WO2009142065A1 - 電子部品封止用エポキシ樹脂組成物 - Google Patents
電子部品封止用エポキシ樹脂組成物 Download PDFInfo
- Publication number
- WO2009142065A1 WO2009142065A1 PCT/JP2009/056602 JP2009056602W WO2009142065A1 WO 2009142065 A1 WO2009142065 A1 WO 2009142065A1 JP 2009056602 W JP2009056602 W JP 2009056602W WO 2009142065 A1 WO2009142065 A1 WO 2009142065A1
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- WIPO (PCT)
- Prior art keywords
- weight
- parts
- epoxy resin
- composition
- compound
- Prior art date
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- 239000000203 mixture Substances 0.000 title claims abstract description 62
- 229920000647 polyepoxide Polymers 0.000 title claims abstract description 60
- 239000003822 epoxy resin Substances 0.000 title claims abstract description 59
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 57
- 150000008065 acid anhydrides Chemical class 0.000 claims abstract description 19
- 239000002245 particle Substances 0.000 claims abstract description 16
- 239000003094 microcapsule Substances 0.000 claims abstract description 10
- -1 diisocyanate compound Chemical class 0.000 claims description 43
- 229920001296 polysiloxane Polymers 0.000 claims description 29
- 239000000377 silicon dioxide Substances 0.000 claims description 24
- 150000001875 compounds Chemical group 0.000 claims description 16
- 230000008719 thickening Effects 0.000 claims description 16
- 239000002270 dispersing agent Substances 0.000 claims description 14
- 229920002545 silicone oil Polymers 0.000 claims description 14
- 239000004593 Epoxy Substances 0.000 claims description 13
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 13
- 229910052739 hydrogen Inorganic materials 0.000 claims description 13
- 239000001257 hydrogen Substances 0.000 claims description 13
- 238000007789 sealing Methods 0.000 claims description 13
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N diphenyl Chemical compound C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 claims description 10
- 230000001588 bifunctional effect Effects 0.000 claims description 8
- 150000008064 anhydrides Chemical class 0.000 claims description 7
- 125000000524 functional group Chemical group 0.000 claims description 6
- 150000002894 organic compounds Chemical group 0.000 claims description 6
- 235000010290 biphenyl Nutrition 0.000 claims description 5
- 239000004305 biphenyl Substances 0.000 claims description 5
- 229930185605 Bisphenol Natural products 0.000 claims description 4
- 125000001624 naphthyl group Chemical group 0.000 claims description 4
- LYCAIKOWRPUZTN-UHFFFAOYSA-N ethylene glycol Natural products OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 claims description 3
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 claims description 3
- 239000011256 inorganic filler Substances 0.000 abstract description 7
- 229910003475 inorganic filler Inorganic materials 0.000 abstract description 7
- 230000009257 reactivity Effects 0.000 abstract description 6
- 238000003860 storage Methods 0.000 abstract description 5
- 230000009969 flowable effect Effects 0.000 abstract 1
- 239000005350 fused silica glass Substances 0.000 abstract 1
- 238000000034 method Methods 0.000 description 21
- 230000000052 comparative effect Effects 0.000 description 18
- 238000000748 compression moulding Methods 0.000 description 16
- 238000000465 moulding Methods 0.000 description 14
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 12
- 239000000047 product Substances 0.000 description 12
- 229920005989 resin Polymers 0.000 description 12
- 239000011347 resin Substances 0.000 description 12
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 11
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 8
- GYZLOYUZLJXAJU-UHFFFAOYSA-N diglycidyl ether Chemical compound C1OC1COCC1CO1 GYZLOYUZLJXAJU-UHFFFAOYSA-N 0.000 description 8
- 238000002156 mixing Methods 0.000 description 8
- 235000012431 wafers Nutrition 0.000 description 7
- 239000006087 Silane Coupling Agent Substances 0.000 description 6
- 125000003118 aryl group Chemical group 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 125000003700 epoxy group Chemical group 0.000 description 4
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 125000002723 alicyclic group Chemical group 0.000 description 3
- 239000007795 chemical reaction product Substances 0.000 description 3
- 230000007547 defect Effects 0.000 description 3
- 239000000945 filler Substances 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 239000004850 liquid epoxy resins (LERs) Substances 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 239000000843 powder Substances 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- 239000000654 additive Substances 0.000 description 2
