JPS57180140A - Mutual connecting defect detector for logic circuit - Google Patents
Mutual connecting defect detector for logic circuitInfo
- Publication number
- JPS57180140A JPS57180140A JP57028037A JP2803782A JPS57180140A JP S57180140 A JPS57180140 A JP S57180140A JP 57028037 A JP57028037 A JP 57028037A JP 2803782 A JP2803782 A JP 2803782A JP S57180140 A JPS57180140 A JP S57180140A
- Authority
- JP
- Japan
- Prior art keywords
- output
- logic circuit
- voltage level
- input
- comparator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0751—Error or fault detection not based on redundancy
- G06F11/0754—Error or fault detection not based on redundancy by exceeding limits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318505—Test of Modular systems, e.g. Wafers, MCM's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/70—Testing of connections between components and printed circuit boards
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Tests Of Electronic Circuits (AREA)
- Logic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/255,929 US4395767A (en) | 1981-04-20 | 1981-04-20 | Interconnect fault detector for LSI logic chips |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57180140A true JPS57180140A (en) | 1982-11-06 |
Family
ID=22970433
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57028037A Pending JPS57180140A (en) | 1981-04-20 | 1982-02-23 | Mutual connecting defect detector for logic circuit |
Country Status (6)
Country | Link |
---|---|
US (1) | US4395767A (ja) |
EP (1) | EP0063407B1 (ja) |
JP (1) | JPS57180140A (ja) |
AU (1) | AU551062B2 (ja) |
CA (1) | CA1181531A (ja) |
DE (1) | DE3274300D1 (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01154546A (ja) * | 1987-12-10 | 1989-06-16 | Fujitsu Ltd | 端子開放検出回路半導体装置 |
JP2007155444A (ja) * | 2005-12-02 | 2007-06-21 | Denso Corp | 断線検出装置 |
JP2012078332A (ja) * | 2009-10-09 | 2012-04-19 | Elpida Memory Inc | 半導体装置、半導体装置の試験方法、及びデータ処理システム。 |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4504784A (en) * | 1981-07-02 | 1985-03-12 | International Business Machines Corporation | Method of electrically testing a packaging structure having N interconnected integrated circuit chips |
US4494066A (en) * | 1981-07-02 | 1985-01-15 | International Business Machines Corporation | Method of electrically testing a packaging structure having n interconnected integrated circuit chips |
JPS58115372A (ja) * | 1981-12-29 | 1983-07-09 | Fujitsu Ltd | 半導体装置試験回路 |
US4509008A (en) * | 1982-04-20 | 1985-04-02 | International Business Machines Corporation | Method of concurrently testing each of a plurality of interconnected integrated circuit chips |
US4660198A (en) * | 1985-04-15 | 1987-04-21 | Control Data Corporation | Data capture logic for VLSI chips |
JPH0255355U (ja) * | 1988-10-11 | 1990-04-20 | ||
US5070296A (en) * | 1990-06-22 | 1991-12-03 | Honeywell Inc. | Integrated circuit interconnections testing |
US5291075A (en) * | 1990-10-01 | 1994-03-01 | Motorola, Inc. | Fault detection circuit |
WO1992013281A1 (en) * | 1991-01-22 | 1992-08-06 | Vlsi Technology, Inc. | Method to reduce test vectors/test time in devices using equivalent blocks |
JP2884847B2 (ja) * | 1991-10-03 | 1999-04-19 | 三菱電機株式会社 | 故障検出機能を備えた半導体集積回路装置の製造方法 |
US5278841A (en) * | 1991-10-30 | 1994-01-11 | International Business Machines Corporation | Method and apparatus for diagnosing net interconnect faults using echo pulsed signals |
JP3377225B2 (ja) * | 1992-04-07 | 2003-02-17 | 富士写真フイルム株式会社 | チェック回路を含む集積回路 |
US5581176A (en) * | 1993-05-24 | 1996-12-03 | North American Philips Corporation | Analog autonomous test bus framework for testing integrated circuits on a printed circuit board |
GB2278689B (en) * | 1993-06-02 | 1997-03-19 | Ford Motor Co | Method and apparatus for testing integrated circuits |
JPH07167920A (ja) * | 1993-10-18 | 1995-07-04 | Fujitsu Ltd | Lsi |
FR2732133B1 (fr) * | 1995-03-21 | 1997-04-25 | Sgs Thomson Microelectronics | Detecteur de coherence d'informations contenues dans un circuit integre |
