JP4995068B2 - シリコン単結晶引上げ用石英ガラスルツボ - Google Patents
シリコン単結晶引上げ用石英ガラスルツボ Download PDFInfo
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- JP4995068B2 JP4995068B2 JP2007339345A JP2007339345A JP4995068B2 JP 4995068 B2 JP4995068 B2 JP 4995068B2 JP 2007339345 A JP2007339345 A JP 2007339345A JP 2007339345 A JP2007339345 A JP 2007339345A JP 4995068 B2 JP4995068 B2 JP 4995068B2
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- pulling
- quartz glass
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- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 68
- 239000010703 silicon Substances 0.000 title claims abstract description 68
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 67
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 title claims abstract description 43
- 239000013078 crystal Substances 0.000 title claims description 29
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims abstract description 63
- 230000002093 peripheral effect Effects 0.000 claims description 3
- 238000005452 bending Methods 0.000 claims 1
- 239000007788 liquid Substances 0.000 abstract description 11
- 230000003628 erosive effect Effects 0.000 abstract description 2
- 229910021421 monocrystalline silicon Inorganic materials 0.000 abstract 3
- 239000011521 glass Substances 0.000 description 8
- 238000002844 melting Methods 0.000 description 8
- 230000008018 melting Effects 0.000 description 8
- 238000002425 crystallisation Methods 0.000 description 5
- 230000008025 crystallization Effects 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 239000000843 powder Substances 0.000 description 4
- 239000010453 quartz Substances 0.000 description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 229910052760 oxygen Inorganic materials 0.000 description 3
- 239000001301 oxygen Substances 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 2
- 239000000155 melt Substances 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/10—Crucibles or containers for supporting the melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10S117/90—Apparatus characterized by composition or treatment thereof, e.g. surface finish, surface coating
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
- Y10T117/1052—Seed pulling including a sectioned crucible [e.g., double crucible, baffle]
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Glass Melting And Manufacturing (AREA)
Description
〔1〕石英ガラスルツボ内表面の溶損厚さ部分に含まれるOH基濃度について、シリコン単結晶引上げ開始時のシリコン融液面から引上げ終了時のシリコン融液面に至る範囲のOH基濃度が、該範囲より下側部分のOH基濃度より高いことを特徴とするシリコン単結晶引上げ用石英ガラスルツボ。
〔2〕ルツボ内表面の溶損厚さ部分に含まれるOH基濃度について、底部のOH基濃度よりも湾曲部のOH濃度が高く、湾曲部のOH濃度よりも壁部のOH基濃度が高い上記[1]に記載するシリコン単結晶引上げ用石英ガラスルツボ。
〔3〕ルツボ内表面の溶損厚さ部分に含まれるOH基濃度について、該部分に含まれるOH基濃度について、底部のOH基濃度が40〜120ppm、湾曲部のOH濃度が50〜140ppm、壁部のOH基濃度が60〜150ppmの範囲において、湾曲部のOH濃度が底部のOH基濃度より10〜50ppm高く、壁部のOH基濃度が湾曲部のOH基濃度よりも10〜30ppm高く形成されており、かつOH基濃度調整部分の層厚がルツボ肉厚の15%以下である上記[1]〜上記[2]に記載するシリコン単結晶引上げ用石英ガラスルツボ。