- PXKLMJQFEQBVLD-UHFFFAOYSA-N bisphenol F Chemical compound C1=CC(O)=CC=C1CC1=CC=C(O)C=C1 PXKLMJQFEQBVLD-UHFFFAOYSA-N 0.000 description 2
- 239000006229 carbon black Substances 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- NIHNNTQXNPWCJQ-UHFFFAOYSA-N fluorene Chemical compound C1=CC=C2CC3=CC=CC=C3C2=C1 NIHNNTQXNPWCJQ-UHFFFAOYSA-N 0.000 description 2
- 239000012948 isocyanate Substances 0.000 description 2
- 150000002513 isocyanates Chemical class 0.000 description 2
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 238000001721 transfer moulding Methods 0.000 description 2
- BPSIOYPQMFLKFR-UHFFFAOYSA-N trimethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CO[Si](OC)(OC)CCCOCC1CO1 BPSIOYPQMFLKFR-UHFFFAOYSA-N 0.000 description 2
- KMOUUZVZFBCRAM-OLQVQODUSA-N (3as,7ar)-3a,4,7,7a-tetrahydro-2-benzofuran-1,3-dione Chemical compound C1C=CC[C@@H]2C(=O)OC(=O)[C@@H]21 KMOUUZVZFBCRAM-OLQVQODUSA-N 0.000 description 1
- WBODDOZXDKQEFS-UHFFFAOYSA-N 1,2,3,4-tetramethyl-5-phenylbenzene Chemical group CC1=C(C)C(C)=CC(C=2C=CC=CC=2)=C1C WBODDOZXDKQEFS-UHFFFAOYSA-N 0.000 description 1
- HECLRDQVFMWTQS-RGOKHQFPSA-N 1755-01-7 Chemical compound C1[C@H]2[C@@H]3CC=C[C@@H]3[C@@H]1C=C2 HECLRDQVFMWTQS-RGOKHQFPSA-N 0.000 description 1
- AMKFXDUNGJKVDE-UHFFFAOYSA-N 2,5-di(propan-2-yl)benzene-1,4-diol Chemical compound CC(C)C1=CC(O)=C(C(C)C)C=C1O AMKFXDUNGJKVDE-UHFFFAOYSA-N 0.000 description 1
- FALRKNHUBBKYCC-UHFFFAOYSA-N 2-(chloromethyl)pyridine-3-carbonitrile Chemical compound ClCC1=NC=CC=C1C#N FALRKNHUBBKYCC-UHFFFAOYSA-N 0.000 description 1
- NQXNYVAALXGLQT-UHFFFAOYSA-N 2-[4-[9-[4-(2-hydroxyethoxy)phenyl]fluoren-9-yl]phenoxy]ethanol Chemical compound C1=CC(OCCO)=CC=C1C1(C=2C=CC(OCCO)=CC=2)C2=CC=CC=C2C2=CC=CC=C21 NQXNYVAALXGLQT-UHFFFAOYSA-N 0.000 description 1
- NKANYVMWDXJHLE-UHFFFAOYSA-N 2-[[2-(oxiran-2-ylmethoxy)phenoxy]methyl]oxirane Chemical compound C1OC1COC1=CC=CC=C1OCC1CO1 NKANYVMWDXJHLE-UHFFFAOYSA-N 0.000 description 1
- AGXAFZNONAXBOS-UHFFFAOYSA-N 2-[[3-(oxiran-2-ylmethyl)phenyl]methyl]oxirane Chemical compound C=1C=CC(CC2OC2)=CC=1CC1CO1 AGXAFZNONAXBOS-UHFFFAOYSA-N 0.000 description 1
- FSYPIGPPWAJCJG-UHFFFAOYSA-N 2-[[4-(oxiran-2-ylmethoxy)phenoxy]methyl]oxirane Chemical compound C1OC1COC(C=C1)=CC=C1OCC1CO1 FSYPIGPPWAJCJG-UHFFFAOYSA-N 0.000 description 1
- LXBGSDVWAMZHDD-UHFFFAOYSA-N 2-methyl-1h-imidazole Chemical compound CC1=NC=CN1 LXBGSDVWAMZHDD-UHFFFAOYSA-N 0.000 description 1
- VPWNQTHUCYMVMZ-UHFFFAOYSA-N 4,4'-sulfonyldiphenol Chemical compound C1=CC(O)=CC=C1S(=O)(=O)C1=CC=C(O)C=C1 VPWNQTHUCYMVMZ-UHFFFAOYSA-N 0.000 description 1
- NZGQHKSLKRFZFL-UHFFFAOYSA-N 4-(4-hydroxyphenoxy)phenol Chemical compound C1=CC(O)=CC=C1OC1=CC=C(O)C=C1 NZGQHKSLKRFZFL-UHFFFAOYSA-N 0.000 description 1
- KBRQWCWVFNLHPU-UHFFFAOYSA-N 4-[(4-hydroxyphenyl)methyl]-2,3,5,6-tetramethylphenol Chemical compound CC1=C(O)C(C)=C(C)C(CC=2C=CC(O)=CC=2)=C1C KBRQWCWVFNLHPU-UHFFFAOYSA-N 0.000 description 1
- WOCGGVRGNIEDSZ-UHFFFAOYSA-N 4-[2-(4-hydroxy-3-prop-2-enylphenyl)propan-2-yl]-2-prop-2-enylphenol Chemical compound C=1C=C(O)C(CC=C)=CC=1C(C)(C)C1=CC=C(O)C(CC=C)=C1 WOCGGVRGNIEDSZ-UHFFFAOYSA-N 0.000 description 1
- VNGLVZLEUDIDQH-UHFFFAOYSA-N 4-[2-(4-hydroxyphenyl)propan-2-yl]phenol;2-methyloxirane Chemical compound CC1CO1.C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 VNGLVZLEUDIDQH-UHFFFAOYSA-N 0.000 description 1
- WPSWDCBWMRJJED-UHFFFAOYSA-N 4-[2-(4-hydroxyphenyl)propan-2-yl]phenol;oxirane Chemical compound C1CO1.C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 WPSWDCBWMRJJED-UHFFFAOYSA-N 0.000 description 1
- NUDSREQIJYWLRA-UHFFFAOYSA-N 4-[9-(4-hydroxy-3-methylphenyl)fluoren-9-yl]-2-methylphenol Chemical compound C1=C(O)C(C)=CC(C2(C3=CC=CC=C3C3=CC=CC=C32)C=2C=C(C)C(O)=CC=2)=C1 NUDSREQIJYWLRA-UHFFFAOYSA-N 0.000 description 1
- LWMIDUUVMLBKQF-UHFFFAOYSA-N 4-methyl-3a,4,5,7a-tetrahydro-2-benzofuran-1,3-dione Chemical compound CC1CC=CC2C(=O)OC(=O)C12 LWMIDUUVMLBKQF-UHFFFAOYSA-N 0.000 description 1
- LCFVJGUPQDGYKZ-UHFFFAOYSA-N Bisphenol A diglycidyl ether Chemical compound C=1C=C(OCC2OC2)C=CC=1C(C)(C)C(C=C1)=CC=C1OCC1CO1 LCFVJGUPQDGYKZ-UHFFFAOYSA-N 0.000 description 1
- LSNNMFCWUKXFEE-UHFFFAOYSA-M Bisulfite Chemical compound OS([O-])=O LSNNMFCWUKXFEE-UHFFFAOYSA-M 0.000 description 1
- OKIZCWYLBDKLSU-UHFFFAOYSA-M N,N,N-Trimethylmethanaminium chloride Chemical compound [Cl-].C[N+](C)(C)C OKIZCWYLBDKLSU-UHFFFAOYSA-M 0.000 description 1
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 1
- JPYHHZQJCSQRJY-UHFFFAOYSA-N Phloroglucinol Natural products CCC=CCC=CCC=CCC=CCCCCC(=O)C1=C(O)C=C(O)C=C1O JPYHHZQJCSQRJY-UHFFFAOYSA-N 0.000 description 1
