GB2214319B - Automatic test equipment - Google Patents
Automatic test equipmentInfo
- Publication number
- GB2214319B GB2214319B GB8902317A GB8902317A GB2214319B GB 2214319 B GB2214319 B GB 2214319B GB 8902317 A GB8902317 A GB 8902317A GB 8902317 A GB8902317 A GB 8902317A GB 2214319 B GB2214319 B GB 2214319B
- Authority
- GB
- United Kingdom
- Prior art keywords
- local
- differential
- measuring circuit
- inputs
- time measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31937—Timing aspects, e.g. measuring propagation delay
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Apparatus for automatically testing electronic circuits (16) includes an AC measurement system (32, 22) and a time measuring circuit (18) for counting clock pulses provided between stop and start event edges presented to it. Two independent input selectors (54, 56) each selectively connect one of a plurality of its inputs to the time measuring circuit, and a plurality of local timing comparators (26, 28) generate an event edge upon receiving a signal crossing a threshold value. Also disclosed are making time measurements of signals at digital and analog pins using local comparators connected to input selectors over deskewed transmission paths and connecting a local comparator (68, 70) to the filter output of an AC measurement instrument (62, 63); and a differential input selector (Fig 2 not shown) for selectively connecting one of a plurality of differential inputs (118) to a differential output (122). <IMAGE>
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB8902317A GB2214319B (en) | 1987-01-16 | 1989-02-02 | Automatic test equipment |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/003,951 US4792932A (en) | 1987-01-16 | 1987-01-16 | Time measurement in automatic test equipment |
US07/003,945 US4755765A (en) | 1987-01-16 | 1987-01-16 | Differential input selector |
GB8800917A GB2200465B (en) | 1987-01-16 | 1988-01-15 | Automatic test equipment |
GB8902317A GB2214319B (en) | 1987-01-16 | 1989-02-02 | Automatic test equipment |
Publications (3)
Publication Number | Publication Date |
---|---|
GB8902317D0 GB8902317D0 (en) | 1989-03-22 |
GB2214319A GB2214319A (en) | 1989-08-31 |
GB2214319B true GB2214319B (en) | 1991-09-25 |
Family
ID=27263745
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB8902317A Expired - Lifetime GB2214319B (en) | 1987-01-16 | 1989-02-02 | Automatic test equipment |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB2214319B (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2251081B (en) * | 1990-12-18 | 1995-08-23 | Motorola Ltd | Automatic analysis apparatus |
US5101150A (en) * | 1991-02-22 | 1992-03-31 | Genrad, Inc. | Automatic circuit tester with separate instrument and scanner buses |
GB2261957B (en) * | 1991-11-16 | 1995-05-17 | Voltech Instr Ltd | Apparatus for testing wound components |
GB2274716A (en) * | 1992-09-22 | 1994-08-03 | Mistrock Microsystems Limited | Circuit tester |
US5418470A (en) * | 1993-10-22 | 1995-05-23 | Tektronix, Inc. | Analog multi-channel probe system |
-
1989
- 1989-02-02 GB GB8902317A patent/GB2214319B/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
GB2214319A (en) | 1989-08-31 |
GB8902317D0 (en) | 1989-03-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20070115 |