing a specific 1-butene / ⁇ -olefin copolymer (A) and a specific propylene-based elastomer composition (B) at a predetermined ratio are as follows: It can be seen that the expansion rate is as high as 120% or more and necking does not occur.
- the film of Comparative Examples 1 to 3 not containing the specific propylene-based elastomer composition (B), and the mixing ratio of the 1-butene / ⁇ -olefin copolymer (A) and the propylene-based elastomer composition (B) It can be seen that the films of Comparative Examples 4 to 6, which are outside the scope of the present application, have a low expansion rate, low handling properties, or are susceptible to necking. Further, it can be seen that the films of Comparative Examples 7 to 9 using other elastomers in place of the propylene-based elastomer composition (B) have good expandability, but are easy to neck and have low handling properties. It can be seen that the films of Comparative Examples 10 to 12 were broken during the expansibility test, and the expansibility was extremely low.
- Example 19 Preparation of raw material for each layer
- a mixture obtained by mixing the aforementioned 1-butene / ⁇ -olefin copolymer (A1) and the propylene elastomer composition (B1) at a mass ratio of 60/40 was prepared.
- Got ready. TAFMER P0275 (registered trademark) manufactured by Mitsui Chemicals, Inc. was prepared as a raw material for the intermediate layer.
- the above-described UV-curable pressure-sensitive adhesive coating solution was prepared.
- the same mixture as the base material layer was prepared as a raw material for the low friction layer.
- each raw material of the base material layer, the intermediate layer, and the low friction layer was put into each extruder equipped with a full flight type screw and melt-kneaded.
- the extrusion temperature of the base material layer, the intermediate layer, and the low friction layer was 230 ° C., and three layers of molten resin were laminated in a multilayer die and coextruded.
- the adhesive layer was laminated on the intermediate layer, and the low friction layer, the base material layer, the intermediate layer, and the adhesive as shown in FIG.
- a laminated film (dicing film) having a four-layer structure in which the layers were sequentially laminated was obtained.
- the thickness of each layer of the dicing film the thickness of the low friction layer / base material layer / intermediate layer / adhesive layer was 10 ⁇ m / 60 ⁇ m / 350 ⁇ m / 5 ⁇ m.
- Example 20 Except that the mixing ratio of the 1-butene / ⁇ -olefin copolymer (A1) and the propylene-based elastomer composition (B1) in the base material layer was changed as shown in Table 10, the same as in Example 19 A dicing film was obtained.
- Example 22 A dicing film was obtained in the same manner as in Example 19 except that the propylene elastomer composition (B1) in the base material layer was changed to the propylene elastomer composition (B2).
- Example 23 A dicing film was obtained in the same manner as in Example 19 except that the propylene-based elastomer composition (B1) in the base material layer was changed to the propylene-based elastomer composition (B3).
- Example 24 A dicing film was obtained in the same manner as in Example 19 except that the propylene-based elastomer composition (B1) in the base material layer was changed to the propylene-based elastomer composition (B4).
- Example 25 The raw material of the low friction layer was changed to the product name Evolue SP2040 (Prime Polymer Co., Ltd. linear low density polyethylene Bigat softening point 101 ° C.), and the base layer, intermediate layer, adhesive layer, and low friction layer A dicing film was obtained in the same manner as in Example 19 except that the extrusion temperature was 230 ° C. and four layers of molten resin were laminated in a multilayer die and co-extruded. As for the thickness of each layer of the dicing film, the thickness of the low friction layer / base material layer / intermediate layer / adhesive layer was 10 ⁇ m / 60 ⁇ m / 350 ⁇ m / 5 ⁇ m.
- Example 26 The raw material of the low friction layer was mixed with 5% by weight of low density polyethylene (Mitsui / DuPont Polychemical Co., Ltd .: trade name: Mirason 11P) and silicone resin (Toray Dow Corning Silicone: trade name: BY27-002). A dicing film was obtained in the same manner as in Example 25 except that the above was changed.
- low density polyethylene Mitsubishi Chemical Company Co., Ltd .: trade name: Mirason 11P
- silicone resin Toray Dow Corning Silicone: trade name: BY27-002
- Example 27 A dicing film was obtained in the same manner as in Example 25 except that the raw material for the intermediate layer was changed to TAFMER P0280 (registered trademark) manufactured by Mitsui Chemicals.
- Example 28 A dicing film was obtained in the same manner as in Example 25 except that the raw material for the pressure-sensitive adhesive layer was changed to trade name NOTIO PN3560 (Mitsui Chemicals, MFR 4 g / 10 min (according to ASTM D1238, measurement temperature 230 ° C.)). .
- Example 29 A dicing film was obtained in the same manner as in Example 25 except that NOTIO PN2060 (registered trademark, MFR 7 g / 10 min (according to ASTM D1238, 230 ° C.)) manufactured by Mitsui Chemicals, Inc. was used as a material for the pressure-sensitive adhesive layer. .
- NOTIO PN2060 registered trademark, MFR 7 g / 10 min (according to ASTM D1238, 230 ° C.)
- Mitsui Chemicals, Inc. was used as a material for the pressure-sensitive adhesive layer. .
- Example 30 A dicing film was obtained in the same manner as in Example 25 except that Dynalon DR1322P (registered trademark) (HSBR hydrogenated styrene / butadiene rubber manufactured by JSR Corporation) was used as a raw material for the pressure-sensitive adhesive layer.
- Dynalon DR1322P registered trademark
- Example 13 A dicing film was obtained in the same manner as in Example 25 except that only the 1-butene / ⁇ -olefin copolymer (A1) was used as a raw material for the base material layer.
- Example 14 Dicing was performed in the same manner as in Example 25 except that the mixing ratio of the 1-butene / ⁇ -olefin copolymer (A1) and the propylene-based elastomer composition (B1) in the base material layer was changed to 80/20. A film was obtained.
- Example 15 Dicing was performed in the same manner as in Example 25 except that the mixing ratio of the 1-butene / ⁇ -olefin copolymer (A1) and the propylene elastomer composition (B1) in the base material layer was changed to 20/80. A film was obtained.
- Example 16 A dicing film was obtained in the same manner as in Example 19 except that a polyethylene terephthalate layer having a thickness of 75 ⁇ m was used as the base material layer and the low friction layer was not laminated.
- Example 17 A dicing film was obtained in the same manner as in Example 25 except that an ethylene-vinyl acetate copolymer (EVA) layer having a thickness of 60 ⁇ m was used as the base material layer.
- EVA ethylene-vinyl acetate copolymer
- Example 31 A dicing film was obtained in the same manner as in Example 25, except that an ethylene-vinyl acetate copolymer (EVA) layer having a thickness of 350 ⁇ m was used as the intermediate layer.
- EVA ethylene-vinyl acetate copolymer
- Example 32 A dicing film was obtained in the same manner as in Example 25 except that the pressure-sensitive adhesive layer was not laminated.
- Example 33 A dicing film was obtained in the same manner as in Example 10 except that the thickness of the base material layer was 60 ⁇ m.
- Example 34 A dicing film was obtained in the same manner as in Example 33 except that the propylene elastomer composition (B1) in the base material layer was changed to the propylene elastomer composition (B5).
- Example 35 A dicing film was obtained in the same manner as in Example 33 except that the propylene-based elastomer composition (B1) in the base material layer was changed to the propylene-based elastomer composition (B6).
- Example 36 A dicing film was obtained in the same manner as in Example 33 except that the propylene-based elastomer composition (B1) in the base material layer was changed to the propylene-based elastomer composition (B7).
