JPH0332044A - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit

Info

Publication number
JPH0332044A
JPH0332044A JP16792189A JP16792189A JPH0332044A JP H0332044 A JPH0332044 A JP H0332044A JP 16792189 A JP16792189 A JP 16792189A JP 16792189 A JP16792189 A JP 16792189A JP H0332044 A JPH0332044 A JP H0332044A
Authority
JP
Japan
Prior art keywords
internal
cell
semiconductor integrated
integrated circuit
interface blocks
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16792189A
Other languages
Japanese (ja)
Inventor
Mitsuhiro Emoto
江本 三浩
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP16792189A priority Critical patent/JPH0332044A/en
Publication of JPH0332044A publication Critical patent/JPH0332044A/en
Pending legal-status Critical Current

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  • Design And Manufacture Of Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE:To improve the integration degree in the entire chip by arranging an internal function cell whose shape is exclusively designed in a vacant region formed between interface blocks. CONSTITUTION:An internal function cell 1 is arranged in a vacant region 4 between interface blocks 2. The height of the cell 1 is designed so that the height is equal to or a lower than that of the interface block 2. The arrangement and wiring are performed by the same way by which the interface blocks 2 are wired to function cells within an inner region 3. When the internal function cell 1 whose shape is exclusively designed is arranged in the vacant region 4 between the interface blocks 2 in this way, the integration degree of the entire chip 10 can be enhanced.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半導体集積回路に利用され、特に、自動配置配
線で設計されるスタンダードセル方式の半導体集積回路
に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention is used in semiconductor integrated circuits, and particularly relates to a standard cell type semiconductor integrated circuit designed by automatic placement and wiring.

〔概要〕〔overview〕

本発明は、スタンダードセル方式の半導体集積回路にお
いて、 チップ周辺に配置されたインタフェースブロック間の空
領域に、形状が専用設計された回路構成用の内部機能セ
ルを設けることにより、チップ全体の集積度を高めるよ
うにしたものである。
In a standard cell type semiconductor integrated circuit, the present invention increases the degree of integration of the entire chip by providing internal functional cells for the circuit configuration whose shape is specially designed in the empty area between the interface blocks arranged around the chip. It was designed to increase the

〔従来の技術〕[Conventional technology]

第3図は従来のスタンダードセル方式の半導体集積回路
の一例を示すパターンレイアウト図である。第3図にお
いて、2は外部の回路とのインタフェースをとるための
インタフェースブロック、3は半導体集積回路の機能を
実現するために図形の内部機能ブロックが自動配置配線
される内部領域、4はチップサイズが内部領域3の大き
さで決まる場合にインタフェースブロック2間にできる
空領域、および10はチップである。
FIG. 3 is a pattern layout diagram showing an example of a conventional standard cell type semiconductor integrated circuit. In Figure 3, 2 is an interface block for interfacing with external circuits, 3 is an internal area where the internal functional blocks of the figure are automatically placed and routed to realize the functions of the semiconductor integrated circuit, and 4 is the chip size. is determined by the size of the internal area 3, and 10 is a chip.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

前述した従来のスタンダードセル方式の半導体集積回路
は、インタフェースブロック2をすき間なく並べて配置
したときにできる内部領域3より、大きい内部領域3を
必要とする場合には、第3図および後述の第4図に示す
ようにインタフェースブロック2間に空領域4ができ、
チップ10全体の集積度が低くなる欠点がある。
When the conventional standard cell type semiconductor integrated circuit described above requires a larger internal area 3 than the internal area 3 created when the interface blocks 2 are arranged side by side without any gaps, As shown in the figure, an empty area 4 is created between the interface blocks 2,
This has the disadvantage that the degree of integration of the entire chip 10 is reduced.

本発明の目的は、前記の欠点を除去することにより、チ
ップ全体の集積度を高めることができるスタンダードセ
ル方式の半導体集積回路を提供することにある。
An object of the present invention is to provide a standard cell type semiconductor integrated circuit that can increase the degree of integration of the entire chip by eliminating the above-mentioned drawbacks.

〔問題点を解決するための手段〕[Means for solving problems]

本発明は、回路構成用の一定形状の複数の内部機能セル
が配置された内部セル領域と、この内部セル領域を囲ん
でチップ外周に配置された外部機能セルを含む複数のイ
ンタフェースブロックとを備えたスタンダードセル方式
の半導体集積回路において、前記インタフェースブロッ
ク間の空領域に配置され形状が専用設計された少なくと
も1個の内部機能セルを含むことを特徴とする。
The present invention includes an internal cell area in which a plurality of internal functional cells of a fixed shape for circuit configuration are arranged, and a plurality of interface blocks including external functional cells that surround this internal cell area and are arranged on the outer periphery of a chip. The standard cell type semiconductor integrated circuit is characterized in that it includes at least one internal functional cell whose shape is specially designed and arranged in the empty area between the interface blocks.

