JP6749894B2 - 積層光学フィルムの欠陥検査方法、光学フィルムの欠陥検査方法及び積層光学フィルムの製造方法 - Google Patents
積層光学フィルムの欠陥検査方法、光学フィルムの欠陥検査方法及び積層光学フィルムの製造方法 Download PDFInfo
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- JP6749894B2 JP6749894B2 JP2017511541A JP2017511541A JP6749894B2 JP 6749894 B2 JP6749894 B2 JP 6749894B2 JP 2017511541 A JP2017511541 A JP 2017511541A JP 2017511541 A JP2017511541 A JP 2017511541A JP 6749894 B2 JP6749894 B2 JP 6749894B2
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- 239000012788 optical film Substances 0.000 title claims description 183
- 238000007689 inspection Methods 0.000 title claims description 168
- 230000007547 defect Effects 0.000 title claims description 164
- 238000000034 method Methods 0.000 title claims description 89
- 238000004519 manufacturing process Methods 0.000 title claims description 17
- 239000010408 film Substances 0.000 claims description 36
- 230000001681 protective effect Effects 0.000 claims description 19
- 239000000463 material Substances 0.000 claims description 16
- 239000000853 adhesive Substances 0.000 claims description 14
- 230000001070 adhesive effect Effects 0.000 claims description 14
- 239000004820 Pressure-sensitive adhesive Substances 0.000 claims description 3
- 230000005540 biological transmission Effects 0.000 description 14
- 230000003287 optical effect Effects 0.000 description 6
- 229920002284 Cellulose triacetate Polymers 0.000 description 4
- 239000004372 Polyvinyl alcohol Substances 0.000 description 4
- NNLVGZFZQQXQNW-ADJNRHBOSA-N [(2r,3r,4s,5r,6s)-4,5-diacetyloxy-3-[(2s,3r,4s,5r,6r)-3,4,5-triacetyloxy-6-(acetyloxymethyl)oxan-2-yl]oxy-6-[(2r,3r,4s,5r,6s)-4,5,6-triacetyloxy-2-(acetyloxymethyl)oxan-3-yl]oxyoxan-2-yl]methyl acetate Chemical compound O([C@@H]1O[C@@H]([C@H]([C@H](OC(C)=O)[C@H]1OC(C)=O)O[C@H]1[C@@H]([C@@H](OC(C)=O)[C@H](OC(C)=O)[C@@H](COC(C)=O)O1)OC(C)=O)COC(=O)C)[C@@H]1[C@@H](COC(C)=O)O[C@@H](OC(C)=O)[C@H](OC(C)=O)[C@H]1OC(C)=O NNLVGZFZQQXQNW-ADJNRHBOSA-N 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 239000005020 polyethylene terephthalate Substances 0.000 description 4
- 229920000139 polyethylene terephthalate Polymers 0.000 description 4
- 229920002451 polyvinyl alcohol Polymers 0.000 description 4
- -1 Polyethylene Terephthalate Polymers 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 2
- 238000010030 laminating Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
- 239000002356 single layer Substances 0.000 description 2
- 230000007812 deficiency Effects 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 239000010410 layer Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/888—Marking defects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N2021/8924—Dents; Relief flaws
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- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Pathology (AREA)
- Biochemistry (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Textile Engineering (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
[第1の実施形態]
[第1の実施形態の変形例]
[第2の実施形態]
Claims (5)
- 光学フィルムに保護フィルム及び粘着材の少なくとも一方を貼り合せて積層光学フィルムを得ながら、前記積層光学フィルム中の欠陥を検査する方法であって、
前記光学フィルムの欠陥検査を行う第1検査工程と、
前記光学フィルムに前記保護フィルム及び前記粘着材の少なくとも一方を貼り合せて前記積層光学フィルムを生成する工程と、
前記第1検査工程において検出された欠陥に対応して前記積層光学フィルムにマーキングを行う第1マーキング工程と、
前記積層光学フィルムの欠陥検査を行う第2検査工程と、
前記第2検査工程において検出された欠陥に対応して前記積層光学フィルムにマーキングを行う第2マーキング工程と、
を含み、
前記第2検査工程では、前記第1マーキング工程においてマーキングされたマークを検出しない、
積層光学フィルムの欠陥検査方法。 - 前記第1検査工程における欠陥検査方法と前記第2検査工程における欠陥検査方法とは同一である、請求項1に記載の積層光学フィルムの欠陥検査方法。
- 前記第1検査工程における欠陥検査方法と前記第2検査工程における欠陥検査方法とは異なる、請求項1に記載の積層光学フィルムの欠陥検査方法。