- LGRFSURHDFAFJT-UHFFFAOYSA-N Phthalic anhydride Natural products C1=CC=C2C(=O)OC(=O)C2=C1 LGRFSURHDFAFJT-UHFFFAOYSA-N 0.000 description 1
- 239000004721 Polyphenylene oxide Substances 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 238000007259 addition reaction Methods 0.000 description 1
- 125000001931 aliphatic group Chemical group 0.000 description 1
- JRPRCOLKIYRSNH-UHFFFAOYSA-N bis(oxiran-2-ylmethyl) benzene-1,2-dicarboxylate Chemical compound C=1C=CC=C(C(=O)OCC2OC2)C=1C(=O)OCC1CO1 JRPRCOLKIYRSNH-UHFFFAOYSA-N 0.000 description 1
- JHIWVOJDXOSYLW-UHFFFAOYSA-N butyl 2,2-difluorocyclopropane-1-carboxylate Chemical compound CCCCOC(=O)C1CC1(F)F JHIWVOJDXOSYLW-UHFFFAOYSA-N 0.000 description 1
- 150000001732 carboxylic acid derivatives Chemical class 0.000 description 1
- 150000001735 carboxylic acids Chemical class 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000013329 compounding Methods 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 238000006482 condensation reaction Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 150000005690 diesters Chemical class 0.000 description 1
- 239000004205 dimethyl polysiloxane Substances 0.000 description 1
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- FWDBOZPQNFPOLF-UHFFFAOYSA-N ethenyl(triethoxy)silane Chemical compound CCO[Si](OCC)(OCC)C=C FWDBOZPQNFPOLF-UHFFFAOYSA-N 0.000 description 1
- NKSJNEHGWDZZQF-UHFFFAOYSA-N ethenyl(trimethoxy)silane Chemical compound CO[Si](OC)(OC)C=C NKSJNEHGWDZZQF-UHFFFAOYSA-N 0.000 description 1
- 239000010419 fine particle Substances 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- ANSXAPJVJOKRDJ-UHFFFAOYSA-N furo[3,4-f][2]benzofuran-1,3,5,7-tetrone Chemical compound C1=C2C(=O)OC(=O)C2=CC2=C1C(=O)OC2=O ANSXAPJVJOKRDJ-UHFFFAOYSA-N 0.000 description 1
- 125000000623 heterocyclic group Chemical group 0.000 description 1
- 150000002462 imidazolines Chemical class 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- AFEQENGXSMURHA-UHFFFAOYSA-N oxiran-2-ylmethanamine Chemical compound NCC1CO1 AFEQENGXSMURHA-UHFFFAOYSA-N 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 1
- QCDYQQDYXPDABM-UHFFFAOYSA-N phloroglucinol Chemical compound OC1=CC(O)=CC(O)=C1 QCDYQQDYXPDABM-UHFFFAOYSA-N 0.000 description 1
- 229960001553 phloroglucinol Drugs 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 150000003058 platinum compounds Chemical class 0.000 description 1
- 229920000435 poly(dimethylsiloxane) Polymers 0.000 description 1
- 229920000570 polyether Polymers 0.000 description 1
- 150000003335 secondary amines Chemical class 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 229940014800 succinic anhydride Drugs 0.000 description 1
- 150000003460 sulfonic acids Chemical class 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
- 239000002562 thickening agent Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- UDUKMRHNZZLJRB-UHFFFAOYSA-N triethoxy-[2-(7-oxabicyclo[4.1.0]heptan-4-yl)ethyl]silane Chemical compound C1C(CC[Si](OCC)(OCC)OCC)CCC2OC21 UDUKMRHNZZLJRB-UHFFFAOYSA-N 0.000 description 1
- JXUKBNICSRJFAP-UHFFFAOYSA-N triethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CCO[Si](OCC)(OCC)CCCOCC1CO1 JXUKBNICSRJFAP-UHFFFAOYSA-N 0.000 description 1
- SRPWOOOHEPICQU-UHFFFAOYSA-N trimellitic anhydride Chemical compound OC(=O)C1=CC=C2C(=O)OC(=O)C2=C1 SRPWOOOHEPICQU-UHFFFAOYSA-N 0.000 description 1
- DQZNLOXENNXVAD-UHFFFAOYSA-N trimethoxy-[2-(7-oxabicyclo[4.1.0]heptan-4-yl)ethyl]silane Chemical compound C1C(CC[Si](OC)(OC)OC)CCC2OC21 DQZNLOXENNXVAD-UHFFFAOYSA-N 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
- H01L23/293—Organic, e.g. plastic
- H01L23/295—Organic, e.g. plastic containing a filler
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/40—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
- C08G59/42—Polycarboxylic acids; Anhydrides, halides or low molecular weight esters thereof
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/54—Silicon-containing compounds
- C08K5/541—Silicon-containing compounds containing oxygen
- C08K5/5435—Silicon-containing compounds containing oxygen containing oxygen in a ring
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L63/00—Compositions of epoxy resins; Compositions of derivatives of epoxy resins
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
- H01L23/293—Organic, e.g. plastic
- H01L23/296—Organo-silicon compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Definitions
- the present invention relates to an epoxy resin composition for encapsulating electronic parts that is fluid at room temperature and contains a high content of inorganic filler.
