KR100841269B1 - Ⅲ족 질화물 반도체 다층구조물 - Google Patents

Ⅲ족 질화물 반도체 다층구조물 Download PDF

Info

Publication number
KR100841269B1
KR100841269B1 KR20067013720A KR20067013720A KR100841269B1 KR 100841269 B1 KR100841269 B1 KR 100841269B1 KR 20067013720 A KR20067013720 A KR 20067013720A KR 20067013720 A KR20067013720 A KR 20067013720A KR 100841269 B1 KR100841269 B1 KR 100841269B1
Authority
KR
South Korea
Prior art keywords
group iii
nitride semiconductor
layer
substrate
iii nitride
Prior art date
Application number
KR20067013720A
Other languages
English (en)
Korean (ko)
Other versions
KR20060112685A (ko
Inventor
야스히토 우라시마
Original Assignee
쇼와 덴코 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 쇼와 덴코 가부시키가이샤 filed Critical 쇼와 덴코 가부시키가이샤
Publication of KR20060112685A publication Critical patent/KR20060112685A/ko
Application granted granted Critical
Publication of KR100841269B1 publication Critical patent/KR100841269B1/ko

Links

Images

Landscapes

  • Led Devices (AREA)
KR20067013720A 2004-01-26 2005-01-25 Ⅲ족 질화물 반도체 다층구조물 KR100841269B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004017368 2004-01-26
JPJP-P-2004-00017368 2004-01-26

Publications (2)

Publication Number Publication Date
KR20060112685A KR20060112685A (ko) 2006-11-01
KR100841269B1 true KR100841269B1 (ko) 2008-06-25

Family

ID=37620871

Family Applications (1)

Application Number Title Priority Date Filing Date
KR20067013720A KR100841269B1 (ko) 2004-01-26 2005-01-25 Ⅲ족 질화물 반도체 다층구조물

Country Status (3)

Country Link
KR (1) KR100841269B1 (zh)
CN (1) CN100524624C (zh)
TW (1) TWI258873B (zh)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101066135B1 (ko) * 2006-05-10 2011-09-20 쇼와 덴코 가부시키가이샤 Ⅲ족 질화물 화합물 반도체 적층 구조체
TWI398016B (zh) * 2007-02-07 2013-06-01 Advanced Optoelectronic Tech 具三族氮化合物半導體緩衝層之光電半導體元件及其製造方法
CN101452976B (zh) * 2007-12-06 2011-03-30 泰谷光电科技股份有限公司 高亮度发光二极管结构
EP2589069A2 (en) * 2010-06-30 2013-05-08 Corning Incorporated Method for finishing silicon on insulator substrates
US20140027770A1 (en) * 2011-04-08 2014-01-30 Kazuyuki IIzuka Semiconductor laminate and process for production thereof, and semiconductor element
CN103107257B (zh) * 2011-11-10 2015-09-09 展晶科技(深圳)有限公司 Led磊晶结构及制程
CN108461589B (zh) * 2018-03-27 2019-11-12 华灿光电(浙江)有限公司 一种发光二极管的外延片及其制作方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10125608A (ja) * 1996-10-24 1998-05-15 Showa Denko Kk 化合物半導体エピタキシャルウエハ
JP2000319099A (ja) * 1999-05-07 2000-11-21 Hiroyuki Matsunami SiCウエハ、SiC半導体デバイス、および、SiCウエハの製造方法
JP2002093726A (ja) * 2000-07-13 2002-03-29 Univ Meijo 半導体素子の製造方法及び半導体素子
US20030207125A1 (en) * 1999-10-22 2003-11-06 Nec Corporation Base substrate for crystal growth and manufacturing method of substrate by using the same

