JP4600786B2 - 表示装置およびその製造方法 - Google Patents
表示装置およびその製造方法 Download PDFInfo
- Publication number
- JP4600786B2 JP4600786B2 JP2008123004A JP2008123004A JP4600786B2 JP 4600786 B2 JP4600786 B2 JP 4600786B2 JP 2008123004 A JP2008123004 A JP 2008123004A JP 2008123004 A JP2008123004 A JP 2008123004A JP 4600786 B2 JP4600786 B2 JP 4600786B2
- Authority
- JP
- Japan
- Prior art keywords
- layer
- insulating film
- electrode
- opening
- contact portion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 19
- 239000010936 titanium Substances 0.000 claims description 59
- 239000000463 material Substances 0.000 claims description 46
- 229910052782 aluminium Inorganic materials 0.000 claims description 26
- 239000000758 substrate Substances 0.000 claims description 24
- 229910045601 alloy Inorganic materials 0.000 claims description 20
- 239000000956 alloy Substances 0.000 claims description 20
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 20
- 229910052719 titanium Inorganic materials 0.000 claims description 17
- 229910052751 metal Inorganic materials 0.000 claims description 13
- 239000002184 metal Substances 0.000 claims description 13
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 11
- 238000001312 dry etching Methods 0.000 claims description 9
- 229910052750 molybdenum Inorganic materials 0.000 claims description 9
- 238000001039 wet etching Methods 0.000 claims description 6
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims description 5
- 239000011733 molybdenum Substances 0.000 claims description 5
- 239000010410 layer Substances 0.000 description 218
- 239000010408 film Substances 0.000 description 150
- 238000005401 electroluminescence Methods 0.000 description 77
- 238000000034 method Methods 0.000 description 43
- 239000010409 thin film Substances 0.000 description 31
- 230000001681 protective effect Effects 0.000 description 19
- 238000000605 extraction Methods 0.000 description 17
- 238000005530 etching Methods 0.000 description 16
- 230000000052 comparative effect Effects 0.000 description 11
- 238000007789 sealing Methods 0.000 description 10
- 239000011347 resin Substances 0.000 description 9
- 229920005989 resin Polymers 0.000 description 9
- 230000015572 biosynthetic process Effects 0.000 description 8
- 229920002120 photoresistant polymer Polymers 0.000 description 8
- 238000000206 photolithography Methods 0.000 description 7
- 230000007547 defect Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- 239000011159 matrix material Substances 0.000 description 6
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 6
- KZBUYRJDOAKODT-UHFFFAOYSA-N Chlorine Chemical compound ClCl KZBUYRJDOAKODT-UHFFFAOYSA-N 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 5
- 229910021417 amorphous silicon Inorganic materials 0.000 description 5
- 238000005229 chemical vapour deposition Methods 0.000 description 5
- 239000004020 conductor Substances 0.000 description 5
- 239000010949 copper Substances 0.000 description 5
- 239000011810 insulating material Substances 0.000 description 5
- 229910052710 silicon Inorganic materials 0.000 description 5
- 239000010703 silicon Substances 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- 239000011651 chromium Substances 0.000 description 4
- 239000000470 constituent Substances 0.000 description 4
- 239000010931 gold Substances 0.000 description 4
- 239000007769 metal material Substances 0.000 description 4
- VXAPDXVBDZRZKP-UHFFFAOYSA-N nitric acid phosphoric acid Chemical compound O[N+]([O-])=O.OP(O)(O)=O VXAPDXVBDZRZKP-UHFFFAOYSA-N 0.000 description 4
- 238000004544 sputter deposition Methods 0.000 description 4
- 238000001771 vacuum deposition Methods 0.000 description 4
- YVTHLONGBIQYBO-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) Chemical compound [O--].[Zn++].[In+3] YVTHLONGBIQYBO-UHFFFAOYSA-N 0.000 description 4
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- 229910052802 copper Inorganic materials 0.000 description 3
- 238000011156 evaluation Methods 0.000 description 3
- 229920001721 polyimide Polymers 0.000 description 3
- 239000009719 polyimide resin Substances 0.000 description 3
- 229910052709 silver Inorganic materials 0.000 description 3
