KR850000803A - 반도체 장치 - Google Patents

반도체 장치 Download PDF

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Publication number
KR850000803A
KR850000803A KR1019840002606A KR840002606A KR850000803A KR 850000803 A KR850000803 A KR 850000803A KR 1019840002606 A KR1019840002606 A KR 1019840002606A KR 840002606 A KR840002606 A KR 840002606A KR 850000803 A KR850000803 A KR 850000803A
Authority
KR
South Korea
Prior art keywords
impurity region
semiconductor devices
semiconductor
output pad
semiconductor element
Prior art date
Application number
KR1019840002606A
Other languages
English (en)
Other versions
KR900003257B1 (ko
Inventor
다깨히대 시라도
Original Assignee
야마모도 다꾸마
후지쓰 가부시끼가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 야마모도 다꾸마, 후지쓰 가부시끼가이샤 filed Critical 야마모도 다꾸마
Publication of KR850000803A publication Critical patent/KR850000803A/ko
Application granted granted Critical
Publication of KR900003257B1 publication Critical patent/KR900003257B1/ko

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Power Engineering (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Optics & Photonics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Mechanical Optical Scanning Systems (AREA)
  • Laser Beam Printer (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)

Abstract

내용 없음.

Description

반도체 장치
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 종래의 정전보호회로를 나터내는 도면. 제2도는 본 발명의 일실시예의 평면도. 제3도는 제2도의 장치의입력회로부를 형성하는 공정에 있어서의 반도체 장치 요부의 단면도.

Claims (1)

  1. 반도체기판(基板)상에 형성한 반도체소자(素子), 입력 또는 출력팻드 및 전기(前記) 입출력팻드와 반도체소자를 접속하는 회로를 포함하며, 전기(前記) 입출력팻드와 반도체 소자는 상기한 반도체소자의 불순물영역보다도 깊이 형성된 제1의 불순물영역과 이 제1의 불순물영역보다 얕은 깊이에 형성된 제2의 불순물영역으 되는 보호회로 소자를 거쳐 접속되는 것을 특징으로 하는 반도체 장치.
    ※참고사항:최초출원 내용에 의하여 공개하는 것임.
KR1019840002606A 1983-06-30 1984-05-14 보호회로를 갖는 반도체장치 KR900003257B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP58-119083 1983-06-30
JP58119083A JPS6010765A (ja) 1983-06-30 1983-06-30 半導体装置

Publications (2)

Publication Number Publication Date
KR850000803A true KR850000803A (ko) 1985-03-09
KR900003257B1 KR900003257B1 (ko) 1990-05-12

Family

ID=14752456

Family Applications (2)

Application Number Title Priority Date Filing Date
KR1019840002606A KR900003257B1 (ko) 1983-06-30 1984-05-14 보호회로를 갖는 반도체장치
KR8403791A KR900002967B1 (en) 1983-06-30 1984-06-30 Light beam scanning apparatus

Family Applications After (1)

Application Number Title Priority Date Filing Date
KR8403791A KR900002967B1 (en) 1983-06-30 1984-06-30 Light beam scanning apparatus

Country Status (6)

