KR920012905A - 투명물체의 결함검사 방법 및 그 장치 - Google Patents

투명물체의 결함검사 방법 및 그 장치 Download PDF

Info

Publication number
KR920012905A
KR920012905A KR1019910023354A KR910023354A KR920012905A KR 920012905 A KR920012905 A KR 920012905A KR 1019910023354 A KR1019910023354 A KR 1019910023354A KR 910023354 A KR910023354 A KR 910023354A KR 920012905 A KR920012905 A KR 920012905A
Authority
KR
South Korea
Prior art keywords
value
pitch
transparent object
dark
pixel data
Prior art date
Application number
KR1019910023354A
Other languages
English (en)
Other versions
KR0166593B1 (ko
Inventor
노부히로 미나또
Original Assignee
사애끼 구니오
도요 가라스 가부시끼가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 사애끼 구니오, 도요 가라스 가부시끼가이샤 filed Critical 사애끼 구니오
Publication of KR920012905A publication Critical patent/KR920012905A/ko
Application granted granted Critical
Publication of KR0166593B1 publication Critical patent/KR0166593B1/ko

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/90Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9036Investigating the presence of flaws or contamination in a container or its contents using arrays of emitters or receivers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • G01N2021/8829Shadow projection or structured background, e.g. for deflectometry
    • G01N2021/8832Structured background, e.g. for transparent objects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/8877Proximity analysis, local statistics
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)

Abstract

내용 없음

Description

투명물체의 결함검사 방법 및 그 장치
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명에 의한 투명물체의 결함 검사장치의 블럭도, 제2도는 본 발명에 의한 방법의 개념도, 제3도는 기준패턴의 일실시예의 상태도.

Claims (5)

  1. 명암이 소정의 피치(P)로서 규칙성으로 가지며 연속되는 모아레등의 기준패턴을, 그대로 또는 결함이 없는 정상적인 투명물체에 비추어서, 고체촬상소자에 의한 이미지센서로 수광하고, 그와 같이 수광된 폐턴의 명암의 화소수로부터 상기 피치(P)를 검출한 후, 동일한 기준 패턴을 검사대상인 투명물체에 비추어 같은 이미지센서로 수광하고, 그 화소데이터에 대하여, 상기 검출피치(P)를 기준으로 하는 소정 화소수만틈 떨어진 두개의 화소데이터의 평균치로부터 기준치를 설정하여, 그 기준치에 따라 각 화소의 명암을 판정하고, 그 명암수로부터 결합을 판정하는 것을 특징으로 하는 투명물체의 결함검사방법.
  2. 제1항에 있어서, 전기 검출피치(P)의 2분의 1만큼 떨어진 두개의 화소데이터의 평균치로부터 기준치를 설정하는 것을 특징으로 하는 투명물체의 결함검사방법.
  3. 제1항 또는 제2항에 있어서, 전기 평균치에 보정치를 가한 상기준치, 그 보정치를 뺀 값을 하기준치로 하고, 각 화소데이터가 이들 상하 기준치의 사이에 있을 때는 어두움(暗) 그 이외일 때는 밝음(明)으로 판정하는 것을 특징으로 하는 투명물체의 결함검사방법.
  4. 제1항, 제2항또는 제3항에 있어서, 상기 상기준치의 명암판정후, 다시금 단위면적당 복수의 화소군에 대하여 명암각각의 화소수를 계수하고, 그 차이에 따라 각 화소의 명암을 결정하는 것을 특징으로 하는 투명물체의 결함검사방법.
  5. 명암이 소정의 피치(P)로 규칙성을 가지고 연속되는 모아레등의 기준패턴과, 그 기준패턴을 투명물체에 비추어서 수광하는 고체촬상소자에 의한 이미지 센서와, 정상적인 투명물체에 비추거나 그대로 그 이미지센서에 의해 수광된 기준패턴의 상(像)의 명암의 화소수로부터 상기 피치(P)를 검출하는 기준패턴피치 검출수단과, 검사대상인 투명물체에 비추어 상기 이미지센서에 수광된 상기 기준패턴의 화소데이터에 대하여 상기 검출피치(P)를 기준으로 하는 소정 화소수만틈 떨어진 두개의 화소데이터의 평균치를 산출하는 평균치산출수단과, 그 평균치로부터 명암판정레벨이 상하 기준치를 설정하는 기준치 설정수단과, 상기 화소데이타가 상기 상기준치 사이에 있을 때는 어두움(暗), 그 이외의 때는 밝음(明)으로 판정하므로 기준패턴에 의한 데이터를 소거하는 기준패턴 소거수단과, 그 소거후에 화소데이터에 대하여 단위 면적당의 복수의 화수군에 대하여 그 명암 각각의 화소수를 계수하여, 그 차이에 따라 각 화소의 명암을 결정하는 명암결정수단과, 그와 같이 결정된 명암수에 의해 결함을 판정하는 결함판정수단을 갖추어서 되는 것을 특징으로 하는 투명물에의 결함검사장치.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019910023354A 1990-12-19 1991-12-18 투명물체의 결함검사방법 및 그 장치 KR0166593B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP90-411634 1990-12-19
JP2411634A JPH06100555B2 (ja) 1990-12-19 1990-12-19 透明物体の欠陥検査方法とその装置