- 238000004528 spin coating Methods 0.000 description 3
- 229920000178 Acrylic resin Polymers 0.000 description 2
- 239000004925 Acrylic resin Substances 0.000 description 2
- 229910000789 Aluminium-silicon alloy Inorganic materials 0.000 description 2
- 229910052684 Cerium Inorganic materials 0.000 description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
- 229910004541 SiN Inorganic materials 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 description 2
- 239000012790 adhesive layer Substances 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- GWXLDORMOJMVQZ-UHFFFAOYSA-N cerium Chemical compound [Ce] GWXLDORMOJMVQZ-UHFFFAOYSA-N 0.000 description 2
- 229910052804 chromium Inorganic materials 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 229910052681 coesite Inorganic materials 0.000 description 2
- 229910052906 cristobalite Inorganic materials 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 229920003023 plastic Polymers 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
- 230000004043 responsiveness Effects 0.000 description 2
- 239000000377 silicon dioxide Substances 0.000 description 2
- 235000012239 silicon dioxide Nutrition 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- 229910052682 stishovite Inorganic materials 0.000 description 2
- 229910052905 tridymite Inorganic materials 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- 229910052779 Neodymium Inorganic materials 0.000 description 1
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005525 hole transport Effects 0.000 description 1
- RHZWSUVWRRXEJF-UHFFFAOYSA-N indium tin Chemical compound [In].[Sn] RHZWSUVWRRXEJF-UHFFFAOYSA-N 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 239000011777 magnesium Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- QEFYFXOXNSNQGX-UHFFFAOYSA-N neodymium atom Chemical compound [Nd] QEFYFXOXNSNQGX-UHFFFAOYSA-N 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 229920003986 novolac Polymers 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
- 238000001020 plasma etching Methods 0.000 description 1
- 229920002577 polybenzoxazole Polymers 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 230000001568 sexual effect Effects 0.000 description 1
- 239000010944 silver (metal) Substances 0.000 description 1
- 238000010301 surface-oxidation reaction Methods 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
- FAQYAMRNWDIXMY-UHFFFAOYSA-N trichloroborane Chemical compound ClB(Cl)Cl FAQYAMRNWDIXMY-UHFFFAOYSA-N 0.000 description 1
- 230000004304 visual acuity Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/80—Constructional details
- H10K59/805—Electrodes
- H10K59/8052—Cathodes
- H10K59/80522—Cathodes combined with auxiliary electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67075—Apparatus for fluid treatment for etching for wet etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1259—Multistep manufacturing methods
- H01L27/1288—Multistep manufacturing methods employing particular masking sequences or specially adapted masks, e.g. half-tone mask
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01013—Aluminum [Al]
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Electroluminescent Light Sources (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008123004A JP4600786B2 (ja) | 2007-12-18 | 2008-05-09 | 表示装置およびその製造方法 |
US12/330,194 US8692455B2 (en) | 2007-12-18 | 2008-12-08 | Display device and method for production thereof |
KR1020080127126A KR101635165B1 (ko) | 2007-12-18 | 2008-12-15 | 표시 장치 및 그 제조 방법 |
CN2008101864091A CN101465368B (zh) | 2007-12-18 | 2008-12-16 | 显示装置及其制造方法 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007326595 | 2007-12-18 | ||
JP2008123004A JP4600786B2 (ja) | 2007-12-18 | 2008-05-09 | 表示装置およびその製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2009170395A JP2009170395A (ja) | 2009-07-30 |
JP4600786B2 true JP4600786B2 (ja) | 2010-12-15 |
Family
ID=40805831
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008123004A Expired - Fee Related JP4600786B2 (ja) | 2007-12-18 | 2008-05-09 | 表示装置およびその製造方法 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP4600786B2 (ko) |
KR (1) | KR101635165B1 (ko) |