- the thickness of the sealing resin has become very thin as electronic parts such as semiconductor packages have become thinner.
- sealing of electronic parts such as semiconductors has been performed by a transfer molding method using a solid epoxy resin composition.
- the resin flows in a narrow part. There is a concern that wire deformation will occur. Further, when the sealing area is increased, filling failure is likely to occur.
- a compression molding method using a liquid epoxy resin composition has been used for sealing a thin film package or a wafer level PKG for sealing a large area.
- a liquid epoxy resin composition is used for sealing molding, the viscosity at the time of molding is very low compared to a solid epoxy resin composition, so that wire deformation is difficult to occur, and a large area can be sealed at once. It is expected to be possible.
- the present invention contains a large amount of an inorganic filler, and has low viscosity and fluidity at room temperature, and has the following advantages: Reactivity and storage stability It is an object of the present invention to provide an epoxy resin composition for encapsulating electronic parts, which is excellent in demolding property, appearance of a molded product and the like, and is also prevented from warping.
- the present invention relates to (A) 100 parts by weight of epoxy resin, (B) 50 to 150 parts by weight of acid anhydride, and (C) As a curing accelerator, a mixture of 10 parts by weight thereof, 100 parts by weight of an epoxy resin (A) and 100 parts by weight of methyltetrahydroxy anhydride as an acid anhydride (B) after 24 hours at 25 ° C.
- the composition contains 88 to 92% by weight of fused spherical silica having an average particle size of 20 to 40 ⁇ m, It is an epoxy resin composition for electronic component sealing having a viscosity of 1000 Pa ⁇ s or less at 25 ° C. and a shear rate of 2.5 (1 / s).
- the fused spherical silica (D) having an average particle size of 20 to 40 ⁇ m contains 5 to 40% by weight of fused spherical silica having an average particle size of 0.2 to 5 ⁇ m. .
- (E) 5 to 100 parts by weight of silicone gel or silicone oil is added to 100 parts by weight of epoxy resin (A), and (F) a dispersant is added. contains.
- the dispersant (F) is an organopolysiloxane derivative having a structure represented by the following general formula (1) in the molecule. -[-BABA- (CD) nC-] p- (1)
- A represents an organopolysiloxane compound residue having 20 to 50 siloxane bonds having active hydrogen-containing groups at both ends, and B has two functional groups capable of reacting with active hydrogen.
- C is a bifunctional organic compound residue having two active hydrogen-containing groups
- D represents two functional groups capable of reacting with active hydrogen
- n represents an integer of 1 to 20
- p represents an integer of 1 to 20.
- the composition of the present invention has sufficient reactivity at a high temperature due to the above-described configuration, and the thickening is suppressed at room temperature. Since the thickening at room temperature is low, there is little increase in viscosity during the curing press, the appearance of the molded product is improved, and it is suitable for compression molding applications. Moreover, since it has sufficiently high Tg after compression molding, for example, Tg higher than the molding temperature, the demolding property is good. Furthermore, the composition of the present invention exhibits a low viscosity at room temperature while being highly filled with an inorganic filler at 88 to 92% by weight, and can seal an electronic component of a thin package or a large area electronic component by compression molding.
- an epoxy resin used for semiconductor encapsulation can be used.
- these bifunctional epoxy resins can be combined with a trifunctional or higher polyfunctional epoxy resin from the viewpoint of elastic modulus.
- the polyfunctional epoxy resin include polyfunctional glycidyl amine, dicyclopentadiene type epoxy resin, and polyfunctional glycidyl ether.
- Other epoxy resins such as silylated epoxy resins, heterocyclic epoxy resins, diglycidyl ether of bisphenol A propylene oxide adduct, diglycidyl ether of bisphenol A ethylene oxide adduct, diallyl bisphenol A type epoxy resin are used in combination. You can also.
- bisphenol A type epoxy resins, alicyclic epoxy resins, naphthalene type epoxy resins, and combinations of two or more thereof are preferred.
- an acid anhydride used as a curing agent for an epoxy resin can be used.
- phthalic anhydride, tetrahydrophthalic anhydride, 3-methyltetrahydrophthalic anhydride examples include acid, hymic anhydride, methyltetrahydroxy anhydride, methylhexahydroxy anhydride, succinic anhydride, trimellitic anhydride, pyromellitic anhydride, and the like. These may be used alone or in combination of two or more. Of these, methyl tetrahydroxy anhydride and methyl hexahydroxy anhydride are preferable.
- the curing accelerator (C) is 25 ° C. of a mixture of 10 parts by weight thereof, 100 parts by weight of the epoxy resin (A) and 100 parts by weight of methyltetrahydroxy acid anhydride as the acid anhydride (B).
- a microcapsule type curing accelerator having a thickening ratio of 1.0 to 2.0 after 24 hours.
- the thickening factor is preferably 1.0 to 1.5. The smaller the thickening factor, the longer the handling time during work. When the thickening ratio exceeds 2.0, the storage stability is poor, the handling property at the time of work is lowered, or the reactivity is high, so that a part of the cavity may not be filled with the resin.
- the measurement of the thickening factor can be performed at 25 ° C.