- Example 37 A dicing film was obtained in the same manner as in Example 33 except that the propylene-based elastomer composition (B1) in the base material layer was changed to the propylene-based elastomer composition (B8).
- Example 1 About the dicing film of Example 25, the below-mentioned concavo-convex embedding evaluation was performed at a table temperature of 25 ° C., a roller temperature of 25 ° C., and a pressure of 0.5 MPa.
- Reference Example 2 About the dicing film of Example 25, the below-mentioned unevenness
- Example 25 was the same as Example 25 except that the thickness of the intermediate layer of the dicing film of Example 25 was 180 ⁇ m.
- the tensile elasticity modulus E (25) in 25 degreeC and the tensile elasticity modulus (E) in 60 degreeC are measured, Furthermore, the tensile elasticity modulus E in 60 degreeC with respect to the tensile elasticity modulus E (25) in 25 degreeC The ratio of (60) (E (60) / E (25)) was calculated.
- the films obtained in Examples 33 to 37 and Comparative Example 18 have 1) expandability, 2) ease of necking, and 3) handling properties, and 4) adhesive strength of the adhesive layer. Measurement was performed in the same manner as in No.18.
- the adhesive force when the dicing film was peeled off from the ring frame in the 180 ° direction at a peeling speed of 300 mm / min was measured. This adhesive strength was measured twice.
- the average value of the adhesive force at this time was defined as “adhesiveness with the ring frame” (N).
- the adhesiveness to the ring frame is 0.1 N or more, and less than 0.1 N is x.
- Expansion rate (%) 100 ⁇ length of lattice after expansion / length of lattice before expansion The case where the expansion rate is 120% or more is rated as “ ⁇ ”, and the case where the expansion rate is less than 120% is “ ⁇ ”.
- Example 19-24 are in Table 10; the results of Examples 25-30 are in Table 11; the results of Comparative Examples 13-17 are in Table 12; the results of Examples 31, 32, and Reference Examples 1-3 Table 13 shows the results of Examples 33 to 37 and Comparative Example 18.
- the films of Examples 19 to 32 having a base layer obtained by mixing a specific 1-butene / ⁇ -olefin copolymer (A) and a specific propylene-based elastomer composition (B) at a predetermined ratio are as follows: It can be seen that the expansion rate is as high as 120% or more.
- the film of Comparative Example 13 in which the base layer does not contain the specific propylene-based elastomer composition (B), and the 1-butene / ⁇ -olefin copolymer (A) and the propylene-based elastomer composition (B) The films of Comparative Examples 14 and 15 in which the mixing ratio is outside the scope of the present application have a low expansion rate. Further, when Comparative Examples 16 and 17 not containing the specific 1-butene / ⁇ -olefin copolymer (A) and the specific propylene-based elastomer composition (B) are used, the expansion rate is low.
- the tensile elastic modulus E (25) at 25 ° C. and the tensile elastic modulus E (60) at 60 ° C. of E (60) / E (25) ⁇ 0.1 between the base material layer and the adhesive layer It can be seen that by having an intermediate layer satisfying the relationship and having a tensile elastic modulus E (25) at 25 ° C. of 1 to 10 MPa, the uneven embedding property is improved (Examples 19 to 30 and 32). On the other hand, in Example 31, which does not satisfy the relationship of E (60) / E (25) ⁇ 0.1, it can be seen that the unevenness embedding property is lowered.
- Reference Example 1 shows a case where the dicing film of Example 25 is adhered to a wafer at a temperature lower than the temperature specified by the method for manufacturing a semiconductor device of the present invention, and the meltability of the intermediate layer is sufficient. It can be seen that the uneven embedding property is insufficient.
