TW471707U - Probing apparatus - Google Patents

Probing apparatus

Info

Publication number
TW471707U
TW471707U TW087200536U TW87200536U TW471707U TW 471707 U TW471707 U TW 471707U TW 087200536 U TW087200536 U TW 087200536U TW 87200536 U TW87200536 U TW 87200536U TW 471707 U TW471707 U TW 471707U
Authority
TW
Taiwan
Prior art keywords
probing apparatus
probing
Prior art date
Application number
TW087200536U
Other languages
English (en)
Inventor
Tsuyoshi Aruga
Wataru Mochizuki
Shuji Akiyama
Hisatomi Hosaka
Yuichi Abe
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP16687995A external-priority patent/JPH08335614A/ja
Priority claimed from JP8203996A external-priority patent/JPH09246333A/ja
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of TW471707U publication Critical patent/TW471707U/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW087200536U 1995-06-08 1996-06-08 Probing apparatus TW471707U (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP16687995A JPH08335614A (ja) 1995-06-08 1995-06-08 プロ−ブシステム
JP8203996A JPH09246333A (ja) 1996-03-11 1996-03-11 検査装置

Publications (1)

Publication Number Publication Date
TW471707U true TW471707U (en) 2002-01-01

Family

ID=26423075

Family Applications (2)

Application Number Title Priority Date Filing Date
TW087200536U TW471707U (en) 1995-06-08 1996-06-08 Probing apparatus
TW085106896A TW442884B (en) 1995-06-08 1996-06-08 Probe system

Family Applications After (1)

Application Number Title Priority Date Filing Date
TW085106896A TW442884B (en) 1995-06-08 1996-06-08 Probe system

Country Status (3)

Country Link
US (1) US5798651A (zh)
KR (1) KR100346147B1 (zh)
TW (2) TW471707U (zh)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100292699B1 (ko) * 1996-05-17 2001-08-07 히가시 데쓰로 프로브 검사장치
TW480645B (en) * 1997-02-24 2002-03-21 Tokyo Electron Ltd Method and apparatus for inspecting semiconductor integrated circuits, and contactor incorporated in the apparatus
JP3099183B2 (ja) * 1997-05-14 2000-10-16 株式会社東京精密 ウェーハプロービングマシン
US6420864B1 (en) * 2000-04-13 2002-07-16 Nanophotonics Ag Modular substrate measurement system
KR100500230B1 (ko) * 2000-07-26 2005-07-11 삼성전자주식회사 무인운반 시스템 및 그 제어방법
US6876215B1 (en) * 2003-02-27 2005-04-05 Credence Systems Corporation Apparatus for testing semiconductor integrated circuit devices in wafer form
KR100617273B1 (ko) * 2004-05-28 2006-08-31 (주) 쎄믹스 반도체 웨이퍼 프로버의 웨이퍼 수용 용기 이송장치
US7151591B2 (en) * 2004-09-28 2006-12-19 Asml Netherlands B.V. Alignment system, alignment method, and lithographic apparatus
JP4529135B2 (ja) * 2005-04-11 2010-08-25 富士機械製造株式会社 対回路基板作業システム
US7671614B2 (en) * 2005-12-02 2010-03-02 Formfactor, Inc. Apparatus and method for adjusting an orientation of probes
US20090190426A1 (en) * 2008-01-24 2009-07-30 International Business Machines Corporation Circuits, methods and design structures for adaptive repair of sram arrays
CN102301462A (zh) * 2009-02-12 2011-12-28 株式会社爱德万测试 半导体晶片测试装置
JP2017096949A (ja) * 2015-11-24 2017-06-01 フォトン・ダイナミクス・インコーポレーテッド セル接触プロービングパッドを使用して平面パネル型表示装置を電気的に検査するためのシステムおよび方法
WO2018029833A1 (ja) * 2016-08-10 2018-02-15 株式会社ｉｓｐａｃｅ 探査方法、探査システム及び探査機
JP6885456B2 (ja) * 2017-02-22 2021-06-16 新東工業株式会社 テストシステム
JP7280700B2 (ja) * 2019-01-21 2023-05-24 株式会社東芝 保持装置、制御システム、及び検査システム
KR102202033B1 (ko) * 2020-09-03 2021-01-12 주식회사 프로이천 캠승강식 오토 프로브장치

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4639664A (en) * 1984-05-31 1987-01-27 Texas Instruments Incorporated Apparatus for testing a plurality of integrated circuits in parallel
JP2560371B2 (ja) * 1988-01-05 1996-12-04 株式会社ニコン 基板処理システム
JP2952331B2 (ja) * 1990-04-05 1999-09-27 東京エレクトロン株式会社 プローブ装置
JPH0465850A (ja) * 1990-07-06 1992-03-02 Tokyo Electron Ltd 検査・リペア装置
JP3312748B2 (ja) * 1992-06-05 2002-08-12 株式会社東京精密 ウエハ検査装置及びウエハ検査方法
US5510724A (en) * 1993-05-31 1996-04-23 Tokyo Electron Limited Probe apparatus and burn-in apparatus
US5488292A (en) * 1993-10-04 1996-01-30 Tokyo Seimitsu Co., Ltd. Wafer inspecting system

Also Published As

Publication number Publication date
US5798651A (en) 1998-08-25
KR970003749A (ko) 1997-01-28
KR100346147B1 (ko) 2002-11-23
TW442884B (en) 2001-06-23

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Legal Events

Date Code Title Description
GD4K Issue of patent certificate for granted utility model filed before june 30, 2004
MK4K Expiration of patent term of a granted utility model