TWI779055B - 光學顯示面板的損傷檢查方法 - Google Patents

光學顯示面板的損傷檢查方法 Download PDF

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Publication number
TWI779055B
TWI779055B TW107122468A TW107122468A TWI779055B TW I779055 B TWI779055 B TW I779055B TW 107122468 A TW107122468 A TW 107122468A TW 107122468 A TW107122468 A TW 107122468A TW I779055 B TWI779055 B TW I779055B
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TW
Taiwan
Prior art keywords
panel
light
edge
optical display
reflected light
Prior art date
Application number
TW107122468A
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English (en)
Chinese (zh)
Other versions
TW201915481A (zh
Inventor
田村宜之
原知広
Original Assignee
日商日東電工股份有限公司
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Application filed by 日商日東電工股份有限公司 filed Critical 日商日東電工股份有限公司
Publication of TW201915481A publication Critical patent/TW201915481A/zh
Application granted granted Critical
Publication of TWI779055B publication Critical patent/TWI779055B/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
TW107122468A 2017-09-28 2018-06-29 光學顯示面板的損傷檢查方法 TWI779055B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017187930A JP6937647B2 (ja) 2017-09-28 2017-09-28 光学表示パネルの損傷検査方法
JP2017-187930 2017-09-28

Publications (2)

Publication Number Publication Date
TW201915481A TW201915481A (zh) 2019-04-16
TWI779055B true TWI779055B (zh) 2022-10-01

Family

ID=65903437

Family Applications (1)

Application Number Title Priority Date Filing Date
TW107122468A TWI779055B (zh) 2017-09-28 2018-06-29 光學顯示面板的損傷檢查方法

Country Status (5)

Country Link
JP (1) JP6937647B2 (ja)
KR (1) KR102495565B1 (ja)
CN (1) CN110945347B (ja)
TW (1) TWI779055B (ja)
WO (1) WO2019064622A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7030914B1 (ja) * 2020-08-27 2022-03-07 花王株式会社 シート状部材の製造方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003247953A (ja) * 2002-02-25 2003-09-05 Seiko Epson Corp 液晶パネル外観検査方法及び検査装置
WO2004079352A1 (ja) * 2003-03-04 2004-09-16 Mitsuboshi Diamond Industrial Co. Ltd. 透明基板端面部の検査装置およびその検査方法
JP2011232324A (ja) * 2010-04-09 2011-11-17 Nippon Steel Corp 表面欠陥検査装置、表面欠陥検査方法及びプログラム

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3025946B2 (ja) * 1995-10-11 2000-03-27 茨城県 物体表面の粗さ測定方法及び装置
JPH11271035A (ja) * 1998-03-24 1999-10-05 Hitachi Metals Ltd 欠陥検査装置及び欠陥検査方法
US6628381B1 (en) * 2000-06-20 2003-09-30 Applied Materials, Inc. Optical inspection method and apparatus utilizing a collection angle design
JP4703911B2 (ja) * 2001-08-10 2011-06-15 日新製鋼株式会社 金属帯の孔状欠陥検査装置
KR100418357B1 (ko) * 2003-03-31 2004-02-14 (주)에이치아이티에스 엘시디(lcd) 패널의 측면검사장치 및 방법
WO2004088399A1 (en) * 2003-03-31 2004-10-14 Hits Co., Ltd. Lcd cell edge inspection apparatus and method thereof
JP4760029B2 (ja) * 2005-01-31 2011-08-31 アイシン精機株式会社 欠陥検査方法および欠陥検査装置
JP4626982B2 (ja) * 2005-02-10 2011-02-09 セントラル硝子株式会社 ガラス板の端面の欠陥検出装置および検出方法
JP5015824B2 (ja) * 2008-02-29 2012-08-29 日東電工株式会社 粘着フィルム位置検出器および粘着フィルム貼付装置
WO2011074261A1 (ja) * 2009-12-17 2011-06-23 住友金属工業株式会社 管状品の検査装置およびその検査方法
JP2011257257A (ja) * 2010-06-09 2011-12-22 Panasonic Corp 検査装置、検査方法およびこれらを用いた画像表示用パネルの製造方法
JP6329397B2 (ja) * 2014-03-07 2018-05-23 株式会社ダイヘン 画像検査装置及び画像検査方法
CN204215118U (zh) * 2014-12-02 2015-03-18 北京兆维电子(集团)有限责任公司 液晶屏外观检测装置
JP6344290B2 (ja) * 2015-04-01 2018-06-20 東芝三菱電機産業システム株式会社 平面形状測定装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003247953A (ja) * 2002-02-25 2003-09-05 Seiko Epson Corp 液晶パネル外観検査方法及び検査装置
WO2004079352A1 (ja) * 2003-03-04 2004-09-16 Mitsuboshi Diamond Industrial Co. Ltd. 透明基板端面部の検査装置およびその検査方法
JP2011232324A (ja) * 2010-04-09 2011-11-17 Nippon Steel Corp 表面欠陥検査装置、表面欠陥検査方法及びプログラム

Also Published As

Publication number Publication date
CN110945347A (zh) 2020-03-31
KR20200062081A (ko) 2020-06-03
JP2019060823A (ja) 2019-04-18
JP6937647B2 (ja) 2021-09-22
WO2019064622A1 (ja) 2019-04-04
TW201915481A (zh) 2019-04-16
CN110945347B (zh) 2024-01-12
KR102495565B1 (ko) 2023-02-03

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