JPS5745942A - Semiconductor integrated circuit device - Google Patents

Semiconductor integrated circuit device

Info

Publication number
JPS5745942A
JPS5745942A JP55121396A JP12139680A JPS5745942A JP S5745942 A JPS5745942 A JP S5745942A JP 55121396 A JP55121396 A JP 55121396A JP 12139680 A JP12139680 A JP 12139680A JP S5745942 A JPS5745942 A JP S5745942A
Authority
JP
Japan
Prior art keywords
test
pins
output
inverter
pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55121396A
Other languages
Japanese (ja)
Inventor
Soichi Kawasaki
Soichi Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP55121396A priority Critical patent/JPS5745942A/en
Publication of JPS5745942A publication Critical patent/JPS5745942A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE:To obtain an IC device which can perform the evaluation test of the characteristics of a function circuit by providing only one of pin exclusive for the test. CONSTITUTION:A level signal to be applied to a pin TM is fed through an inverter 14 and an inverter 15 to a function circuit 13. Signals are respectively inputted to the pins I1-In of a decoder 11, and when the output of the inverter 14 is high level, the signals of the pins I1-In are decoded, and one of the test modes of 2<n> types is selected. A test circuit 12 outputs a signal responsive to the test mode. The function circuit 13 communicates signals through the pins I1-In and input/output pins T1- Tn when the output of the inverter 15 is high level to perform the original function, and performs the evaluation test of the characteristics of the respective function blocks in response to the output signal of the testing circuit when the output is low level. According to this configuration, the test modes of 2<n> types can be set with the input pins I1-In, and the pin exclusive for the test may only the pin TM.
JP55121396A 1980-09-02 1980-09-02 Semiconductor integrated circuit device Pending JPS5745942A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55121396A JPS5745942A (en) 1980-09-02 1980-09-02 Semiconductor integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55121396A JPS5745942A (en) 1980-09-02 1980-09-02 Semiconductor integrated circuit device

Publications (1)

Publication Number Publication Date
JPS5745942A true JPS5745942A (en) 1982-03-16

Family

ID=14810148

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55121396A Pending JPS5745942A (en) 1980-09-02 1980-09-02 Semiconductor integrated circuit device

Country Status (1)

Country Link
JP (1) JPS5745942A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58201352A (en) * 1982-05-19 1983-11-24 Nec Corp Integrated circuit device
JPS6053041A (en) * 1983-09-02 1985-03-26 Oki Electric Ind Co Ltd Integrated circuit provided with testing circuit
JPH0252461A (en) * 1988-08-17 1990-02-22 Nec Kyushu Ltd Semiconductor device
JPH02190783A (en) * 1988-12-14 1990-07-26 Samsung Electron Co Ltd Multiple test mode selection circuit

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58201352A (en) * 1982-05-19 1983-11-24 Nec Corp Integrated circuit device
JPH0345546B2 (en) * 1982-05-19 1991-07-11 Nippon Electric Co
JPS6053041A (en) * 1983-09-02 1985-03-26 Oki Electric Ind Co Ltd Integrated circuit provided with testing circuit
JPH0576775B2 (en) * 1983-09-02 1993-10-25 Oki Electric Ind Co Ltd
JPH0252461A (en) * 1988-08-17 1990-02-22 Nec Kyushu Ltd Semiconductor device
JPH02190783A (en) * 1988-12-14 1990-07-26 Samsung Electron Co Ltd Multiple test mode selection circuit

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