SE515190C2 - Användning av en elektrisk spole som mäter materialparametrar medelst en induktiv virvelströmsmetod - Google Patents

Användning av en elektrisk spole som mäter materialparametrar medelst en induktiv virvelströmsmetod

Info

Publication number
SE515190C2
SE515190C2 SE9804080A SE9804080A SE515190C2 SE 515190 C2 SE515190 C2 SE 515190C2 SE 9804080 A SE9804080 A SE 9804080A SE 9804080 A SE9804080 A SE 9804080A SE 515190 C2 SE515190 C2 SE 515190C2
Authority
SE
Sweden
Prior art keywords
measuring
use according
coil
helical
helical part
Prior art date
Application number
SE9804080A
Other languages
English (en)
Swedish (sv)
Other versions
SE9804080D0 (sv
SE9804080L (sv
Inventor
Kurt-Aake Magnusson
Laust Pedersen
Original Assignee
Westinghouse Atom Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Atom Ab filed Critical Westinghouse Atom Ab
Priority to SE9804080A priority Critical patent/SE515190C2/sv
Publication of SE9804080D0 publication Critical patent/SE9804080D0/xx
Priority to ES99963773T priority patent/ES2160564T3/es
Priority to PCT/SE1999/002212 priority patent/WO2000034734A1/en
Priority to JP2000587145A priority patent/JP2002531853A/ja
Priority to EP99963773A priority patent/EP1137907B1/de
Priority to DE69935610T priority patent/DE69935610T2/de
Priority to DE1137907T priority patent/DE1137907T1/de
Publication of SE9804080L publication Critical patent/SE9804080L/
Publication of SE515190C2 publication Critical patent/SE515190C2/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9006—Details, e.g. in the structure or functioning of sensors

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Electrochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
SE9804080A 1998-11-26 1998-11-26 Användning av en elektrisk spole som mäter materialparametrar medelst en induktiv virvelströmsmetod SE515190C2 (sv)

Priority Applications (7)

Application Number Priority Date Filing Date Title
SE9804080A SE515190C2 (sv) 1998-11-26 1998-11-26 Användning av en elektrisk spole som mäter materialparametrar medelst en induktiv virvelströmsmetod
ES99963773T ES2160564T3 (es) 1998-11-26 1999-11-26 Utilizacion de un componente de medicion electrico.
PCT/SE1999/002212 WO2000034734A1 (en) 1998-11-26 1999-11-26 Electric measurement component and use of the same
JP2000587145A JP2002531853A (ja) 1998-11-26 1999-11-26 電気的測定コンポーネントおよびその使用法
EP99963773A EP1137907B1 (de) 1998-11-26 1999-11-26 Verwendung eines elektrischen messelements
DE69935610T DE69935610T2 (de) 1998-11-26 1999-11-26 Verwendung eines elektrischen messelements
DE1137907T DE1137907T1 (de) 1998-11-26 1999-11-26 Elektrische messkomponente und ihre verwendung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9804080A SE515190C2 (sv) 1998-11-26 1998-11-26 Användning av en elektrisk spole som mäter materialparametrar medelst en induktiv virvelströmsmetod

Publications (3)

Publication Number Publication Date
SE9804080D0 SE9804080D0 (sv) 1998-11-26
SE9804080L SE9804080L (sv) 2000-05-27
SE515190C2 true SE515190C2 (sv) 2001-06-25

Family

ID=20413443

Family Applications (1)

Application Number Title Priority Date Filing Date
SE9804080A SE515190C2 (sv) 1998-11-26 1998-11-26 Användning av en elektrisk spole som mäter materialparametrar medelst en induktiv virvelströmsmetod

Country Status (6)

Country Link
EP (1) EP1137907B1 (de)
JP (1) JP2002531853A (de)
DE (2) DE69935610T2 (de)
ES (1) ES2160564T3 (de)
SE (1) SE515190C2 (de)
WO (1) WO2000034734A1 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5047833B2 (ja) * 2008-02-14 2012-10-10 日本システム開発株式会社 変位センサシステム及び変位センサ
DE102011103122A1 (de) * 2011-05-25 2012-11-29 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Aufsetzkalotte für eine Messsonde sowie Messsonde zur Messung der Dicke dünner Schichten
JP6067001B2 (ja) 2011-05-25 2017-01-25 ヘルムート・フィッシャー・ゲーエムベーハー・インスティテュート・フューア・エレクトロニク・ウント・メステクニク 薄層の厚さを測定する測定プローブ
DE102011103123A1 (de) * 2011-05-25 2012-11-29 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Messsonde zur Messung der Dicke dünner Schichten sowie ein Sensorelement für die Messsonde und ein Verfahren zu deren Herstellung
CN103515045B (zh) * 2013-09-30 2016-02-03 东北大学 一种柔软压敏电涡流线圈的研制方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1567600A (en) * 1975-10-15 1980-05-21 British Gas Corp Lipe line inspection equipment
SU1185217A2 (ru) * 1983-11-22 1985-10-15 Kubansk Selskokhozyajst Inst Матрица токовихревых накладньк преобразователей
US4593245A (en) * 1983-12-12 1986-06-03 General Electric Company Eddy current method for detecting a flaw in semi-conductive material
US4706020A (en) * 1983-12-12 1987-11-10 General Electric Company High frequency eddy current probe with planar, spiral-like coil on flexible substrate for detecting flaws in semi-conductive material
SU1610420A1 (ru) * 1987-12-08 1990-11-30 Всесоюзный заочный машиностроительный институт Вихретоковый преобразователь дл неразрушающего контрол
US5402098A (en) * 1991-03-25 1995-03-28 Satosen Co., Ltd. Coil

Also Published As

Publication number Publication date
ES2160564T1 (es) 2001-11-16
DE69935610T2 (de) 2007-11-29
SE9804080D0 (sv) 1998-11-26
DE69935610D1 (de) 2007-05-03
SE9804080L (sv) 2000-05-27
EP1137907A1 (de) 2001-10-04
WO2000034734A1 (en) 2000-06-15
DE1137907T1 (de) 2002-06-13
JP2002531853A (ja) 2002-09-24
ES2160564T3 (es) 2007-10-16
EP1137907B1 (de) 2007-03-21

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Legal Events

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