DE19723079C1 (de) * | 1997-06-02 | 1998-11-19 | Bosch Gmbh Robert | Fehlerdiagnosevorrichtung und -verfahren |
JP3361472B2 (ja) * | 1999-04-02 | 2003-01-07 | 松下電器産業株式会社 | アナログ・バウンダリ・スキャン対応集積回路装置 |
US6804803B2 (en) | 2001-04-05 | 2004-10-12 | International Business Machines Corporation | Method for testing integrated logic circuits |
US7049842B2 (en) * | 2003-12-18 | 2006-05-23 | Texas Instruments Incorporated | Simultaneous pin short and continuity test on IC packages |
JP4315853B2 (ja) * | 2004-04-08 | 2009-08-19 | 富士通株式会社 | Icカード機能を有した携帯機器 |
US9363469B2 (en) | 2008-07-17 | 2016-06-07 | Ppc Broadband, Inc. | Passive-active terminal adapter and method having automatic return loss control |
US8699356B2 (en) * | 2010-12-20 | 2014-04-15 | Deere & Company | Method and system for diagnosing a fault or open circuit in a network |
TWI477788B (zh) * | 2012-04-10 | 2015-03-21 | Realtek Semiconductor Corp | 偵測發光二極體短路的方法及其裝置 |
FR3090888B1 (fr) * | 2018-12-19 | 2020-11-27 | Continental Automotive France | Dispositif de détection automatique de couplage entre dispositifs électronique |
CN111458621B (zh) * | 2019-01-21 | 2022-03-01 | 华邦电子股份有限公司 | 集成电路及其多芯片状态的检测方法 |
CN110297737B (zh) * | 2019-07-10 | 2023-11-14 | 北京汽车股份有限公司 | 多路输出芯片的故障诊断测试方法及装置 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1951861A1 (de) * | 1968-10-17 | 1970-08-06 | Gen Electric Information Syste | Verfahren und Anordnung zur automatischen UEberpruefung von Karten mit gedruckten Schaltungen |
US3746973A (en) * | 1972-05-05 | 1973-07-17 | Ibm | Testing of metallization networks on insulative substrates supporting semiconductor chips |
US3784910A (en) * | 1972-07-13 | 1974-01-08 | Teradyne Inc | Sequential addressing network testing system |
US3851161A (en) * | 1973-05-07 | 1974-11-26 | Burroughs Corp | Continuity network testing and fault isolating |
US4001818A (en) * | 1975-10-22 | 1977-01-04 | Storage Technology Corporation | Digital circuit failure detector |
US4009437A (en) * | 1976-03-31 | 1977-02-22 | Burroughs Corporation | Net analyzer for electronic circuits |
GB1555026A (en) * | 1976-04-03 | 1979-11-07 | Ibm | Circuit testing apparatus |
US4183460A (en) * | 1977-12-23 | 1980-01-15 | Burroughs Corporation | In-situ test and diagnostic circuitry and method for CML chips |
US4176258A (en) * | 1978-05-01 | 1979-11-27 | Intel Corporation | Method and circuit for checking integrated circuit chips |
US4233682A (en) * | 1978-06-15 | 1980-11-11 | Sperry Corporation | Fault detection and isolation system |
US4220917A (en) * | 1978-07-31 | 1980-09-02 | International Business Machines Corporation | Test circuitry for module interconnection network |
US4241307A (en) * | 1978-08-18 | 1980-12-23 | International Business Machines Corporation | Module interconnection testing scheme |
US4271515A (en) * | 1979-03-23 | 1981-06-02 | John Fluke Mfg. Co., Inc. | Universal analog and digital tester |
-
1981
- 1981-04-20 US US06/255,929 patent/US4395767A/en not_active Expired - Fee Related
-
1982
- 1982-02-23 JP JP57028037A patent/JPS57180140A/ja active Pending
- 1982-03-05 EP EP82301143A patent/EP0063407B1/en not_active Expired
- 1982-03-05 DE DE8282301143T patent/DE3274300D1/de not_active Expired
- 1982-03-26 AU AU81977/82A patent/AU551062B2/en not_active Ceased
- 1982-04-07 CA CA000400678A patent/CA1181531A/en not_active Expired
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01154546A (ja) * | 1987-12-10 | 1989-06-16 | Fujitsu Ltd | 端子開放検出回路半導体装置 |
JP2007155444A (ja) * | 2005-12-02 | 2007-06-21 | Denso Corp | 断線検出装置 |
JP4692255B2 (ja) * | 2005-12-02 | 2011-06-01 | 株式会社デンソー | 断線検出装置 |
JP2012078332A (ja) * | 2009-10-09 | 2012-04-19 | Elpida Memory Inc | 半導体装置、半導体装置の試験方法、及びデータ処理システム。 |
Also Published As
Publication number | Publication date |
---|---|
US4395767A (en) | 1983-07-26 |
EP0063407A1 (en) | 1982-10-27 |
AU551062B2 (en) | 1986-04-17 |
DE3274300D1 (en) | 1987-01-02 |
CA1181531A (en) | 1985-01-22 |
EP0063407B1 (en) | 1986-11-12 |
AU8197782A (en) | 1982-10-28 |
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