JP5436614B2 - パッケージ構造とその製造方法 - Google Patents
パッケージ構造とその製造方法 Download PDFInfo
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- 238000004519 manufacturing process Methods 0.000 title claims description 27
- 239000010410 layer Substances 0.000 claims description 204
- 239000002184 metal Substances 0.000 claims description 125
- 229910052751 metal Inorganic materials 0.000 claims description 125
- 239000000758 substrate Substances 0.000 claims description 69
- 230000017525 heat dissipation Effects 0.000 claims description 40
- 239000012790 adhesive layer Substances 0.000 claims description 31
- 229910000679 solder Inorganic materials 0.000 claims description 20
- 238000000034 method Methods 0.000 claims description 13
- 238000009823 thermal lamination Methods 0.000 claims description 4
- 239000000853 adhesive Substances 0.000 claims description 3
- 230000001070 adhesive effect Effects 0.000 claims description 3
- 238000010030 laminating Methods 0.000 claims description 3
- 238000009713 electroplating Methods 0.000 claims description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 9
- 239000011889 copper foil Substances 0.000 description 9
- 230000000694 effects Effects 0.000 description 4
- 230000002349 favourable effect Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 230000015654 memory Effects 0.000 description 3
- 239000004642 Polyimide Substances 0.000 description 2
- 239000002775 capsule Substances 0.000 description 2
- 230000000149 penetrating effect Effects 0.000 description 2
- 238000007747 plating Methods 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- RNFJDJUURJAICM-UHFFFAOYSA-N 2,2,4,4,6,6-hexaphenoxy-1,3,5-triaza-2$l^{5},4$l^{5},6$l^{5}-triphosphacyclohexa-1,3,5-triene Chemical group N=1P(OC=2C=CC=CC=2)(OC=2C=CC=CC=2)=NP(OC=2C=CC=CC=2)(OC=2C=CC=CC=2)=NP=1(OC=1C=CC=CC=1)OC1=CC=CC=C1 RNFJDJUURJAICM-UHFFFAOYSA-N 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- 239000003063 flame retardant Substances 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 239000003365 glass fiber Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/13—Mountings, e.g. non-detachable insulating substrates characterised by the shape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/538—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
- H01L23/5389—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates the chips being integrally enclosed by the interconnect and support structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/18—High density interconnect [HDI] connectors; Manufacturing methods related thereto
- H01L24/19—Manufacturing methods of high density interconnect preforms
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/18—High density interconnect [HDI] connectors; Manufacturing methods related thereto
- H01L24/20—Structure, shape, material or disposition of high density interconnect preforms
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/16227—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the bump connector connecting to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12041—LED
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/156—Material
- H01L2924/15786—Material with a principal constituent of the material being a non metallic, non metalloid inorganic material
- H01L2924/15788—Glasses, e.g. amorphous oxides, nitrides or fluorides
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0201—Thermal arrangements, e.g. for cooling, heating or preventing overheating
- H05K1/0203—Cooling of mounted components
- H05K1/0207—Cooling of mounted components using internal conductor planes parallel to the surface for thermal conduction, e.g. power planes
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/18—Printed circuits structurally associated with non-printed electric components
- H05K1/182—Printed circuits structurally associated with non-printed electric components associated with components mounted in the printed circuit board, e.g. insert mounted components [IMC]
- H05K1/185—Components encapsulated in the insulating substrate of the printed circuit or incorporated in internal layers of a multilayer circuit
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49126—Assembling bases
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/4913—Assembling to base an electrical component, e.g., capacitor, etc.
- Y10T29/49146—Assembling to base an electrical component, e.g., capacitor, etc. with encapsulating, e.g., potting, etc.
