WO2009075091A1 - 試験装置、試験方法、測定装置、および、測定方法 - Google Patents
試験装置、試験方法、測定装置、および、測定方法 Download PDFInfo
- Publication number
- WO2009075091A1 WO2009075091A1 PCT/JP2008/003653 JP2008003653W WO2009075091A1 WO 2009075091 A1 WO2009075091 A1 WO 2009075091A1 JP 2008003653 W JP2008003653 W JP 2008003653W WO 2009075091 A1 WO2009075091 A1 WO 2009075091A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- signal
- jitter
- data signal
- strobe
- testing
- Prior art date
Links
- 238000012360 testing method Methods 0.000 title abstract 6
- 238000000034 method Methods 0.000 title 1
- 230000002194 synthesizing effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31937—Timing aspects, e.g. measuring propagation delay
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31708—Analysis of signal quality
- G01R31/31709—Jitter measurements; Jitter generators
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Dc Digital Transmission (AREA)
- Tests Of Electronic Circuits (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
データ信号とデータ信号を受信すべきタイミングを示すストローブ信号とを入力し、ストローブ信号により指定されたタイミングでデータ信号を取り込む被試験デバイスのジッタ耐性を試験する試験装置であって、被試験デバイスに供給するデータ信号およびストローブ信号を生成する信号生成部と、データ信号に対して許容されるべきデータジッタと、ストローブ信号に対して許容されるべきストローブジッタとを合成した合成ジッタをデータ信号またはストローブ信号に印加するジッタ印加部と、一方に合成ジッタが印加されたデータ信号およびストローブ信号を被試験デバイスに供給する信号供給部と、を備える試験装置を提供する。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009545344A JP5235196B2 (ja) | 2007-12-13 | 2008-12-08 | 試験装置および試験方法 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/955,390 | 2007-12-13 | ||
US11/955,390 US7808252B2 (en) | 2007-12-13 | 2007-12-13 | Measurement apparatus and measurement method |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2009075091A1 true WO2009075091A1 (ja) | 2009-06-18 |
Family
ID=40755339
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/003653 WO2009075091A1 (ja) | 2007-12-13 | 2008-12-08 | 試験装置、試験方法、測定装置、および、測定方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7808252B2 (ja) |
JP (1) | JP5235196B2 (ja) |
TW (1) | TWI391692B (ja) |
WO (1) | WO2009075091A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011196718A (ja) * | 2010-03-17 | 2011-10-06 | Anritsu Corp | ジッタ伝達特性試験装置及びジッタ伝達特性試験方法 |
JP2021009042A (ja) * | 2019-06-28 | 2021-01-28 | 株式会社アドバンテスト | 信号処理装置および信号処理方法 |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5012663B2 (ja) * | 2008-05-27 | 2012-08-29 | 富士通株式会社 | 回路シミュレーション装置、回路シミュレーションプログラム、回路シミュレーション方法 |
JP2012095120A (ja) * | 2010-10-27 | 2012-05-17 | Advantest Corp | 測定装置、測定方法およびプログラム |
JP7072438B2 (ja) | 2018-05-09 | 2022-05-20 | 積水ハウス株式会社 | 発光建材 |
US10873517B2 (en) * | 2019-01-23 | 2020-12-22 | Rohde & Schwarz Gmbh & Co. Kg | Jitter decomposition method and measurement instrument |
DE112020000640T5 (de) | 2019-01-31 | 2021-11-25 | Tektronix, Inc. | Systeme, Verfahren und Vorrichtungen für Hochgeschwindigkeits-Eingangs-/Ausgangs-Margin-Tests |
US11940483B2 (en) | 2019-01-31 | 2024-03-26 | Tektronix, Inc. | Systems, methods and devices for high-speed input/output margin testing |
US12061232B2 (en) | 2020-09-21 | 2024-08-13 | Tektronix, Inc. | Margin test data tagging and predictive expected margins |
US11927627B2 (en) | 2020-11-24 | 2024-03-12 | Tektronix, Inc. | Systems, methods, and devices for high-speed input/output margin testing |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002189061A (ja) * | 2000-12-21 | 2002-07-05 | Advantest Corp | フェーズロックループ回路の応答特性評価装置 |
JP2005181325A (ja) * | 2003-12-16 | 2005-07-07 | Advantest Corp | 試験装置、及び試験方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05235718A (ja) | 1992-02-18 | 1993-09-10 | Advantest Corp | ジッタ付与装置 |
JP4425367B2 (ja) | 1999-03-15 | 2010-03-03 | 株式会社アドバンテスト | 遅延デバイス |
JP4251800B2 (ja) * | 2001-11-08 | 2009-04-08 | 株式会社アドバンテスト | 試験装置 |
JP4216198B2 (ja) * | 2002-02-26 | 2009-01-28 | 株式会社アドバンテスト | 測定装置、及び測定方法 |
US7054358B2 (en) * | 2002-04-29 | 2006-05-30 | Advantest Corporation | Measuring apparatus and measuring method |
US7136773B2 (en) * | 2003-12-16 | 2006-11-14 | Advantest Corporation | Testing apparatus and testing method |
JP4425735B2 (ja) * | 2004-07-22 | 2010-03-03 | 株式会社アドバンテスト | ジッタ印加回路、及び試験装置 |