- Reference Example 2 shows a case where the dicing film of Example 25 is attached to a wafer at a pressure lower than the pressure specified by the method for manufacturing a semiconductor device of the present invention. In this case, the intermediate layer and the adhesive layer Does not sufficiently follow the unevenness, and the embedding property of the unevenness becomes insufficient.
- Reference Example 3 shows a case where the thickness of the intermediate layer of the dicing film of Example 25 is smaller than the uneven height of the wafer. The intermediate layer and the pressure-sensitive adhesive layer do not sufficiently enter the unevenness, and the uneven embedding property is not good. It turns out that it will be sufficient.
- Examples 33 to 37 containing 70 parts by weight or less of polypropylene (b2) with respect to 100 parts by weight of the propylene-based elastomer composition (B), dicing films excellent in necking property and handling property were obtained.
- the expansion rate decreases in both the MD direction and the TD direction as the amount of polypropylene (b2) increases.
- the anisotropy of the expansion rate is increased.
- Comparative Example 18 in which the tensile elastic modulus of the propylene-based elastomer composition (B) exceeded 500 MPa, the dicing film had insufficient expandability, and the dicing film was broken.
- an olefinic expandable base material and a dicing film that are low in contamination, have high expandability, and are difficult to neck, which is insufficient with conventional olefinic expandable base materials.
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Abstract
Description
特許文献6のダイシングフィルムは拡張性が不十分であり、フィルムの延伸時に破断しやすく、拡張時にウエハの破損を招くことが懸念される。特許文献7~9のダイシングフィルムは、熱可塑性エラストマーの含有量の好ましい範囲が80重量%以上であり、拡張性が不十分であると懸念される。
2)プロピレン・ブテン・α-オレフィン共重合体(b1)とポリプロピレン(b2)とを含むプロピレン系エラストマー組成物(B)を含み、その組成物(B)の引張弾性率が8~500MPaであること、および
3)(B)の含有量は、(A)と(B)との合計100重量部に対して、30~70重量部であること。
[1]23℃における引張弾性率が100~500MPaである、1-ブテン・α-オレフィン共重合体(A)と、プロピレン・α-オレフィン共重合体(b1)を含み、23℃における引張弾性率が8~500MPaであるプロピレン系エラストマー組成物(B)と、を含む基材であって、前記(B)の含有量は、(A)と(B)の合計100重量部に対して、30~70重量部である、拡張性フィルム。
[2]前記プロピレン系エラストマー組成物(B)は、23℃における引張弾性率が10~50MPaである、[1]に記載の拡張性フィルム。
[3]前記プロピレン系エラストマー組成物(B)が、100重量部の前記プロピレン系エラストマー組成物(B)に対して1~70重量部のポリプロピレン(b2)を含む、[1]または[2]に記載の拡張性フィルム。
[4]前記プロピレン系エラストマー組成物(B)が、100重量部の前記プロピレン系エラストマー組成物(B)に対して5~20重量部のポリプロピレン(b2)を含む、[3]に記載の拡張性フィルム。
[5]前記[1]~[4]に記載の拡張性フィルムを含む基材層と、粘着剤層とを有するダイシングフィルムであって、前記粘着剤層は、前記ダイシングフィルムの最表面に設けられ、前記粘着剤層の、SUS-304-BA板の表面に貼着されて60分間放置した後、前記SUS-304-BA板の表面から剥離されるときの、JIS Z0237に準拠して測定される粘着力が0.1~10N/25mmである、ダイシングフィルム。
[6]ASTM D1238に準拠して測定される、前記基材層の230℃におけるMFRと、前記粘着剤層の230℃におけるMFRとは、いずれも1~20g/10min以下である、[5]に記載のダイシングフィルム。
[8]前記基材層と前記粘着剤層との間に中間層を有し、前記中間層は、25℃における引張弾性率E(25)および60℃における引張弾性率E(60)が、E(60)/E(25)<0.1の関係を満たし、かつ前記25℃における引張弾性率E(25)が1~10MPaである、[5]に記載のダイシングフィルム。
[9]前記中間層が、オレフィン系共重合体を含む、[7]または[8]に記載のダイシングフィルム。
[10]前記中間層の密度が800~890kg/m3である、[7]~[9]のいずれかに記載のダイシングフィルム。
[11]ダイシングフィルムは、少なくとも一方の面に段差を有する半導体ウエハの、前記段差を有する面に貼り合わせて用いられるものであり、前記中間層の厚みが、前記半導体ウエハの段差より大きい、[7]~[10]のいずれかに記載のダイシングフィルム。
[13]半導体ウエハに、[8]に記載のダイシングフィルムを、40~80℃の温度で、0.3~0.5MPaの圧力で前記ダイシングフィルムの粘着剤層を介して貼り合せる工程と、前記半導体ウエハをダイシングして半導体チップを得る工程と、前記ダイシングフィルムを拡張して、前記半導体チップをピックアップする工程とを含む、半導体製造装置の製造方法。
本発明の拡張性フィルムは、1-ブテン・α-オレフィン共重合体(A)と、プロピレン系エラストマー組成物(B)とを含む。
拡張性フィルムに含まれる1-ブテン・α-オレフィン共重合体(A)は、1-ブテンを主な構成成分として含む重合体である。1-ブテン・α-オレフィン共重合体(A)におけるα-オレフィンは、1-ブテン以外の炭素数2~10のα-オレフィンでありうる。炭素数2~10のα-オレフィンの例には、エチレン、プロピレン、1-ペンテン、1-ヘキセン、1-ヘプテン、1-オクテン、1-ノネン、1-デセン等が含まれ、好ましくはエチレン、プロピレンである。1-ブテン・α-オレフィン共重合体(A)に含まれるα-オレフィンは、1種類であってもよいし、2種類以上を組み合わせものであってもよい。1-ブテン・α-オレフィン共重合体(A)に含まれる1-ブテン含有量は80モル%以上が好ましく、90モル%以上がより好ましい。80モル%未満では十分な拡張性が得られない。
拡張性フィルムに含まれるプロピレン系エラストマー組成物(B)は、プロピレン・α-オレフィン共重合体(b1)を主成分として含み、好ましくはポリプロピレン(b2)をさらに含む。
本発明のダイシングフィルムは、前述の拡張性フィルムを含む基材層を有し、必要に応じて粘着剤層や中間層、低摩擦層などをさらに有してもよい。
また、近年、標準的なLSIと比較して起伏の大きな金バンプ、高周波用デバイスの実装基板接合に用いられる半田ボールなどのバンプが形成されたウエハなども多く見られる。そこで、ダイシングに際して、これらの凹凸を有する半導体ウエハの破損を防止することも、大きな課題の一つとなっている。