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10125608A (ja) * 1996-10-24 1998-05-15 Showa Denko Kk 化合物半導体エピタキシャルウエハ
JP2000319099A (ja) * 1999-05-07 2000-11-21 Hiroyuki Matsunami SiCウエハ、SiC半導体デバイス、および、SiCウエハの製造方法
US20030207125A1 (en) * 1999-10-22 2003-11-06 Nec Corporation Base substrate for crystal growth and manufacturing method of substrate by using the same
JP2002093726A (ja) * 2000-07-13 2002-03-29 Univ Meijo 半導体素子の製造方法及び半導体素子

Also Published As

Publication number Publication date
CN100524624C (zh) 2009-08-05
TW200531314A (en) 2005-09-16
CN1910738A (zh) 2007-02-07
TWI258873B (en) 2006-07-21
KR20060112685A (ko) 2006-11-01

Similar Documents

Publication Publication Date Title
US7935955B2 (en) Group III nitride semiconductor multilayer structure
JP5406871B2 (ja) 窒化物半導体構造の製造方法および発光ダイオード
JP4371202B2 (ja) 窒化物半導体の製造方法及び半導体ウエハ並びに半導体デバイス
JP4529846B2 (ja) Iii−v族窒化物系半導体基板及びその製造方法
CN102714145B (zh) 第iii族氮化物半导体生长基板、外延基板、元件、自立基板及其制造方法
KR100449074B1 (ko) 반도체의 제조 방법 및 반도체 발광 소자
US20100059759A1 (en) Nitride semiconductor light emitting device and method for forming the same
US9190268B2 (en) Method for producing Ga-containing group III nitride semiconductor
JP2005244202A (ja) Iii族窒化物半導体積層物
JP5979547B2 (ja) エピタキシャルウェハ及びその製造方法
KR100841269B1 (ko) Ⅲ족 질화물 반도체 다층구조물
JP4734786B2 (ja) 窒化ガリウム系化合物半導体基板、及びその製造方法
JP2017028076A (ja) Iii族窒化物発光素子の製造方法
JP2009023853A (ja) Iii−v族窒化物系半導体基板及びその製造方法、並びにiii−v族窒化物系半導体デバイス
JP4359770B2 (ja) Iii−v族窒化物系半導体基板及びその製造ロット
JP4016062B2 (ja) 窒化物半導体構造とその製造方法および発光素子
JP7350477B2 (ja) 半導体成長用基板、半導体素子、半導体発光素子および半導体成長用基板の製造方法
JP2010251743A (ja) Iii族窒化物半導体成長用基板、iii族窒化物半導体自立基板、iii族窒化物半導体素子、ならびに、これらの製造方法
JP3987879B2 (ja) 窒化物半導体発光素子とその製造方法
JP5080820B2 (ja) 窒化物半導体構造とその製造方法および発光素子
JP5076094B2 (ja) Iii族窒化物単結晶の製造方法、金属窒化物層を有する下地結晶基板、および多層構造ウエハ
JP2020061510A (ja) 半導体成長用基板、半導体素子、半導体発光素子および半導体素子製造方法
JP4420128B2 (ja) Iii−v族窒化物系半導体デバイス及びその製造方法
JP3950471B2 (ja) 窒化物半導体構造とその製造方法および発光素子
JP2005045153A (ja) 窒化物半導体の製造方法及び半導体ウエハ並びに半導体デバイス

Legal Events

Date Code Title Description
A201 Request for examination
AMND Amendment
E902 Notification of reason for refusal
AMND Amendment
E601 Decision to refuse application
AMND Amendment
J201 Request for trial against refusal decision
B701 Decision to grant
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20130531

Year of fee payment: 6

FPAY Annual fee payment

Payment date: 20140603

Year of fee payment: 7

FPAY Annual fee payment

Payment date: 20150518

Year of fee payment: 8

FPAY Annual fee payment

Payment date: 20160517

Year of fee payment: 9

FPAY Annual fee payment

Payment date: 20170522

Year of fee payment: 10

FPAY Annual fee payment

Payment date: 20180530

Year of fee payment: 11

FPAY Annual fee payment

Payment date: 20190530

Year of fee payment: 12