KR920012905A - 투명물체의 결함검사 방법 및 그 장치 - Google Patents
투명물체의 결함검사 방법 및 그 장치 Download PDFInfo
- Publication number
- KR920012905A KR920012905A KR1019910023354A KR910023354A KR920012905A KR 920012905 A KR920012905 A KR 920012905A KR 1019910023354 A KR1019910023354 A KR 1019910023354A KR 910023354 A KR910023354 A KR 910023354A KR 920012905 A KR920012905 A KR 920012905A
- Authority
- KR
- South Korea
- Prior art keywords
- value
- pitch
- transparent object
- dark
- pixel data
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
- G01N21/9036—Investigating the presence of flaws or contamination in a container or its contents using arrays of emitters or receivers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry
- G01N2021/8832—Structured background, e.g. for transparent objects
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/8877—Proximity analysis, local statistics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Abstract
내용 없음
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명에 의한 투명물체의 결함 검사장치의 블럭도, 제2도는 본 발명에 의한 방법의 개념도, 제3도는 기준패턴의 일실시예의 상태도.
Claims (5)
- 명암이 소정의 피치(P)로서 규칙성으로 가지며 연속되는 모아레등의 기준패턴을, 그대로 또는 결함이 없는 정상적인 투명물체에 비추어서, 고체촬상소자에 의한 이미지센서로 수광하고, 그와 같이 수광된 폐턴의 명암의 화소수로부터 상기 피치(P)를 검출한 후, 동일한 기준 패턴을 검사대상인 투명물체에 비추어 같은 이미지센서로 수광하고, 그 화소데이터에 대하여, 상기 검출피치(P)를 기준으로 하는 소정 화소수만틈 떨어진 두개의 화소데이터의 평균치로부터 기준치를 설정하여, 그 기준치에 따라 각 화소의 명암을 판정하고, 그 명암수로부터 결합을 판정하는 것을 특징으로 하는 투명물체의 결함검사방법.
- 제1항에 있어서, 전기 검출피치(P)의 2분의 1만큼 떨어진 두개의 화소데이터의 평균치로부터 기준치를 설정하는 것을 특징으로 하는 투명물체의 결함검사방법.
- 제1항 또는 제2항에 있어서, 전기 평균치에 보정치를 가한 상기준치, 그 보정치를 뺀 값을 하기준치로 하고, 각 화소데이터가 이들 상하 기준치의 사이에 있을 때는 어두움(暗) 그 이외일 때는 밝음(明)으로 판정하는 것을 특징으로 하는 투명물체의 결함검사방법.
- 제1항, 제2항또는 제3항에 있어서, 상기 상기준치의 명암판정후, 다시금 단위면적당 복수의 화소군에 대하여 명암각각의 화소수를 계수하고, 그 차이에 따라 각 화소의 명암을 결정하는 것을 특징으로 하는 투명물체의 결함검사방법.
- 명암이 소정의 피치(P)로 규칙성을 가지고 연속되는 모아레등의 기준패턴과, 그 기준패턴을 투명물체에 비추어서 수광하는 고체촬상소자에 의한 이미지 센서와, 정상적인 투명물체에 비추거나 그대로 그 이미지센서에 의해 수광된 기준패턴의 상(像)의 명암의 화소수로부터 상기 피치(P)를 검출하는 기준패턴피치 검출수단과, 검사대상인 투명물체에 비추어 상기 이미지센서에 수광된 상기 기준패턴의 화소데이터에 대하여 상기 검출피치(P)를 기준으로 하는 소정 화소수만틈 떨어진 두개의 화소데이터의 평균치를 산출하는 평균치산출수단과, 그 평균치로부터 명암판정레벨이 상하 기준치를 설정하는 기준치 설정수단과, 상기 화소데이타가 상기 상기준치 사이에 있을 때는 어두움(暗), 그 이외의 때는 밝음(明)으로 판정하므로 기준패턴에 의한 데이터를 소거하는 기준패턴 소거수단과, 그 소거후에 화소데이터에 대하여 단위 면적당의 복수의 화수군에 대하여 그 명암 각각의 화소수를 계수하여, 그 차이에 따라 각 화소의 명암을 결정하는 명암결정수단과, 그와 같이 결정된 명암수에 의해 결함을 판정하는 결함판정수단을 갖추어서 되는 것을 특징으로 하는 투명물에의 결함검사장치.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP90-411634 | 1990-12-19 | ||
JP2411634A JPH06100555B2 (ja) | 1990-12-19 | 1990-12-19 | 透明物体の欠陥検査方法とその装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR920012905A true KR920012905A (ko) | 1992-07-28 |
KR0166593B1 KR0166593B1 (ko) | 1999-05-01 |
Family
ID=18520604
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019910023354A KR0166593B1 (ko) | 1990-12-19 | 1991-12-18 | 투명물체의 결함검사방법 및 그 장치 |
Country Status (7)
Country | Link |
---|---|
US (1) | US5216481A (ko) |
EP (1) | EP0491555B1 (ko) |
JP (1) | JPH06100555B2 (ko) |
KR (1) | KR0166593B1 (ko) |
AU (1) | AU647558B2 (ko) |
CA (1) | CA2057670A1 (ko) |
DE (1) | DE69120517T2 (ko) |
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---|---|---|---|---|
JPS5546172A (en) * | 1978-09-29 | 1980-03-31 | Kirin Brewery Co Ltd | Detector for foreign material |
DE3237511A1 (de) * | 1982-10-09 | 1984-04-12 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München | Verfahren zur pruefung von glaserzeugnissen |
JPS61100604A (ja) * | 1984-10-24 | 1986-05-19 | Hajime Sangyo Kk | 表面検査装置 |
US4691231A (en) * | 1985-10-01 | 1987-09-01 | Vistech Corporation | Bottle inspection system |
DE68923653T2 (de) * | 1988-05-30 | 1996-01-18 | Kirin Techno Syst Yokohama | Verfahren und Vorrichtung zur Prüfung der Seitenwände von Flaschen. |
-
1990
- 1990-12-19 JP JP2411634A patent/JPH06100555B2/ja not_active Expired - Lifetime
-
1991
- 1991-12-13 CA CA002057670A patent/CA2057670A1/en not_active Abandoned
- 1991-12-17 US US07/808,620 patent/US5216481A/en not_active Expired - Fee Related
- 1991-12-17 EP EP91311715A patent/EP0491555B1/en not_active Expired - Lifetime
- 1991-12-17 AU AU89773/91A patent/AU647558B2/en not_active Ceased
- 1991-12-17 DE DE69120517T patent/DE69120517T2/de not_active Expired - Fee Related
- 1991-12-18 KR KR1019910023354A patent/KR0166593B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JPH06100555B2 (ja) | 1994-12-12 |
AU8977391A (en) | 1992-06-25 |
AU647558B2 (en) | 1994-03-24 |
US5216481A (en) | 1993-06-01 |
JPH04220551A (ja) | 1992-08-11 |
EP0491555A1 (en) | 1992-06-24 |
DE69120517T2 (de) | 1996-12-19 |
DE69120517D1 (de) | 1996-08-01 |
EP0491555B1 (en) | 1996-06-26 |
CA2057670A1 (en) | 1992-06-20 |
KR0166593B1 (ko) | 1999-05-01 |
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