粘着剤層は、公知の粘着剤で構成されてよく、特に限定されないが、例えばゴム系、アクリル系およびシリコーン系等の粘着剤のほか、スチレン系エラストマーやオレフィン系エラストマーなど熱可塑性エラストマーで構成されても良い。さらに、粘着剤層は、放射線により粘着力を低下させる放射線硬化型粘着剤や加熱により粘着力を低下させる加熱硬化型粘着剤などにより構成されてよい。放射線硬化型粘着剤の好ましい例には、紫外線硬化型粘着剤が含まれる。
中間層は、半導体ウエハの凹凸吸収性を有する層である。後述するように、中間層は、例えば基材層と粘着剤層との間に設けられる層としてもよく、また、粘着剤層の機能を兼ね備える層としてもよい。
25℃及び60℃における引張弾性率の比が上記範囲を満たすことにより、中間層は、熱溶融性を有し、塑性変形するものとできる。具体的には、シートを加温下で貼り付ける時には、半導体ウエハの回路形成面の凸凹に追従して高い密着性を示し、シートを貼り付けた後の常温下では凹凸に密着した形状を保持(固定)することが可能となる。
中間層の60℃における引張弾性率E(60)は、0.005MPa~1.0MPaが好ましく、0.01MPa~0.5MPaがより好ましい。引張弾性率E(60)が上記範囲にあれば、シートを加温下で貼り付ける際に、流動性を示すため、凸凹に対する良好な追従性が得られる。
本発明のダイシングフィルムは、必要に応じて、粘着剤層とは反対側の表面に、低摩擦層をさらに有してもよい。
すなわち、ダイシングフィルムが、後述のように半導体用ダイシングフィルムとして用いられる場合、ダイシングフィルムを拡張する方法として、ダイシングフィルムの周縁部をリングフレームで固定しておき、ダイシングフィルムの中央部下側から、拡張機のステージを押し上げる方法がある(後述の図6参照)。この際、ダイシングフィルムのステージと接する側の面の摩擦が大きいと、ステージ上でフィルムが滑り難くなり、ステージと接するフィルム部分を拡張できなくなる。このため、ダイシングフィルムのうち、ステージと接する側の表面の摩擦を小さくすること;即ち、低摩擦層を配置することで、拡張機のステージを滑りやすくし、ダイシングフィルムの面全体をより均一に拡張できる。
本発明のダイシングフィルムの層構成は、特に制限されず、基材層及び粘着剤層、もしくは基材層及び中間層の少なくとも2層からなるフィルムであっても良く、基材層と中間層と粘着剤層とがこの順に積層された3層からなるフィルムであっても良い。また粘着剤層や中間層の他に低摩擦層などの他の層を有する4層以上の積層フィルムであってもよい。本発明のダイシングフィルムが前記積層フィルムであり、粘着剤層と低摩擦層とを有する場合、粘着剤層は基材層の一方の面側、低摩擦層は基材層の他方の面側に配置されることが好ましい。本発明の効果を損なわない範囲で、基材層と粘着剤層との間、基材層と中間層との間、中間層と粘着剤層との間、基材層と低摩擦層との間等に、上記以外の層が積層されていてもよい。また、基材層、中間層、および粘着剤層は、それぞれ多層であってもよい。また、基材層を複数有する場合には、基材層と基材層との間に任意の層が配置されていてもよい。
また、基材層と粘着剤層との間に中間層が形成されている本発明のダイシングフィルムにおいては、総厚みは、60~700μmであることが好ましく、80~500μmであることがより好ましい。
本発明のダイシングフィルムは、任意の方法で製造することができる。本発明のダイシングフィルムが、基材層のほか、粘着剤層や低摩擦層などを含む積層フィルムである場合には、1)各層を構成する溶融樹脂を共押出しして積層する方法(共押出し法);2)基材層上に、他の層を構成する溶融樹脂を積層する方法(押出しラミネート法);3)各層を構成するフィルムを熱圧着または接着剤等を介して積層する方法(ラミネート法);および4)基材層上、もしくは基材層及び中間層が積層された樹脂積層体上に、粘着剤層を構成する樹脂組成物を塗布して積層する方法(塗布法)等、により製造されてもよい。
本発明のダイシングフィルムを用いた半導体装置の製造方法は、1)本発明のダイシングフィルムを、半導体ウエハの裏面に粘着剤層を介して貼り付ける工程、2)半導体ウエハをダイシングする工程、3)ダイシングフィルムをエクスパンド(拡張)して、ダイシングされた半導体ウエハ(半導体チップ)をピックアップする工程、4)半導体チップを、半導体装置のダイパッド(不図示)等に接着させてマウントする工程、を経て製造される。本発明のダイシングフィルムとしては、前述のダイシングフィルムを用いることができる。
基材層に含まれる1-ブテン・α-オレフィン共重合体(A)として、表1に示される1-ブテン・α-オレフィン共重合体(A1)(商品名 タフマー BL4000、三井化学(株)製)、1-ブテン・α-オレフィン共重合体(A2)(商品名 タフマーBL3450、三井化学(株)製)および1-ブテン・α-オレフィン共重合体(A3)(商品名 タフマーBL2481、三井化学(株)製)を用いた。
特開2001-33372に開示されている、密度勾配管法を用いて測定した。具体的には、得られた1-ブテン・α-オレフィン共重合体試料を、メルトインデクサ-によって溶融し、ストランドを得た。このストランドにアニ-リングを施した後、適当な大きさに切断して密度勾配管に投入した。
1-ブテン・α-オレフィン共重合体(A)からなるフィルムを作製した。このフィルムの引張弾性率を、ASTM D638に準拠した方法で測定した。すなわち、
i)厚み100μmのフィルムをカットして、巾(TD方向)10mm、長さ(MD方向)100mmの短冊状の試料片を準備した。
ii)次いで、JIS K7161に準拠して、引張試験機によりチャック間距離50mm、引張速度300mm/分の条件で試料片の引張弾性率を測定した。引張弾性率の測定は、温度23℃、相対湿度55%の条件下で実施した。
1-ブテン・α-オレフィン共重合体(A)のMFRを、ASTM D1238に準拠して、温度190℃ないしは230℃、荷重2.16kgの条件で測定した。
プロピレン・α-オレフィン共重合体(b1)の合成
(合成例1)
充分に窒素置換した2000mlの重合装置に、833mlの乾燥ヘキサン、100gの1-ブテン、および1.0mmolのトリイソブチルアルミニウムを常温で仕込んだ後、重合装置内の温度を40℃に昇温して、プロピレンで系内の圧力を0.76MPaになるように加圧した。次いで、重合装置内の圧力を、エチレンで0.8MPaに調整した。次いで、0.001mmolのジメチルメチレン(3-tert-ブチル-5-メチルシクロペンタジエニル)フルオレニルジルコニウムジクロライドと、アルミニウム換算で0.3mmolのメチルアルミノキサン(東ソー・ファインケム社製)とを接触させたトルエン溶液を、重合装置内に添加し、内温40℃、エチレンで系内圧力を0.8MPaに保ちながら20分間重合させた後、20mlのメタノールを添加して重合反応を停止させた。脱圧後、2Lのメタノール中で重合溶液からポリマーを析出させて、真空下130℃で12時間乾燥させて、36.4gのプロピレン・α-オレフィン共重合体(b1-1)を得た。
プロピレン、エチレンおよび1-ブテンの共重合比を表2に示すように変更した以外は、合成例1と同様にしてプロピレン・α-オレフィン共重合体(b1-2)~(b1-4)を得た。
(合成例5)
合成例2で得られた80重量部のプロピレン・α-オレフィン共重合体(b1-2)と、20重量部のホモポリプロピレン(b2)とを200℃で2軸押出機にて混練し、プロピレン系エラストマー組成物(B1)を得た。
合成例3で得られた85重量部のプロピレン・α-オレフィン共重合体(b1-3)と、15重量部のポリプロピレン(b2)とを混練した以外は、合成例5と同様にしてプロピレン系エラストマー組成物(B2)を得た。
合成例4で得られた90重量部のプロピレン・α-オレフィン共重合体(b1-4)と、10重量部のポリプロピレン(b2)とを混練した以外は、合成例5と同様にしてプロピレン系エラストマー組成物(B3)を得た。
合成例1で得られた80重量部のプロピレン・α-オレフィン共重合体(b1-1)と、20重量部のポリプロピレン(b2)とを混練した以外は、合成例5と同様にしてプロピレン系エラストマー組成物(B4)を得た。
合成例2で得られた70重量部のプロピレン・α-オレフィン共重合体(b1-2)と、30重量部のホモポリプロピレン(b2)とを200℃で2軸押出機にて混練し、プロピレン系エラストマー組成物(B5)を得た。
合成例2で得られた60重量部のプロピレン・α-オレフィン共重合体(b1-2)と、40重量部のホモポリプロピレン(b2)とを200℃で2軸押出機にて混練し、プロピレン系エラストマー組成物(B6)を得た。
合成例2で得られた50重量部のプロピレン・α-オレフィン共重合体(b1-2)と、50重量部のホモポリプロピレン(b2)とを200℃で2軸押出機にて混練し、プロピレン系エラストマー組成物(B7)を得た。
合成例2で得られた30重量部のプロピレン・α-オレフィン共重合体(b1-2)と、70重量部のホモポリプロピレン(b2)とを200℃で2軸押出機にて混練し、プロピレン系エラストマー組成物(B8)を得た。