- the microcapsule type curing accelerator used as the curing accelerator (C) is appropriately measured by measuring the viscosity increase ratio of the mixture of epoxy resin, acid anhydride and curing accelerator under the above-mentioned conditions. Things can be easily selected.
- a fine particle composition in which an amine compound powder is dispersed in an epoxy resin can be used.
- a thickening agent can be selected from those exemplified below. Selection may be based on magnification: aliphatic primary amine, alicyclic primary amine, aromatic primary amine, aliphatic secondary amine, alicyclic secondary amine, aromatic secondary amine, imidazole compound, Examples include imidazoline compounds, reaction products of these compounds with carboxylic acids, sulfonic acids, isocyanates, epoxies, and the like.
- aliphatic primary amine 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 13, 20, 21, 22, 13, 20, 21, 22, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 30, 31, 32, 33, 40, 41, 42, 43, 44, 45, 46, 47, 48, 49, 50, 52, 53, 52, 53, 54, 55, 56, 55, 56, 55, 56, 55, 56 ° C. or higher from the viewpoint of suppressing thickening at 25 ° C.
- aliphatic primary amine alicyclic primary amine
- aromatic primary amine aliphatic secondary amine
- aromatic a combination of a secondary amine, an imidazole compound, or an imidazoline compound and a reaction product of the carboxylic acid, sulfonic acid, isocyanate, or epoxy
- the amine compound powder has a volume average particle size of preferably 50 ⁇ m or less, and more preferably 10 ⁇ m or less.
- the amount of these components is 50 to 150 parts by weight of the acid anhydride (B) and 8 to 40 parts by weight of the curing accelerator (C) with respect to 100 parts by weight of the epoxy resin (A). .
- the content of the acid anhydride (B) is within the above range, the curability and the physical properties of the cured product are good.
- the content of the curing accelerator (C) is less than the above range, the Tg after molding is not sufficiently high, and the demolding property is deteriorated.
- the filling property is deteriorated.
- the acid anhydride (B) is 80 to 120 parts by weight and the curing accelerator (C) is 10 to 25 parts by weight with respect to 100 parts by weight of the epoxy resin (A).
- the fused spherical silica (D) is further contained in the composition in an amount of 88 to 92% by weight.
- the fused spherical silica preferably has a high sphericity.
- the blending amount of the fused spherical silica (D) is less than 88% by weight, the warpage of the molded product cannot be suppressed.
- the blending amount exceeds 92% by weight, it is difficult to impart fluidity.
- the fused spherical silica (D) preferably contains 5 to 40% by weight of fused spherical silica having an average particle size of 0.2 to 5 ⁇ m.
- the viscosity of the composition is increased. While suppressing, the filling amount can be increased.
- the fused spherical silica (D) may be obtained by reacting a silane coupling agent on the surface in advance.
- silicone gel or silicone oil (E) can be added to the composition of the present invention.
- the silicone gel has a polysiloxane structure, and is produced by a condensation reaction method or an addition reaction method, and is itself known.
- the silicone oil has a polysiloxane structure and a linear structure having a siloxane bond of approximately 2000 or less, and is known per se.
- the production methods thereof are known, and can be obtained by the production methods described in, for example, JP-A Nos. 54-48720 and 48-17847. Specifically, for example, it can be obtained by reacting vinyl group-containing organopolysiloxane with SiH group-containing siloxane in a ratio of 0.3 to 0.8 in the presence of a platinum compound as a catalyst.
- the blending amount of the silicone gel or silicone oil (E) is preferably 5 to 100 parts by weight and more preferably 10 to 80 parts by weight with respect to 100 parts by weight of the epoxy resin (A).
- the silicone gel or silicone oil (E) it is preferable to mix
- a dispersing agent include organopolysiloxane derivatives having a structure represented by the following general formula (1) in the molecule. -[-BABA- (CD) nC-] p- (1)
- A represents an organopolysiloxane compound residue having 20 to 50 siloxane bonds having active hydrogen-containing groups at both ends, and B has two functional groups capable of reacting with active hydrogen.
- C is a bifunctional organic compound residue having two active hydrogen-containing groups
- D represents two functional groups capable of reacting with active hydrogen
- n represents an integer of 1 to 20
- p represents an integer of 1 to 20.
- organopolysiloxane derivative contains both an organopolysiloxane chain and an aromatic ring-containing chain or a long aliphatic chain, it is suitable as a dispersant for dispersing silicone gel or silicone oil in an epoxy resin. It is.
- the residue B and the residue D in the general formula (1) may be the same compound residue.
- the structure represented by the following general formula (2) is used.
- A represents an organopolysiloxane compound residue having 20 to 50 siloxane bonds having active hydrogen-containing groups at both ends
- B represents general formula (3):
- Ar1 represents a divalent aromatic group derived from biphenyl or naphthalene, and m represents an integer of 1 or 2.
- a bifunctional aromatic epoxy compound residue represented by C represents a dihydric phenol compound residue represented by —O—Ar 2 —O— (wherein Ar 2 represents a 2,2-bisphenylpropyl group), and n represents an integer of 1 to 20 P represents an integer of 1 to 20.
- the method for producing the polysiloxane derivative is known, and for example, the method described in Japanese Patent No. 3855074 can be used.
- Specific examples of polysiloxane derivatives as preferred dispersants are also disclosed in Example 1 (dispersant B) and Example 5 (dispersant C) of the above publication.
- a phenol-terminated silicone oil and a naphthalene skeleton-type diglycidyl ether are reacted, and bisphenol A diglycidyl ether and bisphenol A are polymerized in the reaction product.
- a dispersant having a polyether structure and having an epoxy group at the terminal can be obtained.
- the blending amount of the dispersant (F) may be an amount necessary for dispersing the silicone gel or silicone oil (E) in the resin.