〔4〕ルツボ内表面の溶損厚さ部分に含まれるOH基濃度について、底部から湾曲部および壁部のOH基濃度が上記[1]〜上記[3]の何れかに記載されるように形成されており、かつルツボ内表面の溶損厚さ部分がルツボ内表面から1mm厚の透明層部分であるシリコン単結晶引上げ用石英ガラスルツボ。
本発明の石英ガラスルツボは、石英ガラスルツボ内表面の溶損厚さ部分に含まれるOH基濃度について、シリコン単結晶引上げ開始時のシリコン融液面から引上げ終了時のシリコン融液面に至る範囲のOH基濃度が、該範囲より下側部分のOH基濃度より高いことを特徴とするシリコン単結晶引上げ用石英ガラスルツボである。
〔実施例1〜4、比較例1〜4〕
表1に示すOH基濃度を有する石英ガラスルツボ(口径32インチ)を用い、シリコン単結晶の引上げを行った。この結果を表1に示した。
実施例1〜4は単結晶化歩留まりが80%以上である。一方、比較例1〜4は何れもルツボ内表面のブラウンリングや斑点が剥離し、単結晶化歩留まりが大幅に低い。
10−底部、20−湾曲部、30−壁部
Claims (2)
- シリコン単結晶引上げ用石英ガラスルツボであって、
略垂直の周壁部分からなる壁部と、
所定の曲率を有する底部と、
前記壁部から前記底部に至る断面が湾曲した部分からなり、前記底部の曲率と異なる曲率を有する湾曲部と、
を備え、
シリコン融液に接触するルツボ内表面は、透明石英ガラス層によって形成されており、
ルツボ内表面のOH基濃度調整部分に含まれるOH基濃度について、
底部のOH基濃度が40〜120ppmの範囲であり、
湾曲部のOH基濃度が50〜140ppmの範囲であり、
壁部のOH基濃度が60〜150ppmの範囲であり、
湾曲部のOH基濃度が底部のOH基濃度より10〜50ppm高く形成されており、
壁部のOH基濃度が湾曲部のOH基濃度よりも10〜60ppm高く形成されており、かつOH基濃度調整部分の層厚がルツボ肉厚の15%以下である
ことを特徴とするシリコン単結晶引上げ用石英ガラスルツボ。 - ルツボ内表面のOH基濃度調整部分がルツボ内表面から1mm厚の透明層部分である
請求項1に記載するシリコン単結晶引上げ用石英ガラスルツボ。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007339345A JP4995068B2 (ja) | 2007-12-28 | 2007-12-28 | シリコン単結晶引上げ用石英ガラスルツボ |
EP08020715A EP2075354B1 (en) | 2007-12-28 | 2008-11-28 | Vitreous silica crucible and method for pulling single-crystal silicon |
AT08020715T ATE555236T1 (de) | 2007-12-28 | 2008-11-28 | Glasartiger quarztiegel und verfahren zum ziehen von einkristall-silicium |
US12/325,033 US8142565B2 (en) | 2007-12-28 | 2008-11-28 | Vitreous silica crucible for pulling single-crystal silicon |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007339345A JP4995068B2 (ja) | 2007-12-28 | 2007-12-28 | シリコン単結晶引上げ用石英ガラスルツボ |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2009161363A JP2009161363A (ja) | 2009-07-23 |
JP4995068B2 true JP4995068B2 (ja) | 2012-08-08 |
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JP2007339345A Active JP4995068B2 (ja) | 2007-12-28 | 2007-12-28 | シリコン単結晶引上げ用石英ガラスルツボ |
Country Status (4)
Country | Link |
---|---|
US (1) | US8142565B2 (ja) |
EP (1) | EP2075354B1 (ja) |
JP (1) | JP4995068B2 (ja) |
AT (1) | ATE555236T1 (ja) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
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JP4994647B2 (ja) * | 2005-11-30 | 2012-08-08 | ジャパンスーパークォーツ株式会社 | 結晶化し易い石英ガラス部材とその用途 |
JP4995068B2 (ja) * | 2007-12-28 | 2012-08-08 | ジャパンスーパークォーツ株式会社 | シリコン単結晶引上げ用石英ガラスルツボ |
JP5058138B2 (ja) * | 2008-12-09 | 2012-10-24 | ジャパンスーパークォーツ株式会社 | シリコン単結晶引き上げ用石英ガラスルツボ |
JP4987029B2 (ja) * | 2009-04-02 | 2012-07-25 | ジャパンスーパークォーツ株式会社 | シリコン単結晶引き上げ用石英ガラスルツボ |
JP5453677B2 (ja) * | 2010-06-25 | 2014-03-26 | 株式会社Sumco | シリカガラスルツボ、シリコンインゴットの製造方法 |
EP2799596B1 (en) * | 2011-12-30 | 2018-08-22 | Sumco Corporation | Silica glass crucible and method for producing monocrystalline silicon using same |