合成例2で得られた20重量部のプロピレン・α-オレフィン共重合体(b1-2)と、80重量部のホモポリプロピレン(b2)とを200℃で2軸押出機にて混練し、プロピレン系エラストマー組成物(B9)を得た。
フィルムの成形
基材層の原料として、前述の1-ブテン・α-オレフィン共重合体(A1)とプロピレン系エラストマー組成物(B1)とを、質量比60/40で混合した混合物を準備した。低摩擦層の原料として、商品名 エボリューSP2040(プライムポリマー(株)製 直鎖状低密度ポリエチレン ビガット軟化点101℃)を準備した。粘着剤層の原料として、商品名 NOTIO PN3560(三井化学(株)製、MFR4g/10min(ASTM D1238準拠、測定温度230℃)を準備した。
次いで、基材層、低摩擦層および粘着剤層の各原料を、フルフライト型のスクリューを備えた各押出機に投入し、溶融混練させた。基材層、低摩擦層および粘着剤層の押出温度を230℃とし、3層の溶融樹脂を多層ダイ内で積層させて共押出し成形し、前述の図2に示されるような、低摩擦層、基材層および粘着剤層が順に積層された3層構造の積層フィルムを得た。得られた積層フィルムの粘着剤層上に、セパレータ(東セロ(株)製 商品名SP-PET)をさらに積層した後、所定の幅にスリットして巻き取った。
基材層における、1-ブテン・α-オレフィン共重合体(A1)と、プロピレン系エラストマー組成物(B1)との混合比率を表4に示されるように変更した以外は、実施例1と同様にして積層フィルムを得た。
基材層におけるプロピレン系エラストマー組成物(B1)を、プロピレン系エラストマー組成物(B2)に変更した以外は、実施例1と同様にして積層フィルムを得た。
基材層における、1-ブテン・α-オレフィン共重合体(A1)と、プロピレン系エラストマー組成物(B2)の混合比率を表4に示されるように変更した以外は、実施例1と同様にして積層フィルムを得た。
基材層における、1-ブテン・α-オレフィン共重合体(A1)と、表2記載のプロピレン・α-オレフィン共重合体(b1-4)の混合比率を表5に示されるように変更した以外は、実施例1と同様にして積層フィルムを得た。
粘着剤層の原料であるNOTIO PN3560の代わりに、商品名 エボリューSP2040(プライムポリマー(株)製 直鎖状低密度ポリエチレン)を用いた以外は実施例1と同様にして積層フィルムを得た。
粘着剤層の原料であるNOTIO PN3560の代わりに、商品名 エボリューSP2040(プライムポリマー(株)製 直鎖状低密度ポリエチレン)を用いた以外は実施例4と同様にして積層フィルムを得た。
低摩擦層の原料であるエボリューSP2040(プライムポリマー(株)製 直鎖状低密度ポリエチレン)の代わりに、基材層の原料と同一の原料を用いた以外は実施例1と同様にして、基材層と粘着剤層の2層構造の積層フィルムを得た。
粘着剤層の原料であるNOTIO PN3560の代わりに、NOTIO PN2060(三井化学(株)製、登録商標、MFR 7g/10min(ASTM D1238準拠、230℃))を用いた以外は実施例10と同様にして、2層構造の積層フィルムを得た。
粘着剤層の原料であるNOTIO PN3560の代わりに、ダイナロンDR1322P(登録商標)(JSR(株)製 HSBR 水添スチレン・ブタジエンゴム)を用いた以外は実施例10と同様にして、2層構造の積層フィルムを得た。
UV硬化型粘着剤層を構成するUV硬化型粘着剤塗布液の調製
アクリル酸エチル48重量部、アクリル酸-2-エチルヘキシル27重量部、アクリル酸メチル20重量部、メタクリル酸グリシジル5重量部、および重合開始剤としてベンゾイルパーオキサイド0.5重量部を混合した。これを、トルエン65重量部、酢酸エチル50重量部が入った窒素置換フラスコ中に、撹拌しながら80℃で5時間かけて滴下し、さらに5時間撹拌して反応させた。反応終了後、この溶液を冷却し、これにキシレン25重量部、アクリル酸2.5重量部、およびテトラデシルベンジルアンモニウムクロライド1.5重量部を加え、空気を吹き込みながら80℃で10時間反応させ、光重合性炭素-炭素二重結合が導入されたアクリル酸エステル共重合体溶液を得た。
片表面にシリコーン処理(離型処理)が施された厚み38μmのPETフィルム(剥離フィルム、東セロ(株)製 商品名SP-PET)の離型処理が施された側の面に、前記UV硬化型粘着剤塗布液をコンマコーターにより塗布し、120℃で4分間乾燥し、厚み30μmのUV硬化型粘着剤層を得た。一方、前述の実施例10と同じ基材フィルムの片面にコロナ処理を施したものを準備した。そして、前記PETフィルム上に形成したUV硬化型粘着剤層と、前記基材フィルムのコロナ処理が施された側の面とを、ドライラミネーターにより貼り合わせて押圧して、UV硬化型粘着剤層を基材フィルムのコロナ処理が施された側の面に転写させて、積層フィルムを得た。
低摩擦層の原料であるエボリューSP2040(プライムポリマー(株)製 直鎖状低密度ポリエチレン)を、商品名 ニュクレルAN4213C(三井・デュポンポリケミカル(株)製 エチレン・メタクリル酸共重合体 MFR 10g/10min(JIS K7210 1999準拠 190℃))に変更した以外は実施例1と同様にして積層フィルムを得た。
低摩擦層の原料であるエボリューSP2040(プライムポリマー(株)製 直鎖状低密度ポリエチレン)を、商品名 ニュクレルN1108C(三井・デュポンポリケミカル(株)製 エチレン・メタクリル酸共重合体 MFR 8g/10min(JIS K7210 1999準拠 190℃))に変更した以外は実施例1と同様にして積層フィルムを得た。
低摩擦層の原料であるエボリューSP2040(プライムポリマー(株)製 直鎖状低密度ポリエチレン)と、粘着剤層の原料であるNOTIO PN3560とを、それぞれ商品名 ニュクレルAN4213C(三井・デュポンポリケミカル(株)製 エチレン・メタクリル酸共重合体 MFR 10g/10min(JIS K7210 1999準拠 190℃))に変更した以外は実施例1と同様にして積層フィルムを得た。
基材層におけるプロピレン系エラストマー組成物(B1)を、プロピレン系エラストマー組成物(B3)に変更した以外は、実施例10と同様にして積層フィルムを得た。
基材層におけるプロピレン系エラストマー組成物(B1)を、プロピレン系エラストマー組成物(B4)に変更した以外は、実施例10と同様にして積層フィルムを得た。
基材層の原料として、1-ブテン・α-オレフィン共重合体(A1)のみを用いた以外は実施例1と同様にして積層フィルムを得た。
基材層の原料として、1-ブテン・α-オレフィン共重合体(A2)のみを用いた以外は実施例1と同様にして積層フィルムを得た。
基材層の原料として、1-ブテン・α-オレフィン共重合体(A3)のみを用いた以外は実施例1と同様にして積層フィルムを得た。
基材層における、1-ブテン・α-オレフィン共重合体(A1)と、プロピレン系エラストマー組成物(B1)との混合比率を80/20に変更した以外は、実施例1と同様にして積層フィルムを得た。
基材層における、1-ブテン・α-オレフィン共重合体(A1)と、プロピレン系エラストマー組成物(B2)の混合比率を80/20に変更した以外は、実施例1と同様にして積層フィルムを得た。
基材層における、1-ブテン・α-オレフィン共重合体(A1)と、プロピレン系エラストマー組成物(B2)の混合比率を20/80に変更した以外は、実施例1と同様にして積層フィルムを得た。
基材層におけるプロピレン系エラストマー組成物(B1)を、タフマーP0275(三井化学(株)製 エチレン・α-オレフィン共重合体)に変更した以外は、実施例2と同様にして積層フィルムを得た。
基材層におけるプロピレン系エラストマー組成物(B1)を、商品名 ダイナロン DR8601P(JSR(株)製 SEBS )に変更した以外は、実施例2と同様にして積層フィルムを得た。
基材層におけるプロピレン系エラストマー組成物(B1)を、商品名 ダイナロン DR1322P(JSR(株)製 HSBR 水添スチレン・ブタジエンゴム)に変更した以外は、実施例2と同様にして積層フィルムを得た。
ホモポリプロピレン h-PP(プライムポリマー(株)製 商品名 F107PV)と、低密度ポリエチレン LDPE(プライムポリマー(株)製、商品名 ミラソン11P)とを質量比30/70で混合したものを、フライト型のスクリューを備えた押出機に投入し、押出温度230℃で押出し、単層フィルムを得た。
高密度ポリエチレン HDPE(プライムポリマー(株)製、商品名 ハイゼックス2100J)と、エチレンプロピレンラバー EPR(三井化学(株)製、商品名 P0275)と、ランダムポリプロピレン r-PP(プライムポリマー(株)製、商品名 F327)とを、質量比30/10/60で混合したものを、フライト型のスクリューを備えた押出機に投入し、押出温度230℃で押出し、単層フィルムを得た。
