TWI600879B - Shape measuring device, processing device and shape measuring method - Google Patents

Shape measuring device, processing device and shape measuring method Download PDF

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Publication number
TWI600879B
TWI600879B TW105104767A TW105104767A TWI600879B TW I600879 B TWI600879 B TW I600879B TW 105104767 A TW105104767 A TW 105104767A TW 105104767 A TW105104767 A TW 105104767A TW I600879 B TWI600879 B TW I600879B
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TW
Taiwan
Prior art keywords
interpolation
data
measured
shape
gap
Prior art date
Application number
TW105104767A
Other languages
English (en)
Chinese (zh)
Other versions
TW201631295A (zh
Inventor
高娜
市原浩一
Original Assignee
住友重機械工業股份有限公司
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Application filed by 住友重機械工業股份有限公司 filed Critical 住友重機械工業股份有限公司
Publication of TW201631295A publication Critical patent/TW201631295A/zh
Application granted granted Critical
Publication of TWI600879B publication Critical patent/TWI600879B/zh

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/20Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
TW105104767A 2015-02-26 2016-02-18 Shape measuring device, processing device and shape measuring method TWI600879B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015036783A JP6352833B2 (ja) 2015-02-26 2015-02-26 形状計測装置、加工装置及び形状計測方法

Publications (2)

Publication Number Publication Date
TW201631295A TW201631295A (zh) 2016-09-01
TWI600879B true TWI600879B (zh) 2017-10-01

Family

ID=56825819

Family Applications (1)

Application Number Title Priority Date Filing Date
TW105104767A TWI600879B (zh) 2015-02-26 2016-02-18 Shape measuring device, processing device and shape measuring method

Country Status (4)

Country Link
JP (1) JP6352833B2 (ja)
KR (1) KR101701084B1 (ja)
CN (1) CN105928482B (ja)
TW (1) TWI600879B (ja)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7260871B2 (ja) * 2018-10-16 2023-04-19 ナブテスコ株式会社 変位センサ
JP7212559B2 (ja) * 2019-03-18 2023-01-25 住友重機械工業株式会社 形状測定装置及び形状測定方法
CN111940843A (zh) * 2020-07-29 2020-11-17 南京理工大学 基于非接触测量的大型结构件智能切削***及方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200643670A (en) * 2005-02-25 2006-12-16 Seiko Epson Corp Robot locus control method and apparatus and program of robot locus control method
TW200813677A (en) * 2006-08-04 2008-03-16 Hurco Co Inc Machine tool system control
TW200916721A (en) * 2007-07-24 2009-04-16 Hexagon Metrology Spa Method of compensating measurement errors of a measuring machine deriving from the deformations of the machine bed caused by the load exerted by the workpiece to be measured on the machine bed, and measuring machine operating according to said method
CN101549476A (zh) * 2008-03-31 2009-10-07 株式会社捷太格特 用于磨床的加工后尺寸控制设备
TW201326741A (zh) * 2011-12-20 2013-07-01 Metal Ind Res & Dev Ct 探針量測補償方法

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JPH0634360A (ja) * 1992-07-20 1994-02-08 Nippon Steel Corp 鋼板の形状測定方法
FI92529C (fi) * 1993-10-19 1994-11-25 Sitra Foundation Menetelmä sylinterimäisen kappaleen mittaamiseksi
FR2727198A1 (fr) * 1994-11-18 1996-05-24 Otis Elevator Co Capteur de distance et notamment du positionnement des cabines d'ascenseur
JPH0942941A (ja) * 1995-08-03 1997-02-14 Nissan Motor Co Ltd 三次元形状測定方法および装置
JPH11230735A (ja) * 1998-02-12 1999-08-27 Nikon Corp 座標測定装置のデータ処理方法
JP2003254747A (ja) 2002-02-28 2003-09-10 Mitsutoyo Corp 真直度測定法
JP2007333556A (ja) * 2006-06-15 2007-12-27 Micro Engineering Inc 逐次多点式真直度測定法および測定装置
JP2009063541A (ja) * 2007-09-10 2009-03-26 Sumitomo Heavy Ind Ltd 幾何学量計測方法及び幾何学量計測装置
JP5100612B2 (ja) * 2008-10-29 2012-12-19 住友重機械工業株式会社 真直度測定方法及び真直度測定装置
JP5100613B2 (ja) * 2008-10-29 2012-12-19 住友重機械工業株式会社 真直度測定方法及び真直度測定装置
CN102221354B (zh) * 2011-04-02 2013-01-09 中南大学 一种多测点浮动定位表面不平顺测量方法
CN102495961B (zh) * 2011-12-05 2014-08-27 山东电力研究院 简化的测量过程统计控制方法
KR101266394B1 (ko) * 2011-12-16 2013-05-22 한국과학기술연구원 거리측정 센서의 입사각 영향에 따른 오차 보정방법
CN103871102B (zh) * 2014-03-28 2016-11-16 南京大学 一种基于高程点和道路轮廓面的道路三维精细建模方法
CN103900504A (zh) * 2014-04-10 2014-07-02 华中科技大学 纳米尺度下的实时三维视觉信息反馈方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200643670A (en) * 2005-02-25 2006-12-16 Seiko Epson Corp Robot locus control method and apparatus and program of robot locus control method
TW200813677A (en) * 2006-08-04 2008-03-16 Hurco Co Inc Machine tool system control
TW200916721A (en) * 2007-07-24 2009-04-16 Hexagon Metrology Spa Method of compensating measurement errors of a measuring machine deriving from the deformations of the machine bed caused by the load exerted by the workpiece to be measured on the machine bed, and measuring machine operating according to said method
CN101549476A (zh) * 2008-03-31 2009-10-07 株式会社捷太格特 用于磨床的加工后尺寸控制设备
TW201326741A (zh) * 2011-12-20 2013-07-01 Metal Ind Res & Dev Ct 探針量測補償方法

Also Published As

Publication number Publication date
CN105928482B (zh) 2020-09-29
JP6352833B2 (ja) 2018-07-04
KR20160104552A (ko) 2016-09-05
TW201631295A (zh) 2016-09-01
JP2016156793A (ja) 2016-09-01
CN105928482A (zh) 2016-09-07
KR101701084B1 (ko) 2017-01-31

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