CN (1) | CN101465368B (ko) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI555436B (zh) * | 2011-04-08 | 2016-10-21 | 半導體能源研究所股份有限公司 | 發光裝置及其製造方法 |
US8912547B2 (en) * | 2012-01-20 | 2014-12-16 | Semiconductor Energy Laboratory Co., Ltd. | Light-emitting device, display device, and semiconductor device |
TWI479948B (zh) * | 2012-02-29 | 2015-04-01 | Innocom Tech Shenzhen Co Ltd | 顯示面板及顯示裝置 |
US9178174B2 (en) * | 2012-03-27 | 2015-11-03 | Sony Corporation | Display device and method of manufacturing the same, method of repairing display device, and electronic apparatus |
JP5954162B2 (ja) * | 2012-03-28 | 2016-07-20 | ソニー株式会社 | 表示装置の製造方法 |
KR101930847B1 (ko) * | 2012-05-16 | 2018-12-20 | 삼성디스플레이 주식회사 | 유기 발광 표시 장치 및 그 제조방법 |
KR20130128940A (ko) * | 2012-05-18 | 2013-11-27 | 삼성디스플레이 주식회사 | 유기 발광 표시 장치 및 그 제조방법 |
KR102132884B1 (ko) * | 2013-05-21 | 2020-07-13 | 삼성디스플레이 주식회사 | 유기발광 디스플레이 장치 및 그 제조방법 |
KR102155370B1 (ko) * | 2013-12-02 | 2020-09-22 | 삼성디스플레이 주식회사 | 유기 발광 표시장치 및 그의 제조방법 |
KR102164949B1 (ko) | 2014-03-25 | 2020-10-14 | 삼성디스플레이 주식회사 | 표시 장치, 이의 제조 방법 및 리페어 방법 |
KR102315824B1 (ko) * | 2014-06-27 | 2021-10-20 | 엘지디스플레이 주식회사 | 유기 발광 표시 장치 및 그의 제조 방법 |
JP2016062885A (ja) * | 2014-09-22 | 2016-04-25 | ソニー株式会社 | 表示装置およびその製造方法、ならびに電子機器 |
KR102320591B1 (ko) * | 2014-10-30 | 2021-11-03 | 엘지디스플레이 주식회사 | 유기전계발광표시장치와 이의 제조방법 |
KR102374833B1 (ko) * | 2014-11-25 | 2022-03-15 | 엘지디스플레이 주식회사 | 유기 발광 표시 장치 및 그 제조 방법 |
KR102426691B1 (ko) * | 2015-02-05 | 2022-07-28 | 삼성디스플레이 주식회사 | 유기 발광 표시 장치 및 그 제조 방법 |
JP6457879B2 (ja) * | 2015-04-22 | 2019-01-23 | 株式会社ジャパンディスプレイ | 表示装置及びその製造方法 |
KR102465826B1 (ko) * | 2015-10-29 | 2022-11-09 | 엘지디스플레이 주식회사 | 유기 발광 표시 장치 및 그 제조 방법 |
KR102578834B1 (ko) * | 2015-11-30 | 2023-09-15 | 엘지디스플레이 주식회사 | 유기 발광 표시 장치 |
JP6676998B2 (ja) * | 2016-02-10 | 2020-04-08 | セイコーエプソン株式会社 | 電気光学装置、および電子機器 |
KR101878187B1 (ko) * | 2016-07-29 | 2018-07-13 | 엘지디스플레이 주식회사 | 유기 발광 표시 장치 및 그 제조 방법 |
KR20180046229A (ko) * | 2016-10-27 | 2018-05-08 | 엘지디스플레이 주식회사 | 유기 발광 표시 장치 및 그 제조 방법 |
KR102410500B1 (ko) * | 2017-11-30 | 2022-06-16 | 엘지디스플레이 주식회사 | 전계 발광 표시장치 |
JP7179517B2 (ja) * | 2018-03-01 | 2022-11-29 | Tianma Japan株式会社 | 表示装置 |
CN113284921B (zh) * | 2020-02-19 | 2023-05-09 | 合肥鑫晟光电科技有限公司 | 阵列基板及显示装置 |
CN114141826B (zh) * | 2021-11-16 | 2023-08-01 | 深圳市华星光电半导体显示技术有限公司 | 显示面板及其制备方法 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004071365A (ja) * | 2002-08-07 | 2004-03-04 | Hitachi Ltd | 有機発光表示装置 |
JP2005011810A (ja) * | 2003-06-16 | 2005-01-13 | Eastman Kodak Co | 上面発光型oledデバイスの製造方法 |
JP2006113571A (ja) * | 2004-09-15 | 2006-04-27 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
JP2007141844A (ja) * | 2005-11-15 | 2007-06-07 | Samsung Electronics Co Ltd | 表示装置とその製造方法 |
JP2007287354A (ja) * | 2006-04-12 | 2007-11-01 | Hitachi Displays Ltd | 有機el表示装置 |
JP2009124108A (ja) * | 2007-11-16 | 2009-06-04 | Samsung Mobile Display Co Ltd | 有機発光ディスプレイ装置 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006030937A1 (en) * | 2004-09-15 | 2006-03-23 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
JP5228910B2 (ja) * | 2006-06-19 | 2013-07-03 | ソニー株式会社 | 発光表示装置およびその製造方法 |
-
2008
- 2008-05-09 JP JP2008123004A patent/JP4600786B2/ja not_active Expired - Fee Related
- 2008-12-15 KR KR1020080127126A patent/KR101635165B1/ko active IP Right Grant
- 2008-12-16 CN CN2008101864091A patent/CN101465368B/zh active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004071365A (ja) * | 2002-08-07 | 2004-03-04 | Hitachi Ltd | 有機発光表示装置 |
JP2005011810A (ja) * | 2003-06-16 | 2005-01-13 | Eastman Kodak Co | 上面発光型oledデバイスの製造方法 |
JP2006113571A (ja) * | 2004-09-15 | 2006-04-27 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
JP2007141844A (ja) * | 2005-11-15 | 2007-06-07 | Samsung Electronics Co Ltd | 表示装置とその製造方法 |
JP2007287354A (ja) * | 2006-04-12 | 2007-11-01 | Hitachi Displays Ltd | 有機el表示装置 |
JP2009124108A (ja) * | 2007-11-16 | 2009-06-04 | Samsung Mobile Display Co Ltd | 有機発光ディスプレイ装置 |
Also Published As
Publication number | Publication date |
---|---|
CN101465368A (zh) | 2009-06-24 |
KR20090066223A (ko) | 2009-06-23 |
CN101465368B (zh) | 2011-07-27 |
KR101635165B1 (ko) | 2016-06-30 |
JP2009170395A (ja) | 2009-07-30 |
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