US9376761B2 (en) * | 2012-01-13 | 2016-06-28 | Shin-Etsu Quartz Products Co., Ltd. | Single-crystal silicon pulling silica container and method for producing the same |
KR101497385B1 (ko) * | 2012-05-15 | 2015-03-03 | 신에쯔 세끼에이 가부시키가이샤 | 단결정 실리콘 인상용 실리카 용기 및 그 제조 방법 |
SG11201508512PA (en) * | 2013-05-23 | 2015-12-30 | Applied Materials Inc | A coated liner assembly for a semiconductor processing chamber |
KR102060422B1 (ko) * | 2015-11-02 | 2019-12-30 | 가부시키가이샤 사무코 | 단결정 실리콘의 제조 방법 |
CN114457421A (zh) * | 2021-12-21 | 2022-05-10 | 弘元新材料(包头)有限公司 | 一种单晶硅生产用增加投料量的装置及其使用方法 |
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JPS61242984A (ja) * | 1985-04-19 | 1986-10-29 | Shinetsu Sekiei Kk | シリコン単結晶引上げ用ルツボ |
JPH068237B2 (ja) * | 1988-04-28 | 1994-02-02 | 三菱マテリアル株式会社 | シリコン単結晶引上げ用石英ルツボ |
JPH0764673B2 (ja) * | 1990-01-10 | 1995-07-12 | 三菱マテリアル株式会社 | 石英ルツボの製造方法 |
JPH10182287A (ja) * | 1996-12-19 | 1998-07-07 | Nippon Steel Corp | シリコン単結晶製造方法および石英ルツボ |
JP4138959B2 (ja) * | 1998-08-28 | 2008-08-27 | 信越石英株式会社 | シリコン単結晶引き上げ用大口径石英ガラスるつぼ及びその製造方法 |
US7118789B2 (en) * | 2001-07-16 | 2006-10-10 | Heraeus Shin-Etsu America | Silica glass crucible |
US20060191294A1 (en) * | 2003-03-21 | 2006-08-31 | Heraeus Tenevo Gmbh | Synthetic silica glass tube for the production of a preform, method for producing the same in a vertical drawing process and use of said tube |
US8277559B2 (en) * | 2003-05-01 | 2012-10-02 | Heraeus Quarzglas Gmbh & Co. Kg | Quartz glass crucible for pulling up silicon single crystal and method for manufacture thereof |
JP2005067910A (ja) | 2003-08-25 | 2005-03-17 | Japan Siper Quarts Corp | シリコン単結晶引き上げ用石英ルツボとその製造方法および引き上げ方法 |
JP2005330157A (ja) * | 2004-05-20 | 2005-12-02 | Toshiba Ceramics Co Ltd | シリカガラスルツボ |
JP4678667B2 (ja) * | 2004-06-07 | 2011-04-27 | 信越石英株式会社 | シリコン単結晶引上げ用石英ガラスルツボ及びその製造方法 |
JP2007091562A (ja) * | 2005-09-30 | 2007-04-12 | Toshiba Ceramics Co Ltd | 結晶化促進コーティング用シリカガラスルツボ |
JP4671999B2 (ja) * | 2007-11-30 | 2011-04-20 | ジャパンスーパークォーツ株式会社 | 石英ガラスルツボの試験方法 |
JP4995068B2 (ja) * | 2007-12-28 | 2012-08-08 | ジャパンスーパークォーツ株式会社 | シリコン単結晶引上げ用石英ガラスルツボ |
JP4922233B2 (ja) * | 2008-04-30 | 2012-04-25 | ジャパンスーパークォーツ株式会社 | 石英ガラスルツボ |
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2008
- 2008-11-28 US US12/325,033 patent/US8142565B2/en active Active
- 2008-11-28 EP EP08020715A patent/EP2075354B1/en active Active
- 2008-11-28 AT AT08020715T patent/ATE555236T1/de active
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Publication number | Publication date |
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EP2075354A2 (en) | 2009-07-01 |
ATE555236T1 (de) | 2012-05-15 |
US8142565B2 (en) | 2012-03-27 |
EP2075354A3 (en) | 2010-08-11 |
US20090165701A1 (en) | 2009-07-02 |
EP2075354B1 (en) | 2012-04-25 |
JP2009161363A (ja) | 2009-07-23 |
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