- 光学フィルムの欠陥を検査する方法であって、
前記光学フィルムの欠陥検査を行う第1検査工程と、
前記第1検査工程において検出された欠陥に対応して前記光学フィルムにマーキングを行う第1マーキング工程と、
前記光学フィルムの欠陥検査であって、前記第1検査工程における欠陥検査とは異なる欠陥検査を行う第2検査工程と、
前記第2検査工程において検出された欠陥に対応して前記光学フィルムにマーキングを行う第2マーキング工程と、
を含み、
前記第2検査工程では、前記第1マーキング工程においてマーキングされたマークを検出しない、
光学フィルムの欠陥検査方法。 - 光学フィルムに保護フィルム及び粘着材の少なくとも一方を貼り合せて積層光学フィルムを製造する方法であって、
請求項1〜3の何れか1項に記載の積層光学フィルムの欠陥検査方法を含む、
積層光学フィルムの製造方法。
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JP2015080113 | 2015-04-09 | ||
JP2015080113 | 2015-04-09 | ||
PCT/JP2016/059934 WO2016163261A1 (ja) | 2015-04-09 | 2016-03-28 | 積層光学フィルムの欠陥検査方法、光学フィルムの欠陥検査方法及び積層光学フィルムの製造方法 |
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JPWO2016163261A1 JPWO2016163261A1 (ja) | 2018-02-08 |
JP6749894B2 true JP6749894B2 (ja) | 2020-09-02 |
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JP (1) | JP6749894B2 (ja) |
KR (1) | KR101898835B1 (ja) |
CN (1) | CN107407642B (ja) |
TW (1) | TWI663391B (ja) |
WO (1) | WO2016163261A1 (ja) |
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KR102475056B1 (ko) * | 2017-03-03 | 2022-12-06 | 스미또모 가가꾸 가부시키가이샤 | 결함 마킹 방법 및 결함 마킹 장치, 원반의 제조 방법 및 원반, 그리고 시트의 제조 방법 및 시트 |
JP7299219B2 (ja) * | 2018-07-30 | 2023-06-27 | 日本化薬株式会社 | マーキング装置、マーキング方法、偏光板の製造方法および偏光板 |
CN109212023A (zh) * | 2018-09-07 | 2019-01-15 | 深圳市哈德胜精密科技股份有限公司 | 一种石墨探伤方法 |
CN111452514B (zh) * | 2020-04-26 | 2021-01-12 | 杭州利珀科技有限公司 | 偏光膜整线打标***及方法 |
JP2022107419A (ja) * | 2021-01-08 | 2022-07-21 | 日東電工株式会社 | 光学積層フィルムの検査方法及びフィルム製品の製造方法 |
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JP3051001B2 (ja) * | 1992-11-13 | 2000-06-12 | 株式会社東芝 | 欠陥検査装置 |
JP4343456B2 (ja) * | 2001-04-03 | 2009-10-14 | 大日本印刷株式会社 | シート状製品の欠陥マーキング方法および装置 |
JP2006194721A (ja) * | 2005-01-13 | 2006-07-27 | Nagase & Co Ltd | 欠陥マーキング装置 |
TWI366706B (en) * | 2006-07-03 | 2012-06-21 | Olympus Corp | Semiconductor substrate defects detection device and method of detection of defects |
JP2009069142A (ja) * | 2007-08-23 | 2009-04-02 | Nitto Denko Corp | 積層フィルムの欠陥検査方法およびその装置 |
JP2009244064A (ja) * | 2008-03-31 | 2009-10-22 | Sumitomo Chemical Co Ltd | 偏光フィルムの検査方法 |
EP2295930B1 (en) * | 2008-06-04 | 2014-01-01 | Kabushiki Kaisha Kobe Seiko Sho | Tire shape inspection method and tire shape inspection device |
JP2011065184A (ja) | 2009-04-10 | 2011-03-31 | Nitto Denko Corp | 光学フィルムロール原反、およびそれを用いた画像表示装置の製造方法 |
KR101315102B1 (ko) * | 2011-07-25 | 2013-10-07 | 동우 화인켐 주식회사 | 필름의 수율 예측 시스템 및 방법 |
KR101288906B1 (ko) * | 2011-10-20 | 2013-07-23 | 주식회사 엘지화학 | 광학 필름의 결함 검사 장치 |
JP5944175B2 (ja) * | 2012-02-07 | 2016-07-05 | 住友ゴム工業株式会社 | タイヤ用部材の製造装置および製造方法 |
KR20140087716A (ko) * | 2012-12-31 | 2014-07-09 | 동우 화인켐 주식회사 | 측정 결과 검증 시스템 |
JP6182806B2 (ja) * | 2013-06-04 | 2017-08-23 | 住友化学株式会社 | 欠陥検査システム及びフィルムの製造装置 |
JP2015049350A (ja) * | 2013-08-30 | 2015-03-16 | 住友化学株式会社 | 光学部材貼合体の製造方法 |
JP6641093B2 (ja) * | 2015-03-20 | 2020-02-05 | 住友化学株式会社 | 光学フィルム及び積層光学フィルムの欠陥検査方法 |
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- 2016-03-28 WO PCT/JP2016/059934 patent/WO2016163261A1/ja active Application Filing
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- 2016-03-31 TW TW105110395A patent/TWI663391B/zh active
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CN107407642B (zh) | 2020-04-03 |
KR20170118933A (ko) | 2017-10-25 |
TW201640100A (zh) | 2016-11-16 |
TWI663391B (zh) | 2019-06-21 |
WO2016163261A1 (ja) | 2016-10-13 |
JPWO2016163261A1 (ja) | 2018-02-08 |
KR101898835B1 (ko) | 2018-09-13 |
CN107407642A (zh) | 2017-11-28 |
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