〔作用〕[Effect]

本発明は、従来空領域が発生してもそのままにしておい
たのに対し、前記空領域に配置するために専用設計され
た内部機能セルを有している。
The present invention has an internal functional cell specially designed to be placed in the empty area, whereas in the past, even if an empty area occurs, it is left as is.

従って、チップ全体の集積度を高めることが可能となる
Therefore, it becomes possible to increase the degree of integration of the entire chip.

〔実施例〕〔Example〕

以下、本発明の実施例について図面を参照して説明する
Embodiments of the present invention will be described below with reference to the drawings.

第1図は本発明の第一実施例を示すパターンレイアウト
図である。
FIG. 1 is a pattern layout diagram showing a first embodiment of the present invention.

本実施例は、回路構成用の一定形状の複数の図外の内部
機能セルが配置された内部領域3と、この内部領域3を
囲んでチップ10の外周に配置された図外の外部機能セ
ルを含む複数のインタフェースブロック2とを備えたス
タンダードセル方式の半導体集積回路において、 本発明の特徴とするところの、形状が専用設計されイン
タフェースブロック2間の空領域4に配置された複数の
内部機能セル1を含んでいる。
This embodiment includes an internal region 3 in which a plurality of internal functional cells (not shown) of a fixed shape for circuit configuration are arranged, and external functional cells (not shown) arranged around the outer periphery of the chip 10 surrounding this internal region 3. In a standard cell type semiconductor integrated circuit equipped with a plurality of interface blocks 2 including a plurality of interface blocks 2, the present invention is characterized by a plurality of internal functions whose shapes are specially designed and arranged in empty areas 4 between the interface blocks 2. Contains cell 1.

ここで、内部機能セル1は、高さがインタフェースブロ
ック2の高さと同じかインタフェースブロック2より小
さく設計され、配置配線時には、インタフェースブロッ
ク2と内部領域3内の図外の機能セルとを配線するのと
同様に行う。
Here, the internal functional cell 1 is designed to have the same height as the interface block 2 or smaller than the interface block 2, and at the time of placement and wiring, the interface block 2 and an unillustrated functional cell in the internal area 3 are wired. Do the same as.

第4図は、チップ10の一辺の長さがlQmmの正方形
のスタンダードセル方式の半導体集積回路におけるイン
タフェースブロック2の数と空領域4との関係を示す特
性図である。なお、インタフェースブロック2の幅はQ
、2tnm、高さは1mm、チップ10の各コーナー1
mm口の領域には内部機能セル1もインタフェースブロ
ック2も置けないものとする。すなわち、インタフェー
スブロック2と空領域4とが占める面積は、 1+tomx (10mm −2mm)  X 4 =
32mm2となる。例えば、インタフェースブロック2
が80個のとき、空領域4は15mm” になり、この
空領域4に内部機能セルlを配置したとしてチップサイ
ズを計算すると約92mm口になる。従って、この場合
チップ面積は、 に減少する。すなわち、チップ全体の集積度を高めるこ
とができる。
FIG. 4 is a characteristic diagram showing the relationship between the number of interface blocks 2 and the empty area 4 in a square standard cell type semiconductor integrated circuit with each side of the chip 10 having a length of 1Q mm. Note that the width of interface block 2 is Q
, 2tnm, height 1mm, each corner 1 of chip 10
It is assumed that neither the internal functional cell 1 nor the interface block 2 can be placed in the area of the mm opening. That is, the area occupied by the interface block 2 and the empty area 4 is 1+tomx (10mm - 2mm) x 4 =
It becomes 32mm2. For example, interface block 2
When there are 80 cells, the empty area 4 is 15 mm'', and if the internal functional cell l is placed in this empty area 4, the chip size is calculated to be approximately 92 mm. Therefore, in this case, the chip area is reduced to In other words, the degree of integration of the entire chip can be increased.

