NL7808130A - Meetinrichting voor roentgenfluorescentie-analyse. - Google Patents

Meetinrichting voor roentgenfluorescentie-analyse.

Info

Publication number
NL7808130A
NL7808130A NL7808130A NL7808130A NL7808130A NL 7808130 A NL7808130 A NL 7808130A NL 7808130 A NL7808130 A NL 7808130A NL 7808130 A NL7808130 A NL 7808130A NL 7808130 A NL7808130 A NL 7808130A
Authority
NL
Netherlands
Prior art keywords
roentgen
measurement device
fluorescence analysis
fluorescence
analysis
Prior art date
Application number
NL7808130A
Other languages
English (en)
Other versions
NL185305B (nl
NL185305C (nl
Original Assignee
Kernenergieverwert Ges Fuer
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kernenergieverwert Ges Fuer filed Critical Kernenergieverwert Ges Fuer
Publication of NL7808130A publication Critical patent/NL7808130A/nl
Publication of NL185305B publication Critical patent/NL185305B/nl
Application granted granted Critical
Publication of NL185305C publication Critical patent/NL185305C/nl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
NLAANVRAGE7808130,A 1977-08-17 1978-08-02 Meetinrichtig voor roentgenfluorescentie-analyse. NL185305C (nl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2736960A DE2736960C3 (de) 1977-08-17 1977-08-17 Meßanordnung zur Röntgenfluoreszenzanalyse

Publications (3)

Publication Number Publication Date
NL7808130A true NL7808130A (nl) 1979-02-20
NL185305B NL185305B (nl) 1989-10-02
NL185305C NL185305C (nl) 1990-03-01

Family

ID=6016538

Family Applications (1)

Application Number Title Priority Date Filing Date
NLAANVRAGE7808130,A NL185305C (nl) 1977-08-17 1978-08-02 Meetinrichtig voor roentgenfluorescentie-analyse.

Country Status (12)

Country Link
US (1) US4426717A (nl)
AT (1) AT368285B (nl)
BE (1) BE869791A (nl)
CA (1) CA1111576A (nl)
CH (1) CH635433A5 (nl)
DE (1) DE2736960C3 (nl)
DK (1) DK146367C (nl)
FR (1) FR2400704A1 (nl)
GB (1) GB2003267B (nl)
IT (1) IT1162195B (nl)
LU (1) LU80106A1 (nl)
NL (1) NL185305C (nl)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3542003A1 (de) * 1985-11-28 1987-06-04 Geesthacht Gkss Forschung Verfahren zur zerstoerungsfreien analyse der oberflaechenschicht von proben
DE3606748C1 (de) * 1986-03-01 1987-10-01 Geesthacht Gkss Forschung Anordnung zur zerstoerungsfreien Messung von Metallspuren
DE3813329A1 (de) * 1988-04-21 1989-11-02 Geesthacht Gkss Forschung Verfahren und anordnung zur sammlung und analyse von staub
EP0372278A3 (de) * 1988-12-02 1991-08-21 Gkss-Forschungszentrum Geesthacht Gmbh Verfahren und Anordung zur Untersuchung von Proben nach der Methode der Röntgenfluoreszenzanalyse
JP2853261B2 (ja) * 1989-05-16 1999-02-03 三菱マテリアル株式会社 金属分析方法および分析装置
US5220591A (en) * 1989-10-19 1993-06-15 Sumitomo Electric Industries, Ltd. Total reflection X-ray fluorescence apparatus
US5249216B1 (en) * 1989-10-19 1996-11-05 Sumitomo Electric Industries Total reflection x-ray fluorescence apparatus
US5014287A (en) * 1990-04-18 1991-05-07 Thornton Michael G Portable x-ray fluorescence spectrometer for environmental monitoring of inorganic pollutants
DE4127778C2 (de) * 1991-04-30 1994-11-03 Picolab Oberflaechen Und Spure Vorrichtung zur Totalreflexions-Röntgenfluoreszenzanalyse
CN109827982B (zh) * 2017-11-23 2024-04-26 核工业西南物理研究院 一种土壤重金属检测的快速检测仪

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3920984A (en) * 1974-04-08 1975-11-18 Machlett Lab Inc X-ray energy analyzer

Also Published As

Publication number Publication date
DK325778A (da) 1979-02-18
CH635433A5 (de) 1983-03-31
NL185305B (nl) 1989-10-02
DK146367B (da) 1983-09-19
DK146367C (da) 1984-02-27
DE2736960C3 (de) 1980-03-06
NL185305C (nl) 1990-03-01
DE2736960B2 (de) 1979-06-28
LU80106A1 (nl) 1979-01-19
ATA557478A (de) 1982-01-15
IT1162195B (it) 1987-03-25
BE869791A (fr) 1978-12-18
US4426717A (en) 1984-01-17
IT7883626A0 (it) 1978-07-16
AT368285B (de) 1982-09-27
DE2736960A1 (de) 1979-03-01
CA1111576A (en) 1981-10-27
FR2400704A1 (fr) 1979-03-16
GB2003267B (en) 1982-01-06
GB2003267A (en) 1979-03-07
FR2400704B1 (nl) 1983-09-16

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Legal Events

Date Code Title Description
DNT Communications of changes of names of applicants whose applications have been laid open to public inspection

Free format text: GKSS-FORSCHUNGSZENTRUM GEESTHACHT GMBH

BA A request for search or an international-type search has been filed
BB A search report has been drawn up
A85 Still pending on 85-01-01
BC A request for examination has been filed
V1 Lapsed because of non-payment of the annual fee