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
Description
図1A〜図1Gは、この発明の実施形態にかかるパッケージ構造を製造する方法を示す概略的な断面図である。図1Aに示したように、この実施形態中のパッケージ構造を製造する方法に従い、基板110が提供される。基板110は、上表面111と、この上表面111に対向する下表面113とを有する。基板110が例えば絶縁層112および銅箔層114aからなるとともに、絶縁層112が例えばポリイミド(polyimide = PI)またはエポキシ(epoxy)樹脂からできている。図示していない別な実施形態中、基板は、1つの絶縁層と、絶縁層の2つの各側面に位置する2つの銅箔層とから構成される両側板(double-sided board)であることもでき、あるいは基板がグラスファイバー(glass fiber)(FR4 = Flame Retardant Type 4)基板であることができるけれども、この発明を限定するものではない。
20 カプセル素材
100 パッケージ構造
110 基板
111 上表面
112 絶縁層
113 下表面
114 パターン化銅箔層
114a 銅箔層
116 開口
120 電子デバイス
122 頂表面
124 底表面
130 接着剤層
140 パターン化金属層
140a 金属層
150 散熱コラム
160 第1ラミネート構造
162 第1誘電層
164 第1パターン化金属層
164a 第1金属層
166 導電ビア
170 第2ラミネート構造
172 第2誘電層
174、176 第2パターン化金属層
174a 第2金属層
180 第1ソルダーマスク層
190 第2ソルダーマスク層
H ブラインド孔
Claims (12)
- 基板を提供し、前記基板が上表面、下表面、および開口を有し、前記上表面ならびに前記下表面が互いに対向し、前記開口が前記上表面および前記下表面を連通するステップと、
前記基板の前記開口中に前記基板の前記上表面上に配置される接着剤を介して一時的に電子デバイスを固定するステップと、
接着剤層および前記接着剤層上に位置するパターン化金属層を、前記基板の前記下表面上及び電子デバイスの底表面の一部上にラミネートし、前記接着剤層ならびに前記パターン化金属層が前記電子デバイスの底表面の一部を露出させるステップと、
前記接着剤層および前記パターン化金属層により露出された前記電子デバイスの前記底表面上に散熱コラムを形成し、前記散熱コラムが前記パターン化金属層ならびに前記電子デバイスの前記底表面に連接するステップと、
それぞれ第1ラミネート構造および第2ラミネート構造を前記基板の前記上表面ならびに前記パターン化金属層上にラミネートし、前記第1ラミネート構造が前記基板の前記上表面および前記電子デバイスの頂表面を被覆し、前記第2ラミネート構造が前記散熱コラムならびに前記パターン化金属層を被覆するステップと
を備えるパッケージ構造を製造する方法。 - 前記電子デバイスが、無線周波数(radio frequency = RF)素子、能動素子または受動素子を含む請求項1記載のパッケージ構造を製造する方法。
- 前記第1ラミネート構造が、少なくとも1つの第1誘電層、少なくとも1つの第1パターン化金属層、および前記少なくとも1つの第1誘電層を貫通する少なくとも1つの導電ビアを備え、前記少なくとも1つの第1誘電層および前記少なくとも1つの第1パターン化金属層が前記基板の前記上表面上に順番に積層され、前記開口が前記少なくとも1つの第1誘電層で充填されるとともに、前記少なくとも1つの第1パターン化金属層が前記少なくとも1つの導電ビアを介して前記電子デバイスに電気接続される請求項1記載のパッケージ構造を製造する方法。
- 前記第2ラミネート構造が少なくとも1つの第2誘電層および少なくとも1つの第2パターン化金属層を含み、前記少なくとも1つの第2誘電層ならびに前記少なくとも1つの第2パターン化金属層が前記パターン化金属層および前記散熱コラム上に積層されるとともに、前記散熱コラムが前記少なくとも1つの第2パターン化金属層に直接接触される請求項1記載のパッケージ構造を製造する方法。
- 前記第1ラミネート構造および前記第2ラミネート構造を前記基板の前記上表面ならびに前記パターン化金属層上にラミネートした後、さらに、
第1ソルダーマスク層を前記第1ラミネート構造上に形成するステップと、