DE102005024649B4 (de) * | 2005-05-25 | 2007-04-12 | Infineon Technologies Ag | Vorrichtung und Verfahren zum Messen von Jitter |
US7856330B2 (en) * | 2006-02-27 | 2010-12-21 | Advantest Corporation | Measuring apparatus, testing apparatus, and electronic device |
US7412341B2 (en) * | 2006-03-28 | 2008-08-12 | Advantest Corporation | Jitter amplifier, jitter amplification method, electronic device, testing apparatus, and testing method |
US7288976B2 (en) * | 2006-03-31 | 2007-10-30 | Realtek Semiconductor Corp. | Charge pump circuit and method thereof |
-
2007
- 2007-12-13 US US11/955,390 patent/US7808252B2/en not_active Expired - Fee Related
-
2008
- 2008-12-08 JP JP2009545344A patent/JP5235196B2/ja not_active Expired - Fee Related
- 2008-12-08 WO PCT/JP2008/003653 patent/WO2009075091A1/ja active Application Filing
- 2008-12-11 TW TW097148285A patent/TWI391692B/zh not_active IP Right Cessation
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002189061A (ja) * | 2000-12-21 | 2002-07-05 | Advantest Corp | フェーズロックループ回路の応答特性評価装置 |
JP2005181325A (ja) * | 2003-12-16 | 2005-07-07 | Advantest Corp | 試験装置、及び試験方法 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011196718A (ja) * | 2010-03-17 | 2011-10-06 | Anritsu Corp | ジッタ伝達特性試験装置及びジッタ伝達特性試験方法 |
JP2021009042A (ja) * | 2019-06-28 | 2021-01-28 | 株式会社アドバンテスト | 信号処理装置および信号処理方法 |
JP7217204B2 (ja) | 2019-06-28 | 2023-02-02 | 株式会社アドバンテスト | 信号処理装置および信号処理方法 |
Also Published As
Publication number | Publication date |
---|---|
TW200931046A (en) | 2009-07-16 |
JPWO2009075091A1 (ja) | 2011-04-28 |
US7808252B2 (en) | 2010-10-05 |
TWI391692B (zh) | 2013-04-01 |
US20090261807A1 (en) | 2009-10-22 |
JP5235196B2 (ja) | 2013-07-10 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2009075091A1 (ja) | 試験装置、試験方法、測定装置、および、測定方法 | |
WO2008114700A1 (ja) | 測定装置、測定方法、試験装置、電子デバイス、および、プログラム | |
WO2008133238A1 (ja) | 試験装置および試験方法 | |
DE602005021243D1 (de) | System und verfahren zur jitter-einspeisung auf dem chip | |
HK1155812A1 (en) | Method for the non-destructive testing of a test object by way of ultrasound and corresponding device | |
HK1152989A1 (en) | Method for the non-destructive testing of a test object by way of ultrasound and apparatus therefor | |
TW200516240A (en) | Method and apparatus for fluid flow testing | |
WO2007133601A3 (en) | Dynamic vehicle durability testing and simulation | |
TW200623019A (en) | Gamma voltage generating apparatus and method of testing a gamma voltage | |
TWI372320B (en) | Apparatus and method of generating map data for a probe tester | |
WO2007146581A3 (en) | Method of expanding tester drive and measurement capability | |
BRPI0814940A2 (pt) | Métodos para medir propriedades de uma formação com um furo de sondagem e para testar formação utilizando uma sequência de pulsos de um dispositivo de teste de formação. | |
BRPI0907605A2 (pt) | Aparelho, montagem e método de teste submarino | |
WO2008063654A3 (en) | Apparatus and method for transducing an in vitro or mammalian system with a low-frequency signal | |
ATE483169T1 (de) | Testeinrichtung und testverfahren | |
TW200739093A (en) | Measuring device, testing device, electronic element, program and record medium | |
TW200731444A (en) | Image sensor testing method and apparatus | |
WO2008042138A3 (en) | Single event upset test circuit and methodology | |
ATE505734T1 (de) | Chipprüfvorrichtung und verfahren zum bereitstellen von timinginformationen | |
TWI350915B (en) | Apparatus for producing stress on smooth surfaces and method of testing using the same | |
WO2008114701A1 (ja) | 試験装置および電子デバイス | |
EP2190279A4 (en) | METHOD AND DEVICE FOR TESTING SEEDS | |
TWI366401B (en) | Test pattern signal generator and generation method, color measurement system and display device | |
WO2008114654A1 (ja) | 試験装置および電子デバイス | |
WO2008002316A3 (en) | Calibrating a testing device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 08859319 Country of ref document: EP Kind code of ref document: A1 |
|
WWE | Wipo information: entry into national phase |
Ref document number: 2009545344 Country of ref document: JP |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 08859319 Country of ref document: EP Kind code of ref document: A1 |