ホモポリプロピレン h-PP(プライムポリマー(株)製、商品名 F107PV)と、エチレンプロピレンラバー EPR(三井化学(株)製、商品名 P0275)と、エチレン-メタアクリル酸共重合体 EMAA(三井・デュポンポリケミカル(株)製、商品名 N1108C)とを、質量比20/10/70で混合したものを、フライト型のスクリューを備えた押出機に投入し、押出温度230℃で押出し、単層フィルムを得た。
得られたフィルムからセパレータを剥離した後、フィルムの粘着剤層を8インチサイズのリングフレームにゴムロールで密着させた。粘着性の無いフィルム(実施例8、実施例9、比較例10、比較例11、比較例12)は、リングフレームに両面テープ(ニチバン、ナイスタック)でフィルムを固定した。
拡張率(MD方向、TD方向)(%)=100×拡張後の格子の長さ/拡張前の格子の長さ
拡張率の異方性=(MD方向の拡張率-TD方向の拡張率)の絶対値
よって前記拡張率は、前記ステージ上の拡張性粘着フィルムの拡張率を示す。すべてのフィルムについて、前述のようにステージを65mm上昇させているので、前記拡張率が低いフィルムは、ステージ上のフィルムが大きく拡張せず、ステージ外のフィルム、すなわちステージの端部とリングフレームの間のフィルムが拡張していることを意味する。よって、上記拡張性は、前記格子に対応する半導体チップをピックアップする半導体などのダイシング工程で必要な拡張性と対応する。
拡張時のフィルムのネッキングし易さは、ステージと接するフィルム部分と、ステージ端部と接するフィルム部分とで、それぞれ白化が生じるか否かを観察し、以下のように評価した。
○:ネッキングが生じなかった
×:ネッキングが生じた
フィルムのハンドリング性は、フィルムの引張弾性率によって評価した。すなわち、得られたフィルムをカットして、巾(TD方向)10mm、長さ(MD方向)100mmの短冊状の試料片を得た。次いで、JIS K7161に準拠して、引張試験機を用いてチャック間距離50mm、引張速度300mm/分で、試料片の引張弾性率を測定した。5つの試料片について、同様にして引張弾性率を測定し、それらの平均値を引張弾性率とした。引張弾性率の測定は、温度23℃、湿度55%の条件下で実施した。
フィルム全体の引張弾性率が70MPa未満または170MPa以上:×
フィルム全体の引張弾性率が70MPa以上170MPa未満:○
得られたフィルム(共押出粘着剤層付きフィルム、UV硬化型粘着剤層付きフィルム)の粘着力を、JIS Z0237に記載の粘着シート試験方法に準拠して、温度23℃、相対湿度50%の環境下にて測定した。得られたフィルムを、SUS-BA板に約2kgゴムロールで圧力を加えながら貼り付けて、温度23℃、相対湿度50%の一定環境下に30分間置いた。次いで、フィルムを180°方向に、剥離速度300mm/分でSUS-BA板から引き剥がす際の粘着力を測定した。この粘着力の測定を2回行った。幅25mmの試験片を用いて測定したときの粘着力の平均値を「粘着力」(N/25mm)とした。
実施例1~6の結果を表4に;実施例7~12の結果を表5に;実施例13~18の結果を表6に示す。さらに、比較例1~6の結果を表7に;比較例7~9の結果を表8に;比較例10~12の結果を表9に示す。
各層の原料の準備
基材層の原料として、前述の1-ブテン・α-オレフィン共重合体(A1)と、プロピレン系エラストマー組成物(B1)とを、質量比60/40で混合した混合物を準備した。
中間層の原料として、三井化学(株)製TAFMER P0275(登録商標)を準備した。
粘着剤層の原料として、上述のUV硬化型粘着剤塗布液を準備した。
低摩擦層の原料として、基材層と同一の混合物を準備した。
次いで、基材層、中間層、及び低摩擦層の各原料を、フルフライト型のスクリューを備えた各押出機に投入し、溶融混練させた。基材層、中間層、及び低摩擦層の押出温度を230℃とし、3層の溶融樹脂を多層ダイ内で積層させて共押出し成形した。
その後、実施例13のUV粘着剤層の積層方法と同様に、中間層上に粘着剤層を積層し、図3に示されるような、低摩擦層、基材層、中間層、および粘着剤層が順に積層された4層構造の積層フィルム(ダイシングフィルム)を得た。ダイシングフィルムの各層の厚みは、低摩擦層/基材層/中間層/粘着剤層の厚みは、10μm/60μm/350μm/5μmであった。
基材層における、1-ブテン・α-オレフィン共重合体(A1)と、プロピレン系エラストマー組成物(B1)との混合比率を表10に示されるように変更した以外は、実施例19と同様にしてダイシングフィルムを得た。
基材層におけるプロピレン系エラストマー組成物(B1)を、プロピレン系エラストマー組成物(B2)に変更した以外は、実施例19と同様にしてダイシングフィルムを得た。
基材層におけるプロピレン系エラストマー組成物(B1)を、プロピレン系エラストマー組成物(B3)に変更した以外は、実施例19と同様にしてダイシングフィルムを得た。
基材層におけるプロピレン系エラストマー組成物(B1)を、プロピレン系エラストマー組成物(B4)に変更した以外は、実施例19と同様にしてダイシングフィルムを得た。
低摩擦層の原料を、商品名 エボリューSP2040(プライムポリマー(株)製 直鎖状低密度ポリエチレン ビガット軟化点101℃)に変更し、基材層、中間層、粘着剤層、及び低摩擦層の押出温度を230℃とし、4層の溶融樹脂を多層ダイ内で積層させて共押出し成形した以外は、実施例19と同様にしてダイシングフィルムを得た。ダイシングフィルムの各層の厚みは、低摩擦層/基材層/中間層/粘着剤層の厚みは、10μm/60μm/350μm/5μmであった。
低摩擦層の原料を、低密度ポリエチレン(三井・デュポンポリケミカル(株)製:商品名 ミラソン11P)にシリコーン樹脂(東レ・ダウ・コーニングシリコーン社製:商品名 BY27-002)を5wt%混合したものに変更した以外は、実施例25と同様にダイシングフィルムを得た。
中間層の原料を、三井化学(株)製TAFMER P0280(登録商標)に変更した以外は、実施例25と同様にしてダイシングフィルムを得た。
粘着剤層の原料を、商品名 NOTIO PN3560(三井化学(株)製、MFR4g/10min(ASTM D1238準拠、測定温度230℃)に変更した以外は、実施例25と同様にしてダイシングフィルムを得た。
粘着剤層の原料として、NOTIO PN2060(三井化学(株)製、登録商標、MFR 7g/10min(ASTM D1238準拠、230℃))を用いた以外は実施例25と同様にしてダイシングフィルムを得た。
粘着剤層の原料として、ダイナロンDR1322P(登録商標)(JSR(株)製 HSBR 水添スチレン・ブタジエンゴム)を用いた以外は実施例25と同様にしてダイシングフィルムを得た。
基材層の原料として、1-ブテン・α-オレフィン共重合体(A1)のみを用いた以外は実施例25と同様にしてダイシングフィルムを得た。
基材層における、1-ブテン・α-オレフィン共重合体(A1)と、プロピレン系エラストマー組成物(B1)との混合比率を80/20に変更した以外は、実施例25と同様にしてダイシングフィルムを得た。
基材層における、1-ブテン・α-オレフィン共重合体(A1)と、プロピレン系エラストマー組成物(B1)との混合比率を20/80に変更した以外は、実施例25と同様にしてダイシングフィルムを得た。
基材層として、厚み75μmのポリエチレンテレフタレート層を用い、低摩擦層を積層しなかった以外は、実施例19と同様にしてダイシングフィルムを得た。
基材層として、厚み60μmのエチレン-酢酸ビニル共重合体(EVA)層を用いた以外は、実施例25と同様にしてダイシングフィルムを得た。
中間層として、厚み350μmのエチレン-酢酸ビニル共重合体(EVA)層を用いた以外は、実施例25と同様にしてダイシングフィルムを得た。
粘着剤層を積層しなかった以外は、実施例25と同様にしてダイシングフィルムを得た。
基材層の厚みを60μmとした以外は、実施例10と同様にしてダイシングフィルムを得た。
基材層におけるプロピレン系エラストマー組成物(B1)を、プロピレン系エラストマー組成物(B5)に変更した以外は、実施例33と同様にしてダイシングフィルムを得た。
基材層におけるプロピレン系エラストマー組成物(B1)を、プロピレン系エラストマー組成物(B6)に変更した以外は、実施例33と同様にしてダイシングフィルムを得た。
基材層におけるプロピレン系エラストマー組成物(B1)を、プロピレン系エラストマー組成物(B7)に変更した以外は、実施例33と同様にしてダイシングフィルムを得た。
基材層におけるプロピレン系エラストマー組成物(B1)を、プロピレン系エラストマー組成物(B8)に変更した以外は、実施例33と同様にしてダイシングフィルムを得た。
基材層におけるプロピレン系エラストマー組成物(B1)を、プロピレン系エラストマー組成物(B9)に変更した以外は、実施例33と同様にしてダイシングフィルムを得た。
実施例25のダイシングフィルムについて、後述の凹凸埋め込み性評価を、テーブル温度25℃、ローラー温度25℃、圧力0.5MPaで行った。(参考例2)
実施例25のダイシングフィルムについて、後述の凹凸埋め込み性評価を、テーブル温度60℃、ローラー温度60℃、圧力0.2MPaで行った。(参考例3)