第2ソルダーマスク層を前記第2ラミネート構造上に形成するステップと
を含む請求項1記載のパッケージ構造を製造する方法。 - 前記第1ラミネート構造および前記第2ラミネート構造を前記基板の前記上表面ならびに前記パターン化金属層上にラミネートする方法が熱ラミネーションを含む請求項1記載のパッケージ構造を製造する方法。
- 前記接着剤層および前記パターン化金属層により露出された前記電子デバイスの前記底表面上に前記散熱コラムを形成する方法が、電気メッキを含む請求項1記載のパッケージ構造を製造する方法。
- 上表面、下表面、および開口を有し、前記上表面ならびに前記下表面が互いに対向し、前記開口が前記上表面および前記下表面を連通する基板と、
前記基板の前記開口中に配置されるとともに、頂表面ならびに底表面を有し、前記頂表面および前記底表面が互いに対向する電子デバイスと、
前記基板の前記下表面上に配置されるとともに、前記電子デバイスの前記底表面の一部を露出させる接着剤層と、
前記接着剤層を介して前記基板の前記下表面に接着されるとともに、前記電子デバイスの前記底表面を露出させるパターン化金属層と、
前記接着剤層および前記パターン化金属層によって露出された前記電子デバイスの前記底表面上に配置され、前記パターン化金属層ならびに前記電子デバイスの前記底表面に連接される散熱コラムと、
前記基板の前記上表面に配置されるとともに、前記基板の前記上表面および前記電子デバイスの前記頂表面を被覆する第1ラミネート構造と、
前記パターン化金属層上に配置されるとともに、前記散熱コラムおよび前記パターン化金属層を被覆する第2ラミネート構造と
を含むパッケージ構造。 - 前記電子デバイスが、無線周波数(radio frequency = RF)素子、能動素子または受動素子を含む請求項8記載のパッケージ構造。
- 前記第1ラミネート構造が少なくとも1つの第1誘電層、少なくとも1つの第1パターン化金属層、および少なくとも1つの前記少なくとも1つの第1誘電層を貫通する導電ビアを備え、前記少なくとも1つの第1誘電層および前記少なくとも1つの第1パターン化金属層が前記基板の前記上表面上に順番に積層され、前記開口が前記少なくとも1つの第1誘電層で充填されるとともに、前記少なくとも1つの第1パターン化金属層が前記少なくとも1つの導電ビアを介して前記電子デバイスに電気接続される請求項8記載のパッケージ構造。
- 前記第2ラミネート構造が少なくとも1つの第2誘電層および少なくとも1つの第2パターン化金属層を含み、前記少なくとも1つの第2誘電層ならびに前記少なくとも1つの第2パターン化金属層が前記パターン化金属層および前記散熱コラム上に積層されるとともに、前記散熱コラムが前記少なくとも1つの第2パターン化金属層に直接接触される請求項8記載のパッケージ構造。
- さらに、
第1ソルダーマスク層が前記第1ラミネート構造上に配置されるとともに、
第2ソルダーマスク層が前記第2ラミネート構造上に配置される請求項8記載のパッケージ構造。
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TW100117788 | 2011-05-20 | ||
TW100117788A TWI446464B (zh) | 2011-05-20 | 2011-05-20 | 封裝結構及其製作方法 |
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JP5436614B2 true JP5436614B2 (ja) | 2014-03-05 |
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JP2012244166A (ja) | 2012-12-10 |
TW201248744A (en) | 2012-12-01 |
US20120293977A1 (en) | 2012-11-22 |
CN102789991A (zh) | 2012-11-21 |
TWI446464B (zh) | 2014-07-21 |
US9532494B2 (en) | 2016-12-27 |
US20140317907A1 (en) | 2014-10-30 |
CN102789991B (zh) | 2016-04-27 |
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