Publications (2)

Publication Number Publication Date
KR920012905A true KR920012905A (ko) 1992-07-28
KR0166593B1 KR0166593B1 (ko) 1999-05-01

Family

ID=18520604

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019910023354A KR0166593B1 (ko) 1990-12-19 1991-12-18 투명물체의 결함검사방법 및 그 장치

Country Status (7)

Country Link
US (1) US5216481A (ko)
EP (1) EP0491555B1 (ko)
JP (1) JPH06100555B2 (ko)
KR (1) KR0166593B1 (ko)
AU (1) AU647558B2 (ko)
CA (1) CA2057670A1 (ko)
DE (1) DE69120517T2 (ko)

Families Citing this family (69)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5243400A (en) * 1992-04-27 1993-09-07 Owens-Brockway Glass Container Inc. Inspection of transparent containers
JP2795595B2 (ja) * 1992-06-26 1998-09-10 セントラル硝子株式会社 透明板状体の欠点検出方法
JP3212389B2 (ja) * 1992-10-26 2001-09-25 株式会社キリンテクノシステム 固体上の異物検査方法
JPH0785061B2 (ja) * 1993-04-12 1995-09-13 東洋ガラス株式会社 透明ガラス容器の裾底部の異物検査装置
US5442446A (en) * 1994-08-19 1995-08-15 Owens-Brockaway Glass Container Inc. Inspection of transparent containers
US6122048A (en) * 1994-08-26 2000-09-19 Pressco Technology Inc. Integral field lens illumination for video inspection
US5486692A (en) * 1994-10-19 1996-01-23 Emhart Glass Machinery Investments Inc. Glassware inspection machine comprising diffused light sources and two-dimensional cameras
US6148097A (en) * 1995-06-07 2000-11-14 Asahi Kogaku Kogyo Kabushiki Kaisha Optical member inspecting apparatus and method of inspection thereof
US5592286A (en) * 1995-03-08 1997-01-07 Alltrista Corporation Container flange inspection system using an annular lens
US5699152A (en) * 1995-04-03 1997-12-16 Alltrista Corporation Electro-optical inspection system and method
US5847822A (en) * 1995-08-29 1998-12-08 Asahi Kogaku Kogyo Kabushiki Kaisha Optical element inspecting apparatus
US5835207A (en) * 1995-10-02 1998-11-10 Asahi Kogaku Kogyo Kabushiki Kaisha Optical member inspecting apparatus
US5828500A (en) * 1995-10-11 1998-10-27 Asahi Kogaku Kogyo Kabushiki Kaisha Optical element inspecting apparatus
JP2976869B2 (ja) * 1995-12-28 1999-11-10 日産自動車株式会社 表面欠陥検査装置
US5805279A (en) * 1996-01-11 1998-09-08 Alltrista Corporation Method and apparatus for illuminating and imaging a can end coated with sealing material
US6587581B1 (en) * 1997-01-10 2003-07-01 Hitachi, Ltd. Visual inspection method and apparatus therefor
US6034766A (en) * 1997-03-05 2000-03-07 Asahi Kogaku Kogyo Kabushiki Kaisha Optical member inspection apparatus
DE19741384A1 (de) * 1997-09-19 1999-03-25 Heuft Systemtechnik Gmbh Verfahren zum Erkennen von diffus streuenden Materialien, Verunreinigungen und sonstigen Fehlern bei transparenten Gegenständen
WO1999027491A1 (en) * 1997-11-20 1999-06-03 Cornell Research Foundation, Inc. A fast method and system for determining local properties of striped patterns
US7781723B1 (en) 1998-02-19 2010-08-24 Emhart Glass S.A. Container inspection machine using light source having spatially cyclically continuously varying intensity
US6618495B1 (en) * 1998-02-19 2003-09-09 Emhart Glass, S.A. Container inspection machine