- the amount is preferably 5 to 80 parts by weight, more preferably 10 to 50 parts by weight, based on 100 parts by weight of the silicone oil or silicone gel.
- additives can be used as long as the object of the present invention is not impaired.
- additives include silane coupling agents and carbon black.
- the silane coupling include ⁇ -glycidoxypropyltrimethoxysilane, ⁇ -glycidoxypropyltriethoxysilane, ⁇ - (3,4-epoxycyclohexyl) ethyltrimethoxysilane, ⁇ - (3,4- Epoxycyclohexyl) ethyltriethoxysilane, vinyltrimethoxysilane, vinyltriethoxysilane and the like.
- the silane coupling agent may be blended as desired even when using fused spherical silica having a surface reacted with a silane coupling agent in advance.
- the compounding amount of the silane coupling agent is preferably 0.1 to 10 phr, more preferably 2 to 6 phr in the composition.
- the blending amount of the carbon black in the composition is preferably 0.1 to 5 phr, more preferably 0.5 to 3 phr.
- composition of the present invention can be prepared by mixing the above components by a conventional method.
- no volatile components are used, no organic solvent is used.
- the composition of the present invention has a viscosity of 1000 Pa ⁇ s or less at 25 ° C. and a shear rate of 2.5 (1 / s).
- the viscosity is a value measured using an HBT viscometer manufactured by Brookfield.
- the viscosity of the composition exceeds 1000 Pa ⁇ s, it tends to cause a wire sweep or filling failure during compression molding, and it becomes difficult to supply a resin during production.
- the curing conditions are preferably 50 to 200 ° C., more preferably 100 to 175 ° C., and about 2 to 10 minutes.
- the composition of the present invention is an electronic component sealing composition.
- As the method of use there is a method of sealing an electronic component, preferably sealing a large area semiconductor package by a compression molding method.
- the compression molding method can be performed using a known compression molding machine or the like.
- Examples 1 to 13 and Comparative Examples 1 to 11 Each composition and blending amount (parts by weight) shown in Table 1, Table 2, and Table 3 were blended and mixed well at room temperature to obtain each composition. About the obtained composition, the viscosity in 25 degreeC and the shear rate 2.5 (1 / s) was measured with the Brookfield company make and HBT type
- the filler filling rate represents the filling rate of fused spherical silica.
- each composition was subjected to a compression molding method in Examples 1 to 9 and Comparative Examples 1 to 9 on a FR-4 substrate (120 ⁇ 120 ⁇ 0.4 mm) with a cavity of 100 ⁇ 100 ⁇ 0.3 mm. Molded at 3 ° C. for 3 minutes.
- Examples 10 to 13 and Comparative Examples 10 to 11 had a cavity diameter of 200 mm ⁇ cavity height of 0.4 mm on a silicon wafer (diameter 200 ⁇ thickness 0.7 mm) at 120 ° C. Molded in minutes.
- the molded product was evaluated for demoldability and fillability by the following methods.
- the Tg of the molded product was measured by the DMA method.
- the measurement conditions were a temperature increase rate of 2 ° C./min and a frequency of 1 Hz, and the temperature of the first peak of tan ⁇ was determined.
- the molded product was post-cured at 150 ° C. for 1 hour, and the Tg of the cured product was measured by the DMA method.
- the measurement conditions were a temperature increase rate of 2 ° C./min and a frequency of 1 Hz, and the temperature of the tan ⁇ peak was determined.
- the warpage of the cured product was evaluated by the following method. These results are shown in Table 1, Table 2, and Table 3.
- ⁇ Resin is filled in the cavity (100 ⁇ 100 ⁇ 0.3 mm), and there is no defect in the appearance of the molded product.
- X Curing starts in the middle of molding, and the cavity (100 ⁇ 100 ⁇ 0.3 mm) (3) Fillability (appearance) B
- Examples 10 to 13 and Comparative Examples 10 to 11 were evaluated according to the following criteria after compression molding at 120 ° C. for 10 minutes. However, in Comparative Example 10, since the initial viscosity of the composition was high and was putty, the filling property (appearance) B was not evaluated.
- ⁇ Resin is filled in the cavity (diameter 200 mm ⁇ cavity height 0.4 mm), and there is no defect in the appearance of the molded product from the inner periphery to the outer periphery of the wafer.
- ⁇ Cavity (diameter 200 mm ⁇ cavity height) 0.4mm) is filled with resin, but a flow mark is generated on the outer periphery of the wafer.
- X Curing starts in the middle of molding, and part of the cavity (diameter 200mm x cavity height 0.4mm) The resin was not filled, and the molded product had an appearance defect due to molding failure. Also, when the filling property (appearance) B was similarly evaluated using the compositions of Examples 1 to 9, all were good.
- Warpage A Examples 1 to 9 and Comparative Examples 1 to 9 were evaluated by the following criteria and method after compression molding at 150 ° C. for 3 minutes. After molding, the substrate side of the post-cured package was measured, and the amount of warpage was evaluated according to the following criteria. The measuring method used the laser displacement meter, measured the average of the height difference of a center part and four corner
- the viscosity increase ratio of the accelerator is 10 parts by weight, 100 parts by weight of the epoxy resin (1), and 100 parts by weight of methyltetrahydroxy acid anhydride. It measured using the HBT type
- Epoxy resin (1) bisphenol A type epoxy resin (epoxy equivalent 190 g / eq)
- Epoxy resin (2) Alicyclic epoxy resin (epoxy equivalent 135 g / eq)
- Acid anhydride (1) methyltetrahydroxy acid anhydride (acid anhydride equivalent 164 g / eq)
- Silane coupling agent 3-glycidoxyprop
- Epoxy groups at both ends and a weight average molecular weight of 23,000 silicone gel Two-part silicone gel TSE3062 (manufactured by GE Toshiba Silicone) Silicone oil: Epoxy group-containing silicone oil (epoxy equivalent 1200, viscosity 700 mPa ⁇ s at 25 ° C.)
