NL7702877A - Onderzoekapparaat. - Google Patents

Onderzoekapparaat.

Info

Publication number: NL7702877A
Authority: NL; Netherlands
Prior art keywords: examination device; examination
Prior art date: 1977-02-16

Application number

NL7702877A

Other languages

English (en)

Original Assignee

Huntron Instr Inc

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1977-02-16

Filing date

1977-03-17

Publication date

1978-08-18

1977-03-17 Application filed by Huntron Instr Inc filed Critical Huntron Instr Inc

1978-08-18 Publication of NL7702877A publication Critical patent/NL7702877A/nl

Links

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2843—In-circuit-testing
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Engineering & Computer Science (AREA)
General Engineering & Computer Science (AREA)
Tests Of Electronic Circuits (AREA)
Testing Of Individual Semiconductor Devices (AREA)

NL7702877A 1977-02-16 1977-03-17 Onderzoekapparaat. NL7702877A (nl)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
US05/769,110 US4074195A (en)	1977-02-16	1977-02-16	Semiconductor tester

Publications (1)

Publication Number	Publication Date
NL7702877A true NL7702877A (nl)	1978-08-18

Family

ID=25084487

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
NL7702877A NL7702877A (nl)	1977-02-16	1977-03-17	Onderzoekapparaat.

Country Status (9)

Country	Link
US (1)	US4074195A (nl)
JP (1)	JPS53101984A (nl)
CA (1)	CA1093705A (nl)
FR (1)	FR2381316A1 (nl)
GB (1)	GB1567231A (nl)
IL (1)	IL51637A (nl)
IT (1)	IT1082962B (nl)
MX (1)	MX145865A (nl)
NL (1)	NL7702877A (nl)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4386317A (en) *	1980-09-12	1983-05-31	Huntron Instruments, Inc.	Apparatus for testing, in-circuit, semiconductors shunted by a low resistance
FR2662259B1 (fr) *	1990-05-17	1992-09-18	Commissariat Energie Atomique	Dispositif automatique pour la mesure de caracteristiques concernant des composants electroniques.
GB2278689B (en) *	1993-06-02	1997-03-19	Ford Motor Co	Method and apparatus for testing integrated circuits
US5508607A (en) *	1994-08-11	1996-04-16	Fluke Corporation	Electronic test instrument for component test
US5596280A (en) *	1995-06-15	1997-01-21	International Business Machines Corp.	Apparatus and method for testing circuits by the response of a phase-locked loop
US9310408B2 (en) *	2012-04-30	2016-04-12	Keysight Technologies, Inc.	Power device analyzer
WO2024029282A1 (ja) *	2022-08-04	2024-02-08	ローム株式会社	半導体試験装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS4720457U (nl) *	1971-03-06	1972-11-08
DE2345469A1 (de) *	1973-09-08	1975-03-20	Rolf Kox	Verfahren, geraet und schaltungsanordnung zur funktionsfaehigkeitspruefung eines in einer schaltung integrierten elektrischen bauelementes
US3973198A (en) *	1974-10-29	1976-08-03	Bill Hunt	In-circuit semiconductor tester

1977
- 1977-02-16 US US05/769,110 patent/US4074195A/en not_active Expired - Lifetime
- 1977-03-08 MX MX168266A patent/MX145865A/es unknown
- 1977-03-09 IL IL51637A patent/IL51637A/xx unknown
- 1977-03-14 JP JP2713477A patent/JPS53101984A/ja active Pending
- 1977-03-15 GB GB10944/77A patent/GB1567231A/en not_active Expired
- 1977-03-15 FR FR7707649A patent/FR2381316A1/fr active Granted
- 1977-03-17 NL NL7702877A patent/NL7702877A/nl not_active Application Discontinuation
- 1977-03-31 IT IT67710/77A patent/IT1082962B/it active
- 1977-04-14 CA CA276,204A patent/CA1093705A/en not_active Expired

Also Published As

Publication number	Publication date
IL51637A0 (en)	1977-05-31
US4074195A (en)	1978-02-14
JPS53101984A (en)	1978-09-05
IT1082962B (it)	1985-05-21
CA1093705A (en)	1981-01-13
FR2381316A1 (fr)	1978-09-15
FR2381316B1 (nl)	1983-02-25
MX145865A (es)	1982-04-12
GB1567231A (en)	1980-05-14
IL51637A (en)	1979-09-30

Legal Events

Date	Code	Title
1984-03-01	BA	A request for search or an international-type search has been filed
1984-03-01	BB	A search report has been drawn up
1984-07-02	BC	A request for examination has been filed
1985-01-01	A85	Still pending on 85-01-01
1992-11-02	BV	The patent application has lapsed

Publication	Publication Date	Title
NL7806723A (nl)	1978-12-27	Hemodialysatorinrichting.
NL7811483A (nl)	1979-05-29	Meetinrichting.
NL7802260A (nl)	1979-05-30	Halfgeleiderinrichting.
NL7812026A (nl)	1979-06-19	Veldeffektinrichting.
SE7808947L (sv)	1979-02-26	Diagnosticeringsanordning
NO144435C (no)	1981-08-26	Forbindelsesanordning.
NL7801017A (nl)	1978-07-31	Aansluitinrichting.
NO153149C (no)	1986-01-22	Frigjoerbar forbindelsesanordning.
NL7808105A (nl)	1979-02-06	Ladingsgekoppelde inrichting.
NL7808025A (nl)	1979-02-06	Hemostatische inrichting.
NL7807236A (nl)	1979-01-09	Halfgeleiderinrichting.
NL7809574A (nl)	1979-03-22	Beeldbeschouwingstoestel.
NL7700879A (nl)	1978-08-01	Halfgeleiderinrichting.
NL7807515A (nl)	1979-01-16	Vastestofbeeldvorminrichting.
NL7805992A (nl)	1978-12-05	Halfgeleiderinrichting.
NL7809575A (nl)	1979-03-22	Beeldbeschouwingstoestel.
NL7802222A (nl)	1978-09-05	Halfgeleiderinrichting.
NL7713758A (nl)	1979-06-15	Halfgeleiderinrichting.
NL7809569A (nl)	1979-03-22	Beeldbeschouwingstoestel.
NL7803374A (nl)	1978-10-03	Weeginrichting.
NO782252L (no)	1979-01-03	Tuftenaalanordning.
NL185750C (nl)	1990-07-16	Computertomografische inrichting.
NL7808941A (nl)	1979-03-27	Meetinrichting.
NL7801082A (nl)	1978-08-04	Halfgeleiderinrichting.
NL7812462A (nl)	1979-07-03	Halfgeleiderinrichting.