DE19813073A1 (de) * 1998-03-25 1999-09-30 Laser Sorter Gmbh Verfahren und Vorrichtung zur Bestimmung der optischen Qualität und zur Detektion von Fehlern von Flachglas und anderen optisch transparenten Materialien, insbesondere von Drips, Fäden und Linien
JP4147682B2 (ja) * 1998-04-27 2008-09-10 旭硝子株式会社 被検物の欠点検査方法および検査装置
JP3284462B2 (ja) * 1998-11-30 2002-05-20 株式会社キリンテクノシステム 壜胴部の欠陥検出方法
EP1006350A1 (en) * 1998-11-30 2000-06-07 Kirin Techno-System Corporation Method for detecting defects in bottles
US6208412B1 (en) * 1999-06-14 2001-03-27 Visteon Global Technologies, Inc. Method and apparatus for determining optical quality
DE10006663B4 (de) * 2000-02-15 2006-10-05 Metronom Ag Verfahren zur Vermessung von langwelligen Oberflächenstrukturen
US6424414B1 (en) * 2000-10-16 2002-07-23 Agr International, Inc. Method and apparatus for detecting refractive defects in transparent containers
DE60223956T3 (de) 2001-03-14 2011-05-19 Hitachi Information & Control Solutions, Ltd., Hitachi Untersuchungsgerät und System zur Untersuchung von Fremdkörpern in mit Flüssigkeit gefüllten Behältern
US6532064B1 (en) * 2001-10-16 2003-03-11 Baader-Canpolar Inc. Automatic inspection apparatus and method for simultaneous detection of anomalies in a 3-dimensional translucent object
JP4072466B2 (ja) * 2002-12-27 2008-04-09 日本板硝子株式会社 板状体の光学的歪みを評価する装置および方法
DE102004025948B3 (de) * 2004-05-27 2006-03-16 Krieg, Gunther, Prof. Dr.-Ing. Verfahren und Vorrichtung zum Untersuchen von lichtdurchlässigen Objekten
KR20070121820A (ko) * 2005-04-06 2007-12-27 코닝 인코포레이티드 유리 검사 시스템 및 이를 이용한 유리 검사 방법
TWI255337B (en) * 2005-05-20 2006-05-21 Primax Electronics Ltd Method and device for judging the quality of an optical element
ATE419519T1 (de) * 2005-09-09 2009-01-15 Sacmi Verfahren und vorrichtung zur optischen inspektion eines gegenstands
JP4671848B2 (ja) * 2005-11-29 2011-04-20 セントラル硝子株式会社 ガラス板の折割切断不良の検出方法
JP4801457B2 (ja) * 2006-02-02 2011-10-26 株式会社リコー 表面欠陥検査装置、表面欠陥検査方法及び表面欠陥検査プログラム
DE102006025312A1 (de) * 2006-05-31 2007-12-06 GM Global Technology Operations, Inc., Detroit Verfahren und Anordnung zur Erfassung der optischen Qualität einer transparenten Scheibe
CN101382502B (zh) * 2007-09-07 2011-07-27 鸿富锦精密工业(深圳)有限公司 表面污点检测***及其检测方法
DE102008053876A1 (de) * 2008-10-30 2010-05-06 Khs Ag Flaschennaht- und Embossingausrichtung
DE102009020919A1 (de) * 2009-05-12 2010-11-18 Krones Ag Vorrichtung zum Erkennen von Erhebungen und/oder Vertiefungen auf Flaschen, insbesondere in einer Etikettiermaschine
DE102010012570A1 (de) * 2010-03-23 2011-09-29 Krones Ag Vorrichtung und Verfahren zum Untersuchen von befüllten Behältnissen auf Fremdkörper
FR2958751B1 (fr) * 2010-04-13 2012-05-25 Iris Inspection Machines Procede de detection de defauts dans des articles verriers et installation pour la mise en oeuvre dudit procede
FR2959864B1 (fr) * 2010-05-06 2013-01-18 Altatech Semiconductor Dispositif et procede d'inspection de plaquettes semi-conductrices en mouvement.