- the composition of the present invention shows a liquid state at room temperature despite containing a high filling rate filler, and has both reactivity and storage stability, demoldability, and filling into the cavity. It turned out that it was excellent in sex etc., and the warpage was suppressed. Further, by using silicone gel or silicone oil together with an appropriate dispersant (Examples 10 to 13), the package molding on the silicon wafer was particularly good.
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Abstract
Description
(B)酸無水物50~150重量部、及び、
(C)硬化促進剤として、その10重量部とエポキシ樹脂(A)100重量部と酸無水物(B)としてのメチルテトラヒドロキシ酸無水物100重量部との混合物の25℃で24時間後の増粘倍率が1.0~2.0であるマイクロカプセル型硬化促進剤を8~40重量部含有し、さらに、
(D)平均粒径20~40μmの溶融球状シリカを組成物中に88~92重量%含有し、
25℃、せん断速度2.5(1/s)における粘度が1000Pa・s以下である電子部品封止用エポキシ樹脂組成物である。
本発明のエポキシ樹脂組成物の別の態様においては、さらに、(E)シリコーンゲル又はシリコーンオイルをエポキシ樹脂(A)100重量部に対して5~100重量部、及び、(F)分散剤を含有する。
本発明のエポキシ樹脂組成物のさらに別の態様においては、分散剤(F)は、分子中に下記一般式(1)で表される構造を有するオルガノポリシロキサン誘導体である。
-[-B-A-B-(C-D)n-C-]p- (1)
また、圧縮成型後、充分高温のTg、例えば、成型温度以上のTg、を有するので、脱型性が良好である。
さらに、本発明の組成物は、無機充填材を88~92重量%に高充填しつつも常温で低い粘度を示し、圧縮成型によって薄型パッケージの電子部品や大面積電子部品を封止しても反りがなく、ワイヤースイープや充填不良も生じない。このため、大面積半導体パッケージ等の電子部品の封止を生産性よく高品質に行うことができる。
また、シリコーンゲル又はシリコーンオイルを適切な分散剤とともに配合することにより、さらに大面積の電子部品の封止を良好に行うことができ、例えば、シリコンウェハーのような大面積の電子部品の圧縮成型封止にも好適に適用可能である。
-[-B-A-B-(C-D)n-C-]p- (1)
-[-B-A-B-(C-B)n-C-]p- (2)
上記カーボンブラックの配合量は、組成物中、0.1~5phrが好ましく、より好ましくは0.5~3phrである。
表1、表2、表3に示す各成分及び配合量(重量部)でそれぞれ配合し室温でよく混合して各組成物を得た。得られた組成物について、ブルックフィールド社製、HBT型粘度計で、25℃、せん断速度2.5(1/s)における粘度を測定した。増粘倍率は、得られた組成物を25℃において、24時間後の粘度を測定して、その粘度増加率(%)として求めた。ただし、組成物の初期粘度が高くパテ状の場合は増粘倍率を求めることができない。なお、促進剤の増粘倍率は後記する。充填剤充填率は溶融球状シリカの充填率を表す。
(1)脱型性
実施例1~9、比較例1~9はコンプレッション成型150℃、3分後に、以下の基準で評価をした。
○:リリースフィルムの剥離性良好で、脱型可能
×:樹脂が硬化しないか、又は、脱型時に変形して、脱型不可能
実施例10~13、比較例10~11はコンプレッション成型120℃、10分後に、以下の基準で評価をした。
○:リリースフィルムの剥離性良好で、脱型可能
×:樹脂が硬化しないか、又は、脱型時に変形して、脱型不可能
(2)充填性(外観)A
実施例1~9、比較例1~9はコンプレッション成型150℃、3分後に、以下の基準で評価をした。
○:キャビティー(100×100×0.3mm)に樹脂が充填されて、成型物の外観に欠陥がない
×:成型途中に硬化が始まって、キャビティー(100×100×0.3mm)の一部に樹脂が充填されず、成型物に成型不良による外観欠陥がある
(3)充填性(外観)B
実施例10~13、比較例10~11はコンプレッション成型120℃、10分後に、以下の基準で評価をした。ただし、比較例10は組成物の初期粘度が高くパテ状であったので、充填性(外観)Bの評価をしなかった。
◎:キャビティー(直径200mm×キャビティー高さ0.4mm)に樹脂が充填されて、ウェハー内周側から外周側まで成型物の外観に欠陥がない
○:キャビティー(直径200mm×キャビティー高さ0.4mm)に樹脂が充填されているが、ウェハー外周部にフローマークが発生
×:成型途中に硬化が始まって、キャビティー(直径200mm×キャビティー高さ0.4mm)の一部に樹脂が充填されず、成型物に成型不良による外観欠陥がある
また、実施例1~9の組成物を用いて同じく充填性(外観)Bの評価をしたところ、全て○であった。
(4)反りA
実施例1~9、比較例1~9はコンプレッション成型150℃、3分後に、以下の基準及び方法で評価をした。
成型した後、後硬化を施したパッケージの基板側を測定し、反り量を以下の基準で評価した。測定方法はレーザー変位計を用いて、中心部と4つの角部との高低差の平均を測定し、その値を反り量とした。
◎:100μm未満
○:100μm以上500μm未満
×:500μm以上
(5)反りB
実施例10~13、比較例10~11はコンプレッション成型120℃、10分後に、以下の基準及び方法で評価をした。ただし、比較例10は組成物の初期粘度が高くパテ状であったので、反りBの評価をしなかった。
成型した後、後硬化を施したシリコンウェハーの基板側を測定し、反り量を以下の基準で評価した。測定方法はレーザー変位計を用いて、中心部と4つの周辺部に等間隔にとった点との高低差の平均を測定し、その値を反り量とした。
