FR2400704A1 - Dispositif de mesure pour analyse de fluorescence x - Google Patents

Dispositif de mesure pour analyse de fluorescence x

Info

Publication number
FR2400704A1
FR2400704A1 FR7823990A FR7823990A FR2400704A1 FR 2400704 A1 FR2400704 A1 FR 2400704A1 FR 7823990 A FR7823990 A FR 7823990A FR 7823990 A FR7823990 A FR 7823990A FR 2400704 A1 FR2400704 A1 FR 2400704A1
Authority
FR
France
Prior art keywords
fluorescence analysis
measuring device
radiation
ray fluorescence
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7823990A
Other languages
English (en)
Other versions
FR2400704B1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KERNENERGIEVERWERT GES fur
Original Assignee
KERNENERGIEVERWERT GES fur
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by KERNENERGIEVERWERT GES fur filed Critical KERNENERGIEVERWERT GES fur
Publication of FR2400704A1 publication Critical patent/FR2400704A1/fr
Application granted granted Critical
Publication of FR2400704B1 publication Critical patent/FR2400704B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

Dispositif de mesure pour analyse de fluorescence X. Dans le trajet du faisceau S du rayonnement X d'excitation est disposé un réflecteur 3 qui dévie le rayonnement vers la surface du support d'échantillon 4 et élimine de cette manière la composante de haute énergie du rayonnement X qui affecte défavorablement le fond. Applications à l'analyse de fluorescence X.
FR7823990A 1977-08-17 1978-08-17 Dispositif de mesure pour analyse de fluorescence x Granted FR2400704A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2736960A DE2736960C3 (de) 1977-08-17 1977-08-17 Meßanordnung zur Röntgenfluoreszenzanalyse

Publications (2)

Publication Number Publication Date
FR2400704A1 true FR2400704A1 (fr) 1979-03-16
FR2400704B1 FR2400704B1 (fr) 1983-09-16

Family

ID=6016538

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7823990A Granted FR2400704A1 (fr) 1977-08-17 1978-08-17 Dispositif de mesure pour analyse de fluorescence x

Country Status (12)

Country Link
US (1) US4426717A (fr)
AT (1) AT368285B (fr)
BE (1) BE869791A (fr)
CA (1) CA1111576A (fr)
CH (1) CH635433A5 (fr)
DE (1) DE2736960C3 (fr)
DK (1) DK146367C (fr)
FR (1) FR2400704A1 (fr)
GB (1) GB2003267B (fr)
IT (1) IT1162195B (fr)
LU (1) LU80106A1 (fr)
NL (1) NL185305C (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0423803A2 (fr) * 1989-10-19 1991-04-24 Sumitomo Electric Industries, Ltd. Appareil à fluorescence par rayons X utilisant la réflexion totale
US5220591A (en) * 1989-10-19 1993-06-15 Sumitomo Electric Industries, Ltd. Total reflection X-ray fluorescence apparatus

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3542003A1 (de) * 1985-11-28 1987-06-04 Geesthacht Gkss Forschung Verfahren zur zerstoerungsfreien analyse der oberflaechenschicht von proben
DE3606748C1 (de) * 1986-03-01 1987-10-01 Geesthacht Gkss Forschung Anordnung zur zerstoerungsfreien Messung von Metallspuren
DE3813329A1 (de) * 1988-04-21 1989-11-02 Geesthacht Gkss Forschung Verfahren und anordnung zur sammlung und analyse von staub
EP0372278A3 (fr) * 1988-12-02 1991-08-21 Gkss-Forschungszentrum Geesthacht Gmbh Procédé et appareil d'analyse d'échantillons par fluorescence aux rayons X
JP2853261B2 (ja) * 1989-05-16 1999-02-03 三菱マテリアル株式会社 金属分析方法および分析装置
US5014287A (en) * 1990-04-18 1991-05-07 Thornton Michael G Portable x-ray fluorescence spectrometer for environmental monitoring of inorganic pollutants
DE4127778C2 (de) * 1991-04-30 1994-11-03 Picolab Oberflaechen Und Spure Vorrichtung zur Totalreflexions-Röntgenfluoreszenzanalyse
CN109827982B (zh) * 2017-11-23 2024-04-26 核工业西南物理研究院 一种土壤重金属检测的快速检测仪

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3920984A (en) * 1974-04-08 1975-11-18 Machlett Lab Inc X-ray energy analyzer

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3920984A (en) * 1974-04-08 1975-11-18 Machlett Lab Inc X-ray energy analyzer

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
EXBK/74 *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0423803A2 (fr) * 1989-10-19 1991-04-24 Sumitomo Electric Industries, Ltd. Appareil à fluorescence par rayons X utilisant la réflexion totale
EP0423803A3 (en) * 1989-10-19 1991-06-12 Sumitomo Electric Industries, Ltd. Total reflection x-ray fluorescence apparatus
US5220591A (en) * 1989-10-19 1993-06-15 Sumitomo Electric Industries, Ltd. Total reflection X-ray fluorescence apparatus
US5249216A (en) * 1989-10-19 1993-09-28 Sumitomo Electric Industries, Ltd. Total reflection x-ray fluorescence apparatus

Also Published As

Publication number Publication date
GB2003267A (en) 1979-03-07
GB2003267B (en) 1982-01-06
LU80106A1 (fr) 1979-01-19
FR2400704B1 (fr) 1983-09-16
NL7808130A (nl) 1979-02-20
CA1111576A (fr) 1981-10-27
DE2736960B2 (de) 1979-06-28
DK146367B (da) 1983-09-19
IT7883626A0 (it) 1978-07-16
NL185305C (nl) 1990-03-01
US4426717A (en) 1984-01-17
DK146367C (da) 1984-02-27
CH635433A5 (de) 1983-03-31
ATA557478A (de) 1982-01-15
DE2736960A1 (de) 1979-03-01
DE2736960C3 (de) 1980-03-06
NL185305B (nl) 1989-10-02
DK325778A (da) 1979-02-18
BE869791A (fr) 1978-12-18
IT1162195B (it) 1987-03-25
AT368285B (de) 1982-09-27

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