第2図は本発明の第二実施例の要部を示すパターンレイ
アウト図である。第2図において、5はパッド、6は外
部機能セノペおよび7は外部機能セルとパッドとを結ぶ
配線であり、インタフェースブロック2はバッド5と外
部機能セル6とによって構成される。
FIG. 2 is a pattern layout diagram showing the main parts of a second embodiment of the present invention. In FIG. 2, 5 is a pad, 6 is an external function cell, and 7 is a wiring connecting the external function cell and the pad, and the interface block 2 is constituted by the pad 5 and the external function cell 6.

第1図の第一実施例では、バッド5と外部機能セル6と
が一体となっており、パッド位置に合わせて置かれる外
部機能セル6の間に、専用設計した内部機能セル1を配
置するが、第2図のように、外部機能セル6をチップの
辺の端にすき間なく配置し、バッド5のみ所定の位置に
配置し、配線7で接続することで大きな空領域4が得ら
れ、比較的大規模な内部機能セル1を配置することがで
きる。
In the first embodiment shown in FIG. 1, a pad 5 and an external functional cell 6 are integrated, and a specially designed internal functional cell 1 is placed between the external functional cells 6 placed in accordance with the pad positions. However, as shown in FIG. 2, a large empty area 4 can be obtained by arranging the external functional cells 6 at the edges of the sides of the chip without gaps, arranging only the pads 5 at predetermined positions, and connecting them with wiring 7. A relatively large-scale internal functional cell 1 can be arranged.

〔発明の効果〕〔Effect of the invention〕

ゑ上説明したように、本発明は、インタフェースブロッ
ク間にできる空領域に、形状を専用設計した内部機能セ
ルを配置することにより、チップ全体の集積度を高める
効果がある。
As described above, the present invention has the effect of increasing the degree of integration of the entire chip by arranging internal functional cells whose shapes are specially designed in the empty areas created between the interface blocks.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の第一実施例を示すパターンレイアウト
図。 第2図は本発明の第二実施例の要部を示すパターンレイ
アウト図。 第3図は従来例を示すパターンレイアウト図。 第4図はインタフェースブロック数と空領域との関係を
示す特性図。 l・・・MJ4能セル、2・・・インタフェースブロッ
ク、3・・・内部領域、4・・・空領域、5・・・パッ
ド、6・・・外部機能セル、7・・・配線、10・・・
チップ。
FIG. 1 is a pattern layout diagram showing a first embodiment of the present invention. FIG. 2 is a pattern layout diagram showing the main parts of a second embodiment of the present invention. FIG. 3 is a pattern layout diagram showing a conventional example. FIG. 4 is a characteristic diagram showing the relationship between the number of interface blocks and empty area. 1...MJ4 functional cell, 2...Interface block, 3...Internal area, 4...Empty area, 5...Pad, 6...External functional cell, 7...Wiring, 10 ...
Chip.

Claims (1)

【特許請求の範囲】 1、回路構成用の一定形状の複数の内部機能セルが配置
された内部セル領域と、この内部セル領域を囲んでチッ
プ外周に配置された外部機能セルを含む複数のインタフ
ェースブロックとを備えたスタンダードセル方式の半導
体集積回路において、前記インタフェースブロック間の
空領域に配置され形状が専用設計された少なくとも1個
の内部機能セルを含む ことを特徴とする半導体集積回路。
[Claims] 1. An internal cell region in which a plurality of internal functional cells of a fixed shape for circuit configuration are arranged, and a plurality of interfaces including external functional cells arranged on the outer periphery of the chip surrounding this internal cell region. 1. A standard cell type semiconductor integrated circuit comprising at least one internal functional cell whose shape is specially designed and arranged in a vacant area between the interface blocks.
JP16792189A 1989-06-28 1989-06-28 Semiconductor integrated circuit Pending JPH0332044A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16792189A JPH0332044A (en) 1989-06-28 1989-06-28 Semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16792189A JPH0332044A (en) 1989-06-28 1989-06-28 Semiconductor integrated circuit

Publications (1)

Publication Number Publication Date
JPH0332044A true JPH0332044A (en) 1991-02-12

Family

ID=15858528

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16792189A Pending JPH0332044A (en) 1989-06-28 1989-06-28 Semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPH0332044A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7652831B2 (en) 2005-11-30 2010-01-26 Fujinon Corporation Lens barrel
JP2011096889A (en) * 2009-10-30 2011-05-12 Elpida Memory Inc Semiconductor device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7652831B2 (en) 2005-11-30 2010-01-26 Fujinon Corporation Lens barrel
JP2011096889A (en) * 2009-10-30 2011-05-12 Elpida Memory Inc Semiconductor device

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