実施例25のダイシングフィルムの中間層の膜厚を180μmとした以外は、実施例25と同様とした。
下記の実施例19~31、比較例13~17、及び参考例1~3について、下記の方法によりリングフレーム密着性、凹凸埋め込み性、拡張性を測定した。
なお、各層や、これを構成する材料の引張弾性率、MFR、密度、及び粘着力については、上述の実施例1~18と同様に測定した。なお、中間層については、25℃における引張弾性率E(25)及び60℃における引張弾性率(E)を測定し、さらに25℃における引張弾性率E(25)に対する60℃における引張弾性率E(60)の比(E(60)/E(25))を算出した。
ディスコ製リングフレームとの密着性を測定した。具体的には、得られたダイシングフィルムの上記リングフレームに対する粘着力をJIS Z0237に記載の粘着シート試験方法に準拠して、温度23℃、相対湿度50%の環境下にて測定した。得られたダイシングフィルムを、粘着剤層がリングフレーム側となるように配置し、上記リングフレームに約2kgゴムロールで圧力を加えながら貼り付けて、温度23℃、相対湿度50%の一定環境下に30分間置いた。次いで、ダイシングフィルムを180°方向に、剥離速度300mm/分でリングフレームから引き剥がす際の粘着力を測定した。この粘着力の測定を2回行った。このときの粘着力の平均値を「リングフレームとの密着性」(N)とした。
リングフレームとの密着性が0.1N以上を○、0.1N未満を×とする。
回路形成面に直径200μmの半田ボールが設けられたウエハ(ウェル社製、JCHIP10)を準備した。
貼付け機(テクノビジョン社製、FMP-1143)使用し、テーブル温度60℃、ローラー温度25℃、圧力0.5MPa、ラミネート速度2mm/秒で、ディスコ製リングフレームと上記ウエハにダイシングフィルムを加熱圧着した。ダイシングフィルムを貼り付けたウエハの回路形成面を、マイクロスコープ(キーエンス社製)を用いて、50~200倍で観察し、回路形成面における凹凸との間に空隙の有るものを×、空隙のないものを○とした。
リングフレームにダイシングフィルムの粘着剤層をゴムロールで密着させた。粘着性のないダイシングフィルム(比較例19)については、リングフレームに両面テープ(ニチバン、ナイスタック)でフィルムを固定した。
ついで、ダイシングフィルムの粘着剤層表面に油性ペンで2センチ角の格子を記入した。次いで、図6Aに示されるように、ダイシングフィルム40の基材層表面が拡張機のステージ43に接触するように、リングフレーム44を拡張機に固定した。拡張機は、ヒューグルエレクトロニクス製 HS-1800を用いた。
拡張率(%)=100×拡張後の格子の長さ/拡張前の格子の長さ
拡張率が120%以上であるものを○、120%未満のものを×とした。
一方、E(60)/E(25)<0.1の関係を満たさない実施例31においては、凹凸埋め込み性が低くなることがわかる。
また参考例2は、実施例25のダイシングフィルムを、本発明の半導体装置の製造方法で特定する圧力以下で、ウエハに貼着する場合を示すものであり、この場合、中間層および粘着剤層が凹凸に十分追従せず、凹凸埋め込み性が不十分となることがわかる。
参考例3は、実施例25のダイシングフィルムの中間層の厚みが、ウエハの凹凸高さより小さい場合を示すものであり、凹凸に中間層および粘着剤層が十分に入り込まず、凹凸埋め込み性が不十分となることがわかる。
12、32、52 基材層
13、53 中間層
14、34、54 粘着剤層
16、36、56 低摩擦層
22、42 ウエハ
43 ステージ
44 リングフレーム
Claims (13)
- 23℃における引張弾性率が100~500MPaである1-ブテン・α-オレフィン共重合体(A)と、
プロピレン・α-オレフィン共重合体(b1)を含み、23℃における引張弾性率が8~500MPaであるプロピレン系エラストマー組成物(B)と、を含む基材であって、
前記(B)の含有量は、(A)と(B)の合計100重量部に対して、30~70重量部である、拡張性フィルム。 - 前記プロピレン系エラストマー組成物(B)は、23℃における引張弾性率が10~50MPaである、請求項1に記載の拡張性フィルム。
- 前記プロピレン系エラストマー組成物(B)が、100重量部の前記プロピレン系エラストマー組成物(B)に対して1~70重量部のポリプロピレン(b2)を含む、請求項1に記載の拡張性フィルム。
- 前記プロピレン系エラストマー組成物(B)が、100重量部の前記プロピレン系エラストマー組成物(B)に対して5~20重量部のポリプロピレン(b2)を含む、請求項3に記載の拡張性フィルム。
- 請求項1に記載の拡張性フィルムを含む基材層と、粘着剤層とを有するダイシングフィルムであって、
前記粘着剤層は、前記ダイシングフィルムの最表面に設けられ、
前記粘着剤層の、SUS-304-BA板の表面に貼着されて60分間放置した後、前記SUS-304-BA板の表面から剥離されるときの、JIS Z0237に準拠して測定される粘着力が0.1~10N/25mmである、ダイシングフィルム。 - ASTM D1238に準拠して測定される、前記基材層の230℃におけるMFRと、前記粘着剤層の230℃におけるMFRとは、いずれも1~20g/10min以下である、請求項5に記載のダイシングフィルム。
- 請求項1に記載の拡張性フィルムを含む基材層と、中間層とを有し、
前記中間層は、25℃における引張弾性率E(25)および60℃における引張弾性率E(60)が、E(60)/E(25)<0.1の関係を満たし、かつ前記25℃における引張弾性率E(25)が1~10MPaである、ダイシングフィルム。 - 前記基材層と前記粘着剤層との間に中間層を有し、
前記中間層は、25℃における引張弾性率E(25)および60℃における引張弾性率E(60)が、E(60)/E(25)<0.1の関係を満たし、かつ前記25℃における引張弾性率E(25)が1~10MPaである、請求項5に記載のダイシングフィルム。 - 前記中間層が、オレフィン系共重合体を含む、請求項7に記載のダイシングフィルム。
- 前記中間層の密度が800~890kg/m3である、請求項7に記載のダイシングフィルム。
- ダイシングフィルムは、少なくとも一方の面に段差を有する半導体ウエハの、前記段差を有する面に貼り合わせて用いられるものであり、
前記中間層の厚みが、前記半導体ウエハの段差より大きい、請求項7に記載のダイシングフィルム。 - 半導体ウエハに、請求項5に記載のダイシングフィルムを、前記ダイシングフィルムの粘着剤層を介して貼り付ける工程と、
前記半導体ウエハをダイシングして半導体チップを得る工程と、
前記ダイシングフィルムを拡張して、前記半導体チップをピックアップする工程とを含む、半導体装置の製造方法。 - 半導体ウエハに、請求項8に記載のダイシングフィルムを、40~80℃の温度で、0.3~0.5MPaの圧力で前記ダイシングフィルムの粘着剤層を介して貼り合せる工程と、
前記半導体ウエハをダイシングして半導体チップを得る工程と、
前記ダイシングフィルムを拡張して、前記半導体チップをピックアップする工程とを含む、半導体製造装置の製造方法。
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Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
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CN103980826A (zh) * | 2013-02-08 | 2014-08-13 | 日东电工株式会社 | 粘合带 |
WO2014156127A1 (ja) * | 2013-03-26 | 2014-10-02 | 三井化学東セロ株式会社 | 積層フィルムの製造方法、積層フィルムおよびそれを用いた半導体装置の製造方法 |
JP2014200949A (ja) * | 2013-04-02 | 2014-10-27 | 三井化学東セロ株式会社 | 拡張性フィルム、それを用いた半導体装置の製造方法 |
JP2016089138A (ja) * | 2014-11-11 | 2016-05-23 | ダイヤプラスフィルム株式会社 | 半導体製造工程用粘着フィルムに使用する基材フィルム |
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WO2017170449A1 (ja) * | 2016-03-31 | 2017-10-05 | 三井化学東セロ株式会社 | 半導体装置製造用粘着性フィルムおよび半導体装置の製造方法 |
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Publication number | Priority date | Publication date | Assignee | Title |
