JPS643546A - Detection of solid surface and internal defect by photoelasticity method - Google Patents
Detection of solid surface and internal defect by photoelasticity methodInfo
- Publication number
- JPS643546A JPS643546A JP15856687A JP15856687A JPS643546A JP S643546 A JPS643546 A JP S643546A JP 15856687 A JP15856687 A JP 15856687A JP 15856687 A JP15856687 A JP 15856687A JP S643546 A JPS643546 A JP S643546A
- Authority
- JP
- Japan
- Prior art keywords
- defect
- polarizers
- main axes
- dust
- affected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
PURPOSE:To detect the defect of a material to be inspected without being affected by dust, etc., sticking thereto by using a photoelasticity experimenting apparatus of a flat plane polarization type and synthesizing >=2 picture element signals specified in the angle between the main axes of polarizers. CONSTITUTION:The light from a light source 4 which emits continuous rays of an adequate wavelength is transmitted through the material 1 to be inspected disposed between the polarizers 2 via lenses 3 and is projected to a photodetector 6 of a video camera, etc. The polarizers 2 are rotated by motors M in the state of the main axes thereof intersecting orthogonally with each other and the image is picked up in such a manner that the angle theta between the main axes thereof attains the value approximate to pi(2n+1)/4 (n is an integer). The brightnesses at the respective points corresponding to the two image signals of such relative angle are added by which the value corresponding to the main stress is obtd. The stresses concentrate near to the defect of material in general and, therefore, the defect is detectable without being affected by the dust, etc.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15856687A JPS643546A (en) | 1987-06-25 | 1987-06-25 | Detection of solid surface and internal defect by photoelasticity method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15856687A JPS643546A (en) | 1987-06-25 | 1987-06-25 | Detection of solid surface and internal defect by photoelasticity method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS643546A true JPS643546A (en) | 1989-01-09 |
Family
ID=15674496
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15856687A Pending JPS643546A (en) | 1987-06-25 | 1987-06-25 | Detection of solid surface and internal defect by photoelasticity method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS643546A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5325755A (en) * | 1990-03-23 | 1994-07-05 | Kabushiki Kaisha Komatsu Seisakusho | Punch press |
WO1998015871A1 (en) * | 1996-10-07 | 1998-04-16 | Hitachi, Ltd. | Method of manufacturing liquid crystal display, optically inspecting instrument, and optically inspecting method |
KR20010063550A (en) * | 1999-12-22 | 2001-07-09 | 권문구 | Measurement method of mechanical stress in cable insulation |
JP2013088293A (en) * | 2011-10-18 | 2013-05-13 | Niigata Univ | Method for detecting cutting plane |
-
1987
- 1987-06-25 JP JP15856687A patent/JPS643546A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5325755A (en) * | 1990-03-23 | 1994-07-05 | Kabushiki Kaisha Komatsu Seisakusho | Punch press |
WO1998015871A1 (en) * | 1996-10-07 | 1998-04-16 | Hitachi, Ltd. | Method of manufacturing liquid crystal display, optically inspecting instrument, and optically inspecting method |
KR20010063550A (en) * | 1999-12-22 | 2001-07-09 | 권문구 | Measurement method of mechanical stress in cable insulation |
JP2013088293A (en) * | 2011-10-18 | 2013-05-13 | Niigata Univ | Method for detecting cutting plane |
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