DE102010037448A1 (de) * 2010-09-10 2012-03-15 Wincor Nixdorf International Gmbh Verfahren und Vorrichtung zur Erfassung von Leergutbehältern
DE102010043632B4 (de) * 2010-11-09 2017-08-24 Krones Aktiengesellschaft Verfahren zur Funktionskontrolle einer Inspektionsvorrichtung und Vorrichtung zur Inspektion eines Produktsstroms
DE102011002269A1 (de) * 2011-04-26 2012-10-31 Wincor Nixdorf International Gmbh Erfassungs- und Kalibriereinheit für Leergutrücknahmeautomaten und Verfahren zur Kalibrierung
DE102011083377A1 (de) * 2011-09-26 2013-03-28 Krones Aktiengesellschaft Vorrichtung und Verfahren zum Ausrichten von Behältern
FR2993662B1 (fr) 2012-07-23 2015-05-15 Msc & Sgcc Procede et installation pour la detection notamment de defauts refractants
US20140286563A1 (en) * 2013-03-19 2014-09-25 Industrial Video Solutions, Inc. Accurate detection of low-contrast defects in transparent material
US9329304B2 (en) 2014-03-06 2016-05-03 Microsoft Technology Licensing, Llc Translucent object presence and condition detection based on detected light intensity
JP6471437B2 (ja) * 2014-09-16 2019-02-20 株式会社リコー 撮像装置、測色装置および画像形成装置
JP6350158B2 (ja) * 2014-09-16 2018-07-04 株式会社リコー 撮像装置、媒体種別判定装置および画像形成装置
JP6373743B2 (ja) * 2014-12-05 2018-08-15 コマツNtc株式会社 面の評価方法および面の評価装置
US20160178535A1 (en) * 2014-12-17 2016-06-23 Xerox Corporation Inspection Device And Method
CN206583820U (zh) * 2016-02-24 2017-10-24 贝克顿迪金森法国公司 用于检测透明量筒中的颗粒的检查***
BR102016028266A2 (pt) * 2016-12-01 2018-06-19 Autaza Tecnologia Ltda - Epp Método e sistema para a inspeção automática de qualidade de materiais
JP6913811B2 (ja) * 2017-02-06 2021-08-04 東洋ガラス株式会社 ガラスびんの検査装置
US20190096057A1 (en) 2017-05-11 2019-03-28 Jacob Nathaniel Allen Object inspection system and method for inspecting an object
US10402963B2 (en) * 2017-08-24 2019-09-03 Kla-Tencor Corporation Defect detection on transparent or translucent wafers
US10580615B2 (en) 2018-03-06 2020-03-03 Globalfoundries Inc. System and method for performing failure analysis using virtual three-dimensional imaging
JP6988592B2 (ja) * 2018-03-13 2022-01-05 オムロン株式会社 画像検査装置、画像検査方法及び画像検査プログラム
CN111179248B (zh) * 2019-12-27 2023-06-09 深港产学研基地 一种透明平滑曲面缺陷识别方法及检测装置
CN112179287B (zh) * 2020-08-19 2022-01-11 成都飞机工业(集团)有限责任公司 一种基于多视光源的快速测量装置及测量方法
BR102020024851A2 (pt) * 2020-12-04 2022-06-21 Autaza Tecnologia Ltda - Epp Métodos e sistemas para a inspeção de qualidade de materiais e de superfícies tridimensionais em ambiente virtual
WO2022271007A1 (en) * 2021-06-22 2022-12-29 Tt Vision Technologies Sdn. Bhd. System and method of inspecting translucent object
DE102022200614A1 (de) 2022-01-20 2023-07-20 Rodenstock Gmbh Vorrichtung zur Untersuchung eines transparenten Werkstückes sowie die Verwendung einer solchen Vorrichtung als telezentrisches Messystem in Transmission
DE102022104990A1 (de) 2022-03-03 2023-09-07 Emhart Glass Sa VORRICHTUNG UND VERFAHREN ZUM INSPIZIEREN VON GEFÄßEN
CN115937052B (zh) * 2023-03-14 2023-05-16 四川福莱宝生物科技有限公司 一种凝胶电泳图像的处理方法、装置、设备及介质