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CN111500206A (zh) * | 2020-04-27 | 2020-08-07 | 广东硕成科技有限公司 | 一种易于拾取的晶圆切割膜及其制备方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11297646A (ja) * | 1998-04-10 | 1999-10-29 | Techno Onishi:Kk | 半導体チップ支持用フィルム |
JP2008004836A (ja) * | 2006-06-23 | 2008-01-10 | Mitsui Chemicals Inc | 半導体ウェハダイシング用保護シート及びそれを用いた半導体ウェハのダイシング方法 |
JP2009267389A (ja) * | 2008-03-31 | 2009-11-12 | Mitsui Chemicals Inc | ダイシングフィルム |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5974178A (ja) | 1982-10-20 | 1984-04-26 | Hitachi Chem Co Ltd | 可塑剤非移行性粘着シ−ト |
JPH02215528A (ja) | 1989-02-17 | 1990-08-28 | Sumitomo Bakelite Co Ltd | 多層フィルム |
JP3845129B2 (ja) | 1995-06-20 | 2006-11-15 | 古河電気工業株式会社 | 半導体ウエハ固定用粘着テープ |
JP3340979B2 (ja) | 1999-09-06 | 2002-11-05 | 日東電工株式会社 | ダイシング用粘着シート |
JP4674836B2 (ja) | 2001-02-13 | 2011-04-20 | 日東電工株式会社 | ダイシング用粘着シート |
JP4886937B2 (ja) | 2001-05-17 | 2012-02-29 | リンテック株式会社 | ダイシングシート及びダイシング方法 |
JP3984075B2 (ja) | 2002-02-27 | 2007-09-26 | 日東電工株式会社 | ダイシング用粘着シート |
JP3443110B2 (ja) | 2001-06-27 | 2003-09-02 | 日東電工株式会社 | ダイシング用粘着シート |
JP3984076B2 (ja) | 2002-02-27 | 2007-09-26 | 日東電工株式会社 | ダイシング用粘着シート |
US7141300B2 (en) | 2001-06-27 | 2006-11-28 | Nitto Denko Corporation | Adhesive sheet for dicing |
ATE396472T1 (de) * | 2002-06-26 | 2008-06-15 | Avery Dennison Corp | Längsorientierte polymere filme |
JP4128058B2 (ja) | 2002-09-24 | 2008-07-30 | 三井化学株式会社 | 粘着フィルム及びその使用方法 |
EP1860149B1 (en) * | 2005-03-18 | 2016-06-15 | Mitsui Chemicals, Inc. | Propylene polymer composition, use thereof, and process for production of thermoplastic polymer composition |
-
2011
- 2011-09-28 JP JP2011552250A patent/JP4945014B1/ja not_active Expired - Fee Related
- 2011-09-28 US US13/576,786 patent/US8728910B2/en not_active Expired - Fee Related
- 2011-09-28 WO PCT/JP2011/005466 patent/WO2012042869A1/ja active Application Filing
- 2011-09-28 SG SG2013010251A patent/SG187806A1/en unknown
- 2011-09-28 KR KR1020127030075A patent/KR101393878B1/ko not_active IP Right Cessation
- 2011-09-28 CN CN201180033494.8A patent/CN102986007B/zh not_active Expired - Fee Related
- 2011-09-30 TW TW100135625A patent/TWI509042B/zh not_active IP Right Cessation
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11297646A (ja) * | 1998-04-10 | 1999-10-29 | Techno Onishi:Kk | 半導体チップ支持用フィルム |
JP2008004836A (ja) * | 2006-06-23 | 2008-01-10 | Mitsui Chemicals Inc | 半導体ウェハダイシング用保護シート及びそれを用いた半導体ウェハのダイシング方法 |
JP2009267389A (ja) * | 2008-03-31 | 2009-11-12 | Mitsui Chemicals Inc | ダイシングフィルム |
Cited By (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPWO2014050658A1 (ja) * | 2012-09-25 | 2016-08-22 | 住友ベークライト株式会社 | ダイシングフィルム |
CN103980826B (zh) * | 2013-02-08 | 2018-10-19 | 日东电工株式会社 | 粘合带 |
JP2014152241A (ja) * | 2013-02-08 | 2014-08-25 | Nitto Denko Corp | 粘着テープ |
CN103980826A (zh) * | 2013-02-08 | 2014-08-13 | 日东电工株式会社 | 粘合带 |
WO2014156127A1 (ja) * | 2013-03-26 | 2014-10-02 | 三井化学東セロ株式会社 | 積層フィルムの製造方法、積層フィルムおよびそれを用いた半導体装置の製造方法 |
US9475962B2 (en) | 2013-03-26 | 2016-10-25 | Mitsui Chemicals Tohcello, Inc. | Production method for laminate film, laminate film, and production method for semiconductor device employing same |
JPWO2014156127A1 (ja) * | 2013-03-26 | 2017-02-16 | 三井化学東セロ株式会社 | 積層フィルムの製造方法、積層フィルムおよびそれを用いた半導体装置の製造方法 |
CN105073931B (zh) * | 2013-03-26 | 2017-03-08 | 三井化学东赛璐株式会社 | 叠层膜的制造方法、叠层膜以及使用该叠层膜的半导体装置的制造方法 |
JP2014200949A (ja) * | 2013-04-02 | 2014-10-27 | 三井化学東セロ株式会社 | 拡張性フィルム、それを用いた半導体装置の製造方法 |
JP2016089138A (ja) * | 2014-11-11 | 2016-05-23 | ダイヤプラスフィルム株式会社 | 半導体製造工程用粘着フィルムに使用する基材フィルム |
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JP4945014B1 (ja) | 2012-06-06 |
CN102986007A (zh) | 2013-03-20 |
KR20130018886A (ko) | 2013-02-25 |
CN102986007B (zh) | 2015-06-10 |
SG187806A1 (en) | 2013-03-28 |
US20120309170A1 (en) | 2012-12-06 |
JPWO2012042869A1 (ja) | 2014-02-06 |
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US8728910B2 (en) | 2014-05-20 |
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