Country Link
US (1) US4720737A (ko)
EP (1) EP0130412B1 (ko)
JP (1) JPS6010765A (ko)
KR (2) KR900003257B1 (ko)
CA (1) CA1204524A (ko)
DE (1) DE3469246D1 (ko)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0659364B2 (ja) * 1985-08-23 1994-08-10 株式会社日立製作所 放射性有機溶媒のイオン処理装置
JPS6271275A (ja) * 1985-09-25 1987-04-01 Toshiba Corp 半導体集積回路
IT1186227B (it) * 1985-12-03 1987-11-18 Sgs Microelettronica Spa Dispositivo di protezione contro le sovratensioni in ingresso per un circuito integrato di tipo mos
JPH065749B2 (ja) * 1986-05-22 1994-01-19 日本電気株式会社 半導体装置
USRE37477E1 (en) * 1987-11-06 2001-12-18 Sgs-Thomson Microelectronics, Inc. Integrated circuit protected against electrostatic discharges, with variable protection threshold
FR2623018B1 (fr) * 1987-11-06 1990-02-09 Thomson Semiconducteurs Circuit integre protege contre les decharges electrostatiques avec seuil de protection variable
US5141898A (en) * 1988-02-02 1992-08-25 Analog Devices, Incorporated Integrated circuit with means for reducing ESD damage
US5687109A (en) * 1988-05-31 1997-11-11 Micron Technology, Inc. Integrated circuit module having on-chip surge capacitors
US6124625A (en) 1988-05-31 2000-09-26 Micron Technology, Inc. Chip decoupling capacitor
CA2021184C (en) * 1990-07-13 2000-10-17 Orchard-Webb, John Input protection device
EP0517391A1 (en) * 1991-06-05 1992-12-09 STMicroelectronics, Inc. ESD protection circuit
JPH0617257U (ja) * 1992-07-30 1994-03-04 鐘淵化学工業株式会社 太陽電池モジュール
BE1007672A3 (nl) * 1993-10-27 1995-09-12 Philips Electronics Nv Hoogfrequent halfgeleiderinrichting met beveiligingsinrichting.
FR2716294B1 (fr) 1994-01-28 1996-05-31 Sgs Thomson Microelectronics Procédé de réalisation d'un transistor bipolaire pour protection d'un circuit intégré contre les décharges électrostatiques.
JPH0951078A (ja) * 1995-05-29 1997-02-18 Mitsubishi Electric Corp 半導体記憶装置および半導体装置
JP3019760B2 (ja) * 1995-11-15 2000-03-13 日本電気株式会社 半導体集積回路装置
US6410964B1 (en) * 1998-03-31 2002-06-25 Nec Corporation Semiconductor device capable of preventing gate oxide film from damage by plasma process and method of manufacturing the same
US6114756A (en) 1998-04-01 2000-09-05 Micron Technology, Inc. Interdigitated capacitor design for integrated circuit leadframes
US6414391B1 (en) * 1998-06-30 2002-07-02 Micron Technology, Inc. Module assembly for stacked BGA packages with a common bus bar in the assembly
US20020060343A1 (en) * 1999-03-19 2002-05-23 Robert J. Gauthier Diffusion resistor/capacitor (drc) non-aligned mosfet structure
JP3678212B2 (ja) * 2002-05-20 2005-08-03 ウシオ電機株式会社 超高圧水銀ランプ
US6755700B2 (en) * 2002-11-12 2004-06-29 Modevation Enterprises Inc. Reset speed control for watercraft

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1170705A (en) * 1967-02-27 1969-11-12 Hitachi Ltd An Insulated Gate Type Field Effect Semiconductor Device having a Breakdown Preventing Circuit Device and a method of manufacturing the same
US3673428A (en) * 1970-09-18 1972-06-27 Rca Corp Input transient protection for complementary insulated gate field effect transistor integrated circuit device
JPS5189392A (ko) * 1975-02-03 1976-08-05
US4100561A (en) * 1976-05-24 1978-07-11 Rca Corp. Protective circuit for MOS devices
JPS5392675A (en) * 1977-01-26 1978-08-14 Nippon Precision Circuits Protecting circuit
JPS54140480A (en) * 1978-04-24 1979-10-31 Hitachi Ltd Semiconductor device
US4476476A (en) * 1979-04-05 1984-10-09 National Semiconductor Corporation CMOS Input and output protection circuit
JPS5694664A (en) * 1979-12-27 1981-07-31 Fujitsu Ltd Semiconductor element
JPS56138953A (en) * 1980-03-31 1981-10-29 Fujitsu Ltd Semiconductor device
JPS5715459A (en) * 1980-07-01 1982-01-26 Fujitsu Ltd Semiconductor integrated circuit
JPS57109375A (en) * 1980-12-26 1982-07-07 Fujitsu Ltd Mis type transistor protection circuit
US4602267A (en) * 1981-02-17 1986-07-22 Fujitsu Limited Protection element for semiconductor device
JPS57190359A (en) * 1981-05-19 1982-11-22 Toshiba Corp Protecting device for semiconductor
JPS57190360A (en) * 1981-05-19 1982-11-22 Toshiba Corp Protecting device for semiconductor
JPS57211272A (en) * 1981-06-23 1982-12-25 Toshiba Corp Semiconductor device
JPS5952866A (ja) * 1982-09-20 1984-03-27 Fujitsu Ltd 半導体装置

Also Published As

Publication number Publication date
DE3469246D1 (en) 1988-03-10
KR900002967B1 (en) 1990-05-03
JPH0348663B2 (ko) 1991-07-25
EP0130412B1 (en) 1988-02-03
EP0130412A1 (en) 1985-01-09
KR900003257B1 (ko) 1990-05-12
KR850000705A (ko) 1985-02-28
US4720737A (en) 1988-01-19
JPS6010765A (ja) 1985-01-19
CA1204524A (en) 1986-05-13

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