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5546172A (en) * 1978-09-29 1980-03-31 Kirin Brewery Co Ltd Detector for foreign material
DE3237511A1 (de) * 1982-10-09 1984-04-12 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Verfahren zur pruefung von glaserzeugnissen
JPS61100604A (ja) * 1984-10-24 1986-05-19 Hajime Sangyo Kk 表面検査装置
US4691231A (en) * 1985-10-01 1987-09-01 Vistech Corporation Bottle inspection system
DE68923653T2 (de) * 1988-05-30 1996-01-18 Kirin Techno Syst Yokohama Verfahren und Vorrichtung zur Prüfung der Seitenwände von Flaschen.

Also Published As

Publication number Publication date
JPH06100555B2 (ja) 1994-12-12
AU8977391A (en) 1992-06-25
AU647558B2 (en) 1994-03-24
US5216481A (en) 1993-06-01
JPH04220551A (ja) 1992-08-11
EP0491555A1 (en) 1992-06-24
DE69120517T2 (de) 1996-12-19
DE69120517D1 (de) 1996-08-01
EP0491555B1 (en) 1996-06-26
CA2057670A1 (en) 1992-06-20
KR0166593B1 (ko) 1999-05-01

Similar Documents

Publication Publication Date Title
KR920012905A (ko) 투명물체의 결함검사 방법 및 그 장치
CA2053176A1 (en) Method of and apparatus for inspecting bottle or the like
KR910012993A (ko) 땜납 접합부 탐지 시스템 및 방법
KR20000071087A (ko) 옥외용 거리 계측 장치
JPH0743326B2 (ja) 物体端部の欠陥検査方法及びその装置
KR880005001A (ko) 병의 나사 입구부 결함 검출장치
EP0974832B1 (en) Apparatus and method for detecting light or dark blemishes
JPH05180781A (ja) 表面欠陥検査方法及び装置
JPH04118546A (ja) 瓶検査装置
JPH0579999A (ja) びん内沈降異物の検査装置
JPH0752161B2 (ja) 透明容器内の粉末中異物の検査装置
JPH04216445A (ja) 瓶検査装置
US6768812B1 (en) Method for locating features on an object using varied illumination
JP2008203229A (ja) 電子部品の端子位置検出方法
KR940005944A (ko) 표면결함검사장치
JP2003139524A (ja) 検査装置
JP2565000B2 (ja) コンデンサ極性検査装置
US5995216A (en) Pattern inspection apparatus
JP2001091470A (ja) 欠陥検査装置
JP2683246B2 (ja) 欠陥検出方法
JP2010223914A (ja) 物体表面の欠陥検査方法および欠陥検査装置
KR970002350A (ko) 인쇄 회로 기판상의 부품 실장 상태 검사 방법 및 장치
JPH0357944A (ja) 板ガラス欠点検出装置
JPS6027064B2 (ja) ラベルの表裏検査装置
JPH02278105A (ja) 半田付検査装置

Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
LAPS Lapse due to unpaid annual fee