WO2009075091A1 - 試験装置、試験方法、測定装置、および、測定方法 - Google Patents

試験装置、試験方法、測定装置、および、測定方法 Download PDF

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Publication number
WO2009075091A1
WO2009075091A1 PCT/JP2008/003653 JP2008003653W WO2009075091A1 WO 2009075091 A1 WO2009075091 A1 WO 2009075091A1 JP 2008003653 W JP2008003653 W JP 2008003653W WO 2009075091 A1 WO2009075091 A1 WO 2009075091A1
Authority
WO
WIPO (PCT)
Prior art keywords
signal
jitter
data signal
strobe
testing
Prior art date
Application number
PCT/JP2008/003653
Other languages
English (en)
French (fr)
Inventor
Atsuo Sawara
Yuichi Miyaji
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to JP2009545344A priority Critical patent/JP5235196B2/ja
Publication of WO2009075091A1 publication Critical patent/WO2009075091A1/ja

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Dc Digital Transmission (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

　データ信号とデータ信号を受信すべきタイミングを示すストローブ信号とを入力し、ストローブ信号により指定されたタイミングでデータ信号を取り込む被試験デバイスのジッタ耐性を試験する試験装置であって、被試験デバイスに供給するデータ信号およびストローブ信号を生成する信号生成部と、データ信号に対して許容されるべきデータジッタと、ストローブ信号に対して許容されるべきストローブジッタとを合成した合成ジッタをデータ信号またはストローブ信号に印加するジッタ印加部と、一方に合成ジッタが印加されたデータ信号およびストローブ信号を被試験デバイスに供給する信号供給部と、を備える試験装置を提供する。
PCT/JP2008/003653 2007-12-13 2008-12-08 試験装置、試験方法、測定装置、および、測定方法 WO2009075091A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009545344A JP5235196B2 (ja) 2007-12-13 2008-12-08 試験装置および試験方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/955,390 2007-12-13
US11/955,390 US7808252B2 (en) 2007-12-13 2007-12-13 Measurement apparatus and measurement method

Publications (1)

Publication Number Publication Date
WO2009075091A1 true WO2009075091A1 (ja) 2009-06-18

Family

ID=40755339

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/003653 WO2009075091A1 (ja) 2007-12-13 2008-12-08 試験装置、試験方法、測定装置、および、測定方法

Country Status (4)

Country Link
US (1) US7808252B2 (ja)
JP (1) JP5235196B2 (ja)
TW (1) TWI391692B (ja)
WO (1) WO2009075091A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011196718A (ja) * 2010-03-17 2011-10-06 Anritsu Corp ジッタ伝達特性試験装置及びジッタ伝達特性試験方法
JP2021009042A (ja) * 2019-06-28 2021-01-28 株式会社アドバンテスト 信号処理装置および信号処理方法

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5012663B2 (ja) * 2008-05-27 2012-08-29 富士通株式会社 回路シミュレーション装置、回路シミュレーションプログラム、回路シミュレーション方法
JP2012095120A (ja) * 2010-10-27 2012-05-17 Advantest Corp 測定装置、測定方法およびプログラム
JP7072438B2 (ja) 2018-05-09 2022-05-20 積水ハウス株式会社 発光建材
US10873517B2 (en) * 2019-01-23 2020-12-22 Rohde & Schwarz Gmbh & Co. Kg Jitter decomposition method and measurement instrument
DE112020000640T5 (de) 2019-01-31 2021-11-25 Tektronix, Inc. Systeme, Verfahren und Vorrichtungen für Hochgeschwindigkeits-Eingangs-/Ausgangs-Margin-Tests
US11940483B2 (en) 2019-01-31 2024-03-26 Tektronix, Inc. Systems, methods and devices for high-speed input/output margin testing
US12061232B2 (en) 2020-09-21 2024-08-13 Tektronix, Inc. Margin test data tagging and predictive expected margins
US11927627B2 (en) 2020-11-24 2024-03-12 Tektronix, Inc. Systems, methods, and devices for high-speed input/output margin testing

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002189061A (ja) * 2000-12-21 2002-07-05 Advantest Corp フェーズロックループ回路の応答特性評価装置
JP2005181325A (ja) * 2003-12-16 2005-07-07 Advantest Corp 試験装置、及び試験方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05235718A (ja) 1992-02-18 1993-09-10 Advantest Corp ジッタ付与装置
JP4425367B2 (ja) 1999-03-15 2010-03-03 株式会社アドバンテスト 遅延デバイス
JP4251800B2 (ja) * 2001-11-08 2009-04-08 株式会社アドバンテスト 試験装置
JP4216198B2 (ja) * 2002-02-26 2009-01-28 株式会社アドバンテスト 測定装置、及び測定方法
US7054358B2 (en) * 2002-04-29 2006-05-30 Advantest Corporation Measuring apparatus and measuring method
US7136773B2 (en) * 2003-12-16 2006-11-14 Advantest Corporation Testing apparatus and testing method
JP4425735B2 (ja) * 2004-07-22 2010-03-03 株式会社アドバンテスト ジッタ印加回路、及び試験装置
DE102005024649B4 (de) * 2005-05-25 2007-04-12 Infineon Technologies Ag Vorrichtung und Verfahren zum Messen von Jitter
US7856330B2 (en) * 2006-02-27 2010-12-21 Advantest Corporation Measuring apparatus, testing apparatus, and electronic device
US7412341B2 (en) * 2006-03-28 2008-08-12 Advantest Corporation Jitter amplifier, jitter amplification method, electronic device, testing apparatus, and testing method
US7288976B2 (en) * 2006-03-31 2007-10-30 Realtek Semiconductor Corp. Charge pump circuit and method thereof

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002189061A (ja) * 2000-12-21 2002-07-05 Advantest Corp フェーズロックループ回路の応答特性評価装置
JP2005181325A (ja) * 2003-12-16 2005-07-07 Advantest Corp 試験装置、及び試験方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011196718A (ja) * 2010-03-17 2011-10-06 Anritsu Corp ジッタ伝達特性試験装置及びジッタ伝達特性試験方法
JP2021009042A (ja) * 2019-06-28 2021-01-28 株式会社アドバンテスト 信号処理装置および信号処理方法
JP7217204B2 (ja) 2019-06-28 2023-02-02 株式会社アドバンテスト 信号処理装置および信号処理方法

Also Published As

Publication number Publication date
TW200931046A (en) 2009-07-16
JPWO2009075091A1 (ja) 2011-04-28
US7808252B2 (en) 2010-10-05
TWI391692B (zh) 2013-04-01
US20090261807A1 (en) 2009-10-22
JP5235196B2 (ja) 2013-07-10

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