◎:5mm未満
○:5mm以上15mm未満
×:15m以上
また、実施例1~9の組成物を用いて同じく反りBの評価をしたところ、全て○であった。
エポキシ樹脂(1):ビスフェノールA型エポキシ樹脂(エポキシ当量190g/eq)
エポキシ樹脂(2):脂環式エポキシ樹脂(エポキシ当量135g/eq)
酸無水物(1):メチルテトラヒドロキシ酸無水物(酸無水物当量164g/eq)
溶融球状シリカ(1):平均粒径10μm
溶融球状シリカ(2):平均粒径8μm(溶融球状シリカ(1)に平均粒径2μmの溶融球状シリカを15%配合)
溶融球状シリカ(3):平均粒径35μm
溶融球状シリカ(4):平均粒径30μm(溶融球状シリカ(3)に平均粒径2μmの溶融球状シリカを15%配合))
シランカップリング剤:3-グリシドキシプロピルトリメトキシシラン
促進剤(1):マイクロカプセル型硬化促進剤(1)(旭化成社製)(増粘倍率1.2倍)
促進剤(2):マイクロカプセル型硬化促進剤(2)(日本化薬社製)(増粘倍率2.2倍)
促進剤(3):2-メチルイミダゾール
促進剤(4):マイクロカプセル型硬化促進剤(3)(旭化成社製)(増粘倍率1.3倍)
促進剤(5):マイクロカプセル型硬化促進剤(4)(旭化成社製)(増粘倍率1.2倍)
オルガノポリシロキサン誘導体:フェノール末端ポリジメチルシロキサン(フェノール当量1500、25℃での粘度100mPa・s)100重量部、ナフタレン骨格型ジグリシジルエーテル(エポキシ当量142)65重量部、塩化テトラメチルアンモニウム0.03重量部及びビスフェノールA34重量部を反応させた、両末端にエポキシ基を有し重量平均分子量23000のもの
シリコーンゲル:2液型シリコーンゲルTSE3062(GE東芝シリコーン社製)
シリコーンオイル:エポキシ基含有シリコーンオイル(エポキシ当量1200、25℃での粘度700mPa・s)
Claims (4)
- (A)エポキシ樹脂100重量部に対して、
(B)酸無水物50~150重量部、及び、
(C)硬化促進剤として、その10重量部とエポキシ樹脂(A)100重量部と酸無水物(B)としてのメチルテトラヒドロキシ酸無水物100重量部との混合物の25℃で24時間後の増粘倍率が1.0~2.0であるマイクロカプセル型硬化促進剤を8~40重量部含有し、さらに、
(D)平均粒径20~40μmの溶融球状シリカを組成物中に88~92重量%含有し、
25℃、せん断速度2.5(1/s)における粘度が1000Pa・s以下である電子部品封止用エポキシ樹脂組成物。 - 前記平均粒径20~40μmの溶融球状シリカ(D)は、平均粒径が0.2~5μmの溶融球状シリカを5~40重量%含有するものである請求項1記載の組成物。
- さらに、(E)シリコーンゲル又はシリコーンオイルをエポキシ樹脂(A)100重量部に対して5~100重量部、及び、(F)分散剤を含有する請求項1又は2記載の組成物。
- 分散剤(F)は、分子中に下記一般式(1)で表される構造を有するオルガノポリシロキサン誘導体である請求項3記載の組成物。
-[-B-A-B-(C-D)n-C-]p- (1)
(一般式(1)中、Aは両末端に活性水素含有基を有する20~50個のシロキサン結合を有するオルガノポリシロキサン化合物残基を表し、Bは活性水素と反応し得る官能基を2個有し、ビフェニル若しくはナフタレン骨格含有エポキシ化合物、ジイソシアネート化合物又はジカルボン酸化合物のいずれかの二官能性有機化合物残基を表し、Cは活性水素含有基を2個有する二官能性有機化合物残基であって、エポキシ化合物と反応するビスフェノール化合物残基、ジイソシアネート化合物と反応するグリコール化合物残基又はジカルボン酸化合物と反応するジアミノ化合物残基のいずれかを表し、Dは活性水素と反応し得る官能基を2個有する二官能性有機化合物残基を表し、nは1~20の整数を表し、pは1~20の整数を表す。)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010512968A JP5574237B2 (ja) | 2008-05-21 | 2009-03-31 | 電子部品封止用エポキシ樹脂組成物 |
EP09750427.8A EP2280044A4 (en) | 2008-05-21 | 2009-03-31 | EPOXY RESIN COMPOSITION FOR THE PACKAGING OF AN ELECTRONIC COMPONENT |
US12/993,688 US20110105646A1 (en) | 2008-05-21 | 2009-03-31 | Epoxy resin composition for encapsulating electronic part |
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US (1) | US20110105646A1 (ja) |
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WO (1) | WO2009142065A1 (ja) |
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JP2020500228A (ja) * | 2016-10-14 | 2020-01-09 | ローベルト ボツシユ ゲゼルシヤフト ミツト ベシユレンクテル ハフツングRobert Bosch Gmbh | 部材を接続するための半製品 |
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Also Published As
Publication number | Publication date |
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JPWO2009142065A1 (ja) | 2011-09-29 |
EP2280044A1 (en) | 2011-02-02 |
US20110105646A1 (en) | 2011-05-05 |
JP5574237B2 (ja) | 2014-08-20 |
EP2280044A4 (en) | 2015-08-19 |
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